| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 10/24/2007 | CN101061609A Contactor and testing method using same |
| 10/24/2007 | CN101061386A Power supply and communications controller |
| 10/24/2007 | CN101060208A Anisotropic conductive sheet and method of manufacturing the same |
| 10/24/2007 | CN101059550A Test contact system for testing integrated circuits with packages having an array of signal and power contacts |
| 10/24/2007 | CN101059533A Automatic direction-recognizing device for ferrule |
| 10/24/2007 | CN101059532A Holder for conductive contact |
| 10/24/2007 | CN101059531A Folding type ICT needle bed fixture |
| 10/24/2007 | CN100344976C Connection unit, board mounting device to be measured, probe card, and device interface unit |
| 10/23/2007 | US7285970 Load board socket adapter and interface method |
| 10/23/2007 | US7285969 Probe for combined signals |
| 10/23/2007 | US7285966 Probe and method of making same |
| 10/23/2007 | US7285430 Connection device and test system |
| 10/23/2007 | US7284324 Method of making photolithographically-patterned out-of-plane coil structures |
| 10/18/2007 | WO2007116963A1 Contact for inspecting substrate and method for manufacturing the contact |
| 10/18/2007 | WO2007116826A1 Anisotropic conductive connector and anisotropic conductive connector device |
| 10/18/2007 | WO2007116795A1 Electrically connecting apparatus |
| 10/18/2007 | US20070241740 Hand-Held Probe |
| 10/17/2007 | EP1845382A1 Probe card and method for manufacturing same |
| 10/17/2007 | CN200962122Y A high voltage load device |
| 10/17/2007 | CN200962121Y A driving device of the probe for simulating the static field mapping |
| 10/17/2007 | CN200962120Y Test instrument |
| 10/17/2007 | CN200962119Y Circuit board fixing structure |
| 10/17/2007 | CN101055298A Temperature detection function-incorporating current sensor |
| 10/17/2007 | CN100344058C Dual edge programmable delay unit and method for providing programm of the unit |
| 10/17/2007 | CN100343968C Detecting head of tester |
| 10/17/2007 | CN100343967C Probe for testing flat panel display and manufacturing method thereof |
| 10/17/2007 | CN100343684C Composite tool for electronic and testing industry |
| 10/17/2007 | CN100343679C Method and system for generating testing pulse for driving tested electronic components |
| 10/17/2007 | CN100343678C Probe for high electric current |
| 10/17/2007 | CN100343677C Contact film probe and manufacturing method thereof |
| 10/17/2007 | CN100343676C Probe for testing electric conduction |
| 10/16/2007 | US7282934 Flexible microcircuit space transformer assembly |
| 10/16/2007 | US7282932 Compliant contact pin assembly, card system and methods thereof |
| 10/16/2007 | US7282931 Full wafer contacter and applications thereof |
| 10/16/2007 | US7282904 Device for measuring the intensity of a strong current passing through a wire |
| 10/10/2007 | CN200959017Y Probe applicating mechanism |
| 10/10/2007 | CN200959016Y PCB universal pneumatic tester |
| 10/10/2007 | CN101052886A Replaceable probe apparatus for probing semiconductor wafer |
| 10/10/2007 | CN101052885A Accumulator current sensor for automobile |
| 10/10/2007 | CN101051066A Detection device for panel display test and its production method |
| 10/10/2007 | CN101051065A Apparatus and method for testing a chip and methods of making the apparatus |
| 10/10/2007 | CN101051057A Method for sharing reference signal and reference signal arrangement system |
| 10/10/2007 | CN101051056A Method of manufacturing mini probe guiding device and mini probe unit |
| 10/09/2007 | US7280620 Electronic device including image forming apparatus |
| 10/09/2007 | US7279915 Test method for electronic modules using movable test contactors |
| 10/09/2007 | US7279914 Circuit board checker and circuit board checking method |
| 10/09/2007 | US7279788 Device for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate |
| 10/09/2007 | US7278868 Socket for semiconductor device |
| 10/04/2007 | US20070229102 Mechanically reconfigurable vertical tester interface for ic probing |
| 10/04/2007 | US20070229101 Inspection method and inspection apparatus |
| 10/04/2007 | US20070229100 High Performance Probe System |
| 10/04/2007 | US20070229011 Circuit Arrangement and Method for Adjusting the Power Consumption of a Load That Can be Operated by a Direct-Voltage System |
| 10/04/2007 | US20070228110 Method Of Wirebonding That Utilizes A Gas Flow Within A Capillary From Which A Wire Is Played Out |
| 10/04/2007 | DE102007013312A1 Sondensystem mit hoher Bandbreite Probe system with high bandwidth |
| 10/03/2007 | CN200956035Y 可替换式探针结构 Replaceable probe structure |
| 10/03/2007 | CN200956034Y Pneumatic press control device for air conditioning electronic control board test tool |
| 10/03/2007 | CN101048670A Kelvin connector including temperature sensor |
| 10/03/2007 | CN101047148A Manufacturing method of semiconductor device and semiconductor device corresponding to loop back test |
| 10/03/2007 | CN101046482A Space convertor base plate, its forming method and contact pad structure |
| 10/02/2007 | US7276924 Electrical connecting method |
| 10/02/2007 | US7276923 Semiconductor device test probe |
| 10/02/2007 | US7276922 Closed-grid bus architecture for wafer interconnect structure |
| 10/02/2007 | US7276921 Probe of under side of component through opening in a printed circuit board |
| 10/02/2007 | US7276920 Packaging and interconnection of contact structure |
| 10/02/2007 | US7276893 Automatic ranging current shunt |
| 10/02/2007 | US7275938 Socket for semiconductor package |
| 09/27/2007 | WO2007108110A1 Probe for testing electricity conduction and probe assembly |
| 09/26/2007 | EP1837995A1 Line frequency synchronisation |
| 09/26/2007 | EP1837663A1 Contact structure for inspection, and probe card |
| 09/26/2007 | EP1692526B1 Apparatus for testing a device with a high frequency signal |
| 09/26/2007 | CN200953030Y Wafer test card |
| 09/26/2007 | CN200953029Y 弹簧测试针 Spring testing needle |
| 09/26/2007 | CN200953028Y Circuit capable of raising electrostatic current tolerance |
| 09/26/2007 | CN101044407A Contact unit and inspection system using it |
| 09/26/2007 | CN100339985C Shaped springs and methds of fabricating and using shaped springs |
| 09/26/2007 | CN100339715C 接触探针 The touch probe |
| 09/26/2007 | CN100339714C Test probe |
| 09/25/2007 | US7274197 Contact system for interfacing a semiconductor wafer to an electrical tester |
| 09/25/2007 | US7274195 Semiconductor device test probe |
| 09/25/2007 | US7273385 Holding device for holding a tested electronic module |
| 09/20/2007 | WO2007085711A3 Device for measuring dc current having large measurement swing, electronic trip comprising such a measurement device and cut-off device having such a trip |
| 09/20/2007 | US20070218755 Coaxial coupling for stepless calibration |
| 09/20/2007 | US20070218572 Fabrication method of semiconductor integrated circuit device |
| 09/20/2007 | US20070216433 Probe For Electric Test |
| 09/20/2007 | US20070216426 Method and structures for detecting moisture in electroluminescence display devices |
| 09/19/2007 | EP1624309B1 Sheet-like probe, process for producing the same and its application |
| 09/19/2007 | EP1095282B1 Multi-point probe |
| 09/19/2007 | CN200950150Y Auxiliary device for detection |
| 09/19/2007 | CN200950149Y Direct-reading gage |
| 09/19/2007 | CN200950148Y Test device for peripheral apparatus extended port of printed circuit boards |
| 09/19/2007 | CN200950147Y Power supply slot testing device for printed circuit boards |
| 09/19/2007 | CN200950146Y 10 bits AD sampling calculation circuit |
| 09/19/2007 | CN101038321A Probe block and probe assembly having the block |
| 09/19/2007 | CN101038302A Probe card, method of designing the probe card, and method of testing semiconductor chips using the probe card |
| 09/19/2007 | CN101038301A Manipulator for a test head with active compliance |
| 09/19/2007 | CN101038300A Detecting circuit arrangement and manufacturing method of liquid crystal display panel |
| 09/19/2007 | CN100338975C Coating technique on surface of testing covering plate and is manufacturing method |
| 09/18/2007 | US7271735 System for the remote data acquisition and control of electric energy meters |
| 09/18/2007 | US7271607 Electrical, high temperature test probe with conductive driven guard |
| 09/18/2007 | US7271603 Shielded probe for testing a device under test |