G01R 1 - Details of instruments or arrangements of the types covered by groups or

Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269)
11/2007
11/14/2007	EP1855117A1 Contact for use in testing integrated circuits
11/14/2007	EP1853931A2 Method and circuit for the detection of solder-joint failures in a digital electronic package
11/14/2007	EP1853930A1 Probes for a wafer test apparatus
11/14/2007	EP1668376B1 Efficient switching architecture with reduced stub lengths
11/14/2007	EP1637893B1 Method and apparatus for testing electrical characteristics of object under test
11/14/2007	EP1570513A4 Microelectronic packaging and components
11/14/2007	EP1396050A4 Apparatus and methods to pre-stress anisotropic conductive elastomer meterials
11/14/2007	EP1350119B1 Low cost, on-line corrosion monitor and smart corrosion probe
11/14/2007	CN200976014Y 背光型指针式万用表 Backlit Analog Multimeter
11/14/2007	CN200976013Y 电路板测试箱 Circuit board test box
11/14/2007	CN200976012Y Touch testing device
11/14/2007	CN200976011Y High-voltage vacuum breaker testing device
11/14/2007	CN200976010Y Clamp for testing essential resistance of fuse
11/14/2007	CN200976009Y Electric performance testing clamp for circuit board
11/14/2007	CN101073014A Relay connection member, inspection device and method of manufacturing relay connection member
11/14/2007	CN101071153A Method for designing a probe card
11/14/2007	CN101071141A Detecting unit and detecting device with same
11/14/2007	CN101071140A Probe, testing head having a plurality of probes, and circuit board tester having the testing head
11/14/2007	CN100349274C Clamp for vertical cavity emission laser To coaxial encapsulation lest
11/14/2007	CN100348983C Circuit film for micro electromechanical probe and fabricating method thereof
11/14/2007	CN100348982C Test method for yielding a known good die
11/14/2007	CN100348981C Test apparatus for electronic device connection interface
11/13/2007	US7295027 Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet
11/13/2007	US7295025 Probe station with low noise characteristics
11/13/2007	US7295021 Process and circuit for protection of test contacts in high current measurement of semiconductor components
11/13/2007	US7295020 Cap at resistors of electrical test probe
11/13/2007	US7294914 Interconnect structure
11/13/2007	US7294790 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
11/11/2007	CA2588313A1 Contact for use in testing integrated circuits
11/08/2007	WO2007125974A1 Conductive contact holder
11/08/2007	WO2007125756A1 Apparatus for inspecting fine structure and method for inspecting fine structure
11/08/2007	WO2006019878A8 System and method to support multiple wireless accounts for a given subscriber
11/08/2007	US20070259506 Probe Needle, Method for Manufacturing the Probe Needle and Method for Constructing a Three-Dimensional Structure
11/08/2007	US20070257663 Current sensing circuit for use in a current measurement probe
11/08/2007	DE102006019911A1 Shunt for use in battery sensor, has two contact elements attached to sides of resistor element, where one contact element has larger total cross-section area in level running parallel to one side via hole and is thicker towards hole
11/07/2007	EP1852810A1 IC tags/RFID tags for magnetic resonance imaging applications
11/07/2007	EP1851558A1 Programmable devices to route signals on probe cards
11/07/2007	EP0850490B1 Process and device for testing a chip
11/07/2007	CN200972483Y Precision trimming mould
11/07/2007	CN200972482Y Trolley and body structure of test machine
11/07/2007	CN200972481Y Test clamp
11/07/2007	CN200972480Y Test base for integrated circuit chip
11/07/2007	CN200972479Y Generator detection platform for vehicle detection equipment
11/07/2007	CN200972478Y Starter detection platform for vehicle detection equipment
11/07/2007	CN101067642A Electronic device test set and contact used therein
11/07/2007	CN101067640A Electric circuit connection detector, electronic equipment and detecting method
11/07/2007	CN101067636A Flexible test cable
11/07/2007	CN100347557C Method and apparatus for in-circuit testing of sockets
11/07/2007	CN100347556C Capacitor for measuring vane electrical characteristics
11/06/2007	US7292057 Probe station thermal chuck with shielding for capacitive current
11/06/2007	US7292022 Current detection resistor, mounting structure thereof and method of measuring effective inductance
11/01/2007	WO2007123185A1 Contact probe and method for manufacturing same
11/01/2007	WO2007123150A1 Probe card and glass substrate drilling method
11/01/2007	WO2007098290A3 Approach for fabricating probe elements for probe card assemblies using a reusable substrate
11/01/2007	WO2006124842A3 Ruggedized apparatus for analysis of nucleic acid and proteins
11/01/2007	US20070252606 Shielded Probe Apparatus for Probing Semiconductor Wafer
11/01/2007	US20070252580 Probe for Measuring Characteristics of an Excitation Current of a Plasma, and Associated Plasma Reactor
11/01/2007	US20070252578 Electrical measuring instrument having detachable current clamp
10/2007
10/31/2007	EP1850419A1 Composite conductive sheet, method for producing the same, anisotropic conductive connector, adapter, and circuit device electric inspection device
10/31/2007	EP1849016A1 Probe card assembly and method of attaching probes to the probe card assembly
10/31/2007	DE102005019564B4 Handhabungsvorrichtung zum Positionieren eines Testkopfs, insbesondere an einer Prüfeinrichtung Handling device for positioning a test head, in particular to a test device
10/31/2007	CN200968972Y Tunable test probe bracket
10/31/2007	CN200968971Y Improved structure for field intensity meter
10/31/2007	CN200968964Y Simple testing needle
10/31/2007	CN200968963Y Clamp for testing machine
10/31/2007	CN200968962Y Pulley test ceiling device
10/31/2007	CN200968961Y Interface neilsbed
10/31/2007	CN101065681A Interface apparatus for semiconductor device tester
10/31/2007	CN101064385A Connection and switch device
10/31/2007	CN101063700A Method and arrangement for implementing chip test
10/31/2007	CN101063686A Probe card
10/31/2007	CN101063685A Cable component and manufacturing method therefor
10/31/2007	CN101063625A BGA packaging retainer apparatus and method for testing BGA packaging
10/31/2007	CN100346200C Display assembly and assembling method thereof
10/31/2007	CN100346165C System for the remote data acquisition and control of electric energy meters
10/30/2007	US7288954 Compliant contact pin test assembly and methods thereof
10/30/2007	US7288953 Method for testing using a universal wafer carrier for wafer level die burn-in
10/30/2007	US7288952 Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
10/30/2007	US7288950 Contacting component, method of producing the same, and test tool having the contacting component
10/30/2007	US7287421 Semiconductor probe with high resolution resistive tip and method of fabricating the same
10/30/2007	US7287326 Methods of forming a contact pin assembly
10/30/2007	US7287322 Lithographic contact elements
10/25/2007	WO2007119638A1 Probe sheet and electrically connecting apparatus
10/25/2007	WO2007119637A1 Flexible circuit board and electrical connection device
10/25/2007	WO2007119636A1 Method for manufacturing probe sheet
10/25/2007	WO2007118970A1 Flexible membrane test board fitted with contact pins guided by a centrally controlled suspension mechanism
10/25/2007	WO2007092594A3 Approach for fabricating cantilever probes for probe card assemblies
10/25/2007	US20070248217 Interface device for testing a telecommunication circuit
10/25/2007	US20070247180 Probe station having multiple enclosures
10/25/2007	US20070247176 Method of Manufacturing a Probe Card
10/25/2007	US20070245808 Pressure Testing Apparatus and Method for Pressure Testing
10/24/2007	EP1847835A2 Method and system for compensating thermally induced motion of probe cards
10/24/2007	EP1847834A1 Interposer, probe card and method for manufacturing interposer
10/24/2007	EP1523229B1 Semiconductor exercising apparatus, test socket apparatus and method of making thereof
10/24/2007	EP0795200B1 Mounting electronic components to a circuit board
10/24/2007	CN200965966Y Electrical signal connecting head and connecting socket for electronic device
10/24/2007	CN200965774Y A measurement carrier detection module for display panel
10/24/2007	CN200965773Y Detection module of display panel for measuring the carriers
10/24/2007	CN200965545Y 电子产品移转装置 Electronic transfer device
10/24/2007	CN200965544Y Tester rail adjustment mechanism

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