G01R 1 - Details of instruments or arrangements of the types covered by groups or

Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269)
12/2007
12/12/2007	CN200989910Y Automatic connecting and disconnecting device
12/12/2007	CN200989909Y Vernier adjustable PCB test device
12/12/2007	CN200989908Y Separating management observe and control instrument
12/12/2007	CN200989793Y Clamp used for optical detector
12/12/2007	CN101086509A Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making same
12/12/2007	CN101086508A Checking apparatus and its connector and checking method
12/12/2007	CN100354640C Apparatus and method for handling and testing of wafers
12/11/2007	US7307436 Electrical feedback detection system for multi-point probes
12/11/2007	US7307435 Probe card
12/11/2007	US7307433 Intelligent probe card architecture
12/11/2007	US7307432 Electron beam generating apparatus and optical sampling apparatus using the same
12/11/2007	US7307412 Inductive measurement system and method
12/06/2007	WO2007137605A1 Fin-socket bridging electronic tapping interface
12/06/2007	WO2007137535A1 Checking device for a switchgear cabinet with an input terminal block
12/06/2007	WO2007091985A3 Current-measuring clamp on sensor in electromechanical relays
12/06/2007	US20070279078 Kelvin contact measurement device and kelvin contact measurement method
12/06/2007	US20070279076 Probe Card Assembly and Method of Attaching Probes to the Probe Card Assembly
12/06/2007	US20070279075 Apparatus and Method for Terminating Probe Apparatus of Semiconductor Wafer
12/06/2007	US20070279074 Probe Cassette, Semiconductor Inspection Apparatus And Manufacturing Method Of Semiconductor Device
12/06/2007	US20070279043 Probe, Manufacturing Method of the Probe, Recording Apparatus, and Reproducing Apparatus
12/06/2007	US20070278405 Multi-tip surface cantilever probe
12/05/2007	CN200986568Y Probe card
12/05/2007	CN200986567Y Electronic test device
12/05/2007	CN200986566Y Universal device for testing combined circuit board
12/05/2007	CN200986565Y PCB test clamp micro-adjusting device
12/05/2007	CN200986564Y Electric energy metering junction box
12/05/2007	CN200986563Y Electrical inspection knife device
12/05/2007	CN101084442A Contactor member, contactor and contacting method
12/05/2007	CN101082639A Standard pulse generator capable of simulating pulse measurement meter used by user
12/05/2007	CN101082638A Transmission line used for internal circuit test point
12/05/2007	CN101082637A Prober for electronic device testing on large area substrates
12/05/2007	CN101082636A Method for detecting tips of probes, alignment method and storage medium storing the methods, and probe apparatus
12/05/2007	CN101082635A Memory bank testing device
12/05/2007	CN101082634A Checking tool for printed circuit-board
12/05/2007	CN101082633A IC detecting machine capable of simultaneously multiple parallel built-in testing
12/05/2007	CN101082632A Testing tool for circuit board
12/05/2007	CN101082631A IC detecting machine capable of simultaneously multiple parallel built-in testing
12/04/2007	US7304489 Inspection method and inspection apparatus
12/04/2007	US7304488 Shielded probe for high-frequency testing of a device under test
12/04/2007	US7304487 Test method of semiconductor devices
12/04/2007	US7304486 Nano-drive for high resolution positioning and for positioning of a multi-point probe
12/04/2007	US7303404 Contact and electrical connecting apparatus
12/04/2007	US7302753 Electrical gripping testing and installation device
11/2007
11/29/2007	WO2007092593A3 Probe repair methods
11/29/2007	US20070275572 Connector for making electrical contact at semiconductor scales
11/29/2007	US20070273399 Probe for testing a device under test
11/29/2007	US20070273387 Optical testing device
11/29/2007	US20070273360 Cap at resistors of electrical test probe
11/29/2007	US20070271781 High density integrated circuit apparatus, test probe and methods of use thereof
11/29/2007	DE202005021386U1 Prüfkopf mit einem Messfühler mit Membranaufhängung Probe with a sensor with membrane suspension
11/28/2007	CN200982998Y A surge current generator
11/28/2007	CN200982985Y 一种信号发生器 A signal generator
11/28/2007	CN200982984Y 一种信号发生器 A signal generator
11/28/2007	CN200982983Y Electric probe device
11/28/2007	CN200982982Y Freezing environment IC testing table
11/28/2007	CN101080643A Signal module with reduced reflections
11/28/2007	CN101079389A Handler for testing of packed chip
11/28/2007	CN101078739A Needle bed processing equipment
11/28/2007	CN101078738A Microelectronic mechanical system probe card based on elastic substrate
11/28/2007	CN101078737A Testing fixture and machine station combination device
11/28/2007	CN100351633C Method and apparatus for testing electronic devices
11/27/2007	US7301358 Contactor assembly for testing electrical circuits
11/27/2007	US7301357 Inspection method and inspection equipment
11/27/2007	US7301354 Contact probe for a testing head having vertical probes for semiconductor integrated devices
11/27/2007	US7301326 Modular interface
11/27/2007	US7301146 Probe driving method, and probe apparatus
11/22/2007	WO2007134012A1 Lumped resistance electrical cable
11/22/2007	WO2007133979A1 Probe holder for various thickness substrates
11/22/2007	WO2007133965A2 Current probe
11/22/2007	WO2007132739A1 Substrate inspecting jig, and electrode structure of connecting electrode unit in the jig
11/22/2007	WO2005091916A3 Flexible microcircuit space transformer assembly
11/22/2007	US20070270041 Microelectronic contact structure
11/22/2007	US20070269997 Electronic components with plurality of contoured microelectronic spring contacts
11/22/2007	US20070269909 Method for processing an integrated circuit
11/22/2007	US20070267385 Semiconductor probe with high resolution resistive tip and method of fabricating the same
11/22/2007	DE19847179B4 Schaltungsanordnung zum Erfassen einer galvanisch getrennten Spannung Circuitry for detecting an electrically isolated voltage
11/21/2007	EP1857822A1 Spatial transformer for RF and low current interconnect
11/21/2007	EP1482313B1 Capacity load type probe, and test jig using the same
11/21/2007	EP1476761B1 Contact actuator with contact force control
11/21/2007	CN200979561Y A circuit board fixing mechanism
11/21/2007	CN200979560Y An inner discharge circuit of a testing circuit board fixture
11/21/2007	CN200979559Y A magnetic fixed substructure of a probe-bed
11/21/2007	CN101076734A Probe head for measuring high frequency
11/21/2007	CN101074970A Transmission circuit, probe sheet, probe card, semiconductor detector and producing method
11/21/2007	CN101074969A Carrier for measuring display device panel
11/21/2007	CN100350258C Insert and electronic component handling apparatus having the same
11/21/2007	CN100350254C Contact structure having silicon finger contactor
11/21/2007	CN100350253C Programmable test socket
11/20/2007	US7298536 Fiber optic wafer probe
11/20/2007	US7298163 TFT array inspection device
11/20/2007	US7297563 Method of making contact pin card system
11/20/2007	CA2360817C Dry load test apparatus
11/15/2007	WO2007131186A2 Current probing system
11/15/2007	WO2007131141A2 Method and apparatus for probing
11/15/2007	WO2007129686A1 Probe
11/15/2007	WO2007100713A3 Approach for fabricating cantilever probes
11/15/2007	WO2007092591A3 Multi-layered probes
11/15/2007	WO2000031828A3 Electrical contact system
11/15/2007	US20070262767 Probing a device
11/15/2007	US20070262463 Semiconductor substrate-based interconnection assembly for semiconductor device bearing external elements

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