| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 01/09/2008 | EP1412139B1 Device for the targeted displacement of electronic components, using a pivoting mirror |
| 01/09/2008 | CN201004081Y Electron and circuit plate detection device |
| 01/09/2008 | CN201004072Y An automatic gear conversion and range measurement circuit |
| 01/09/2008 | CN201004071Y A card button device for testing electronic component plate |
| 01/09/2008 | CN101101886A Inspection apparatus for semiconductor and inspection method for semiconductor ic |
| 01/09/2008 | CN101101314A Display panel test fixture and test method |
| 01/09/2008 | CN101101313A Predictive, adaptive power supply for an integrated circuit under test |
| 01/09/2008 | CN101101307A Semiconductor device testing apparatus |
| 01/09/2008 | CN100361122C Automatic designing method for ICT test conversion PCB |
| 01/09/2008 | CN100360948C Circuit board testing jig |
| 01/09/2008 | CN100360943C Detector capable of preventing overpressure |
| 01/08/2008 | US7317322 Interconnect for bumped semiconductor components |
| 01/03/2008 | WO2007131186A3 Current probing system |
| 01/02/2008 | CN101097721A Voltage bringing device and conductive processing method using same |
| 01/02/2008 | CN101097231A Measuring device |
| 01/02/2008 | CN101097230A Supporting device for measurement probe |
| 01/02/2008 | CN101097229A Detecting device |
| 01/02/2008 | CN101097228A Fixture mechanism used for host board testing operation and testing system having device |
| 01/02/2008 | CN101097158A Regenerative braking halo and method |
| 01/02/2008 | CN100359659C Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method |
| 01/02/2008 | CN100359328C Connector for measuring electric resistance, apparatus and method for measuring electric resistance of circuit board |
| 01/01/2008 | US7315176 Electrical test probes, methods of making, and methods of using |
| 01/01/2008 | US7314821 Method for fabricating a semiconductor interconnect having conductive spring contacts |
| 12/27/2007 | WO2007131141A3 Method and apparatus for probing |
| 12/27/2007 | US20070296431 Membrane probing system with local contact scrub |
| 12/27/2007 | US20070296419 Insert and Pusher of Electronic Device Handling Apparatus, Socket Guide for Test Head, and Electronic Device Handling Apparatus |
| 12/27/2007 | DE19860560B4 Verwendung einer gebrauchten Wolfram-Prüfmesssonde Use a used tungsten Prüfmesssonde |
| 12/27/2007 | DE102006029547A1 Batteriesensoreinheit und Verfahren zur Herstellung der Batteriesensoreinheit Battery sensor unit and method of manufacturing the battery sensor unit |
| 12/26/2007 | EP1870715A1 Probe card |
| 12/26/2007 | EP1870714A1 Microstructure probe card, and microstructure inspecting device, method, and computer program |
| 12/26/2007 | EP1634088A4 A method and apparatus for measuring and analyzing electrical or electrochemical systems |
| 12/26/2007 | EP1436636B1 Method and apparatus for sub-micron imaging and probing on probe station |
| 12/26/2007 | EP0853657B1 Storage device for objects, storage station, and air-conditioned cabinet |
| 12/26/2007 | CN101093244A Semiconductor device, semiconductor device testing method, and probe card |
| 12/26/2007 | CN101093242A Testing apparatus |
| 12/26/2007 | CN101093231A 探针卡 Probe Card |
| 12/26/2007 | CN101093230A Clamp in use for testing LED |
| 12/26/2007 | CN100357747C Flexible test cable |
| 12/26/2007 | CN100357745C Integral probe card and assembling mode |
| 12/26/2007 | CN100357744C Holder for conductive contact |
| 12/26/2007 | CN100357743C Method and apparatus for taking and putting electronic elements waiting for measurement |
| 12/25/2007 | US7312620 Burn-in testing apparatus and method |
| 12/25/2007 | US7312618 Method and system for compensating thermally induced motion of probe cards |
| 12/25/2007 | US7311531 Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method |
| 12/25/2007 | US7311239 Probe attach tool |
| 12/21/2007 | WO2007146583A2 Method of designing an application specific probe card test system |
| 12/21/2007 | WO2007146186A2 Knee probe having increased scrub motion |
| 12/21/2007 | WO2007145729A2 On-wafer test structures |
| 12/21/2007 | WO2007145727A2 Differential signal probing system |
| 12/21/2007 | WO2007143834A1 Electrical energy monitor |
| 12/21/2007 | WO2007092592A3 Automated probe card planarization and alignment methods and tools |
| 12/21/2007 | CA2654997A1 Electrical energy monitor |
| 12/20/2007 | US20070293062 Anisotropic conductive connector and circuit-device electrical inspection device |
| 12/20/2007 | US20070290835 Power Supply and Communications Controller |
| 12/20/2007 | US20070290703 High Resolution Analytical Probe Station |
| 12/20/2007 | US20070290700 Wafer probe station having a skirting component |
| 12/20/2007 | US20070290699 Probe card |
| 12/20/2007 | US20070290698 Probe card |
| 12/20/2007 | US20070290676 Bi-Directional Buffer For Interfacing Test System Channel |
| 12/20/2007 | US20070290673 Portable Electric Testing Equipment |
| 12/20/2007 | DE102006026825A1 Housing for active probe head, is executed in T-section to utilize discrete components during manufacturing of probe head, where execution of housing enables endless alignment of probe head on adjacent pins at interfaces in grid pattern |
| 12/19/2007 | EP1866654A1 Method and device for tempering a substrate |
| 12/19/2007 | EP1828762A4 Method and apparatus for preventing damage to electronics during tire inspection |
| 12/19/2007 | CN200993670Y IC card circuit board detection converting device |
| 12/19/2007 | CN200993657Y Combined plastic casing lock seal |
| 12/19/2007 | CN200993656Y Conducting device for detection carrier |
| 12/19/2007 | CN101089629A Push mechanism for instant test platform |
| 12/19/2007 | CN101089628A High-current test output clip |
| 12/19/2007 | CN101089627A Test two-used clip |
| 12/19/2007 | CN101089626A Instant testing platform clip |
| 12/19/2007 | CN100356541C Apparatus and method for cleaning probe card contacts |
| 12/19/2007 | CN100356184C Loaded board test method |
| 12/19/2007 | CN100356183C Checking tool for printed circuit-board |
| 12/19/2007 | CN100356179C Signal generation apparatus and method |
| 12/19/2007 | CN100356178C Composite motion probing |
| 12/18/2007 | US7309996 Contactor for electronic components and test method using the same |
| 12/18/2007 | US7309991 Scanning probe inspection apparatus |
| 12/18/2007 | US7309244 Anisotropic conductive connector device and production method therefor and circuit device inspection device |
| 12/13/2007 | WO2007143737A2 Compact scanning electron microscope |
| 12/13/2007 | WO2007143736A2 Compact scanning electron microscope |
| 12/13/2007 | WO2007143734A2 User interface for an electron microscope |
| 12/13/2007 | WO2007142855A2 Electrical test probes with a contact element, methods of making and using the same |
| 12/13/2007 | WO2007142204A1 Probe card |
| 12/13/2007 | WO2007141867A1 Electric connection device |
| 12/13/2007 | WO2007140753A1 Test probe for a test apparatus for testing plug-type connectors and method for testing plug-type connectors |
| 12/13/2007 | US20070287304 Electrical Contactor, Espcecially Wafer Level Contactor, Using Fluid Pressure |
| 12/13/2007 | US20070287206 Method for Manufactuing a Semiconductor Integrated Circuit Device |
| 12/13/2007 | US20070285115 Universal wafer carrier for wafer level die burn-in |
| 12/13/2007 | US20070285114 Socket For Making With Electronic Component, Particularly Semiconductor Device With Spring Packaging, For Fixturing, Testing, Burning-In Or Operating Such A Component |
| 12/13/2007 | US20070285112 On-wafer test structures |
| 12/13/2007 | US20070285085 Differential signal probing system |
| 12/12/2007 | EP1865330A2 System for detecting errors in electric conductors |
| 12/12/2007 | EP1466181B1 Probe for electrical measurement methods and use of a flexible probe for production of a rigid probe |
| 12/12/2007 | EP1402763B1 apparatus for non-destructive testing of leaded packages |
| 12/12/2007 | EP1322971A4 Re-locatable partial discharge transducer head |
| 12/12/2007 | CN200989935Y Testing system |
| 12/12/2007 | CN200989932Y Test system for reducing index time |
| 12/12/2007 | CN200989913Y Testing connector for picking up high frequency signal |
| 12/12/2007 | CN200989912Y Probe for detection |
| 12/12/2007 | CN200989911Y Multipurpose device testing holder |