| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 02/07/2008 | WO2008015868A1 Probe pin |
| 02/07/2008 | US20080030215 High density cantilevered probe for electronic devices |
| 02/07/2008 | US20080030213 Active probe contact array management |
| 02/07/2008 | US20080030212 Active probe contact array management |
| 02/06/2008 | EP1883826A1 Probe or measuring head with illumination of the contact region |
| 02/06/2008 | CN201017019Y Test blind removing instrument used for removing electrical cable fault testing and test system |
| 02/06/2008 | CN201016996Y Pressure-bearing thrusting needle |
| 02/06/2008 | CN201016995Y Ammeter box |
| 02/06/2008 | CN201016994Y PCB testing jig |
| 02/06/2008 | CN201016993Y Pressure resistance testing jig |
| 02/06/2008 | CN101120484A Composite conductive sheet, its manufacturing method, anisotropic conductive connector, adapter device, and electric inspection system for circuit apparatus |
| 02/06/2008 | CN101120257A Conductive terminal unit and conductive terminal |
| 02/06/2008 | CN101118262A Device for taking and putting material carrier of ageing oven |
| 02/06/2008 | CN101118261A Material carrier of ageing oven with brake device |
| 02/06/2008 | CN101118252A Signal generating circuit of electric capacitance measurement |
| 02/06/2008 | CN101118251A Perpendicular detecting probe head, detecting probe head manufacturing method and modularized detecting probe card thereof |
| 02/05/2008 | US7325304 Method of connecting probe pin to circuit board and method of manufacturing probe card |
| 01/31/2008 | WO2008013923A1 Probes and methods for semiconductor wafer analysis |
| 01/31/2008 | WO2008013145A1 Ceramic member, probe holder, and method for producing ceramic member |
| 01/31/2008 | WO2007142855A3 Electrical test probes with a contact element, methods of making and using the same |
| 01/31/2008 | WO2007140227A3 Mode selection amplifier circuit usable in a signal acquisition probe |
| 01/31/2008 | US20080026603 Socket for semiconductor device |
| 01/31/2008 | US20080024155 High density cantilevered probe for electronic devices |
| 01/31/2008 | US20080024154 High density cantilevered probe for electronic devices |
| 01/31/2008 | US20080024151 Socket For Connecting Ball-Grid-Array Integrated Circuit Device To Test Circuit |
| 01/31/2008 | US20080024149 Probe for testing a device under test |
| 01/31/2008 | US20080024143 Closed-grid bus architecture for wafer interconnect structure |
| 01/31/2008 | US20080024116 Coupling Electrode for Capacitive Voltage Tapping within the Insulating Body of a Bushing or of a Post Insulator |
| 01/30/2008 | EP1882952A1 Wafer inspecting sheet-like probe and application thereof |
| 01/30/2008 | CN201014995Y Uprightness adjustable fixture mechanism of power metering box |
| 01/30/2008 | CN201014994Y Test arrangement for wire |
| 01/30/2008 | CN201014993Y Testing circuit improvement for PCB tester |
| 01/30/2008 | CN101114603A Probe card for semiconductor integrated circuit detection and manufacturing method thereof |
| 01/30/2008 | CN101113990A Method for manufacturing probe card |
| 01/30/2008 | CN100365422C Insertosome and electronic parts processing device with the same |
| 01/29/2008 | US7324006 Remote display ammeter for power plug or power strip |
| 01/29/2008 | US7323895 Low-current pogo probe card |
| 01/29/2008 | US7323893 Probe device capable of being used for plural kinds of testers |
| 01/29/2008 | US7323890 Multi-point probe |
| 01/29/2008 | US7323859 Auto-measuring universal meter |
| 01/29/2008 | US7323712 Anisotropically conductive connector and production process thereof, and probe member |
| 01/24/2008 | WO2008011517A1 Voltage sensing hand tool and voltage sensing module for attachment to hand tools |
| 01/24/2008 | WO2008009791A2 Test card provided with a transmission line having large frequency ranges. |
| 01/24/2008 | US20080020498 Fabrication method of semiconductor integrated circuit device |
| 01/24/2008 | US20080018355 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
| 01/24/2008 | US20080018354 Test handler |
| 01/24/2008 | US20080018352 Prober and probe contact method |
| 01/24/2008 | DE19707485B4 Haltevorrichtung und Haltebaugruppe für ein Leiterplatten-Prüfgerät Holding device and support assembly for a printed circuit board testing device |
| 01/23/2008 | CN201011611Y Electrical measuring clamp for LCD device |
| 01/23/2008 | CN101111772A Method of shaping lithographically-produced probe elements |
| 01/23/2008 | CN101109785A Product multiplexed test board for integrated circuit high temperature dynamic aging |
| 01/23/2008 | CN101109784A Testing method for integrated circuit high temperature dynamic aging and testing device thereof |
| 01/23/2008 | CN101109774A Three-phase multiple loop monitoring device and implementing method thereof |
| 01/23/2008 | CN101109770A Non-contact type single side probe structure |
| 01/23/2008 | CN101109769A Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same |
| 01/23/2008 | CN101109768A Improved structure of modularized elastic probe |
| 01/23/2008 | CN101109767A Improved structure of two sheet type modularized elastic probe |
| 01/23/2008 | CN101109766A Fixing mechanism of probe card, fixing method of probe card and probe card |
| 01/23/2008 | CN101109765A Electromagnetic high-frequency LED conveying device |
| 01/23/2008 | CN100364041C Wafer inspection device |
| 01/23/2008 | CN100363744C Probe connecting terminal cladded with conducting wire on testing tool of printed circuit distributing board |
| 01/22/2008 | US7321233 System for evaluating probing networks |
| 01/17/2008 | WO2008008232A2 Probes with self-cleaning blunt skates for contacting conductive pads |
| 01/17/2008 | WO2007098291A3 Beam assembly method for large area array multi-beam dut probe cards |
| 01/17/2008 | US20080012595 Wafer test card using electric conductive spring as wafer test interface |
| 01/17/2008 | US20080012593 Circuit board checker and circuit board checking method |
| 01/17/2008 | US20080012592 Device and method for testing semiconductor packages |
| 01/17/2008 | US20080012590 Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
| 01/17/2008 | US20080012589 Wafer test card applicable for wafer test |
| 01/17/2008 | US20080012588 Silicon Wafer for Probe Bonding and Probe Bonding Method Using Thereof |
| 01/17/2008 | US20080010824 Probe card and method for manufacturing probe card |
| 01/16/2008 | EP1879038A1 Conductive contact holder and conductive contact unit |
| 01/16/2008 | EP1879035A1 Probe Card |
| 01/16/2008 | CN201007723Y Signal connecting port positioning device for panel carrier |
| 01/16/2008 | CN201007722Y Semiconductor component testing table with flexible buffering heat conduction foundation |
| 01/16/2008 | CN201007721Y Semiconductor component testing table with ventiduct cooling device |
| 01/16/2008 | CN101105516A Device and method for testing semiconductor packages |
| 01/16/2008 | CN101105510A Phase error measurement circuit and method thereof |
| 01/16/2008 | CN101105507A Probe card |
| 01/16/2008 | CN101105506A High frequency probe card |
| 01/16/2008 | CN101105505A Carrier module and test tray installed with the carrier module |
| 01/16/2008 | CN101105504A 探针卡装置 Probe card device |
| 01/16/2008 | CN100362707C Socket for semiconductor device |
| 01/16/2008 | CN100362351C Non-suction head type apparatus for taking and putting measured electronic elements |
| 01/15/2008 | US7319339 Inspection apparatus to break the oxide of an electrode by fritting phenomenon |
| 01/15/2008 | US7319304 Shunt connection to a PCB of an energy management system employed in an automotive vehicle |
| 01/15/2008 | US7319273 Methods and apparatus for a flexible circuit interposer |
| 01/15/2008 | US7319224 Semiconductor probe with resistive tip and method of fabricating the same |
| 01/15/2008 | US7318729 Sheet-form connector and production method and application therefor |
| 01/10/2008 | WO2007133980A3 Input by-pass circuit for a current probe |
| 01/10/2008 | WO2007133965A3 Current probe |
| 01/10/2008 | WO2007098293A3 Blade probe and blade probe card |
| 01/10/2008 | WO2005091916B1 Flexible microcircuit space transformer assembly |
| 01/10/2008 | US20080009082 Connection device and test system |
| 01/10/2008 | US20080007286 Probe of under side of component through opening in a printed circuit board |
| 01/10/2008 | US20080007282 Probe assembly |
| 01/10/2008 | US20080007281 Method of forming probe card assembly |
| 01/10/2008 | US20080007279 Probe Cards |
| 01/09/2008 | EP1876461A2 Current measuring apparatus for battery |
| 01/09/2008 | EP1876454A1 Method for testing chips electrically |