| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 03/06/2008 | US20080054922 Probe station with low noise characteristics |
| 03/06/2008 | US20080054916 Probe |
| 03/06/2008 | US20080054910 Test apparatus for testing operation of a printed circuit board |
| 03/06/2008 | US20080054885 Chuck for holding a device under test |
| 03/06/2008 | US20080054884 Chuck for holding a device under test |
| 03/06/2008 | US20080054883 Chuck for holding a device under test |
| 03/05/2008 | EP1894027A1 Apparatus for testing electronic devices |
| 03/05/2008 | EP1894023A1 Radio frequency isolation container |
| 03/05/2008 | EP1894022A1 Sensor module, system, and method for sensors in proximity to circuit breakers |
| 03/05/2008 | CN101135701A 垂直式高频探针卡 Vertical high-frequency probe card |
| 03/05/2008 | CN101135700A Microcomputer electric detecting probe fasten with multiple layer elastic |
| 03/05/2008 | CN100373167C Cooling assembly with direct cooling of active electronic components |
| 03/04/2008 | US7339367 Interface for detection and control of multiple test probes |
| 03/04/2008 | US7338308 IC socket |
| 03/04/2008 | US7338293 Circuit contact to test apparatus |
| 03/04/2008 | US7337656 Surface characteristic analysis apparatus |
| 02/28/2008 | WO2008024124A1 Probe with contact ring |
| 02/28/2008 | US20080048702 Contact probe |
| 02/28/2008 | US20080048698 Probe Card |
| 02/28/2008 | US20080048697 High density integrated circuit apparatus, test probe and methods of use thereof |
| 02/28/2008 | US20080048693 Probe station having multiple enclosures |
| 02/28/2008 | US20080048692 Probe for testing a device under test |
| 02/28/2008 | US20080048691 High density integrated circuit apparatus, test probe and methods of use thereof |
| 02/28/2008 | US20080048690 High density integrated circuit apparatus, test probe and methods of use thereof |
| 02/28/2008 | US20080048689 Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same |
| 02/28/2008 | US20080048688 Methods for planarizing a semiconductor contactor |
| 02/28/2008 | US20080048686 Sheet-like Probe, Method of Producing the Probe, and Application of the Probe |
| 02/28/2008 | US20080048648 Chuck for holding a device under test |
| 02/28/2008 | US20080048647 Chuck for holding a device under test |
| 02/28/2008 | US20080047741 High density integrated circuit apparatus, test probe and methods of use thereof |
| 02/27/2008 | CN201029107Y Clamper of lithium battery detecting cabinet |
| 02/27/2008 | CN201028999Y Output function module |
| 02/27/2008 | CN101133487A Method for manufacturing semiconductor IC device |
| 02/27/2008 | CN101133338A Probe card with segmented substrate |
| 02/27/2008 | CN101131400A Micro-electronmechanical manufacturing method for alloy probe |
| 02/27/2008 | CN101131399A Test chip socket |
| 02/27/2008 | CN101131398A Integrated circuit tester |
| 02/27/2008 | CN100371777C Projector for detecting plane displaying board and projecting method realized by same |
| 02/26/2008 | USRE40105 Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits |
| 02/26/2008 | US7336087 Circuit board test device comprising contact needles which are driven in diagonally protruding manner |
| 02/26/2008 | US7335942 Field effect transistor sensor |
| 02/26/2008 | US7335057 High density planar electrical interface |
| 02/21/2008 | WO2008020565A1 Conductive contactor unit |
| 02/21/2008 | WO2008020564A1 Conductive contactor and conductive contactor unit |
| 02/21/2008 | WO2008019740A1 Oscilloscope probe |
| 02/21/2008 | WO2008019732A1 Oscilloscope probe |
| 02/21/2008 | WO2008019731A1 Oscilloscope probe |
| 02/21/2008 | WO2007137241A3 Multi-channel signal acquisition probe |
| 02/21/2008 | WO2007133975A3 Current probing system |
| 02/21/2008 | US20080045028 Wafer probe |
| 02/21/2008 | US20080042680 Probe station thermal chuck with shielding for capacitive current |
| 02/21/2008 | US20080042678 Wafer probe |
| 02/21/2008 | US20080042677 Wafer probe |
| 02/21/2008 | US20080042675 Probe station |
| 02/21/2008 | US20080042674 Chuck for holding a device under test |
| 02/21/2008 | US20080042673 Probe for combined signals |
| 02/21/2008 | US20080042672 Probe for testing a device under test |
| 02/21/2008 | US20080042671 Probe for testing a device under test |
| 02/21/2008 | US20080042670 Probe station |
| 02/21/2008 | US20080042669 Probe station |
| 02/21/2008 | US20080042668 Apparatus and method for managing thermally induced motion of a probe card assembly |
| 02/21/2008 | US20080042655 Systems and methods for detecting impurities in reactor systems |
| 02/21/2008 | US20080042642 Chuck for holding a device under test |
| 02/21/2008 | US20080042374 Chuck for holding a device under test |
| 02/21/2008 | DE102006052745A1 Oszilloskop-Tastkopf Oscilloscope probe |
| 02/21/2008 | DE102006052720A1 Oszilloskop-Tastkopf Oscilloscope probe |
| 02/20/2008 | EP1890162A2 Electric measuring device |
| 02/20/2008 | EP1797437B1 Device for determining electric variables |
| 02/20/2008 | CN101126769A Transient high-current signal generator |
| 02/20/2008 | CN101126768A Extruded article |
| 02/20/2008 | CN100370260C Multiple crystal grain needle-detection instrument |
| 02/19/2008 | US7332923 Test probe for high-frequency measurement |
| 02/19/2008 | US7332922 Method for fabricating a structure for making contact with a device |
| 02/19/2008 | US7332921 Probe card and method for constructing same |
| 02/19/2008 | US7332918 Prober and probe testing method for temperature-controlling object to be tested |
| 02/19/2008 | US7332903 Device and method for measuring a current flowing in an electrical conductor |
| 02/14/2008 | US20080036484 Test probe and manufacturing method thereof |
| 02/14/2008 | US20080036479 Probe and Method of Manufacturing Probe |
| 02/14/2008 | US20080036449 Coordinate transforming apparatus for electrical signal connection |
| 02/14/2008 | US20080035487 Probe and method of making same |
| 02/14/2008 | DE102006038373A1 Electrical device, especially for determining electrical parameters, e.g. battery sensor, has conductive boundary surface between two conductor sections that is offset relative to the central axis |
| 02/13/2008 | CN201021933Y Device for integrated circuit test |
| 02/13/2008 | CN201021931Y Testing interface board shared by suspending arm probe and vertical probe |
| 02/13/2008 | CN201021930Y Improved structure of probe detector plate |
| 02/13/2008 | CN201021929Y Testing tool base for wire group |
| 02/13/2008 | CN101122616A Contactor assembly |
| 02/13/2008 | CN101122615A Strip type test method and function test device |
| 02/13/2008 | CN101122614A Test probe and manufacturing method thereof |
| 02/13/2008 | CN101122613A Carrier tray for use with prober |
| 02/13/2008 | CN101122612A Contact for use in testing integrated circuits |
| 02/13/2008 | CN100369335C Spiral contactor, contact sheet and connecting device |
| 02/13/2008 | CN100369329C Anisotropic electrically conductive film and method of producing the same |
| 02/13/2008 | CN100369227C Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method |
| 02/13/2008 | CN100369226C Anisotropic conductivity connector, conductive paste composition, probe member, wafer inspecting device, and wafer inspecting method |
| 02/13/2008 | CN100368811C Wire-connected circular probe chunck basilar plate |
| 02/12/2008 | US7330039 Method for making a socket to perform testing on integrated circuits |
| 02/12/2008 | US7330037 Electrical characteristic measuring probe and method of manufacturing the same |
| 02/12/2008 | US7330036 Engagement Probes |
| 02/12/2008 | US7330023 Wafer probe station having a skirting component |
| 02/07/2008 | WO2008015967A1 Composite conductive sheet, method for manufacturing the same and application of the same |