Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
04/2008
04/02/2008EP1906189A1 Method of manufacturing a probe card
04/02/2008EP1904861A2 Probe card assembly with an interchangeable probe insert
04/02/2008CN201043980Y Keyboard bearing mechanism
04/02/2008CN101153878A Coordinate transforming apparatus for electrical signal connection
04/02/2008CN101153877A Component interface plate used for test of semiconductor integrated circuit
04/02/2008CN101153876A Tool used for loading and unloading wafer module group
04/02/2008CN100379087C Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument
04/02/2008CN100378970C Multipurpose load plate
04/01/2008US7353090 System, bus monitor assembly and method of monitoring at least one data bus of an aircraft
04/01/2008US7352196 Probe card assembly and kit
04/01/2008US7352168 Chuck for holding a device under test
04/01/2008US7352164 Device for measuring an electric current
04/01/2008US7351597 Fabrication method of semiconductor integrated circuit device
03/2008
03/27/2008WO2008036786A2 Attachment of an electrical element to an electronic device using a conductive material
03/27/2008WO2008036210A2 Methods of and apparatus for measuring and controlling wafer potential in pulsed rf bias processing
03/27/2008WO2008034962A2 Method and device for characterising an electric signal propagating through a sample
03/27/2008WO2008006045A3 Guided pin and plunger
03/27/2008WO2007137284A3 Probe needle protection method for high current probe testing of power devices
03/27/2008US20080074131 Attachment of an Electrical Element to an Electronic Device Using a Conductive Material
03/27/2008US20080074129 Probe for combined signals
03/27/2008US20080074128 Electrical test probe and electrical test probe assembly
03/27/2008US20080074127 Probe substrate for test and manufacturing method thereof
03/27/2008US20080074121 Apparatus for probing multiple integrated circuit devices
03/26/2008EP1903341A1 Connector for measuring electrical resistance, and apparatus and method for measuring electrical resistance of circuit board
03/26/2008EP1903340A1 Probe substrate for test and manufacturing method thereof
03/26/2008EP1493038B1 Cross-coil instrument with a predefined characteristic
03/26/2008EP1247304A4 Shunt resistance device for monitoring battery state of charge
03/26/2008CN201041572Y High voltage generator
03/26/2008CN201041571Y An empty tube testing probe
03/26/2008CN201041570Y Plastic electrode base
03/26/2008CN201041569Y Removable vertical adaptation card
03/26/2008CN101151541A Contact probe
03/26/2008CN101151540A Microstructure probe card, and microstructure inspecting device, method, and computer program
03/26/2008CN101151539A Probe card assembly and method of attaching probes to the probe card assembly
03/26/2008CN101149892A Detection module of measuring carrier for display panel
03/26/2008CN101149891A Detection module of measuring carrier for display panel
03/26/2008CN101149890A Adjustable type spiral arm of carrier for display panel
03/26/2008CN101149397A Ignition device for high voltage electric appliance experiment circuit
03/26/2008CN101149396A Interface apparatus for electronic device test apparatus
03/26/2008CN101149395A Connector assembly, receptacle type connector, and interface apparatus
03/26/2008CN101149394A Pushing block and a handler with the pushing block
03/26/2008CN101149393A Probe substrate for test and manufacturing method thereof
03/26/2008CN101149392A Wafer test card over current protection method and related wafer test system
03/26/2008CN100377425C Press fitting type spring connector
03/26/2008CN100376896C BGA tester on circuit board
03/25/2008US7349223 Enhanced compliant probe card systems having improved planarity
03/25/2008US7348788 Probing card and inspection apparatus for microstructure
03/25/2008US7348787 Wafer probe station having environment control enclosure
03/25/2008US7348785 Method and apparatus for magnetically achieving electrical continuity
03/25/2008US7347702 Contact carriers (tiles) for populating larger substrates with spring contacts
03/20/2008WO2008033559A2 Load side voltage sensing for ami metrology
03/20/2008DE202005021434U1 Thermooptische Einspannvorrichtung Thermo-optical jig
03/19/2008CN201037861Y Improved carbon pile accumulator tester
03/19/2008CN201037849Y Foundation testing needle
03/19/2008CN201037848Y Insulation testing probe
03/19/2008CN201037847Y Testing probe with large head
03/19/2008CN201037846Y Measuring appliance
03/19/2008CN201037845Y Measuring rack
03/19/2008CN201037844Y Measurement auxiliary instrument
03/19/2008CN201037843Y Breaker detecting clamp
03/19/2008CN201037842Y Special-purpose mobile loading vehicle for set examination
03/19/2008CN101144843A On-line automatic test device for matrix array type signal sampling and method
03/19/2008CN101144831A Probe card substrate
03/19/2008CN101144830A Nonlinear resistor valve sheet for leakage detector and its preparation method
03/19/2008CN101144829A PC board checking device
03/18/2008US7345494 Probe tile for probing semiconductor wafer
03/18/2008US7344382 Fine terminal, its manufacturing method, and contact sheet
03/13/2008WO2008030416A2 Load side voltage sensing for ami metrology
03/13/2008US20080061813 Semiconductor integrated circuit tester with interchangeable tester module
03/13/2008US20080061809 Pogo pins and contact-type of test device having pogo pins for testing semiconductor device
03/13/2008US20080061806 Probe substrate for test and manufacturing method thereof
03/12/2008EP1898223A1 Probe substrate for test and manufacturing method thereof
03/12/2008CN201035223Y Adjustable angle type ammeter box magnifying glasses
03/12/2008CN201035120Y Cutter type rapid conductive clamp
03/12/2008CN201035119Y Annular insulating stud suspension testing jig
03/12/2008CN201035107Y Electric socket connector reed elastic test pen
03/12/2008CN201035079Y Luo coil great current integrated intelligent detector
03/12/2008CN201035046Y Double-ended test probe
03/12/2008CN201035045Y Explore pens with functional select key
03/12/2008CN201035044Y Circuit regulating pens
03/12/2008CN201035043Y Measurement cramping apparatus
03/12/2008CN201035042Y Test arrangement for testing flexible circuit board electrical behavior
03/12/2008CN201035041Y High altitude test plier
03/12/2008CN101142487A Nat inst of advanced ind scien (jp)
03/12/2008CN101141122A Pulse fast edge conversion device
03/12/2008CN101140298A Reset device of test accesses terminal port of JTAG chain circuit used on board
03/12/2008CN101140297A Apparatus and method for limiting over travel in a probe card assembly
03/12/2008CN101140296A Probe substrate for test and manufacturing method thereof
03/12/2008CN101140295A Improvement contactor used for interconnection system
03/12/2008CN100375381C Movement control method for electromagnetic driving mechanism
03/11/2008US7342403 Test apparatuses for integrated circuits and method for manufacturing the same
03/11/2008US7342402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features
03/11/2008US7341193 Portable diagnostic device
03/06/2008WO2008008232A3 Probes with self-cleaning blunt skates for contacting conductive pads
03/06/2008US20080058503 Installing electrical wall socket fixture into junction box using insulated integral handle
03/06/2008US20080054929 Probe for testing a device under test
03/06/2008US20080054927 Probe assembly
03/06/2008US20080054926 Burn-in testing apparatus and method
03/06/2008US20080054925 Test chip socket
03/06/2008US20080054923 Probe for testing a device under test
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