| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 05/01/2008 | US20080100326 Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes |
| 05/01/2008 | US20080100325 Integrated circuit test probe with hollow tubular contact configuration |
| 05/01/2008 | US20080100324 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/01/2008 | US20080100320 Intelligent probe card architecture |
| 05/01/2008 | US20080100318 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/01/2008 | US20080100317 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/01/2008 | US20080100316 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/01/2008 | US20080100315 Electrochemically fabricated microprobes |
| 05/01/2008 | US20080100314 Electrical test system including coaxial cables |
| 04/30/2008 | DE102006052748A1 Oszilloskop-Tastkopf Oscilloscope probe |
| 04/30/2008 | CN201054010Y Induction type electricity test device |
| 04/30/2008 | CN201053975Y Quick detaching type probe module |
| 04/30/2008 | CN201053974Y Clamped type face contact terminal box |
| 04/30/2008 | CN201053973Y Two-segment type test utensil |
| 04/30/2008 | CN101171522A Method and device for tempering a substrate |
| 04/30/2008 | CN101170865A Plasm suspending reference probe |
| 04/30/2008 | CN101170073A Method of manufacturing semiconductor integrated circuit device |
| 04/30/2008 | CN101169455A Probe |
| 04/30/2008 | CN101169454A Advanced sandwich sub card test general carrier plate and its production method |
| 04/30/2008 | CN100385247C Testing circuits on substrates |
| 04/29/2008 | US7365553 Probe card assembly |
| 04/29/2008 | US7365550 Low impedance test fixture for impedance measurements |
| 04/29/2008 | US7365528 Method and apparatus of voltage measurement using flying capacitor and switching circuits |
| 04/29/2008 | US7364474 Cable terminal with contact pins including electrical component |
| 04/29/2008 | US7363694 Method of testing using compliant contact structures, contactor cards and test system |
| 04/24/2008 | WO2008009791A3 Test card provided with a transmission line having large frequency ranges. |
| 04/24/2008 | US20080094095 Apparatus and method for linked slot-level burn-in |
| 04/24/2008 | US20080094090 Probe |
| 04/24/2008 | US20080094089 Semiconductor probe having embossed resistive tip and method of fabricating the same |
| 04/24/2008 | US20080094088 Method and System for Compensating Thermally Induced Motion of Probe Cards |
| 04/24/2008 | US20080094085 Metalized Elastomeric Probe Structure |
| 04/24/2008 | US20080094068 Kelvin Connector Including Temperature Sensor |
| 04/24/2008 | DE102006026825B4 Gehäuse für aktiven Tastkopf im T-Profil Housing for active probe in the T-profile |
| 04/23/2008 | EP1336110A4 Oscilloscope panel capture and implementation |
| 04/23/2008 | EP1135794B1 A method and apparatus for the transport and tracking of an electronic component |
| 04/23/2008 | CN201051112Y Probe assembly body |
| 04/23/2008 | CN201051111Y Perforation probe |
| 04/23/2008 | CN201051110Y Dual line meter pen |
| 04/23/2008 | CN201051109Y A clamper for capacitor aging |
| 04/23/2008 | CN201051108Y Measurement display instrument with online replaceable battery |
| 04/23/2008 | CN101166983A 灵活的微电路空间变压器装配 Flexible microcircuits space transformer assembly |
| 04/23/2008 | CN101165504A Vehicular combination switch testing jig |
| 04/23/2008 | CN101165495A Method and apparatus for increasing clock frequency and data rate for semiconductor devices |
| 04/23/2008 | CN101165494A Probe |
| 04/23/2008 | CN100383534C Test head positioning apparatus |
| 04/22/2008 | US7362119 Torsion spring probe contactor design |
| 04/22/2008 | US7362117 Cooling fin connected to a cooling unit and a pusher of the testing apparatus |
| 04/22/2008 | US7362114 Apparatus for interfacing electronic packages and test equipment |
| 04/22/2008 | US7362113 Universal wafer carrier for wafer level die burn-in |
| 04/22/2008 | US7362112 Signal acquisition probe having a retractable double cushioned probing tip assembly |
| 04/22/2008 | US7362092 Isolation buffers with controlled equal time delays |
| 04/22/2008 | US7362087 Adapter for circuit board examination and device for circuit board examination |
| 04/17/2008 | WO2008044509A1 Electrical connection device |
| 04/17/2008 | WO2006069248A3 Audio fidelity meter |
| 04/17/2008 | US20080088332 High density cantilevered probe for electronic devices |
| 04/17/2008 | US20080088331 Socket for test |
| 04/17/2008 | US20080088300 Device For Determining Electrical Variables |
| 04/17/2008 | US20080088297 Load side voltage sensing for AMI metrology |
| 04/17/2008 | US20080088296 Load side voltage sensing for AMI metrology |
| 04/17/2008 | DE19962702B4 Prüfsockel einer BGA-Vorrichtung A test socket BGA device |
| 04/17/2008 | DE10125345B4 Prüfkontaktsystem mit Planarisierungsmechanismus Prüfkontaktsystem with planarization mechanism |
| 04/16/2008 | EP1910850A1 Post and tip design for a probe contact |
| 04/16/2008 | EP1910849A1 Torsion spring probe contactor design |
| 04/16/2008 | EP1853931A4 Method and circuit for the detection of solder-joint failures in a digital electronic package |
| 04/16/2008 | CN201047867Y IC test carrier non-soldering package assembly |
| 04/16/2008 | CN201047852Y Data read-write contact pin of oil pressure sensor |
| 04/16/2008 | CN201047851Y Improved type universal meter pen |
| 04/16/2008 | CN101164205A Coaxial connector and coaxial probe for measurement |
| 04/16/2008 | CN101162240A Detecting probe card testing system |
| 04/16/2008 | CN101162239A Detecting probe card |
| 04/16/2008 | CN101162238A 10 bit AD sample-taking calculating circuit and sampling method thereof |
| 04/15/2008 | US7358751 Contact pin assembly and contactor card |
| 04/15/2008 | US7358717 Input by-pass circuit for a current probe |
| 04/10/2008 | WO2007143737A3 Compact scanning electron microscope |
| 04/10/2008 | US20080084227 Die design with integrated assembly aid |
| 04/10/2008 | US20080084226 Operation voltage supply apparatus and operation voltage supply method for semiconductor device |
| 04/10/2008 | US20080084201 Method and apparatus for AC integrated current sensor |
| 04/10/2008 | DE102007046042A1 Elektrische Prüfsonde und elektrische Prüfsondenanordnung Electrical test probe and electrical Prüfsondenanordnung |
| 04/10/2008 | DE102004042101B4 Energieversorgung und Signalübertragung für Messtechnik auf Hochspannungspotential Power supply and signal for measurement at high voltage |
| 04/09/2008 | EP1907868A2 Integrated circuit test socket |
| 04/09/2008 | EP1461628B1 Cooling assembly with direct cooling of active electronic components |
| 04/09/2008 | CN201045620Y Residual current detection probe |
| 04/09/2008 | CN201045619Y Device for testing |
| 04/09/2008 | CN101160694A Anisotropic conductive sheet, production method thereof, connection method and inspection method |
| 04/09/2008 | CN101160532A Conductive contact holder and conductive contact unit |
| 04/09/2008 | CN101160531A Contact probe for a testing head having vertical probes for semiconductor integrated electronic devices |
| 04/09/2008 | CN101158700A Detecting probe card |
| 04/09/2008 | CN100380622C Semiconductor inspection apparatus and manufacturing method of semiconductor device |
| 04/09/2008 | CN100380131C Contactor assembly for testing ceramic surface mount devices and other electronic components assembled by said contactor |
| 04/08/2008 | US7355431 Test arrangement including anisotropic conductive film for testing power module |
| 04/08/2008 | US7355426 Universal measuring adapter system |
| 04/08/2008 | US7355424 Test probe for finger tester and corresponding finger tester |
| 04/08/2008 | US7355420 Membrane probing system |
| 04/08/2008 | US7355383 Cross coil instrument with a predefined characteristic |
| 04/03/2008 | WO2008038573A1 Anisotropic conductive connector and method for inspecting article inspected using this anisotropic conductive connector |
| 04/03/2008 | WO2008038468A1 Electrical connecting device |
| 04/03/2008 | WO2007143326A3 Mini-prober for tft-lcd testing |
| 04/03/2008 | US20080079450 Intelligent probe chips/heads |
| 04/03/2008 | US20080079447 Semiconductor device test method and semiconductor device tester |
| 04/03/2008 | DE112005003526T5 Teststecksockel Test socket |