| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 05/28/2008 | CN101187676A Selection circuit of multi-path input and double-path output |
| 05/28/2008 | CN101187675A Probe capable of transmitting high frequency signal |
| 05/28/2008 | CN100390553C Probe card covering system and method |
| 05/28/2008 | CN100390545C Diaphragm-holding device for test |
| 05/28/2008 | CN100390544C Electronic device charged via signal input-output terminal |
| 05/27/2008 | US7377788 Electrical connecting apparatus and contact |
| 05/22/2008 | WO2008059767A1 Optical device inspecting apparatus |
| 05/22/2008 | US20080117613 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080117612 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080117611 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080116927 Contact tip structure for microelectronic interconnection elements and methods of making same |
| 05/22/2008 | US20080116925 Probe device |
| 05/22/2008 | US20080116923 Ultra-Fine Pitch Probe Card Structure |
| 05/22/2008 | US20080116922 Testing system contactor |
| 05/22/2008 | US20080116916 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080116915 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080116914 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080116913 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080116912 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080116911 Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus |
| 05/22/2008 | US20080115354 Probe unit and its manufacturing method |
| 05/22/2008 | US20080115353 Lithographic contact elements |
| 05/21/2008 | EP1923708A1 Conductive contact and method for manufacturing conductive contact |
| 05/21/2008 | DE202008001259U1 Prüfkabel Test Leads |
| 05/21/2008 | CN201063040Y Testing terminal |
| 05/21/2008 | CN201063039Y Clamping apparatus for PCB testing |
| 05/21/2008 | CN101183137A Fixation method of detecting probe type circuit board testing making apparatus |
| 05/21/2008 | CN101183119A Manufacturing method of wafer level testing circuit board and structure thereof |
| 05/21/2008 | CN101183118A Coordinate transformation device for electrical signal connection |
| 05/20/2008 | US7375505 Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method |
| 05/20/2008 | CA2488822C High-voltage resistor element |
| 05/15/2008 | WO2008056627A1 Probe card for inspecting solid state image sensor |
| 05/15/2008 | WO2008055839A2 Electrical contact arrangement |
| 05/15/2008 | US20080113548 Measuring Tip for High-Frequency Measurement |
| 05/15/2008 | US20080112149 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080112148 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080112147 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080112146 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080112145 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080112144 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080111573 Pin-Type Probes for Contacting Electronic Circuits and Methods for Making Such Probes |
| 05/15/2008 | US20080111571 Membrane probing system |
| 05/15/2008 | US20080111570 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080111569 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080111568 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080111567 Probe Card and Method of Producing the Same |
| 05/15/2008 | US20080111555 Security system controller with integrated tester |
| 05/15/2008 | US20080111539 Direct current measuring apparatus and limiting circuit |
| 05/15/2008 | US20080111537 Quick reference test light probe with digital voltage meter |
| 05/15/2008 | US20080110019 Probe card and method for constructing same |
| 05/14/2008 | EP1921715A2 Terminal, test plug and test terminal block |
| 05/14/2008 | EP1921456A2 Motor vehicle sensor, in particular battery sensor with measuring resistance |
| 05/14/2008 | CN201060214Y Signal testing multi-joint group |
| 05/14/2008 | CN201060213Y Signal testing joint |
| 05/14/2008 | CN201060212Y Insulation gloves experiment supporting device |
| 05/14/2008 | CN201060211Y Automatic controlling insulation laboratory flume |
| 05/14/2008 | CN101180545A Sheet probe for wafer inspection and applications thereof |
| 05/14/2008 | CN101178428A Relay connector |
| 05/14/2008 | CN101178427A Relay connector |
| 05/14/2008 | CN101178423A Integrate circuit testing structure and method of use thereof |
| 05/14/2008 | CN101178414A Probe card having cantilever probes, producing method and detecting probe needlepoint locating methods |
| 05/14/2008 | CN101178315A Frequency domain electric means instrument GPS precision synchronization chopped wave decoupling device |
| 05/14/2008 | CN100387994C 探头卡 Probe Card |
| 05/14/2008 | CN100387993C Holder for conductive contact |
| 05/13/2008 | US7372422 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
| 05/13/2008 | US7372286 Modular probe card |
| 05/13/2008 | US7372284 Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket |
| 05/13/2008 | US7372274 Methods and devices configured for dissolving hyperpolarised solid material with a solvent within a cryostat for NMR analyses |
| 05/13/2008 | US7371128 Cable terminal with air-enhanced contact pins |
| 05/13/2008 | US7371078 Insert attachable to an insert magazine of a tray for holding an area array type electronic component to be tested |
| 05/13/2008 | US7371072 Spring interconnect structures |
| 05/08/2008 | WO2008053899A1 Contact with solder and method for manufacturing the contact |
| 05/08/2008 | WO2008034962A3 Method and device for characterising an electric signal propagating through a sample |
| 05/08/2008 | US20080108238 Loading a Socket and/or Adapter Device with a Semiconductor Component |
| 05/08/2008 | US20080106872 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106291 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106290 Wafer probe station having environment control enclosure |
| 05/08/2008 | US20080106289 Torsion spring probe contactor design |
| 05/08/2008 | US20080106285 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106284 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106283 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106282 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106281 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106280 Vertical Microprobes for Contacting Electronic Components and Method for Making Such Probes |
| 05/08/2008 | DE19926088B4 Antriebseinheit für Kreuzspulen-Anzeigeinstrument Drive unit for cross-coil meter |
| 05/08/2008 | DE10300535B4 Testsystem für integrierte Schaltkreischips Test system for integrated circuit chips |
| 05/07/2008 | EP1919034A1 Anisotropic conductive sheet, production method thereof, connection method and inspection method |
| 05/07/2008 | EP1676139B1 Cable terminal with contact pins including electrical component |
| 05/07/2008 | EP1574866B1 Inspection method and inspection equipment |
| 05/07/2008 | EP1455388B1 System and method for reliability evaluation |
| 05/07/2008 | CN101176003A Probes for a wafer test apparatus |
| 05/07/2008 | CN101173970A Chip-based prober for high frequency measurements and methods of measuring |
| 05/07/2008 | CN101173963A Multifunctional tester |
| 05/07/2008 | CN101173960A Universal array type probe card design for semiconductor device testing |
| 05/07/2008 | CN101173959A On-line test attachment |
| 05/07/2008 | CN100386629C Inspection apparatus for display panel |
| 05/06/2008 | US7368925 Probe station with two platens |
| 05/06/2008 | US7368924 Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
| 05/06/2008 | US7368812 Interposers for chip-scale packages and intermediates thereof |
| 05/02/2008 | WO2008051880A2 Method and apparatus for sample extraction and handling |