| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 06/24/2008 | US7391227 Sheet-like probe, process for producing the same and its application |
| 06/24/2008 | US7391117 Method for fabricating semiconductor components with conductive spring contacts |
| 06/24/2008 | US7390442 comprises a metal powder having the form of a lot of fine metal particles being linked in a chain shape as a conductive component formed of a metal having paramagnetism |
| 06/24/2008 | US7389581 Method of forming compliant contact structures |
| 06/24/2008 | US7389572 Method of retrofitting a probe station |
| 06/19/2008 | WO2008072699A1 Conductive contact holder, conductive contact unit and method for manufacturing conductive contact holder |
| 06/19/2008 | WO2008071722A1 Measuring apparatus for measuring an electrical current |
| 06/19/2008 | WO2008071541A2 Module for a test device for testing circuit boards |
| 06/19/2008 | US20080147338 Fiber optic gyroscope deadband circumvention apparatus and method |
| 06/19/2008 | US20080143369 Electrical connecting apparatus and method for use thereof |
| 06/19/2008 | US20080143367 Compliant electrical contact having maximized the internal spring volume |
| 06/19/2008 | US20080143364 Forced air cooling of components on a probecard |
| 06/19/2008 | US20080143362 Electrical connecting apparatus and method for manufacturing the same |
| 06/19/2008 | US20080143358 Electrical guard structures for protecting a signal trace from electrical interference |
| 06/19/2008 | US20080143357 High power cobra interposer wtih integrated guard plate |
| 06/19/2008 | DE102004023987B4 Elektrische Prüfeinrichtung Electrical test equipment |
| 06/18/2008 | EP1932002A1 Probe with a changing device |
| 06/18/2008 | CN201075116Y Probe connector |
| 06/18/2008 | CN201075115Y Testing clamp for circuit board |
| 06/18/2008 | CN201075114Y IC testing control tool |
| 06/18/2008 | CN101201385A Method and assembly for testing circuit board |
| 06/18/2008 | CN101201368A Wide band Kelvin double bridge as well as measurement method, autonomous system as well as method and application |
| 06/18/2008 | CN101201363A Current conversion transformer induction pressure test supply apparatus and method for measurement of partial discharge thereof |
| 06/18/2008 | CN101201362A Tester table |
| 06/18/2008 | CN100395879C Multiplex test method for semiconductor wafer and multiplex test probe station therefor |
| 06/18/2008 | CN100395877C Probe apparatus with optical length-measuring unit and probe testing method |
| 06/18/2008 | CN100395556C System for burn-in testing of electronic devices |
| 06/17/2008 | US7388389 Electronic probe apparatus |
| 06/17/2008 | US7388157 Printed wiring board |
| 06/12/2008 | WO2008069967A2 Lateral interposer contact design and probe card assembly |
| 06/12/2008 | US20080139017 Electric connector and electrical connecting apparatus using the same |
| 06/12/2008 | US20080136436 Wafer chuck, apparatus including the same and method for testing electrical characteristics of wafer |
| 06/12/2008 | US20080136433 Contactor for electronic components and test method using the same |
| 06/12/2008 | US20080136429 Probe card of semiconductor test apparatus and method of fabricating the same |
| 06/12/2008 | US20080136428 Contacting component, method of producing the same, and test tool having the contacting component |
| 06/12/2008 | US20080136427 On-chip probing apparatus |
| 06/12/2008 | US20080136403 Apparatus for the detection of a current and method for operating such an apparatus |
| 06/12/2008 | DE10028835B4 Halbleitertestgerät und Verfahren zum Testen einer Halbleitervorrichtung The semiconductor test apparatus and method for testing a semiconductor device |
| 06/11/2008 | EP1930734A1 Probe card |
| 06/11/2008 | EP1662263B1 Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device |
| 06/11/2008 | CN201072423Y Special jig device of lithium battery checking equipment |
| 06/11/2008 | CN101196546A Method for different IP products executing burn-in test and test board used for it |
| 06/11/2008 | CN101196536A Interconnection unit and interconnection assembly having the same |
| 06/11/2008 | CN100394572C System for processing electronic devices |
| 06/11/2008 | CN100394191C Cross coil instrument with a predefined characteristic |
| 06/11/2008 | CN100394190C Testing device for density variable printed circuit board |
| 06/10/2008 | US7386816 Method for manufacturing an electronic device having an electronically determined physical test member |
| 06/10/2008 | US7385407 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 06/10/2008 | US7385386 Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober |
| 06/10/2008 | US7385384 Diagnosis method for an antenna connection |
| 06/10/2008 | US7384279 Anisotropic conductive connector and wafer inspection device |
| 06/05/2008 | US20080132095 Method of making a socket to perform testing on integrated circuits and socket made |
| 06/05/2008 | US20080132094 High density integrated circuit apparatus, test probe and methods of use thereof |
| 06/05/2008 | US20080129323 Test head for testing electrical components |
| 06/05/2008 | US20080129320 High density integrated circuit apparatus, test probe and methods of use thereof |
| 06/05/2008 | US20080129319 High density integrated circuit apparatus, test probe and methods of use thereof |
| 06/05/2008 | US20080129314 Aligning structure for a power line and sensor |
| 06/05/2008 | US20080129313 Recording medium, test apparatus and diagnostic method |
| 06/05/2008 | US20080129279 Voltage measurement instrument and method having improved automatic mode operation |
| 06/05/2008 | US20080129278 Touch and auditory sensors based on nanotube arrays |
| 06/05/2008 | DE102006052745A9 Oszilloskop-Tastkopf Oscilloscope probe |
| 06/04/2008 | CN201069498Y A probe structure of TFT LCD testing device |
| 06/04/2008 | CN201069462Y Measuring device for circuit base board |
| 06/04/2008 | CN201069449Y Protection circuit of digital multi-purpose meter |
| 06/04/2008 | CN201069448Y Vertical probe interface plate |
| 06/04/2008 | CN201069447Y Test terminal |
| 06/04/2008 | CN101194170A Radio frequency isolation container |
| 06/04/2008 | CN101191801A 探针卡 Probe Card |
| 06/04/2008 | CN101191800A Contacting device for contacting detection piece and method for contacting detection piece |
| 06/04/2008 | CN101191799A AC load |
| 06/04/2008 | CN100392422C Method and devices for dissolving hyperpolarised solid material for nmr analyses |
| 06/04/2008 | CN100392419C Compound whole-working order testing device control and protection system, and failure protection scheme |
| 06/04/2008 | CN100392418C Auxilary valve triggering and detecting code of all-duty testing device |
| 06/04/2008 | CN100392409C Probe, probe assembly method |
| 06/04/2008 | CN100392408C 接触探头 Contact probe |
| 06/03/2008 | US7382914 Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objects |
| 06/03/2008 | US7382142 High density interconnect system having rapid fabrication cycle |
| 05/29/2008 | WO2008063138A2 An improved ball mounting apparatus and method |
| 05/29/2008 | WO2008062980A1 Independent module socket by using clip and probe |
| 05/29/2008 | US20080123310 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/29/2008 | US20080122470 Probe installed to a probe card |
| 05/29/2008 | US20080122469 Probe card for testing image-sensing chips |
| 05/29/2008 | US20080122467 Electrical connecting apparatus |
| 05/29/2008 | US20080122466 Electrical connecting apparatus |
| 05/29/2008 | US20080122465 Probe holder for a probe for testing semiconductor components |
| 05/29/2008 | US20080122464 Replaceable probe |
| 05/29/2008 | US20080122433 Pressing member and electronic component handling device |
| 05/29/2008 | US20080122432 Test head positioning system and method |
| 05/29/2008 | US20080121879 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/28/2008 | EP1925944A2 Contacting device for performing contacting on electric devices to be tested and corresponding contacting method |
| 05/28/2008 | EP1741111A4 Compliant electrical contact assembly |
| 05/28/2008 | CN201066364Y Electronic testing device |
| 05/28/2008 | CN201066363Y Modular probe device |
| 05/28/2008 | CN201066362Y Distribution management terminal meter shell |
| 05/28/2008 | CN201066361Y A battery detection clamper |
| 05/28/2008 | CN201066360Y A point marking device and touch screen testing device using this device |
| 05/28/2008 | CN101189524A Probe card with stacked substrate |
| 05/28/2008 | CN101188341A Test connector for temperature controller |
| 05/28/2008 | CN101187692A Semiconductor integrated circuit |
| 05/28/2008 | CN101187691A Connection unit |