| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 07/23/2008 | CN100405566C Low profile pneumatically actuated docking module with power fault release |
| 07/22/2008 | US7403025 Membrane probing system |
| 07/22/2008 | US7403024 Contactor having contact electrodes of metal springs embedded in a plate-like structure |
| 07/22/2008 | US7402995 Jig device for transporting and testing integrated circuit chip |
| 07/22/2008 | US7402991 Wide bandwidth attenuator input circuit for a measurement probe |
| 07/17/2008 | WO2008084627A1 Conductive contact unit |
| 07/17/2008 | US20080169830 Probe card for test and manufacturing method thereof |
| 07/17/2008 | US20080169803 Device transfer system |
| 07/17/2008 | DE112005001223T5 Sondenbaugruppe Probe assembly |
| 07/17/2008 | DE102008003534A1 Messfühler für eine Hochfrequenz-Signalübertragung und Messfühlerkarte, die gleichen verwendet. Sensors for a high-frequency signal transmission and probe card using the same. |
| 07/16/2008 | EP1944613A1 Probe card for test and manufacturing method thereof |
| 07/16/2008 | EP1943528A1 Probe card with stacked substrate |
| 07/16/2008 | EP1430317B1 Tap switch for frequency response and partial discharge measurement |
| 07/16/2008 | CN201087841Y Testing clamp seat with airtight seal ring, its sorting machine and test machine |
| 07/16/2008 | CN101221222A Battery collection instrument and device for preventing collected battery set from short circuit |
| 07/16/2008 | CN101221212A Inspection method, inspection apparatus and computer-readable storage medium storing program |
| 07/16/2008 | CN101221195A Probe card for test and manufacturing method thereof |
| 07/16/2008 | CN101221194A High-frequency probe |
| 07/16/2008 | CN100403506C Probe positioning and bonding device and probe bonding method |
| 07/15/2008 | US7400513 Conductive printed board, multicore cable and ultrasonic probe using the same |
| 07/15/2008 | US7400161 Electronic device test system |
| 07/15/2008 | US7400159 Integrated complex nano probe card and method of making same |
| 07/15/2008 | US7400157 Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes |
| 07/10/2008 | WO2008082859A2 Stiffener assembly for use with testing devices |
| 07/10/2008 | WO2008082815A2 Resilient contact element and methods of fabrication |
| 07/10/2008 | WO2008081704A1 Method for fixing probe unit wiring, and probe unit |
| 07/10/2008 | WO2008008726A3 Current monitoring device for high voltage electric power lines |
| 07/10/2008 | US20080164901 Multilayer type test board assembly for high-precision inspection |
| 07/10/2008 | US20080164900 Probe for high frequency signal transmission and probe card using the same |
| 07/10/2008 | US20080164896 Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
| 07/10/2008 | US20080164893 Probe card for testing wafer |
| 07/10/2008 | US20080163705 Test chamber apparatus |
| 07/10/2008 | DE112005003667T5 Elektrische Prüfsonde Electrical test probe |
| 07/09/2008 | EP1451593B1 System and method for sensing and locating disturbances in an energy path of a focused ultrasound system |
| 07/09/2008 | CN201083817Y Test tool |
| 07/09/2008 | CN201083766Y High speed arbitrary waveform generator |
| 07/09/2008 | CN201083765Y Contacting detecting probe |
| 07/09/2008 | CN201083764Y Electronic test probe |
| 07/09/2008 | CN201083763Y Multipurpose type resistance-adjusting test probe |
| 07/09/2008 | CN201083762Y Wafer testing fixture structure |
| 07/09/2008 | CN201083761Y Container testing structure |
| 07/09/2008 | CN101218514A Connector for measuring electrical resistance, and apparatus and method for measuring electrical resistance of circuit board |
| 07/09/2008 | CN101216502A Wave plate temperature compensation system suitable for optical fibre current mutual inductor |
| 07/09/2008 | CN101216501A Radio frequency co-axial cable subassembly detecting clamp and method of use thereof |
| 07/09/2008 | CN101214916A Micro-mechanism testing probe card based on electroplating technique and manufacturing method thereof |
| 07/09/2008 | CN100401495C Checking device of display panel |
| 07/09/2008 | CN100401084C Inserted card tester |
| 07/09/2008 | CN100401082C Method and test adapter for testing an appliance having a smart card reader |
| 07/09/2008 | CN100401072C Inspection jig for radio frequency device, and contact probe imcorporated in the jig |
| 07/08/2008 | US7397234 Current sensor with reset circuit |
| 07/08/2008 | US7396236 Wafer level interposer |
| 07/03/2008 | WO2008079307A1 Probe card analysis system and method |
| 07/03/2008 | WO2008051880A3 Method and apparatus for sample extraction and handling |
| 07/03/2008 | US20080160195 compound probe pins arranged in substrate layer; bundle of aligned parallel nanotubes/nanorods and a bonding material |
| 07/03/2008 | US20080157804 Carrier module for adapting non-standard instrument cards to test systems |
| 07/03/2008 | US20080157799 Resilient contact element and methods of fabrication |
| 07/03/2008 | US20080157798 On-die heating circuit and control loop for rapid heating of the die |
| 07/03/2008 | US20080157797 Probe, probe card, and testing device |
| 07/03/2008 | US20080157796 Chuck with integrated wafer support |
| 07/03/2008 | US20080157795 Probe head having a membrane suspended probe |
| 07/03/2008 | US20080157794 Probe unit substrate |
| 07/03/2008 | US20080157792 Probe Card and Method of Manufacturing the Same |
| 07/03/2008 | US20080157791 Stiffener assembly for use with testing devices |
| 07/03/2008 | US20080157790 Stiffener assembly for use with testing devices |
| 07/03/2008 | US20080157753 System and method for determining the performance of an on-chip interconnection network |
| 07/03/2008 | DE10258115B4 Breitbandiges Messmodul zur Strommessung an Einrichtungen der Leistungselektronik Broadband measurement module for current measurement at institutions of power electronics |
| 07/02/2008 | EP1940213A2 Cooling assembly with direct cooling of active electronic components |
| 07/02/2008 | EP1938116A1 Device for measuring the loss factor |
| 07/02/2008 | CN101211808A Picker for use in a handler and method for enabling the picker to place packaged chips |
| 07/02/2008 | CN101211807A Method of manufacturing semiconductor integrated circuit device and method of manufacturing thin film probe sheet for using the same |
| 07/02/2008 | CN101211806A Wafer grade test module o image sensing wafer and test method |
| 07/02/2008 | CN101210939A PCBConnection method for implementing common use of single and double density in PCB test |
| 07/02/2008 | CN101210938A PCBConnection method for implementing common use of four-density grid and eight-density grid in PCB test |
| 07/02/2008 | CN101210651A Testing machine and pipe system for testing machine internal thermostat |
| 07/01/2008 | US7394269 Probe for testing a device under test |
| 07/01/2008 | US7394267 Compliant contact pin assembly and card system |
| 07/01/2008 | US7394266 Ultra-short low-force vertical probe test head |
| 07/01/2008 | US7394265 Flat portions of a probe card flattened to have same vertical level with one another by compensating the unevenness of a substrate and each identical height needle being mounted on the corresponding flat portion through an adhesive |
| 07/01/2008 | US7392584 Methods and apparatus for a flexible circuit interposer |
| 06/29/2008 | CA2615622A1 Current sensing apparatus |
| 06/26/2008 | WO2008076660A2 Compliant electrical contact having maximized the internal spring volume |
| 06/26/2008 | WO2008076590A2 Electrical guard structures for protecting a signal trace from electrical interference |
| 06/26/2008 | WO2008075918A1 Probe tip, probe card, method of manufacturing a probe tip and method of manufacturing a probe structure |
| 06/26/2008 | WO2008045225A3 Probe cards employing probes having retaining portions for potting in a potting region |
| 06/26/2008 | US20080150615 System for providing a reference voltage to a semiconductor integrated circuit |
| 06/26/2008 | US20080150571 High density planar electrical interface |
| 06/26/2008 | US20080150569 Contactor with angled spring probes |
| 06/26/2008 | US20080150566 Alignment features in a probing device |
| 06/26/2008 | US20080150563 Probe card for semiconductor IC test and method of manufacturing the same |
| 06/26/2008 | US20080150560 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 06/26/2008 | US20080150558 Probe Card |
| 06/26/2008 | US20080150548 Test cartridge with internal generation of the test signals |
| 06/25/2008 | EP1936388A1 Electric conductive material with measuring resistance |
| 06/25/2008 | EP1936387A1 Anisotropic conductive connector and inspection equipment of circuit device |
| 06/25/2008 | EP1733337A4 Radio frequency identification tag inlay sortation and assembly |
| 06/25/2008 | EP1444528B1 Electrical test probes and methods of making the same |
| 06/25/2008 | CN101208607A Apparatus for testing electronic devices |
| 06/25/2008 | CN101206249A Electronic load device |
| 06/25/2008 | CN100397710C Copper/saturated copper sulphate gel reference electrode |
| 06/25/2008 | CN100397091C Placing table drive device and probing method |