| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 08/13/2008 | EP1955080A1 Apparatus for detecting an electrical variable of a rechargeable battery and method for producing said apparatus |
| 08/13/2008 | EP1194784B1 Temperature compensated vertical pin probing device |
| 08/13/2008 | CN101243323A Probe card |
| 08/13/2008 | CN101241148A Rain and snow preventing clectroscope possessing insulator |
| 08/13/2008 | CN101241144A Probe card for testing wafer |
| 08/13/2008 | CN101241143A Integrated circuit test seat and its test interface |
| 08/13/2008 | CN100411128C Test probe and manufacturing method for test probe |
| 08/13/2008 | CA2574780A1 Optical assemblage for detecting and reading the current in indoor and outdoor low, medium and high voltage systems |
| 08/12/2008 | US7411304 Semiconductor interconnect having conductive spring contacts |
| 08/12/2008 | US7411210 Semiconductor probe with resistive tip having metal shield thereon |
| 08/12/2008 | US7409762 Method for fabricating an interconnect for semiconductor components |
| 08/12/2008 | CA2336018C Current detector and current measurement apparatus including such detector |
| 08/07/2008 | WO2008093852A2 Potential measurement apparatus and image forming apparatus |
| 08/07/2008 | WO2008093465A1 Testing apparatus and probe card |
| 08/07/2008 | WO2008092268A1 Utility monitoring device, system and method |
| 08/07/2008 | US20080188110 Ic Socket |
| 08/07/2008 | US20080187420 Mounting device |
| 08/07/2008 | US20080186042 Probe card |
| 08/07/2008 | US20080186041 Probe Card Manufacturing Method Including Sensing Probe And The Probe Card, Probe Card Inspection System |
| 08/07/2008 | US20080186040 Apparatus for testing devices |
| 08/07/2008 | US20080186037 Probe card and structure for fixing needle thereof |
| 08/07/2008 | US20080186036 High Speed Electrical Probe |
| 08/07/2008 | US20080186015 Insert and tray for electronic device handling apparatus, and electronic device handling apparatus |
| 08/06/2008 | CN201096854Y A charger streamline testing clamp and charger streamline |
| 08/06/2008 | CN201096830Y Sound and light indicated power measuring pen |
| 08/06/2008 | CN201096814Y Generation device for sudden increase and decrease of voltage signal |
| 08/06/2008 | CN201096813Y Power adjustable load circuit |
| 08/06/2008 | CN201096812Y Intelligent load device for automatic test |
| 08/06/2008 | CN201096811Y Universal probe signal relay base |
| 08/06/2008 | CN201096810Y Connector for connecting fuel battery and its monitoring device |
| 08/06/2008 | CN201096809Y Guide tool |
| 08/06/2008 | CN201096808Y Sliding slot clamp |
| 08/06/2008 | CN201096807Y Commutator |
| 08/06/2008 | CN201096806Y Testing oven structure for available depth increase |
| 08/06/2008 | CN201096805Y Electric core clamp and needle sticking experimental machine using this clamp |
| 08/06/2008 | CN201096804Y Chip testing device |
| 08/06/2008 | CN201096803Y Improvement of chip test clamp structure |
| 08/06/2008 | CN201096802Y Detection display |
| 08/06/2008 | CN101238380A Method and apparatus for cleaning a probe card |
| 08/06/2008 | CN101237227A Analog continuous triangular signal generator based on built-in slice |
| 08/06/2008 | CN101237105A 测试连接器 Test Connector |
| 08/06/2008 | CN101236916A Mounting device |
| 08/06/2008 | CN101236912A ZIF connector pin measuring card, its assembly method, wafer testing system and its testing method |
| 08/06/2008 | CN101236310A Method and apparatus for detecting display panel |
| 08/06/2008 | CN101236228A Lightning arrester various waveform aging test device |
| 08/06/2008 | CN101236227A Electric power transformer insulated on-line monitoring sensor mounting device |
| 08/06/2008 | CN101236215A High-frequency cantilevered detecting probe |
| 07/31/2008 | WO2008091550A1 Rotational positioner and methods for semiconductor wafer test systems |
| 07/31/2008 | WO2008090635A1 Probe and electrical connection device employing it |
| 07/31/2008 | US20080180128 Self-centering nest for electronics testing |
| 07/31/2008 | US20080180125 Contact Probe And Socket For Testing Semiconductor Chips |
| 07/31/2008 | US20080180123 Ultra-fine pitch probe card structure |
| 07/31/2008 | US20080180122 Probe having a Field-replaceable Tip |
| 07/31/2008 | US20080180121 Probe card assembly and kit |
| 07/31/2008 | US20080180120 Probe card |
| 07/31/2008 | US20080180117 Adjustable Force Electrical Contactor |
| 07/31/2008 | US20080180110 Target tester interface |
| 07/31/2008 | DE19541886B4 Zeigerinstrument Pointer instrument |
| 07/30/2008 | EP1950572A1 Method for manufacturing conductive contact holder |
| 07/30/2008 | EP1950571A1 Method for manufacturing conductive contact holder, and conductive contact holder |
| 07/30/2008 | EP1950534A1 Fixing device for a power sensor |
| 07/30/2008 | EP1949118A1 Method, circuit board and test apparatus for testing solder joints |
| 07/30/2008 | EP1949117A2 Tandem handler system and method for reduced index time |
| 07/30/2008 | EP1949116A2 Pin electronics implemented system and method for reduced index time |
| 07/30/2008 | EP1617974B1 Combination hand tool and electrical testing device |
| 07/30/2008 | CN201094107Y Self-scalping cable shield testing jig |
| 07/30/2008 | CN101233416A Vertical type probe and methods of fabricating and bonding the same |
| 07/30/2008 | CN101233415A 集成电路测试座 IC Test Socket |
| 07/30/2008 | CN101232743A Audio playing device and used earphone, automatic control method |
| 07/30/2008 | CN101231964A Semiconductor component voltage stabilization testing method and testing tool |
| 07/30/2008 | CN101231324A Test tray and handler using the test tray |
| 07/30/2008 | CN101231307A Test arrangement capable of preventing electromagnetic interference and test approach thereof |
| 07/30/2008 | CN101231306A Contact probe and socket for testing semiconductor chips |
| 07/30/2008 | CN101231305A Fixing device for a current sensor |
| 07/30/2008 | CN100407393C 半导体集成电路器件的制造方法 The method of manufacturing a semiconductor integrated circuit device |
| 07/30/2008 | CN100407390C 探测器装置和探测器测试方法 Detector means and detector test methods |
| 07/30/2008 | CN100406898C 探针阵列及其制造方法 The method of manufacturing a probe array and |
| 07/30/2008 | CN100406897C 测量光电子器件to封装座高频参数用的测试夹具 Optoelectronic devices to measure high-frequency parameters seat package test fixture |
| 07/29/2008 | US7405581 Probing system uses a probe device including probe tips on a surface of a semiconductor die |
| 07/29/2008 | US7405570 Connector for a measurement element in a battery sensor |
| 07/29/2008 | US7404717 Contactor |
| 07/29/2008 | CA2334951C Voltage measuring device |
| 07/24/2008 | WO2008089430A2 Probing structure with fine pitch probes |
| 07/24/2008 | WO2008058869A3 Measuring device and measuring method for inspecting the surface of a substrate |
| 07/24/2008 | WO2008057807A3 Power line communication and power distribution parameter measurement system and method |
| 07/24/2008 | US20080174332 Electrochemically fabricated microprobes |
| 07/24/2008 | US20080174328 Probing Structure With Fine Pitch Probes |
| 07/24/2008 | US20080174327 Electric signal connecting device and probe assembly and probing device using the same |
| 07/24/2008 | US20080174325 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
| 07/24/2008 | US20080172870 Test device for electrical testing of a unit under test, as well as a method for production of a test drive |
| 07/23/2008 | EP1947466A1 Test head positioning system |
| 07/23/2008 | EP1947464A1 Power detector insensitive to standing waves of a microwave signal transmitted by a mismatched waveguide |
| 07/23/2008 | EP1946124A1 A probe for testing electrical properties of a test sample |
| 07/23/2008 | EP1488243B1 Modular housing for electrical instrument and mounting member therefor |
| 07/23/2008 | CN201090983Y Probe and vertical probe crystal element probe clip with the probe |
| 07/23/2008 | CN101226766A Audio play device automatically adjusting play parameter |
| 07/23/2008 | CN101226227A Test carrier plate |
| 07/23/2008 | CN101226222A PCB multifunctional test system and implementing method |
| 07/23/2008 | CN101226207A Active variable impedance synthesizer |
| 07/23/2008 | CN100405568C Test base board and its chassis |