Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
09/2008
09/10/2008CN201112794Y 44 wire ceramic small-shape packaging integrated circuit aging testing socket
09/10/2008CN201112793Y 48 wire flat packaging integrated circuit aging testing socket
09/10/2008CN201112792Y 24 wire ceramic double-row packaging integrated circuit aging testing socket
09/10/2008CN201112791Y 24 wire ceramic double-row packaging integrated circuit aging testing socket
09/10/2008CN201112790Y 14 wire metal packaging solid relay aging testing socket
09/10/2008CN201112372Y Clamp used for semiconductor package and test
09/10/2008CN201111843Y Clamp for OLED aging testing
09/10/2008CN101261296A Semiconductor element test structure
09/10/2008CN101261288A Load dump transient voltage generator
09/10/2008CN101261287A Probe assembling
09/10/2008CN101261286A Probe device
09/10/2008CN101261285A Method and system for automatically managing probe mark shifts
09/10/2008CN101261284A Wafer adsorption and unloading device capable of longitudinally elevating and horizontally rotating
09/10/2008CN101261283A Test bench wafer suction disc device
09/10/2008CN100417946C Probe structure of preventing noise interference for semiconductor test board
09/09/2008US7423419 Chuck for holding a device under test
09/04/2008WO2008051880B1 Method and apparatus for sample extraction and handling
09/04/2008US20080211525 Probe card assembly and method of forming same
09/04/2008US20080211524 Electrochemically Fabricated Microprobes
09/04/2008US20080211486 Auto-handler comprising pushers each including peltier device
09/03/2008EP1965422A1 Circuit board apparatus for wafer inspection, probe card, and wafer inspection apparatus
09/03/2008EP1963869A1 Probe card assembly
09/03/2008CN201110927Y Tooth hole detecting probe structure
09/03/2008CN201110875Y Test tool power supply linkage
09/03/2008CN201110867Y Main accumulator battery data acquisition interface plate
09/03/2008CN201110862Y Novel digital multi purpose meter protective circuit
09/03/2008CN101258648A Radio frequency test interface
09/03/2008CN101258416A Semiconductor device inspecting apparatus and power supply unit
09/03/2008CN101258410A Manufacturing method of probe card
09/03/2008CN101258409A Conductive contact and method for manufacturing conductive contact
09/03/2008CN101257294A Method for generating amplitude continuous variable signal without D/A converter
09/03/2008CN101256216A Jig for checking characteristic of semiconductor element, characteristic checking device and method
09/03/2008CN101256215A Crosstalk suppression in wireless testing of semiconductor devices
09/03/2008CN101256202A Electronic component-inspection wiring board and method of manufacturing the same
09/03/2008CN101256201A Probe head module group capable of detecting multiple positions
09/03/2008CN101256200A Pressure resistant test tool
09/03/2008CN101256199A Clamper
09/03/2008CN100416788C Multifunctional probe card
09/02/2008US7421258 Compact temperature transmitter with improved lead connections
09/02/2008US7420380 Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method
09/02/2008US7420379 Semiconductor device test method and semiconductor device tester
09/02/2008US7419387 Electric connection member utilizing ansiotropically conductive sheets
08/2008
08/28/2008WO2008101996A1 Temperature compensated inductance measurement
08/28/2008WO2008063320A3 Tamper respondent sensor and enclosure
08/28/2008WO2008027582A3 Improved meter jaw assembly
08/28/2008US20080204062 Cantilever probe card
08/28/2008US20080204061 Spring loaded probe pin assembly
08/28/2008US20080204060 Vertical-Type Electric Contactor And Manufacture Method Thereof
08/28/2008US20080204059 Probe Tile for Probing Semiconductor Wafer
08/28/2008US20080204058 Probe Storage Container, Prober Apparatus, Probe Arranging Method and Manufacturing Method of Probe Storage Container
08/28/2008US20080203999 Test tray transferring apparatus for a test handler, test handler, and method of transferring test trays for a test handler
08/27/2008CN201107830Y Multiplex electrical signal interconnection equipment
08/27/2008CN201107334Y Large-capacity square wave impact current generator
08/27/2008CN201107333Y Detecting probe
08/27/2008CN201107332Y Universal meter test pencil capable of illuminating
08/27/2008CN201107331Y Water proof voltmeters case
08/27/2008CN201107330Y Needle clamp and needle clamp component
08/27/2008CN201107329Y Contact chucking appliance of integrated circuit sorting machines
08/27/2008CN201107328Y Adjustable feed chucking appliance of LED light splitting machine
08/27/2008CN201107327Y Assembly type ceramic block detecting probe card
08/27/2008CN101251577A Test equipment capable of carrying composite test
08/27/2008CN101251571A Crystal round test approach
08/27/2008CN101251565A Panel test circuit structure
08/27/2008CN101251551A Conductive rubber having conducting wire evagination for test
08/27/2008CN101251550A Multiplicity type contact test tablet
08/27/2008CN100414574C Display circuit
08/27/2008CN100414303C Probe card for testing image sensing chip
08/27/2008CN100414302C Method for manufacturing probe pin, and method for manufacturing of probe card
08/27/2008CN100414301C Microelectronic contact structure
08/27/2008CN100414300C Interface comprising a thin PCB with protrusions for testing an integrated circuit
08/26/2008US7417446 Probe for combined signals
08/26/2008US7417445 Probing method and prober for measuring electrical characteristics of circuit devices
08/26/2008US7417419 Method and arrangement for connecting electrical components in an electricity meter
08/26/2008US7417340 Power supply for model vehicle
08/26/2008US7416443 Coaxial coupling for stepless calibration
08/21/2008WO2008098987A1 Test of electronic devices at package level using test boards without sockets
08/21/2008WO2008098655A2 Contacting station for testing test samples under thermal conditions
08/21/2008WO2008071541A3 Module for a test device for testing circuit boards
08/21/2008US20080197869 Electrical connecting apparatus
08/21/2008US20080197867 Socket signal extender
08/21/2008US20080197866 Method of Manufacturing Needle for Probe Card Using Fine Processing Technology, Needle Manufactured by the Method, and Probe Card Comprising the Needle
08/21/2008US20080197834 Signal detecting circuit
08/20/2008EP1959521A1 Dividing electrical connector of the type with needles
08/20/2008EP1959261A1 Probe card
08/20/2008EP1959260A1 Probe card
08/20/2008CN101246186A Measuring instrument
08/20/2008CN101246185A Connector of combined transformation device for measuring current and voltage in power-supply network having direct current and alternating current system
08/20/2008CN100413045C Anisotropically conductive connector, probe material member, wafer inspection apparatus, and wafer inspection method
08/20/2008CN100412543C Gas detecting apparatus and method based on field ionization effect
08/19/2008US7414422 System in-package test inspection apparatus and test inspection method
08/19/2008US7414419 Micro-electromechanical probe circuit substrate
08/19/2008US7414417 Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts
08/19/2008US7414390 Signal detection contactor and signal calibration system
08/14/2008WO2008095415A1 A core-through type current transformer with an anti-theft veil for easily detecting voltage
08/14/2008US20080191727 Probe and probe assembly
08/14/2008US20080191726 Cantilever-type probe card for high frequency application
08/14/2008US20080191722 Isolation buffers with controlled equal time delays
08/14/2008US20080191720 Multilayer Substrate and Probe Card
08/14/2008DE102007005719A1 Fixing arrangement for fixing electrical sensor within groove of component, has fixing plate, which is measured to be smaller than groove width in initial position
08/13/2008EP1956376A1 Electrical testing device for testing electrical test items
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