| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 10/02/2008 | WO2008117343A1 Substrate inspection contact |
| 10/02/2008 | WO2008091550B1 Rotational positioner and methods for semiconductor wafer test systems |
| 10/02/2008 | US20080238711 Automated meter reader direct mount endpoint module |
| 10/02/2008 | US20080238467 Reinforced contact elements |
| 10/02/2008 | US20080238463 Probe apparatus, probing method and storage medium |
| 10/02/2008 | US20080238456 Semiconductor inspection apparatus |
| 10/02/2008 | US20080238454 Tester and structure of probe thereof |
| 10/02/2008 | US20080238431 Apparatus for Detecting an Electrical Variable of a Rechargeable Battery, and Method for Producing Said Apparatus |
| 10/02/2008 | US20080238409 Probe with a Changing Device |
| 10/02/2008 | US20080238408 Micro probe assembly |
| 10/02/2008 | US20080238407 Package level voltage sensing of a power gated die |
| 10/01/2008 | EP1974427A1 Protection unit for an ac/dc low-voltage power supply line |
| 10/01/2008 | EP1188061B1 Segmented contactor |
| 10/01/2008 | CN201126974Y Wireless power supply for zinc oxide lightning arrester leakage current monitoring system |
| 10/01/2008 | CN201126463Y Test device for printed wiring board |
| 10/01/2008 | CN201126455Y Signal test control tool |
| 10/01/2008 | CN201126448Y On-line automatic testing equipment for signal sampling |
| 10/01/2008 | CN201126442Y Multi-core type watch pen |
| 10/01/2008 | CN101278201A Voltage sensors and voltage sensing methods for gas insulated switchgear |
| 10/01/2008 | CN101276661A Anisotropically conductive member and method of manufacturing the same |
| 10/01/2008 | CN101275986A Measuring clamp for electronic apparatus, integrated board thereof and measuring apparatus using same |
| 10/01/2008 | CN101275985A Probing method, probe apparatus and storage medium |
| 10/01/2008 | CN101275984A Semiconductor inspection apparatus |
| 10/01/2008 | CN101275972A Semiconductor element test structure |
| 10/01/2008 | CN101275971A Contact detector |
| 10/01/2008 | CN101275970A Testing device and probe structure thereof |
| 10/01/2008 | CN100423221C Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby |
| 10/01/2008 | CN100422750C Device for measuring the intensity of a strong current passing through a wire |
| 10/01/2008 | CN100422748C Universal probe device for electronic module detecting system |
| 10/01/2008 | CN100422747C Probe guard |
| 10/01/2008 | CN100422746C Inspection probe |
| 09/30/2008 | US7429856 Voltage source measurement unit with minimized common mode errors |
| 09/25/2008 | WO2008114464A1 Electrical connection device |
| 09/25/2008 | WO2008114169A1 Contactless transmission element and method of characterizing the same |
| 09/25/2008 | US20080231305 Contact carriers (tiles) for populating larger substrates with spring contacts |
| 09/25/2008 | US20080231303 Semiconductor device for electrical contacting semiconductor devices |
| 09/25/2008 | US20080231300 Method for detecting tip position of probe, alignment method, apparatus for detecting tip position of probe and probe apparatus |
| 09/25/2008 | US20080231295 Device and method for electrical contacting semiconductor devices for testing |
| 09/25/2008 | US20080231260 Pusher for match plate of test handler |
| 09/25/2008 | US20080231259 Interlocking electrical test probes |
| 09/25/2008 | US20080231258 Stiffening connector and probe card assembly incorporating same |
| 09/25/2008 | US20080230856 Intermediate probe structures for atomic force microscopy |
| 09/25/2008 | US20080229577 Seek-scan probe (SSP) memory with sharp probe tips formed at CMOS-compatible temperatures |
| 09/24/2008 | EP1972898A1 Temperature compensated inductance measurement |
| 09/24/2008 | EP1971995A1 Battery circuit breaker comprising current-measuring means |
| 09/24/2008 | CN201122419Y Rotating platform for OLED test equipment |
| 09/24/2008 | CN201122173Y Reciprocating IC batch detecting bench |
| 09/24/2008 | CN201122166Y SOT type encapsulation element test and aging test socket |
| 09/24/2008 | CN201122165Y Device materiel frame of test equipment |
| 09/24/2008 | CN101271147A Probe unit and detection apparatus |
| 09/24/2008 | CN101271145A Inspection apparatus and method |
| 09/24/2008 | CN101271128A Digital display signal measurement amplifying circuit |
| 09/24/2008 | CN101271127A Goods pressing head |
| 09/24/2008 | CN101271126A Probe needle |
| 09/24/2008 | CN100421311C Socket for electronic elements |
| 09/24/2008 | CN100420948C Banks of elastic probe, and fabricating method |
| 09/24/2008 | CN100420915C Light source for plane display screen detector |
| 09/23/2008 | US7427869 Resilient contact probe apparatus |
| 09/23/2008 | US7427868 Active wafer probe |
| 09/18/2008 | WO2008110174A1 Device including a contact detector |
| 09/18/2008 | WO2008055839A3 Electrical contact arrangement |
| 09/18/2008 | US20080229120 System and method for continual cable thermal monitoring using cable resistance considerations in power over ethernet |
| 09/18/2008 | US20080224720 Support Member Assembly for Conductive Contact Members |
| 09/18/2008 | US20080224690 Embedded Directional Power Sensing |
| 09/17/2008 | EP1970719A1 Anistropic conductive connector, conversion adapter for inspection device having the anisotropic conductive connector, and method for manufacturing the anistropic conductive connector |
| 09/17/2008 | EP1970715A1 Probe card |
| 09/17/2008 | EP1970714A1 Device including a contact detector |
| 09/17/2008 | EP1969381A1 Testing adapter |
| 09/17/2008 | CN201117889Y Electric power connector socket with spring crown jack for electric power test |
| 09/17/2008 | CN201116925Y PCB plate detecting probe |
| 09/17/2008 | CN201116924Y Testing thin film applied for detecting display panel |
| 09/17/2008 | CN201116923Y Electric laboratory table |
| 09/17/2008 | CN101266281A Automatic processing machine |
| 09/17/2008 | CN101266262A High speed test card |
| 09/17/2008 | CN101266261A Carrying bench |
| 09/17/2008 | CN100419435C Board for probe card,inspection apparatus,photo-fabrication apparatus and photo-fabrication method |
| 09/17/2008 | CN100419434C Method for electric feeding, discharging and super-current time delay protecting on high-frequency tuning device |
| 09/17/2008 | CN100419433C Integrated circuit plug socket having signal switching device and electron element testing method |
| 09/16/2008 | US7425151 Connector, printed circuit board, connecting device connecting them, and method of testing electronic part, using them |
| 09/16/2008 | US7424775 Captive wired test fixture |
| 09/12/2008 | WO2008108576A1 Apparatus for inspecting electrical condition and method of manufacturing the same |
| 09/12/2008 | WO2008082150A3 Test socket for semiconductor |
| 09/11/2008 | US20080218191 Probe assembly with rotary tip |
| 09/11/2008 | US20080218187 Probe testing structure |
| 09/11/2008 | US20080218177 Contact insert for a microcircuit test socket |
| 09/11/2008 | DE202008009469U1 Messsonde Probe |
| 09/10/2008 | EP1966615A1 Device, probe, and method for the galvanically decoupled transmission of a measuring signal |
| 09/10/2008 | EP1489695B1 Anisotropic conductive film and method for producing the same |
| 09/10/2008 | CN201113133Y 625 wire ceramic needle grid array element aging testing socket |
| 09/10/2008 | CN201112805Y 9 wire metal packaging high power circuit element aging testing socket |
| 09/10/2008 | CN201112804Y 6 wire high power plug-in type element aging testing socket |
| 09/10/2008 | CN201112803Y 40 wire ceramic lead-wire-free sheet type carrier aging testing socket |
| 09/10/2008 | CN201112802Y 6 wire surface mounting type high-power device aging testing socket |
| 09/10/2008 | CN201112801Y 160 wire ceramic four-side lead wire sheet type carrier aging testing socket |
| 09/10/2008 | CN201112800Y 84 wire ceramic four-side lead wire sheet type carrier aging testing socket |
| 09/10/2008 | CN201112799Y 64 wire ceramic four-side lead wire sheet type carrier aging testing socket |
| 09/10/2008 | CN201112798Y 36 wire ceramic four-side lead wire flat packaging integrated circuit aging testing socket |
| 09/10/2008 | CN201112797Y 44 wire plastic packaging lead wire sheet type carrier aging testing socket |
| 09/10/2008 | CN201112796Y 28 wire ceramic flat packaging integrated circuit aging testing socket |
| 09/10/2008 | CN201112795Y 16 wire ceramic flat packaging integrated circuit aging testing socket |