Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
10/2008
10/29/2008CN201141878Y Probe construction
10/29/2008CN201141877Y Low-impedance spring connecting wire
10/29/2008CN201141876Y Spherical scanning rotation bracket of electromagnetic compatibility experiment
10/29/2008CN201141875Y TO type encapsulated integrated circuit element aging test socket
10/29/2008CN201141874Y Ceramic four-side lead wire piece type carrier element aging test jack
10/29/2008CN201141873Y Probe card fixing frame
10/29/2008CN201141872Y Circuit board test tool needle bed group
10/29/2008CN201141871Y Conversion interface device of wafer sorting machine
10/29/2008CN201141870Y High-voltage suspension insulator leakage current collecting snap ring
10/29/2008CN101295007A Cochlear implant electrode array coupling test device
10/29/2008CN101294986A Light multimeter
10/29/2008CN101294985A Power supply device for controllable reactor induction voltage-resistant experiment and its partial discharging measurement method
10/29/2008CN101294984A Probe apparatus and detection apparatus
10/29/2008CN101294983A Multi-layer electric probe structure and production method thereof
10/28/2008US7444247 System and method for reading power meters
10/28/2008US7443181 High performance probe system
10/28/2008US7443179 Zero motion contact actuation
10/28/2008US7441322 Method of manufacturing a magnetic detection apparatus
10/28/2008CA2269886C Remotely operated meter disconnect switch
10/23/2008WO2008127801A2 Probe for testing semiconductor devices
10/23/2008WO2008127541A1 Fully tested wafers having bond pads undamaged by probing and applications thereof
10/23/2008WO2008127242A1 Dual arcuate blade probe tip
10/23/2008WO2008127241A1 Pronged fork probe tip
10/23/2008WO2008126962A1 Probe card, needles of probe card, and method of manufacturing the needles of probe card
10/23/2008WO2008126601A1 Probe card
10/23/2008WO2008125371A1 Contact system with vibration damper for current measuring instruments
10/23/2008WO2008093852A3 Potential measurement apparatus and image forming apparatus
10/23/2008WO2007146186A3 Knee probe having increased scrub motion
10/23/2008US20080258746 Probes for a Wafer Test Apparatus
10/23/2008US20080258745 Probe Guard
10/23/2008US20080258713 Modular interface
10/22/2008EP1982198A1 Test system for a circuit carrier
10/22/2008EP1982197A1 Finger tester for testing unpopulated printed circuit boards and method for testing unpopulated printed circuit boards using a finger tester
10/22/2008CN201138366Y Panel test structure
10/22/2008CN201138351Y Test adapter
10/22/2008CN201138350Y Clamping device for testing wave-guide duplex apparatus
10/22/2008CN101292169A Device for measuring the loss factor
10/22/2008CN101290329A Probe unit and checking device
10/22/2008CN101290328A Carrier for carrying a packaged chip and handler equipped with the carrier
10/22/2008CN101290327A A receiver of an electronic element and a handler including the same
10/22/2008CN100428597C Overpressure resistant adapter for switchgear insulated by gases
10/22/2008CN100427955C Device interface unit
10/21/2008US7439727 Interlocking electrical test probes
10/21/2008US7438853 For detecting current that illuminates a photoelectrochemical electrode to generate a photocurrent and to magnify the current; increased sensitivity that increases accuracy of detection
10/16/2008WO2008123608A1 Conductive contact holder and conductive contact unit
10/16/2008WO2008123075A1 Through-etching process and method for producing contactor
10/16/2008US20080254651 Spring interconnect structures
10/16/2008US20080252328 Probe for testing semiconductor devices
10/16/2008US20080252326 Probe
10/16/2008US20080252316 Membrane probing system
10/16/2008US20080252315 Electrical component handler having self-cleaning lower contact
10/16/2008US20080252310 Hybrid probe for testing semiconductor devices
10/15/2008CN201134975Y 印刷电路板及夹具 Printed circuit boards and fixtures
10/15/2008CN201134474Y On-line control interface device of series storage battery
10/15/2008CN201133929Y Two stage type vacuum fixture
10/15/2008CN201133912Y Automatic short circuit current gauge base
10/15/2008CN101285872A Improved type carbon-pile type accumulator tester
10/15/2008CN101285865A Method and apparatus for detecting tip position of probe, alignment method, and probe apparatus
10/15/2008CN101285863A Circuit board measurement method and device
10/15/2008CN101285848A Method and device for correcting and obtaining reference voltage
10/14/2008US7436194 Shielded probe with low contact resistance for testing a device under test
10/14/2008US7436193 Thin film probe card contact drive system
10/14/2008US7436171 Apparatus for probing multiple integrated circuit devices
10/14/2008US7436170 Probe station having multiple enclosures
10/14/2008CA2336015C Residual current detection device
10/09/2008WO2008120654A1 Anisotropic conductive connector, probe member and wafer inspection equipment
10/09/2008WO2008120587A1 Contactor, probe card, and method of manufacturing contactor
10/09/2008WO2008120575A1 Mounting method of contactor
10/09/2008WO2008120547A1 Contactor and method of manufacturing contactor
10/09/2008WO2008119179A1 Testing of electronic circuits using an active probe integrated circuit
10/09/2008US20080246501 Probe Card With Stacked Substrate
10/09/2008US20080246500 High density interconnect system having rapid fabrication cycle
10/09/2008US20080246498 Test structure and probe for differential signals
10/09/2008US20080246464 Pusher block
10/09/2008DE112006003034T5 Prüfgerät für elektronische Bauelemente und Verfahren zur Montage einer Leistungsplatine in dem Prüfgerät An electronic component tester and method for mounting a power board in the tester
10/08/2008EP1977258A2 Device for measuring dc current having large measurement swing, electronic trip comprising such a measurement device and cut-off device having such a trip
10/08/2008EP1642145B1 Apparatus and method for electromechanical testing and validation of probe cards
10/08/2008CN201130215Y Front end bus test device with probe as well as front end bus test structure
10/08/2008CN201130197Y Partial discharge test power supply system
10/08/2008CN201130196Y Testing needle for printed circuit board
10/08/2008CN201130195Y Integral terminal kit with pause-copy battery and communication module for static type electric energy meter
10/08/2008CN201130194Y Steel needle mold and needle aculeus experimental machine with the same
10/08/2008CN201130193Y Auxiliary mean for testing proximity test point on circuit board
10/08/2008CN201130192Y Fixed device for detecting breaker magnetic test
10/08/2008CN201130191Y Socket for breaker test
10/08/2008CN201129932Y Heat energy recycling and circulating structure of heating furnace body
10/08/2008CN101281223A Low frequency disturbance jamming immunity tester
10/08/2008CN101281218A Probe resistance measuring method and semiconductor device of bonding pad for probe resistance
10/08/2008CN101281212A Assembled probe body
10/08/2008CN101281211A Making tool for package test
10/08/2008CN100424514C Semiconductor test plate structure for preventing noise interference
10/08/2008CN100424513C Apparatus and method for limiting over travel in a probe card assembly
10/08/2008CN100424512C Modular high frequency detection card
10/08/2008CN100424511C Applied module of test plate
10/08/2008CN100424510C Position regulator for pickup and non-contacted electric resistance rate determiner
10/07/2008US7432727 Electric signal connecting device and probe assembly and probing device using the same
10/07/2008US7432726 Probe
10/07/2008US7432698 Modular active test probe and removable tip module therefor
10/02/2008WO2008118677A2 Stiffening connector and probe card assembly incorporating same
10/02/2008WO2008117645A1 Sheet-like probe and method for manufacturing the same
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