Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
11/2008
11/26/2008CN100437119C Microwave ceramic element detection clamp and device, and detection method thereof
11/25/2008US7456646 Wafer probe
11/25/2008US7456645 Inspection coaxial probe and inspection unit incorporating the same
11/25/2008US7456639 Compliant contact structure
11/25/2008US7456504 Electronic component assemblies with electrically conductive bonds
11/25/2008US7455540 Electrical contactor, especially wafer level contactor, using fluid pressure
11/20/2008WO2008138463A1 Centering device for electronic components, particularly ics
11/20/2008WO2008138419A1 Spring contact pin, particularly actuating pin
11/20/2008US20080284458 Method for Forming Connection Pin, Probe, Connection Pin, Probe Card and Method for Manufacturing Probe Card
11/20/2008US20080284455 Probe apparatus
11/20/2008US20080284454 Test interface with a mixed signal processing device
11/20/2008US20080284412 System for transferring test trays and a handler having same
11/20/2008US20080284411 Method and Circuit Provided for Measuring Very Low Intensity of Electric Current
11/20/2008DE10393724B4 Prüfkopfanordnungen, Prüfvorrichtung und dafür geeignetes Verfahren Prüfkopfanordnungen, Tester and suitable for this method
11/19/2008CN201152941Y Signal conversion isolation device and system for digital electro-hydraulic control system detection
11/19/2008CN201152881Y Chip type LED product suction mechanism
11/19/2008CN101310190A Jig for inspecting substrate, and inspection probe
11/19/2008CN101308833A Circuit substrate, molding semiconductor device, tray and inspection socket
11/19/2008CN101308820A Manufacturing method of semiconductor integrated circuit device and probe card
11/19/2008CN101308819A Manufacturing method of semiconductor integrated circuit device and probe card
11/19/2008CN101308195A High -voltage switch secondary circuit signal emulation system
11/19/2008CN101308194A Probe apparatus
11/19/2008CN101308193A Probe apparatus
11/19/2008CN101308186A Plasma display device panel electrode test pen
11/19/2008CN101308166A Signal generation circuit for testing hall device electrical behavior
11/19/2008CN101308165A Probe array and method of its manufacture
11/19/2008CN101308164A Probe assembly and inspection device
11/19/2008CN101308163A Probe card with electrical shield structure
11/19/2008CN101308162A Penetration type probe and method for packaging body test by the probe
11/19/2008CN100435317C Manufacturing method of semiconductor integrated circuit device and probe card
11/19/2008CN100434925C Examining instrument for liquid crystal panel
11/18/2008US7453276 Probe for combined signals
11/18/2008US7453259 Loading a socket and/or adapter device with a semiconductor component
11/18/2008US7453234 Battery pack—cordless power device interface system
11/18/2008US7452799 Ball film for integrated circuit fabrication and testing
11/18/2008US7452438 Method of fixing a probe needle to a needle fixture of a probe card in semiconductor inspection equipment
11/13/2008WO2008137182A2 Cradle and cable handler for a test head manipulator
11/13/2008WO2008136396A1 Conductive contactor
11/13/2008WO2008136395A1 Probe card
11/13/2008US20080278187 Test pin, method of manufacturing same, and system containing same
11/13/2008US20080278185 Electrical contact device and its manufacturing process
11/13/2008US20080278144 Monitoring Device to Provide Electrical Access in Restricted Spaces
11/13/2008DE19819352B4 Messgerät für elektrische und/oder magnetische Wechselfelder Device for measuring electric and / or magnetic alternating fields
11/12/2008EP1990643A1 Systems, methods, and apparatus for measuring capacitance in a stator component
11/12/2008CN201149610Y Novel test structure and test system containing the same
11/12/2008CN201149599Y Measuring clamper for capacitor burn-in screen
11/12/2008CN101303391A Pipeline test apparatus and method
11/12/2008CN101303389A Test method and apparatus thereof
11/12/2008CN101303371A Probe card and method for fabricating the same
11/12/2008CN101303370A Probe unit and detection apparatus
11/12/2008CN101303369A Test sockets, test equipment including the same and methods of testing semiconductor packages using the same
11/12/2008CN101303368A Battery detecting electrode made by sheet metal stretch forming method
11/12/2008CN100432687C Inspection method and inspection equipment
11/12/2008CN100432679C Vertical probe card
11/12/2008CN100432678C Auxiliary element for fixing a current sensor to an electrical conductor
11/11/2008US7449910 Test system for semiconductor components having conductive spring contacts
11/11/2008US7449906 Probe for testing an electrical device
11/11/2008US7449877 Current measurement apparatus
11/11/2008US7449096 Apparatus for the operation of a microfluidic device
11/06/2008WO2008133833A1 Method and apparatus for identifying broken pins in a test socket
11/06/2008WO2008133209A1 Conductive contact and conductive contact unit
11/06/2008WO2008133089A1 Conductive contact unit
11/06/2008WO2008131497A1 An apparatus for sensing an electrical condition
11/06/2008US20080272796 Probe assembly
11/06/2008US20080272795 Prober Apparatus and Operating Method Therefor
11/06/2008US20080272794 Method of manufacturing a probe card
11/06/2008DE19952183B4 Einrichtung zur Spitzenformung Means for forming top
11/05/2008CN201145724Y Translation circuit of charge switch of ultralong wave front-impulse voltage generator
11/05/2008CN201145715Y Apparatus for testing keyboard
11/05/2008CN101300496A A probe for testing electrical properties of a test sample
11/05/2008CN101300495A Method for manufacturing conductive contact holder, and conductive contact holder
11/05/2008CN101300494A Method for manufacturing conductive contact holder
11/05/2008CN100431128C Method for controlling parallelism between probe card and mounting table, inspection program, and inspection apparatus
11/05/2008CN100431127C Silicon wafer for probe bonding and probe bonding method using thereof
11/05/2008CN100430735C Test probe alignment apparatus
11/05/2008CN100430734C Combined probe for integrated circuit test
11/05/2008CN100430733C Modular housing for electrical instrument and mounting member therefor
11/05/2008CN100430513C Metal structure and method for production thereof
11/04/2008US7446545 Anisotropically conductive sheet
11/04/2008US7446544 Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
11/04/2008US7446536 Scan tool for electronic battery tester
10/2008
10/30/2008WO2008129149A1 Battery output housing comprising a shunt or measuring element
10/30/2008WO2008069967A3 Lateral interposer contact design and probe card assembly
10/30/2008US20080268556 Plate With An Indicator For Discerning Among Pre-Identified Probe Holes In The Plate
10/30/2008US20080265927 Tester on a probe card
10/30/2008US20080265925 Double sided probing structures
10/30/2008US20080265924 Contactor nest for an IC device and method
10/30/2008US20080265922 Wafer level interposer
10/30/2008US20080265874 Test handler
10/30/2008US20080265873 Low profile probe having improved mechanical scrub and reduced contact inductance
10/30/2008US20080265872 Wiring substrate and current detection device
10/30/2008US20080265871 Current measurement apparatus
10/30/2008DE202008010533U1 Kontaktlose Schleifensonde Contactless loop probe
10/29/2008EP1986479A2 Wiring substrate and current detection device
10/29/2008EP1984748A1 Probe head with machined mounting pads and method of forming same
10/29/2008EP1200992B1 Resilient interconnect structure for electronic components and method for making the same
10/29/2008CN201142494Y Temperature controller test connector
10/29/2008CN201141908Y Bias voltage generation device
10/29/2008CN201141886Y Test pencil
10/29/2008CN201141879Y Active variable impedance synthesizer
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