| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 12/18/2008 | US20080309363 Probe assembly with wire probes |
| 12/18/2008 | US20080309362 Probe assembly with probes for electrical testing |
| 12/18/2008 | US20080309360 Testing apparatus for surface mounted connectors |
| 12/18/2008 | US20080309358 Active wafer probe |
| 12/18/2008 | US20080309357 Differential Measurement Probe Having a Ground Clip System for the Probing Tips |
| 12/18/2008 | US20080309356 Differential Measurement Probe Having a Ground Clip System for the Probing Tips |
| 12/18/2008 | US20080309348 Integrated chip clamp adjustment assembly and method |
| 12/18/2008 | US20080309347 Circuit tester device |
| 12/18/2008 | US20080307906 Fluid fitting electromagnetic effects test chamber |
| 12/17/2008 | EP2003460A1 Pin card assembly |
| 12/17/2008 | CN201166758Y Detecting clamp |
| 12/17/2008 | CN201166696Y Machine for testing circuit board |
| 12/17/2008 | CN201166676Y Portable high-power DC experiment power supply |
| 12/17/2008 | CN201166675Y Protection type test pencil |
| 12/17/2008 | CN201166674Y Buffering vertical probe card |
| 12/17/2008 | CN201166673Y Measuring instrument |
| 12/17/2008 | CN201166672Y Measuring instrument |
| 12/17/2008 | CN101324636A Guide connection module for detecting circuit board |
| 12/17/2008 | CN100443911C Electronic device test system |
| 12/17/2008 | CN100443902C Instrument panel of electric vehicle |
| 12/17/2008 | CN100443901C Test adaptor card and test equipment |
| 12/16/2008 | US7466042 Universal DC power |
| 12/11/2008 | WO2008149886A1 Material for probe pin |
| 12/11/2008 | WO2008127801A3 Probe for testing semiconductor devices |
| 12/11/2008 | US20080303541 Method and Apparatus For Increasing Operating Frequency Of A System For Testing Electronic Devices |
| 12/11/2008 | DE112007000415T5 Sonde und elektrische Verbindungsvorrichtung, die sie verwendet Probe and electrical connection device that uses them |
| 12/11/2008 | DE112006000059T5 Prüfkarte und Verfahren zur Herstellung und Reparatur derselben Probe card and method for the production and repair of the same |
| 12/10/2008 | EP1782079B1 Calibration standard |
| 12/10/2008 | CN201163699Y Density converter for PCB test |
| 12/10/2008 | CN101322035A Probe card |
| 12/10/2008 | CN101320875A Test connector for mobile phone camera module group |
| 12/10/2008 | CN101320857A Switching test seat |
| 12/10/2008 | CN101320075A 连接器 Connector |
| 12/10/2008 | CN101320052A Chain type high voltage micro-current detaching device especially for insulation tool experiment |
| 12/10/2008 | CN101320051A Portable high power DC experiment power supply |
| 12/10/2008 | CN100442068C Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
| 12/10/2008 | CN100442059C Apparatus and method for isolating input channels in electronic testing instrument |
| 12/10/2008 | CN100442058C Probe and probe manufacturing method |
| 12/10/2008 | CN100442057C Conductive contact |
| 12/10/2008 | CN100442056C Chip fixing device for finding chip defect by luminous microscope |
| 12/09/2008 | US7463764 Probe area setting method and probe device |
| 12/09/2008 | US7463045 Method for pushing a contact probe against object to be measured |
| 12/09/2008 | US7463041 High-density electroconductive contact probe with uncompressed springs |
| 12/04/2008 | WO2008147119A1 Method for fabricating probe tip |
| 12/04/2008 | WO2008119179B1 Testing of electronic circuits using an active probe integrated circuit |
| 12/04/2008 | US20080297187 Location device for contact probes |
| 12/04/2008 | US20080297185 Multi probe card unit, probe test device including the multi probe card unit, and methods of fabricating and using the same |
| 12/04/2008 | US20080297184 Semiconductor test apparatus |
| 12/04/2008 | US20080297183 Probe card having columnar base portion and method of producing the same |
| 12/04/2008 | US20080297182 Semicoductor testing device with elastomer interposer |
| 12/04/2008 | US20080297157 Discrete magic angle turning system, apparatus, and process for in situ magnetic resonance spectroscopy and imaging |
| 12/04/2008 | US20080297142 Contact insert for a microcircuit test socket |
| 12/04/2008 | US20080297141 Manipulator for positioning a test head on a tester |
| 12/04/2008 | US20080297140 System and method for transferring trays within a test handler |
| 12/03/2008 | CN201159758Y Connector for microcomputer type protective-relay device test |
| 12/03/2008 | CN201159757Y Universal testing device capable of detecting accurate resistor |
| 12/03/2008 | CN201159756Y Test system of non-key ignition device |
| 12/03/2008 | CN201159752Y Collapsible scanner for piezo-electricity scanatron deformation test |
| 12/03/2008 | CN201159742Y Generating device for time operation wave before major wave for extra-high voltage experiment |
| 12/03/2008 | CN101317099A Contact element and checkout system |
| 12/03/2008 | CN101315411A System, method and apparatus for testing circuit combination |
| 12/03/2008 | CN101315405A Semiconductor component test station with detachable electric property detecting system |
| 12/03/2008 | CN101315402A Multi-test seat test station having in-turn arranged feeding section, test section and discharging section |
| 12/03/2008 | CN101315393A Timing triggering module of integrating device system |
| 12/03/2008 | CN101315392A Probe positioning device |
| 12/03/2008 | CN101315391A Stretching type folding probe |
| 12/03/2008 | CN100440644C Socket and test apparatus |
| 12/03/2008 | CN100439925C Assembled probe body |
| 12/03/2008 | CN100439924C Probe component of detecting device for plane display board detection |
| 12/03/2008 | CN100439923C Chip general detector and its structure method |
| 12/03/2008 | CN100439922C Detecting apparatus of display panel |
| 12/02/2008 | US7459922 Microcontactor probe assembly having a plunger and electric probe unit using the same |
| 12/02/2008 | US7459900 Modular current sensor for modularized servo control system |
| 12/02/2008 | US7459886 Combined LDO regulator and battery charger |
| 12/02/2008 | US7458818 Electric connector and electrical connecting apparatus using the same |
| 12/02/2008 | US7458123 Apparatuses and methods for cleaning test probes |
| 11/27/2008 | WO2008144437A1 Wafer probe test and inspection system |
| 11/27/2008 | US20080290888 Probe substrate for test and manufacturing method thereof |
| 11/27/2008 | US20080290886 Probe apparatus |
| 11/27/2008 | US20080290885 Probe test system and method for testing a semiconductor package |
| 11/27/2008 | US20080290882 Probe needle protection method for high current probe testing of power devices |
| 11/27/2008 | US20080290342 Methods and apparatus for a flexible circuit interposer |
| 11/27/2008 | DE10100183B4 Prüfstecker Test Plugs |
| 11/26/2008 | CN201156865Y Clamp for flexible printed circuit board FPC inspection |
| 11/26/2008 | CN201156548Y LED support unit and LED support |
| 11/26/2008 | CN201156074Y Circuit board |
| 11/26/2008 | CN201156051Y High-frequency florescent lamp testing power supply apparatus |
| 11/26/2008 | CN201156050Y Test plug |
| 11/26/2008 | CN101313225A Conductive contact unit, and conductive contact |
| 11/26/2008 | CN101313224A Probe holder and probe unit |
| 11/26/2008 | CN101311741A Automatic test method and its fixture |
| 11/26/2008 | CN101311739A IC chip test platform energy supply structure |
| 11/26/2008 | CN101311733A Electrical contact device manufacture method |
| 11/26/2008 | CN101311732A Rod of measuring electric meter |
| 11/26/2008 | CN101311731A Adsorption workbench |
| 11/26/2008 | CN101311730A System for testing and sorting electronic components |
| 11/26/2008 | CN101311668A Device and method for generating probe tester map data |
| 11/26/2008 | CN100437122C Contact actuator with contact force controlling mechanism |
| 11/26/2008 | CN100437121C Test probe for electrical devices having low or no wedge depression |
| 11/26/2008 | CN100437120C Testing electrode of single nanometer materials and production thereof |