| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 01/15/2009 | US20090015275 Ultra-Fine Area Array Pitch Probe Card |
| 01/14/2009 | EP2015399A1 Anisotropic conductive connector and anisotropic conductive connector device |
| 01/14/2009 | EP2015088A1 Method of positioning an anisotropic conductive connector, method of positioning the anisotropic conductive connector and a circuit board for inspection, anisotropic conductive connector and probe card |
| 01/14/2009 | EP2013633A2 Method and apparatus for probing |
| 01/14/2009 | EP2013632A2 Probe structures with electronic components |
| 01/14/2009 | EP1721174A4 Dual channel source measurement unit for semiconductor device testing |
| 01/14/2009 | EP1610132B1 Fabricating interconnects using sacrificial substrates |
| 01/14/2009 | CN201181311Y Rain-proof electroscope with electrical insulator |
| 01/14/2009 | CN201181304Y Direct current high voltage generator |
| 01/14/2009 | CN201181303Y Integral great current probe |
| 01/14/2009 | CN201181302Y Coaxial isolation type great current probe |
| 01/14/2009 | CN201181301Y Digital multimeter capable of magnetically labeling |
| 01/14/2009 | CN201181300Y Voltage equalizing cover for high-tension testing apparatus |
| 01/14/2009 | CN101346863A Protection unit for an ac/dc low-voltage power supply line |
| 01/14/2009 | CN101346813A Circuit board apparatus for wafer inspection, probe card, and wafer inspection apparatus |
| 01/14/2009 | CN101346633A Probe card |
| 01/14/2009 | CN101346632A Probe card |
| 01/14/2009 | CN101345470A Current transformer |
| 01/14/2009 | CN101344571A Socket, and test apparatus and method using the socket |
| 01/14/2009 | CN101344560A Method for adjusting output amplitude of signal source in electromagnetic compatibility sensitivity test |
| 01/14/2009 | CN101344559A Signal source amplitude adjustment method in electromagnetic compatibility sensitivity test |
| 01/14/2009 | CN101344551A Semi-conductor test structure |
| 01/14/2009 | CN101344538A High/low-voltage isolation circuit |
| 01/14/2009 | CN101344537A General scarf joint tool for positioning ball lattice array packaging member to be measured |
| 01/14/2009 | CN101344536A IC picking device with uniformly-spaced movement |
| 01/14/2009 | CN100452338C Die level testing using machine grooved storage tray with vacuum channels |
| 01/14/2009 | CN100451660C Electrical test device |
| 01/14/2009 | CN100451659C Sheetlike probe, its manufacturing method and its application |
| 01/14/2009 | CN100451658C Adapter for circuit board examination and device for circuit board examination |
| 01/13/2009 | US7477066 Universal grid composite circuit board testing tool |
| 01/13/2009 | US7477062 LSI test socket for BGA |
| 01/08/2009 | WO2009006186A2 Multi-offset die head |
| 01/08/2009 | WO2009004722A1 Probe and probe card |
| 01/08/2009 | WO2009004721A1 Probe, probe card and process for manufacturing probe |
| 01/08/2009 | WO2009004647A2 Clamp meter with safe trigger mechanism |
| 01/08/2009 | WO2009004646A2 A novel clamp meter with rotary mechanism for clamp jaws |
| 01/08/2009 | WO2009003277A1 System and method for probing work pieces |
| 01/08/2009 | US20090009205 Microcontactor probe assembly having a plunger and electric probe module using the same |
| 01/08/2009 | US20090009201 Probe for Electrical Test and Probe Assembly |
| 01/08/2009 | US20090009198 Probing device |
| 01/07/2009 | EP2012131A1 Contact probe and method of making the same |
| 01/07/2009 | CN201178245Y Switch cabinet operating controller |
| 01/07/2009 | CN201177661Y Pin adjusting machine |
| 01/07/2009 | CN201177647Y Multiple waveform aging test apparatus of lightning arrester |
| 01/07/2009 | CN101341412A Probe card |
| 01/07/2009 | CN101341411A Test adapter |
| 01/07/2009 | CN101339205A Electronic parts test device |
| 01/07/2009 | CN101339204A Disc conveyer device |
| 01/07/2009 | CN100449871C Anisotropic conductive connector and circuit-device electrical-inspection device |
| 01/07/2009 | CN100449324C Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device |
| 01/06/2009 | US7474088 Power monitoring system |
| 01/02/2009 | DE102004007696B4 Testvorrichtung zum Prüfen eines Halbleiterbauteils mit Kontaktflächen auf seiner Oberseite und seiner Unterseite und Verfahren zum Prüfen des Halbleiterbauteils Test apparatus for testing a semiconductor device with contact areas on its top and bottom and method for testing the semiconductor device |
| 01/01/2009 | US20090002009 Multi-offset die head |
| 01/01/2009 | US20090002008 Inspection Method, Inspection Apparatus and Control Program |
| 01/01/2009 | US20090002005 Substrate Probe Card and Method for Regenerating Thereof |
| 01/01/2009 | US20090002004 Integrated compound nano probe card and method of making same |
| 12/31/2008 | WO2009001731A1 Conductive contact holder and conductive contact unit |
| 12/31/2008 | WO2008113943A3 Impedance measuring device |
| 12/31/2008 | EP2009452A1 Apparatus and method for dissipating heat generated during an electrical measurement |
| 12/31/2008 | CN201174589Y Accumulator sampling line protector |
| 12/31/2008 | CN201173959Y Two stage type fixture for press |
| 12/31/2008 | CN101334450A Four-terminal method test pen |
| 12/31/2008 | CN101334447A Processor, test tray transfer method and package chip manufacture method |
| 12/31/2008 | CN101334446A Device and method for transferring test trays and a handler having same, process for manufacturing semiconductor device |
| 12/31/2008 | CN101334436A Test system |
| 12/31/2008 | CN101334426A Four-wire ohmmeter connector and ohmmeter using same |
| 12/31/2008 | CN101334425A Integrated circuit element test jack, socket substrate and test machine platform and method of manufacture |
| 12/31/2008 | CN101334424A Pressure welding device possessing multiple pressing head |
| 12/31/2008 | CN101334265A Device for detecting probe position of probe card |
| 12/31/2008 | CN100447573C Fiducial alignment mark on microelectronic spring contact |
| 12/31/2008 | CN100447572C Electrical read head having high sensitivity and resolution power and method of operating the same |
| 12/30/2008 | US7471097 Test probe with planar ground tip extending transversely from the ground barrel for a semiconductor package |
| 12/30/2008 | US7470149 Conductive-contact holder and conductive-contact unit |
| 12/25/2008 | US20080316725 Connector, printed circuit board, connecting device connecting them, and method of testing electronic part, using them |
| 12/25/2008 | US20080315905 Electrical Connecting Apparatus |
| 12/25/2008 | US20080315903 Method for measurement of a device under test |
| 12/25/2008 | US20080315900 High temperature ceramic socket configured to test packaged semiconductor devices |
| 12/25/2008 | US20080315899 Test Apparatus for Testing a Semiconductor Device, and Method for Testing the Semiconductor Device |
| 12/25/2008 | US20080315894 Testing Adapter |
| 12/24/2008 | WO2008156279A1 Probe substrate assembly |
| 12/24/2008 | WO2008156278A1 Probe substrate assembly |
| 12/24/2008 | WO2008156162A1 Wafer inspecting probe member and probe card |
| 12/24/2008 | WO2008155864A1 Ni ELECTROFORMED COIL-SHAPED ULTRAFINE SPRING, Ni ELECTROFORMED PIPE PARTIALLY FURNISHED WITH COIL-SHAPED SPRING STRUCTURE, AND PROCESS FOR PRODUCING THEM |
| 12/24/2008 | CN201170796Y Tool for detecting connector |
| 12/24/2008 | CN201170789Y 探针装置 Probe device |
| 12/24/2008 | CN201170788Y Test fixture for PCB manual veneer |
| 12/24/2008 | CN101329382A High voltage non-local discharge test power supply for crosslinked cable |
| 12/24/2008 | CN101329367A Probe measuring clip having ZIF connector, assembly method, wafer test system and test method thereof |
| 12/24/2008 | CN101329366A Probe short circuit preventing structure |
| 12/24/2008 | CN101329365A Probe clip and combined assembly method |
| 12/24/2008 | CN101329364A Rotary type flexible circuit board testing jig |
| 12/24/2008 | CN101329363A System and method for testing carrier plate and integrated circuit element |
| 12/24/2008 | CN101329362A Component conveying apparatus and IC processor |
| 12/24/2008 | CN100446355C Micro contact-element and making method |
| 12/24/2008 | CN100446207C Probe pin zero-point detecting method and probe device |
| 12/24/2008 | CN100445750C Simple-beam type microelectronic mechanical system detection card and producing method thereof |
| 12/24/2008 | CN100445749C Plate supply device for testing unit of plate display and sub-working table thereof |
| 12/23/2008 | US7468558 Devices having compliant wafer-level input/output interconnections and packages using pillars and methods of fabrication thereof |
| 12/18/2008 | WO2008153238A1 Probe unit and needle thereof |
| 12/18/2008 | US20080309438 Micro-electromechanical system based switching |