| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 02/12/2009 | US20090039906 Circuit board apparatus for wafer inspection, probe card, and wafer inspection apparatus |
| 02/12/2009 | US20090039904 Probe card, production method thereof and repairing method of probe card |
| 02/12/2009 | US20090039274 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 02/11/2009 | EP2023386A2 Probe card for testing semiconductor device, and semiconductor device test method |
| 02/11/2009 | EP2022169A2 Mode selection amplifier circuit usable in a signal acquisition probe |
| 02/11/2009 | CN201194023Y Integrated circuit testing apparatus |
| 02/11/2009 | CN101364802A Bur generating method for test apparatus |
| 02/11/2009 | CN101363898A Heat insulation lens set |
| 02/11/2009 | CN101363894A Methods of using a blade probe for probing a node of a circuit |
| 02/11/2009 | CN101363875A Probe card, semiconductor inspecting apparatus, and manufacturing method of semiconductor device |
| 02/11/2009 | CN101363874A Method for processing electric bottom layer oriented to integrate circuit digilogue mixing test adapter |
| 02/11/2009 | CN101363873A Integrated circuit element test socket, socket substrate and test machine and method for making same |
| 02/11/2009 | CN100461540C Contact tip structure for microelectronic interconnection elements |
| 02/11/2009 | CN100461355C Flexible contact-connection device |
| 02/11/2009 | CN100460886C Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method |
| 02/11/2009 | CN100460876C Measuring system and data interface converting device thereof |
| 02/10/2009 | US7489149 Shielded probe for testing a device under test |
| 02/10/2009 | US7488917 Electric discharge machining of a probe array |
| 02/10/2009 | US7488899 Compliant contact pin assembly and card system |
| 02/05/2009 | WO2009016746A1 Contactor and interface assembly |
| 02/05/2009 | US20090033352 Handler and process for testing a semiconductor chips using the handler |
| 02/05/2009 | US20090033349 Probe assembly |
| 02/05/2009 | US20090033348 Electrical signal connector |
| 02/05/2009 | US20090033347 Measuring board for electronic device test apparatus |
| 02/05/2009 | US20090033346 Group probing over active area pads arrangement |
| 02/05/2009 | US20090033338 Systems and methods for facilitating use of a universal test connection for a plurality of different devices |
| 02/04/2009 | EP1243915B1 Apparatus for evaluating electrical characteristics |
| 02/04/2009 | CN201191299Y Arbitrary waveform generating apparatus for device aging screening cart |
| 02/04/2009 | CN201191298Y Rotary disc rotating device for automatic detection machine of solar panel |
| 02/04/2009 | CN201191297Y Ceramic capacitor test probe |
| 02/04/2009 | CN101359799A Connecting method of electric connector and general battery interface |
| 02/04/2009 | CN101359000A Electrical signal connector |
| 02/04/2009 | CN101358999A Probe assembly |
| 02/04/2009 | CN101358998A A plurality of beam synthetic contact finishes |
| 02/04/2009 | CN101358997A Inspection jig and inspection equipment |
| 02/04/2009 | CN101358996A Constant temperature and humidity shielded box |
| 02/04/2009 | CN101358995A Installation structure of sampling valve plate of lightning arrester resistance leakage current |
| 02/04/2009 | CN101358994A Installation structure of sampling valve plate of lightning arrester resistance leakage current and installation method |
| 02/04/2009 | CN101358993A Power supply system for on-line detecting resistance current of lightning arrester |
| 02/04/2009 | CN100459324C Producing technology of outlet board |
| 02/04/2009 | CN100458450C Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method |
| 02/03/2009 | US7486092 Apparatus for supporting semiconductor devices during testing |
| 02/03/2009 | CA2320342C Method for preparing an emulsified fuel and implementing device |
| 01/29/2009 | WO2009013809A1 Contactor, probe card and method of mounting contactor |
| 01/29/2009 | WO2009012870A1 Mobile high-voltage test set with housing |
| 01/29/2009 | US20090027060 Adapter and interface and electronic device test apparatus provided with adapter |
| 01/29/2009 | US20090027042 Method and apparatus for amplifying a signal and test device using same |
| 01/29/2009 | US20090027041 Buffer circuit, amplifier circuit, and test apparatus |
| 01/29/2009 | DE102007035020A1 Contact device for use in chip test arrangement, for contacting electrical contact, has opening through which electrically conductive liquid produces contact for electrical contact |
| 01/29/2009 | CA2694472A1 Portable high-voltage test instrument with housing |
| 01/28/2009 | CN201188111Y Portable signal generator |
| 01/28/2009 | CN201188110Y Analog wave filter circuit for arbitrary function wave-shape generating system of device burn-in screen vehicle |
| 01/28/2009 | CN201188109Y Hand-operated jig for encapsulating chip |
| 01/28/2009 | CN101356443A Probe and electrical connection device employing it |
| 01/28/2009 | CN101354428A Trolley for probe card and operation method of probe card using the same |
| 01/28/2009 | CN101354407A Power supply apparatus |
| 01/28/2009 | CN101354406A Probe apparatus of radio frequency plasma |
| 01/28/2009 | CN101354405A Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby |
| 01/28/2009 | CN101354404A Metal-silicon compound cantilever beam type microelectronic mechanical system probe card and manufacture method thereof |
| 01/28/2009 | CN101354403A Wafer carrying platform for wafer detection device and wafer detection device having the same |
| 01/27/2009 | US7482825 Burn-in testing apparatus and method |
| 01/27/2009 | US7482824 Polycrystalline contacting component and test tool having the contacting component |
| 01/27/2009 | US7482823 Shielded probe for testing a device under test |
| 01/27/2009 | US7482821 Probe card and the production method |
| 01/22/2009 | WO2009011696A1 A device and method for reparing a microelectromechanical system |
| 01/22/2009 | WO2009011365A1 Probe card |
| 01/22/2009 | WO2009011244A1 Probe unit |
| 01/22/2009 | WO2009011201A1 Inspecting structure |
| 01/22/2009 | WO2009010313A1 Coated motor vehicle battery sensor element and method for producing a motor vehicle battery sensor element |
| 01/22/2009 | WO2009010103A1 Vehicle battery sensor element and method for producing a motor vehicle battery sensor element |
| 01/22/2009 | US20090021278 Commutation failure detection circuit for back-to-back SCR circuit and controlling method thereof having relatively better efficiency |
| 01/22/2009 | US20090021276 Probe or Measuring Head with Illumination of the Contact Region |
| 01/22/2009 | US20090021275 Method and arrangement for positioning a probe card |
| 01/22/2009 | US20090021274 Electrical connecting apparatus |
| 01/22/2009 | US20090021273 On-wafer test structures |
| 01/22/2009 | US20090021272 Inspection apparatus, probe card and inspection method |
| 01/22/2009 | US20090021238 Optical device and method of controlling the same |
| 01/21/2009 | EP2017634A1 Inspection apparatus, probe card and inspection method |
| 01/21/2009 | EP2017629A1 Conductive contact holder |
| 01/21/2009 | EP2016431A2 Input by-pass circuit for a current probe |
| 01/21/2009 | EP2016427A2 Current probing system |
| 01/21/2009 | EP2016426A1 Lumped resistance electrical cable |
| 01/21/2009 | CN201185243Y Active type multipurpose connector structure |
| 01/21/2009 | CN201184889Y Probe for testing film battery assembly electrical property |
| 01/21/2009 | CN201184888Y Electric meter with stick-measuring fixed structure |
| 01/21/2009 | CN101351080A Printed circuit board |
| 01/21/2009 | CN101349736A Inspection apparatus, probe card and inspection method |
| 01/21/2009 | CN101349734A Apparatus for generating oscillating wave for electrical apparatus test |
| 01/21/2009 | CN101349710A Grounding method for shielding electromagnetic interference suitable for laboratory |
| 01/21/2009 | CN100454677C Connector, electronic component fixing device, and tester |
| 01/21/2009 | CN100454032C Method for testing empty printed circuit boards |
| 01/20/2009 | US7479792 Methods for making plated through holes usable as interconnection wire or probe attachments |
| 01/20/2009 | US7479778 Adaptive slope compensation for switching regulators |
| 01/20/2009 | US7479614 Radio frequency identification tag inlay sortation and assembly |
| 01/20/2009 | CA2221525C System for locating patch cord ends |
| 01/15/2009 | WO2009009420A2 Low glitch offset correction circuit for auto-zero sensor amplifiers and method |
| 01/15/2009 | US20090015284 Semi-generic in-circuit test fixture |
| 01/15/2009 | US20090015283 Integrated circuit probing apparatus having a temperature-adjusting mechanism |
| 01/15/2009 | US20090015279 Socket, and test apparatus and method using the socket |
| 01/15/2009 | US20090015276 Probe assembly and method for producing it |