| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 03/18/2009 | CN100470249C An apparatus for measuring an AC current in a cable |
| 03/17/2009 | US7505856 Battery test module |
| 03/17/2009 | US7504845 Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis |
| 03/17/2009 | US7504842 Probe holder for testing of a test device |
| 03/17/2009 | US7504840 Electrochemically fabricated microprobes |
| 03/17/2009 | US7504837 Electrical characteristics measurement method and electrical characteristics measurement device |
| 03/17/2009 | US7504823 Thermal optical chuck |
| 03/17/2009 | US7503772 Socket for semiconductor device |
| 03/12/2009 | US20090066550 Sigma-delta modulator for operating sensors |
| 03/12/2009 | US20090066353 Probe assemblies and methods for housing and providing electrical contact to planar or chip-type sensors and heaters |
| 03/12/2009 | US20090066351 Electrochemically fabricated microprobes |
| 03/12/2009 | US20090066350 Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same |
| 03/12/2009 | US20090066349 Probe system |
| 03/12/2009 | US20090066340 Test apparatus and connecting apparatus |
| 03/11/2009 | EP2032998A2 Method of designing an application specific probe card test system |
| 03/11/2009 | EP1894023A4 Radio frequency isolation container |
| 03/11/2009 | CN201207076Y Chip test seat with replaceable test spring |
| 03/11/2009 | CN201207075Y Over-current test monitoring and protecting device for thyristor valve |
| 03/11/2009 | CN201207060Y General resistance detecting clamp for cylinder battery |
| 03/11/2009 | CN101384910A Device for measuring DC current having large measurement swing, electronic trip comprising such a measurement device and cut-off device having such a trip |
| 03/11/2009 | CN101384909A Electrically conductive contact and electrically conductive contact unit |
| 03/11/2009 | CN101382566A Lead wire for LCD array testing and detecting circuit |
| 03/11/2009 | CN101382565A Extra-high voltage corona cage for researching corona characteristic of conductor |
| 03/11/2009 | CN100468868C Anisotropic conductive connector and inspection equipment for circuit device |
| 03/11/2009 | CN100468867C Anisotropic conductive sheet, its manufacturing method and its application |
| 03/11/2009 | CN100468271C Accurate pure AC voltage/current convertor with low noise |
| 03/11/2009 | CN100468070C Techniques for controlling movement of a circuit board module along card cage slot |
| 03/11/2009 | CN100468065C Sheet probe, manufacturing method and application therefor |
| 03/11/2009 | CN100468064C Probe distinguishing device used for measuring instrument |
| 03/10/2009 | US7501842 Shielded probe for testing a device under test |
| 03/10/2009 | US7501810 Chuck for holding a device under test |
| 03/05/2009 | WO2009028708A1 Probe holder, and probe unit |
| 03/05/2009 | US20090058446 Inspection apparatus and inspection method |
| 03/05/2009 | US20090058442 Prober for testing components |
| 03/05/2009 | US20090058440 Probe assembly, method of producing it and electrical connecting apparatus |
| 03/05/2009 | US20090058398 Current/voltage detection printed board and current/voltage detector |
| 03/04/2009 | CN201204335Y Electric connector |
| 03/04/2009 | CN201203633Y Power supply device for controllable inductor induction voltage-resistant experiment |
| 03/04/2009 | CN201203632Y 探针卡 Probe Card |
| 03/04/2009 | CN201203631Y Probe component |
| 03/04/2009 | CN201203630Y Spring casing tube |
| 03/04/2009 | CN201203629Y 探针 Probe |
| 03/04/2009 | CN201203628Y Multi-adaptability test seat |
| 03/04/2009 | CN201203627Y Auto-switch power supply device for test and test system composed by the same |
| 03/04/2009 | CN201203626Y Consumption unit of AC electronic load |
| 03/04/2009 | CN101378033A Method of forming thin film metal conductive lines |
| 03/04/2009 | CN101377534A Method for setting signal source amplitude initial value in electromagnetic compatible sensitivity test |
| 03/04/2009 | CN100466391C Electric connector apparatus |
| 03/04/2009 | CN100465650C A probe card |
| 03/04/2009 | CN100465649C A semiconductor device, a manufacturing method, a device forming substrate and a wiring connection testing method |
| 03/04/2009 | CN100465648C A debugging device of circuit boards and a method for debugging the circuit boards |
| 03/04/2009 | CN100465627C A scanning probe inspection apparatus |
| 03/03/2009 | US7498829 Shielded probe for testing a device under test |
| 02/26/2009 | WO2007146583A3 Method of designing an application specific probe card test system |
| 02/26/2009 | US20090051382 Probe for electrical test and electrical connecting apparatus using it |
| 02/26/2009 | US20090051378 Air Bridge Structures And Methods Of Making And Using Air Bridge Structures |
| 02/26/2009 | US20090051377 Probe card and method for assembling the same |
| 02/25/2009 | CN201199248Y Socket for testing aging of uniseriel integrated circuit element |
| 02/25/2009 | CN201199247Y Density changeover mechanism for PCB tester |
| 02/25/2009 | CN201199246Y Density changeover mechanism for PCB tester |
| 02/25/2009 | CN201199245Y Analog channel for digital oscilloscope |
| 02/25/2009 | CN101373727A Method and apparatus for adjusting pitch of buffer tray in test sorter |
| 02/25/2009 | CN101373726A Method and apparatus for transferring semiconductor devices in test sorter |
| 02/25/2009 | CN101373204A A contact insert for a microcircuit test socket |
| 02/25/2009 | CN101373194A Probe set |
| 02/25/2009 | CN101373193A Battery emulation apparatus |
| 02/25/2009 | CN100464190C Automatic direction-recognizing device for ferrule |
| 02/24/2009 | US7495461 Wafer probe |
| 02/24/2009 | US7495431 Electric power cord with digital multimeter |
| 02/24/2009 | US7495342 Angled flying lead wire bonding process |
| 02/19/2009 | US20090045831 Contact with plural beams |
| 02/19/2009 | US20090045828 Fine Pitch Testing Substrate Structure And Method Of Manufacturing The Same |
| 02/19/2009 | US20090045827 Multi-Site Probe |
| 02/19/2009 | US20090045826 Measuring probe with optical cable |
| 02/19/2009 | US20090045806 Digital multimeter having case panel structure |
| 02/19/2009 | US20090045805 Digital multimeter having housing sealing arrangement |
| 02/19/2009 | US20090045801 Temperature stable current sensor system |
| 02/19/2009 | DE202008015560U1 Zangenstrommesser mit verdrehbarer Stromzange Current probe with rotatable clamp meter |
| 02/19/2009 | DE112007000937T5 Sondenlamelle und elektrische Verbindungsvorrichtung Probe plate and electrical connection device |
| 02/19/2009 | DE112007000936T5 Verfahren zur Herstellung einer Sondenlamelle A process for producing a probe lamella |
| 02/18/2009 | EP2026078A1 Probe card |
| 02/18/2009 | EP2024749A2 Multi-channel signal acquisition probe |
| 02/18/2009 | CN201196975Y Conductive terminal |
| 02/18/2009 | CN201196680Y Photoelectric head fixing rack lifting mechanism |
| 02/18/2009 | CN201196665Y Heat loss self-compensation terminal type water load microwave high power meter |
| 02/18/2009 | CN201196658Y Analog resistor circuit used for device aging screening vehicle |
| 02/18/2009 | CN201196657Y Constant-current source circuit used for thermal resistance calibration system of device aging screening vehicle |
| 02/18/2009 | CN201196656Y Manual test tools |
| 02/18/2009 | CN201196655Y Wafer adsorption and discharging apparatus with longitudinal elevation and horizontal rotation function |
| 02/18/2009 | CN201196654Y Wafer suction disc apparatus for test bench |
| 02/18/2009 | CN201196653Y Meter core stand of magnetic regulation type megameter |
| 02/18/2009 | CN101368982A Digital multimeter having housing sealing arrangement |
| 02/18/2009 | CN101368981A Radio frequency module testing platform |
| 02/18/2009 | CN101368980A Adjustable probe platform |
| 02/17/2009 | US7492175 Membrane probing system |
| 02/17/2009 | US7492170 Probe based information storage for probes used for opens detection in in-circuit testing |
| 02/17/2009 | US7492147 Wafer probe station having a skirting component |
| 02/17/2009 | US7492143 Method and structure for variable pitch microwave probe assembly |
| 02/12/2009 | US20090042323 Probe card, semiconductor inspecting apparatus, and manufacturing method of semiconductor device |
| 02/12/2009 | US20090039910 Test apparatus for semiconductor modules |