| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 04/16/2009 | WO2007055713A3 Pin electronics implemented system and method for reduced index time |
| 04/16/2009 | US20090096475 Test device |
| 04/16/2009 | US20090096474 Die design with integrated assembly aid |
| 04/16/2009 | US20090096473 Testing probe and electrical connection method using the same |
| 04/16/2009 | US20090096472 Replaceable Probe Apparatus for Probing Semiconductor Wafer |
| 04/16/2009 | US20090096465 Test equipment |
| 04/16/2009 | US20090094826 Contacting component, method of producing the same, and test tool having the contacting component |
| 04/15/2009 | EP1721175A4 Portable electric testing equipment |
| 04/15/2009 | CN201222538Y High-performance ammeter access line device |
| 04/15/2009 | CN201222138Y Clamper construction for panel detection tools |
| 04/15/2009 | CN201222073Y 10/350 Mum thunderbolt stream waveshape excitation device based on vacuum trigger switch tube |
| 04/15/2009 | CN201222072Y Cable measuring clip |
| 04/15/2009 | CN101409413A Switching head and test platform applying the same |
| 04/15/2009 | CN101408557A Optical desk for circuit board visual measurement |
| 04/15/2009 | CN100479127C Micro-mechanical wafer chip test detecting card and its production |
| 04/15/2009 | CN100478742C Probe structure in TFT-LCD substrate detection equipment |
| 04/14/2009 | US7518388 Contactor for electronic components and test method using the same |
| 04/14/2009 | US7518387 Shielded probe for testing a device under test |
| 04/14/2009 | US7518358 Chuck for holding a device under test |
| 04/14/2009 | US7517707 Manufacturing method of semiconductor integrated circuit device and probe card |
| 04/14/2009 | CA2427732C Methods and devices for dissolving hyperpolarised solid material for nmr analyses |
| 04/09/2009 | US20090093161 Conductive-contact holder and conductive-contact unit |
| 04/09/2009 | US20090091343 Method for making a conductive film and a probe card using the same |
| 04/09/2009 | US20090091342 Node Extender for In-Circuit Test Systems |
| 04/09/2009 | DE102008048294A1 Verfahren und Vorrichtung für die analoge Validierung von Hochgeschwindigkeitsbussen, wobei elektromagnetische Koppler verwendet werden Method and apparatus for analog validation of high-speed buses, wherein electromagnetic couplers are used |
| 04/08/2009 | EP2044449A1 Test probe for a test apparatus for testing plug-type connectors and method for testing plug-type connectors |
| 04/08/2009 | CN201219195Y Creepage protection apparatus used for test tool |
| 04/08/2009 | CN201218824Y Single slice voltage collection device for fuel cell |
| 04/08/2009 | CN201218823Y Single slice voltage collection device for fuel cell |
| 04/08/2009 | CN201218818Y Probe holding tool |
| 04/08/2009 | CN201218817Y Automatic signal measurement platform |
| 04/08/2009 | CN201218816Y Heat source apparatus similar to chip |
| 04/08/2009 | CN101403765A Node extender for in-circuit test systems |
| 04/08/2009 | CN101403764A The connecting device for burn in testing equipment |
| 04/08/2009 | CN100477395C Compression mount and zero insertion force socket for integrated circuit devices |
| 04/08/2009 | CN100476442C Apparatus for testing a device with a high frequency signal |
| 04/08/2009 | CN100476441C Test tray for handler for testing semiconductor devices |
| 04/07/2009 | US7514915 Chuck for holding a device under test |
| 04/02/2009 | WO2009042679A2 Stiffener assembly for use with testing devices |
| 04/02/2009 | WO2009040986A1 Probe needle material, probe needle and probe card each using the same, and inspection process |
| 04/02/2009 | US20090087725 Temperature compensated current measuring device and battery pack using the same |
| 04/02/2009 | US20090085595 Method and arrangement for positioning a probe card |
| 04/02/2009 | US20090085593 Test socket |
| 04/02/2009 | US20090085591 Probe tip including a flexible circuit board |
| 04/02/2009 | US20090085590 Method And Apparatus For Testing Devices Using Serially Controlled Intelligent Switches |
| 04/02/2009 | US20090085556 Method of fabricating monolithic nanoscale probes |
| 04/02/2009 | DE202007018748U1 Teststruktur für Messfühler für differentielle Signale Test structure for measuring probe for differential signals |
| 04/01/2009 | EP2042879A1 Battery current sensor for a motor vehicle |
| 04/01/2009 | CN201215568Y Screwdriver shaped multimeter |
| 04/01/2009 | CN201215565Y Switching control tool shared by multiple dimensions for precise high-frequency crystal oscillator test |
| 04/01/2009 | CN101398457A Wafer, test system thereof, test method thereof, and test fixture thereof |
| 04/01/2009 | CN101398453A Single light path quantum efficiency test system |
| 04/01/2009 | CN101398446A Temperature compensated current measuring device and battery pack using the same |
| 04/01/2009 | CN101398443A Intelligent impulsator |
| 04/01/2009 | CN101398442A Tool plate and test method using the same |
| 04/01/2009 | CN101398441A Probe plate and inspection device of semiconductor wafer using the same |
| 04/01/2009 | CN100474577C Base board and electric test method therefor |
| 04/01/2009 | CN100474572C Connector for making electrical contact at semiconductor scales and method for forming the same |
| 04/01/2009 | CN100474545C Test board for high-frequency system level test |
| 04/01/2009 | CN100473992C Module for correcting synchronization of sensitive rod, and method for correcting synchronization of sensitive rod |
| 04/01/2009 | CN100473991C Socket for connecting ball-grid-array integrated circuit device to test circuit |
| 03/31/2009 | US7511521 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 03/31/2009 | US7511519 Electric signal connecting device and probe assembly and probing device using the same |
| 03/31/2009 | US7511470 Electronic tamper detection circuit for an electricity meter |
| 03/26/2009 | US20090079461 Test socket and test board for wafer level semiconductor testing |
| 03/26/2009 | US20090079453 Automated test equipment with dib mounted three dimensional tester electronics bricks |
| 03/26/2009 | US20090079452 Component assembly and alignment |
| 03/26/2009 | US20090079451 High frequency probe |
| 03/26/2009 | US20090079416 Electricity energy monitor |
| 03/26/2009 | DE202007018733U1 Messfühler für differentielle Signale mit integrierter Symmetrieschaltung Probe for differential signals with integrated balun |
| 03/25/2009 | EP1108260A4 Dual-rated current transformer circuit |
| 03/25/2009 | CN201212904Y Electrode array combined test device for artificial cochlea |
| 03/25/2009 | CN201212895Y High density test probe |
| 03/25/2009 | CN201212894Y Electricity test probe for PCB board |
| 03/25/2009 | CN201212893Y General battery connector clamp for mobile terminal |
| 03/25/2009 | CN201212892Y Modular apparatus for button type battery experimental test |
| 03/25/2009 | CN101395482A Conductive contact unit |
| 03/25/2009 | CN101395481A Conductive contact unit |
| 03/25/2009 | CN101393885A Fixing/releasing auxiliary device for a wafer detection platform, the wafer detection platform and method therefor |
| 03/25/2009 | CN101393250A Test socket and test board for wafer level semiconductor testing |
| 03/25/2009 | CN100472215C Electric connector |
| 03/25/2009 | CN100472214C Dual channel source measurement unit for semiconductor device testing |
| 03/24/2009 | US7508227 Closed-grid bus architecture for wafer interconnect structure |
| 03/24/2009 | US7508191 Pin electronics implemented system and method for reduced index time |
| 03/19/2009 | WO2009035456A2 A forked probe for testing semiconductor devices |
| 03/19/2009 | WO2009034693A1 Method for manufacturing probe contact |
| 03/19/2009 | US20090075404 Ball film for integrated circuit fabrication and testing |
| 03/19/2009 | US20090072851 Multi-Pivot Probe Card For Testing Semiconductor Devices |
| 03/19/2009 | US20090072850 Forked probe for testing semiconductor devices |
| 03/19/2009 | US20090072848 Electrical Contactor, Especially Wafer Level Contactor, Using Fluid Pressure |
| 03/19/2009 | US20090072846 High frequency differential test probe for automated printed wiring board test systems |
| 03/19/2009 | US20090072844 Wafer inspecting sheet-like probe and application thereof |
| 03/19/2009 | DE19825274B4 Prüfstation mit innerer und äußerer Abschirmung Test station with inner and outer shield |
| 03/18/2009 | CN201210589Y Road vehicle distribution box having level detection contact interface |
| 03/18/2009 | CN201210184Y Continuous test or data transmission apparatus |
| 03/18/2009 | CN201210183Y IC test device |
| 03/18/2009 | CN201210159Y Electric cable pressure resistant test jig |
| 03/18/2009 | CN101387656A Flexible test fixture |
| 03/18/2009 | CN101387655A Carrying fixture |
| 03/18/2009 | CN100470946C Sharp and orientated contact pointed structure |