| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 05/20/2009 | CN101438172A Current probing system |
| 05/20/2009 | CN101438171A Lumped resistance electrical cable |
| 05/20/2009 | CN100489720C Method for compensating deviation of test temperature |
| 05/20/2009 | CN100489548C Circuit board inspection device |
| 05/20/2009 | CN100489541C Electric connector |
| 05/20/2009 | CN100489540C Component interface plate used for test of semiconductor integrated circuit |
| 05/20/2009 | CN100489539C Apparatus for hot-probing integrated semiconductor circuits on wafers |
| 05/19/2009 | US7535215 Apparatus and method for the determination of a direction of an object |
| 05/19/2009 | US7535126 Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device |
| 05/19/2009 | US7534654 Socket for making with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component |
| 05/19/2009 | US7533571 Apparatus for making high-sensitivity measurements of various parameters, and sensors particularly useful in such apparatus |
| 05/19/2009 | US7533462 Method of constructing a membrane probe |
| 05/14/2009 | WO2009060948A1 Relay connector |
| 05/14/2009 | WO2009060755A1 Process for producing intermediate structure and inspection apparatus |
| 05/14/2009 | US20090121734 Integrated compound nano probe card and method of making same |
| 05/14/2009 | US20090121732 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures |
| 05/13/2009 | EP2058667A2 Microelectronic spring contact element |
| 05/13/2009 | CN201237611Y Multifunctional high-precision resistor signal generator |
| 05/13/2009 | CN201237610Y 铜棒 Tongbang |
| 05/13/2009 | CN201237609Y Testing jig |
| 05/13/2009 | CN201237608Y Automatic testing turnplate for electronic component |
| 05/13/2009 | CN101432628A Measuring device and measuring method for inspecting the surface of a substrate |
| 05/13/2009 | CN101431201A Clamping device |
| 05/13/2009 | CN101431074A Calibration technique for measuring gate resistance of power MOS gate device at wafer level |
| 05/13/2009 | CN101430363A Test system and method for reducing signal attenuation of test integrated circuit |
| 05/13/2009 | CN101430356A Directly tandem high-voltage impulse power supply for insulation detection |
| 05/13/2009 | CN101430354A Test method and apparatus for pin element |
| 05/13/2009 | CN101430344A Probe combination and inspection device |
| 05/13/2009 | CN101430343A H-shaped needle block |
| 05/13/2009 | CN101430342A Temperature raising method and apparatus for reaction chamber |
| 05/13/2009 | CN100487463C Microelectronic mechanical system probe card equipment and method based on elastic substrate |
| 05/13/2009 | CN100487462C 探头片单元 Probe sheet unit |
| 05/07/2009 | US20090115440 Testing integrated circuits |
| 05/07/2009 | US20090115439 Methods for making contact device for making connection to an electronic circuit device and methods of using the same |
| 05/07/2009 | US20090115402 Voltage detecting circuit and semiconductor device including the same |
| 05/07/2009 | US20090115401 System comprising an automotive fuse and an A/D converter |
| 05/07/2009 | DE19954182B4 Elektronischer Multimeter Electronic Multimeter |
| 05/06/2009 | CN201233886Y Three dimensional regulating seat |
| 05/06/2009 | CN201233428Y Novel high-current test cable control device |
| 05/06/2009 | CN201233409Y Constant flow energizing sensor |
| 05/06/2009 | CN201233408Y Electric voltage test clamp and electricity stealing on-line searching instrument |
| 05/06/2009 | CN201233407Y Battery oven test fixture |
| 05/06/2009 | CN201233406Y Part fetching head device |
| 05/06/2009 | CN101424705A Probe column, wafer testing seat and wafer testing system |
| 05/06/2009 | CN101424704A Replaceable probe apparatus for probing semiconductor wafer |
| 05/06/2009 | CN101424703A Test probe and electric connection method using the test probe |
| 05/06/2009 | CN101424702A Probe, test socket and tester thereof |
| 05/06/2009 | CN101424701A Computation method for making AC load |
| 05/06/2009 | CN101424700A Functional menu design method for network electric power instrument |
| 05/06/2009 | CN100485394C IC detection device |
| 05/05/2009 | US7527987 Fast localization of electrical failures on an integrated circuit system and method |
| 05/05/2009 | CA2472548C Solar panel having visual indicator |
| 04/30/2009 | WO2009054670A1 Method of manufacturing an inspection apparatus for inspecting an electronic device |
| 04/30/2009 | WO2009024851A3 Multi-site probe |
| 04/30/2009 | US20090108865 Method and apparatus for array-based electrical device characterization |
| 04/30/2009 | US20090108860 Versatile materials probe |
| 04/29/2009 | EP2052276A1 Oscilloscope probe |
| 04/29/2009 | EP2052264A1 Oscilloscope probe |
| 04/29/2009 | EP2052263A1 Oscilloscope probe |
| 04/29/2009 | CN201230117Y 电连接器 The electrical connector |
| 04/29/2009 | CN201229391Y Circuit board comprising removable gagging point part and test system |
| 04/29/2009 | CN201229360Y Battery cap essential resistance testing jig |
| 04/29/2009 | CN201229359Y Low-power consumption battery electric supply instrument outer casing structure |
| 04/29/2009 | CN201229358Y Casing structure of automatic instrument and meter box |
| 04/29/2009 | CN201229357Y Improved pointer type antivibration electric meter |
| 04/29/2009 | CN101421630A Method for manufacturing probe sheet |
| 04/29/2009 | CN101421629A Probe sheet and electrically connecting apparatus |
| 04/29/2009 | CN101419478A Fiducial reference source circuit with gap and design method |
| 04/29/2009 | CN101419246A Digital multimeter having hinged shield arrangement |
| 04/29/2009 | CN101419245A Digital audio signal standard test source |
| 04/29/2009 | CN101419244A Contact and electric connecting device using the same |
| 04/29/2009 | CN100483145C Method and appts. of adaptor for face bond of tester and tested device |
| 04/29/2009 | CN100483142C Apparatus and method for electromechanical testing and validation of probe cards |
| 04/28/2009 | US7526747 Inspection method and inspection system using charged particle beam |
| 04/28/2009 | US7525328 Cap at resistors of electrical test probe |
| 04/28/2009 | US7524697 Method for manufactuing a semiconductor integrated circuit device |
| 04/28/2009 | US7524194 Lithographic type microelectronic spring structures with improved contours |
| 04/23/2009 | WO2009049946A1 Determination of the internal resistance and connection resistance of a battery |
| 04/23/2009 | US20090102498 Laser Targeting Mechanism |
| 04/23/2009 | US20090102495 Vertical guided probe array providing sideways scrub motion |
| 04/23/2009 | US20090102457 Automated Test Equipment Interface |
| 04/23/2009 | US20090102451 Method and structure for variable pitch microwave probe assembly |
| 04/22/2009 | EP2051088A1 Determination of the internal and ferrule resistance of a battery |
| 04/22/2009 | EP1442307B1 System for compensating thermally induced motion of probe cards |
| 04/22/2009 | CN101414569A Method and structure for manufacturing conductive film, and probe card with the conductive film |
| 04/22/2009 | CN101413978A Semiconductor encapsulation component test device |
| 04/22/2009 | CN101413977A High voltage measuring apparatus and operating method thereof |
| 04/22/2009 | CN101413964A Analog wire laying method facing to integrated circuit digital-analog mixing test adapter |
| 04/22/2009 | CN100480717C Apparatus for measuring clock signal generation |
| 04/22/2009 | CN100480714C Shielded probe apparatus for probing semiconductor water |
| 04/21/2009 | US7523010 Automated circuit board test actuator system |
| 04/21/2009 | US7522662 Electronic device including image forming apparatus |
| 04/21/2009 | US7521947 Probe needle protection method for high current probe testing of power devices |
| 04/21/2009 | US7521917 Method and apparatus for testing material integrity |
| 04/21/2009 | US7521916 Apparatus for the detection of a current and method for operating such an apparatus |
| 04/16/2009 | WO2009047846A1 Display panel and lighting tester |
| 04/16/2009 | WO2009047836A1 Probe card, inspecting apparatus and inspecting method |
| 04/16/2009 | WO2009047160A2 Full raster cartridge for a parallel tester for testing an unpopulated printed circuit board, spring contact pin for such a full raster cartridge and adapter for testing an unpopulated printed circuit board |
| 04/16/2009 | WO2009009420A3 Low glitch offset correction circuit for auto-zero sensor amplifiers and method |
| 04/16/2009 | WO2008137182A3 Cradle and cable handler for a test head manipulator |