| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 06/11/2009 | WO2009071156A1 Probe with highly precise direct current measurement |
| 06/11/2009 | US20090146673 Manufacturing method of probe card and the probe card |
| 06/11/2009 | US20090146672 Double Ended Contact Probe |
| 06/11/2009 | US20090146662 Multi-channel measuring apparatus for connection to a fuel cell stack |
| 06/11/2009 | US20090146644 Electric meter having a detachable measuring bar |
| 06/11/2009 | US20090146641 Electronic tamper detection circuit for an electricity meter |
| 06/11/2009 | US20090144971 Probe card |
| 06/10/2009 | EP2068402A1 A device for measuring the current of a battery on board of a motor-vehicle and a method for assembling the device |
| 06/10/2009 | EP2068156A2 Probe head with waveguide with concentrated damping |
| 06/10/2009 | EP1390766B1 14/42-volt automotive circuit tester |
| 06/10/2009 | DE102008009962A1 Tastkopf mit hochgenauer Gleichspannungsmessung Probe with high precision DC voltage measurement |
| 06/10/2009 | DE102008009961A1 Probe head comprises waveguide, which has strip conductor, which has multiple centered ohmic resistances that are divided in fixed distances over length of strip conductor |
| 06/10/2009 | CN201255746Y Digital sine wave control system for high-voltage test electric power |
| 06/10/2009 | CN201255745Y Medium test board |
| 06/10/2009 | CN101454677A Mini-prober for tft-lcd testing |
| 06/10/2009 | CN101454676A Conductive contact holder |
| 06/10/2009 | CN101452011A Probe card and circuit board |
| 06/10/2009 | CN101452010A Probe card for testing chip and test method thereof |
| 06/10/2009 | CN101452009A Probe card for implementing silicon wafer grade test of HALL chip and test method |
| 06/10/2009 | CN100498346C Transient high-current signal generator |
| 06/10/2009 | CN100498345C Method for manufacturing probe card |
| 06/10/2009 | CN100498344C Universal system for testing different semiconductor device |
| 06/09/2009 | US7545157 Shielded probe apparatus for probing semiconductor wafer |
| 06/09/2009 | US7545138 Precision, temperature-compensated, shielded current measurement device |
| 06/09/2009 | US7545137 Current detecting circuit |
| 06/04/2009 | WO2009069500A1 Probe pin |
| 06/04/2009 | WO2009069440A1 Probe device |
| 06/04/2009 | WO2009069439A1 Probe card |
| 06/04/2009 | US20090140760 Probe card |
| 06/04/2009 | US20090140701 Auto-Averaging RC Time Constant Calibration |
| 06/04/2009 | US20090139965 Probe array and method of its manufacture |
| 06/04/2009 | DE202009003966U1 Messspitzen Measuring tips |
| 06/03/2009 | EP1348132B1 Electrical resistance for the measurement of preferably high frequency alternating currents |
| 06/03/2009 | CN201251588Y 载具 Vehicle |
| 06/03/2009 | CN201251587Y Push-pull type test backing plate |
| 06/03/2009 | CN101449173A Multi-channel signal acquisition probe |
| 06/03/2009 | CN101449172A A detection device for a switch cabinet with an input terminal module |
| 06/03/2009 | CN101446598A Variable-cross-section current lead wire |
| 06/03/2009 | CN101446597A Conductivity test jig, conductivity test apparatus having conductivity test jig, and a method of testing conductivity |
| 06/03/2009 | CN101446596A Conical connecting terminal of electric energy meter |
| 06/03/2009 | CN101446595A Sample rack for measuring critical current properties of high-temperature superconducting tape |
| 06/03/2009 | CN101446594A Polarity-changing tower for changing polarity of UHVDC test section lead |
| 06/03/2009 | CN100495824C Anisotropic conductive film and method for producing the same |
| 06/03/2009 | CN100495040C Counter balanced vertical docking motion in a driven vertical axis test head manipulator |
| 06/03/2009 | CN100495039C Method for processing tungsten needle of probe card for testing crystal wafer |
| 06/02/2009 | US7541824 Forced air cooling of components on a probecard |
| 06/02/2009 | US7541823 Circuit board checker and circuit board checking method |
| 06/02/2009 | US7541821 Membrane probing system with local contact scrub |
| 06/02/2009 | US7541202 Connection device and test system |
| 05/28/2009 | WO2009067271A1 Voltage source measurement unit with minimized common mode errors |
| 05/28/2009 | US20090136235 Probe card with optical transmitting unit and memory tester having the same |
| 05/28/2009 | US20090134898 Coaxial Spring Probe Grounding Method |
| 05/28/2009 | US20090134895 High performance probe system |
| 05/27/2009 | EP2063466A2 Interconnection element and method of fabrication thereof |
| 05/27/2009 | CN201247305Y Device for generating oscillating wave for electrical equipment experiment |
| 05/27/2009 | CN201247304Y Experimental clamper for dielectric strength between commutator segments |
| 05/27/2009 | CN201247266Y High-/low-voltage isolation device |
| 05/27/2009 | CN201247265Y Device for generating voltage signal |
| 05/27/2009 | CN201247264Y Neon-electroscope probe |
| 05/27/2009 | CN201247263Y 可调式探针座 Adjustable probe holder |
| 05/27/2009 | CN201247262Y Test fixture |
| 05/27/2009 | CN201247261Y Drawer type veneer clamper |
| 05/27/2009 | CN201247260Y External frame of electric meter |
| 05/27/2009 | CN201247259Y Lifting device for flexible circuit board |
| 05/27/2009 | CN201247258Y Clamping device |
| 05/27/2009 | CN201247257Y Clamper |
| 05/27/2009 | CN201247256Y Wire connector for experiment instrument of microcomputer self-mutually-casting device |
| 05/27/2009 | CN201247255Y Base frame of electric meter |
| 05/27/2009 | CN101443669A Substrate inspecting jig, and electrode structure of connecting electrode unit in the jig |
| 05/27/2009 | CN101441897A Probe card with optical transmitting unit and memory tester having the same |
| 05/27/2009 | CN101441625A Probe card tester in silicon wafer characteristic test and method for counting use amount of probe card |
| 05/27/2009 | CN101441591A Detection device, system and method |
| 05/27/2009 | CN101441228A Monolithic integrated ring oscillator and frequency divider circuit and processing method thereof |
| 05/27/2009 | CN101441227A Self-adapting contact probe set of multiple-set measurement |
| 05/27/2009 | CN101441226A Testing jig and test method |
| 05/27/2009 | CN101441225A Thimble ejecting mechanism and high precision moving component including the same |
| 05/27/2009 | CN100492043C Testing method and tester for semiconductor integrated circuit device comprising high-speed input/output element |
| 05/27/2009 | CN100492040C Wafer-level burn-in and test cartridge |
| 05/27/2009 | CN100492038C Chip-mounting tape inspecting method and test unit used for inspection |
| 05/27/2009 | CN100492021C Positioning unit for probe device |
| 05/27/2009 | CN100492020C Needle-like member, conductive contact, and conductive contact unit |
| 05/27/2009 | CN100492019C Probe card electrical contacting device |
| 05/27/2009 | CN100492018C Universal measuring adapter system |
| 05/27/2009 | CN100492017C Method for producing batch vertical probe clasp micro-hole guide plate |
| 05/27/2009 | CA2644395A1 Electricity meter capable of minimizing the risk of data destruction from lightning or surge |
| 05/26/2009 | US7538565 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/26/2009 | CA2370020C Expandable intelligent electronic device |
| 05/22/2009 | WO2009062696A2 Apparatus for the contact-connection of circuits |
| 05/21/2009 | US20090128181 Driver circuit and test apparatus |
| 05/21/2009 | US20090128180 Cantilever-Type Probe and Method of Fabricating the Same |
| 05/21/2009 | US20090128176 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/21/2009 | US20090128175 Probe unit substrate |
| 05/21/2009 | US20090128174 Probe card using thermoplastic resin |
| 05/20/2009 | EP2060922A1 Microstructure testing head |
| 05/20/2009 | EP2060921A1 Contact probe for testing head having vertical probes and related testing head for testing microstructure electric performance |
| 05/20/2009 | CN201243343Y Connecting lever veneer clamper |
| 05/20/2009 | CN201242589Y Detection device for self-holding automatic detection machine of mobile phone battery build-in parameter |
| 05/20/2009 | CN201242552Y Connection device for testing signal of RF coaxial connector |
| 05/20/2009 | CN101438177A Method and apparatus for probing |
| 05/20/2009 | CN101438174A Input by-pass circuit for a current probe |