| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 07/09/2009 | WO2009086348A1 Mechanical packaging apparatus and methods for an electrical energy meter |
| 07/09/2009 | WO2009084906A2 The proble pin composed in one body and the method of making it |
| 07/09/2009 | WO2009084770A1 Contact tip structure of a connecting element |
| 07/09/2009 | WO2009084547A1 Probe card |
| 07/09/2009 | WO2009084173A1 Probe pin |
| 07/09/2009 | WO2009042679A3 Stiffener assembly for use with testing devices |
| 07/09/2009 | US20090177420 Detection, localization and interpretation of partial discharge |
| 07/09/2009 | US20090176027 metal structure and fabrication method thereof |
| 07/09/2009 | US20090174394 Electrical test lead with a replaceable inline fuse |
| 07/09/2009 | US20090173861 Levitation type support unit |
| 07/09/2009 | US20090173476 Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis |
| 07/09/2009 | CA2710759A1 Mechanical packaging apparatus and methods for an electrical energy meter |
| 07/08/2009 | EP1828786B1 Device for measuring a current flowing in a cable |
| 07/08/2009 | CN201269890Y Assembling rack |
| 07/08/2009 | CN201269889Y Assembling type indicating and recording electric measuring meter |
| 07/08/2009 | CN201269888Y Tool for printed circuit board assembling test |
| 07/08/2009 | CN201269887Y Conductive wire replacing system for corona cage |
| 07/08/2009 | CN201269886Y Extra-high voltage corona cage for researching corona characteristic of conductive wire |
| 07/08/2009 | CN201269885Y Polarity changing tower for changing polarity of extra-high voltage DC experiment linear conductive wire |
| 07/08/2009 | CN101479610A Finger tester for testing unpopulated printed circuit boards and method for testing unpopulated printed circuit boards using a finger tester |
| 07/08/2009 | CN100511853C Small array contact with precision working range |
| 07/08/2009 | CN100510756C Cantalever type probe card in high frequency |
| 07/08/2009 | CN100510755C Contact probe for a testing head and a method used for realizing contact probe |
| 07/07/2009 | US7557596 Test assembly including a test die for testing a semiconductor product die |
| 07/07/2009 | US7557593 Probe for electrical test and probe assembly |
| 07/07/2009 | US7555958 Physical quantity detector |
| 07/07/2009 | US7555836 Method of making lithographic contact elements |
| 07/02/2009 | WO2009080760A1 Improved probe card for testing integrated circuits |
| 07/02/2009 | US20090168307 Mechanical packaging apparatus and methods for an electrical energy meter |
| 07/02/2009 | US20090167334 Controlled Impedance Structures for High Density Interconnections |
| 07/02/2009 | US20090167332 Electrical probe |
| 07/02/2009 | US20090167293 differential probe device for measuring electrical differential signals and methods for measuring signals using a differential probe device |
| 07/01/2009 | CN201266207Y Battery clamp with support base frame |
| 07/01/2009 | CN201266206Y Battery clamp |
| 07/01/2009 | CN201266205Y Fixing clamp |
| 07/01/2009 | CN201266204Y Pulling device and detection device for detecting flexible circuit board |
| 07/01/2009 | CN101470136A Production method of probe card |
| 07/01/2009 | CN101470135A Probe testing device |
| 07/01/2009 | CN101470134A Switching plate |
| 07/01/2009 | CN101470133A Fixture |
| 07/01/2009 | CN100507578C Manufacturing method of wafer level testing circuit board and structure thereof |
| 07/01/2009 | CN100507577C Probe device of probe card |
| 07/01/2009 | CN100507576C Clamp in use for testing LED |
| 07/01/2009 | CN100507575C Test fixture for clamping signal terminal and its assembling method |
| 07/01/2009 | CN100507574C Probe card capable of transmitting differential signal pairs |
| 06/30/2009 | US7554323 Direct facility water test head cooling architecture |
| 06/30/2009 | US7554321 Counter balanced vertical docking motion in a driven vertical axis test head manipulator |
| 06/30/2009 | US7553165 Spring interconnect structures |
| 06/25/2009 | WO2009047160A3 Full raster cartridge for a parallel tester for testing an unpopulated printed circuit board, spring contact pin for such a full raster cartridge and adapter for testing an unpopulated printed circuit board |
| 06/25/2009 | US20090160473 Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor |
| 06/25/2009 | US20090160465 Determination of equivalent series resistance |
| 06/25/2009 | US20090160451 Scan tool for electronic battery tester |
| 06/24/2009 | EP2073030A1 Sensor arrangement and diagnosis procedure for detecting the status of a battery in a motor vehicle |
| 06/24/2009 | EP2073029A1 Sensor arrangement for detecting the status of a battery |
| 06/24/2009 | CN201262631Y Density converting device for PCB micro-needle test |
| 06/24/2009 | CN101467051A Probe card |
| 06/24/2009 | CN101464474A Semiconductor measuring probe bench with rotatable probe card |
| 06/24/2009 | CN101464473A Electric voltage exception protection device used for circuit board test |
| 06/24/2009 | CN100505199C Contactor block and apparatus for electrical connection |
| 06/24/2009 | CN100504399C Contact unit and inspection system using it |
| 06/24/2009 | CN100504398C Method for treating surface of probe installed on testing card |
| 06/23/2009 | US7550984 Probe station with low noise characteristics |
| 06/23/2009 | US7550983 Membrane probing system with local contact scrub |
| 06/23/2009 | US7550982 Semiconductor device test method for comparing a first area with a second area |
| 06/23/2009 | US7550962 Wide bandwidth attenuator input circuit for a measurement probe |
| 06/18/2009 | WO2009075665A2 Dry side sensor mounting for sensor chip assembly |
| 06/18/2009 | WO2009075220A1 Probe card |
| 06/18/2009 | WO2009075041A1 Electrical connecting apparatus and contactor used for the electrical conneccting apparatus |
| 06/18/2009 | WO2004049897A3 Portable body for diagnostic equipment |
| 06/18/2009 | US20090153165 High Density Interconnect System Having Rapid Fabrication Cycle |
| 06/18/2009 | US20090153164 Contactor Assembly for Integrated Circuit Testing |
| 06/18/2009 | US20090153162 Sharing conversion board for testing chips |
| 06/18/2009 | US20090153161 Probe Holder and Probe Unit |
| 06/18/2009 | US20090153160 Circuit board test clamp |
| 06/18/2009 | US20090153159 Probing Adapter for a Signal Acquisition Probe |
| 06/17/2009 | EP2071680A1 Socket, module board, and inspection system using the module board |
| 06/17/2009 | EP2069813A2 Method and device for characterising an electric signal propagating through a sample |
| 06/17/2009 | EP2069808A2 Single support structure probe group with staggered mounting pattern |
| 06/17/2009 | EP2069807A2 Attachment of an electrical element to an electronic device using a conductive material |
| 06/17/2009 | EP1982198B1 Test system for a circuit carrier |
| 06/17/2009 | CN201259508Y Pressure adjustable compression test clamp |
| 06/17/2009 | CN201259507Y Test device |
| 06/17/2009 | CN101458266A Voltage source for high voltage dc transmission thyristor valve performance test |
| 06/17/2009 | CN101458265A Power supply device for test |
| 06/17/2009 | CN101458264A Signal shielded box with multilayer movable cover |
| 06/17/2009 | CN100501416C Device for measuring the electrical current |
| 06/17/2009 | CN100501413C Integrated circuit detector and preparation method thereof |
| 06/17/2009 | CN100501412C Probe parts and its production |
| 06/17/2009 | CN100501411C Test system for electric components |
| 06/16/2009 | US7548082 Inspection probe |
| 06/16/2009 | US7548076 Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses |
| 06/16/2009 | US7548055 Testing an electronic device using test data from a plurality of testers |
| 06/16/2009 | US7547997 Aircraft electrical servicing adapter |
| 06/16/2009 | US7547996 Power supply system for computer |
| 06/16/2009 | US7547850 Semiconductor device assemblies with compliant spring contact structures |
| 06/11/2009 | WO2009072864A1 Eco contactor |
| 06/11/2009 | WO2009072863A1 Air gap contactor |
| 06/11/2009 | WO2009072368A1 Probe |
| 06/11/2009 | WO2009072341A1 Probe apparatus |
| 06/11/2009 | WO2009071390A2 Method for producing a magnetic field sensor and sensor produced according to said method |