| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 08/13/2009 | WO2009097645A1 Degradation sensor |
| 08/13/2009 | WO2009071390A3 Method for producing a magnetic field sensor and sensor produced according to said method |
| 08/13/2009 | US20090201038 Test head for functional wafer level testing, system and method therefor |
| 08/12/2009 | EP2088443A1 Contact probe for a testing head having vertical probes with improved scrub movement |
| 08/12/2009 | EP2088441A1 Holding member for inspection, inspecting device, and inspecting method |
| 08/12/2009 | EP2088437A1 Energy Meter with Power Quality Monitoring and Diagnostic Systems |
| 08/12/2009 | EP1611445B1 An apparatus for measuring an a.c. current in a cable |
| 08/12/2009 | EP1556707A4 Contact probe with off-centered back-drilled aperture |
| 08/12/2009 | CN201289915Y Secondary circuit pressure-drop measuring access kit of voltage transformator |
| 08/12/2009 | CN201289497Y Non-contact type probe |
| 08/12/2009 | CN201289496Y Test device for formwork |
| 08/12/2009 | CN201289495Y Adapter for test card |
| 08/12/2009 | CN101506666A Conductive contactor and conductive contactor unit |
| 08/12/2009 | CN101506665A Conductive contactor unit |
| 08/12/2009 | CN101504428A Electronic measurement method and multifunctional electronic measuring instrument |
| 08/12/2009 | CN101504427A Automatic testing turnplate for electronic component |
| 08/12/2009 | CN100526901C Probe card for probing wafers with raised contact elements |
| 08/11/2009 | US7573281 Probe for inspecting one or more semiconductor chips |
| 08/11/2009 | US7573255 Meter |
| 08/06/2009 | WO2009096318A1 Probe unit |
| 08/06/2009 | WO2009095389A1 Method and device for transporting electronic modules |
| 08/06/2009 | DE10260697B4 Antennensystem mit Parallelverlagerungs-/Neigungs-Meßvorrichtung Antenna system with Parallelverlagerungs- / tilt measuring device |
| 08/05/2009 | EP1807708B1 Battery current sensor for a motor vehicle |
| 08/05/2009 | CN201285424Y Fast detaching type probe test apparatus |
| 08/05/2009 | CN201285416Y Dielectric property test platform for thin film sample |
| 08/05/2009 | CN201285408Y Enclosed multifunctional high pressure metering cabinet |
| 08/05/2009 | CN201285407Y Test wire clip for electrical apparatus |
| 08/05/2009 | CN201285406Y Thin holding structure for circuit board |
| 08/05/2009 | CN201285405Y Installation structure for electric measurement instrument |
| 08/05/2009 | CN201285404Y Flexible circuit board conducting apparatus |
| 08/05/2009 | CN101501512A Method of designing an application specific probe card test system |
| 08/05/2009 | CN101498762A Electrical measurement tool |
| 08/05/2009 | CN101498750A Method and system for determining real and imaginary components of an AC response |
| 08/05/2009 | CN101497173A Grinding apparatus, circuit board substrate test apparatus with grinding component and manufacturing method |
| 08/05/2009 | CN100523842C Double side probing of semiconductor devices |
| 08/05/2009 | CN100523826C Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 08/05/2009 | CN100523825C Non-contact type single side probe structure |
| 08/05/2009 | CN100523824C Detecting circuit arrangement and manufacturing method of liquid crystal display panel |
| 08/05/2009 | CN100523823C Testing electric clip |
| 08/05/2009 | CN100523822C Zero-setting device for electrical measuring instrument and method for raising air breakdown-resisting voltage value of electric measuring instrument |
| 08/04/2009 | US7570876 Method and system for loading substrate supports into a substrate holder |
| 08/04/2009 | US7570069 Resilient contact probes |
| 07/30/2009 | WO2009092694A1 Module for a parallel tester for testing of circuit boards |
| 07/30/2009 | US20090189288 Angled flying lead wire bonding process |
| 07/30/2009 | US20090189075 Inspection method and inspection system using charged particle beam |
| 07/30/2009 | US20090188120 Angle sensor circuit |
| 07/30/2009 | DE19860704B4 Verfahren zur Überprüfung zumindest eines Teils eines Halbleiterwafers mit einem Rasterelektronenmikroskop Method for checking at least a portion of a semiconductor wafer with a scanning electron microscope |
| 07/29/2009 | CN201281719Y Probe structure and test board with the same |
| 07/29/2009 | CN201281718Y PCB board up-down pull type testing clamp jig |
| 07/29/2009 | CN201281717Y Improved structure of integrated circuit test probe card |
| 07/29/2009 | CN201281716Y Circuit board structure of circuit test device |
| 07/29/2009 | CN101493476A Direct voltage generator |
| 07/29/2009 | CN101493475A Material feeding gas rail |
| 07/29/2009 | CN101493474A Modular program assembly for IC element detecting machine |
| 07/29/2009 | CN100521134C Reliability evaluation test apparatus, system and method |
| 07/29/2009 | CN100520426C Insert, tray, and electronic component handling device for electronic component-handling device |
| 07/29/2009 | CN100520415C Probe card |
| 07/29/2009 | CN100520414C Contact pin and probe card |
| 07/23/2009 | WO2009090907A1 Probe card and method for manufacturing the same |
| 07/23/2009 | WO2004049897A9 Portable body for diagnostic equipment |
| 07/23/2009 | US20090184725 Probe card assembly with interposer probes |
| 07/23/2009 | US20090184720 Attachment apparatus, test head, and electronic device test system |
| 07/23/2009 | US20090184704 MTJ sensor including domain stable free layer |
| 07/22/2009 | CN201277984Y Intelligent pulse generator |
| 07/22/2009 | CN201277983Y Pressing lifting integrated manual veneer fixture |
| 07/22/2009 | CN201277982Y Combined wiring terminal |
| 07/22/2009 | CN201277981Y Brush rack apparatus for measuring excitation voltage |
| 07/22/2009 | CN201277980Y Resistor test adaptor for inner cone casing loop |
| 07/22/2009 | CN201277979Y Flange propeller |
| 07/22/2009 | CN101487853A High-speed test device |
| 07/22/2009 | CN101487852A Detachable probing tip system for a measurement probing system |
| 07/22/2009 | CN101487851A Test probe apparatus |
| 07/22/2009 | CN100516889C Internal reference voltage generation for integrated circuit testing |
| 07/22/2009 | CN100516888C Probe card, test pad and protection structure |
| 07/22/2009 | CN100516887C Probe apparatus manufacturing method |
| 07/22/2009 | CN100516886C Probe of probe card and its manufacturing method |
| 07/22/2009 | CN100516885C Elastic micro-contact element and manufacturing method thereof |
| 07/22/2009 | CN100516884C Micro-hole guide with reinforcing structure |
| 07/21/2009 | US7563487 laminating a porous film made of polytetrafluoroethylene with elasticity suitable for elastic recovery and used as a base film, adhering conductive metal by electroless plating at plural positions of the base film; use in the burn-in test of semiconductor devices |
| 07/16/2009 | US20090179659 Closed-grid bus architecture for wafer interconnect structure |
| 07/16/2009 | US20090179657 Printed circuit board for coupling probes to a tester, and apparatus and test system using same |
| 07/16/2009 | US20090179651 Photovoltaic cell solar simulator |
| 07/16/2009 | US20090179631 Device for detecting voltage disturbance |
| 07/16/2009 | US20090178277 Method of constructing a membrane probe using a depression |
| 07/16/2009 | DE10004806B4 Elektrischer Zähler-, Verteiler- und Wandlerschrank Electric meter, distributor and converter cabinet |
| 07/15/2009 | EP2078964A1 Connector contact, IC test socket and method |
| 07/15/2009 | EP2078963A1 Measuring device, in particular testing device and/or multimeter |
| 07/15/2009 | EP2078208A2 Tamper respondent sensor and enclosure |
| 07/15/2009 | CN201273915Y Multi-pulse generator for testing electric cable failure |
| 07/15/2009 | CN201273914Y Circuit board rack |
| 07/15/2009 | CN201273913Y 夹具 Fixture |
| 07/15/2009 | CN201273912Y Detecting and protecting mechanism for live system |
| 07/15/2009 | CN101482577A Elastic projection pin measuring seat and manufacturing method thereof |
| 07/15/2009 | CN101482576A Auxiliary disassembling apparatus of probe seat and its jig |
| 07/15/2009 | CN100514751C Device probing using a matching device |
| 07/14/2009 | US7560943 Alignment features in a probing device |
| 07/14/2009 | US7560942 Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus |
| 07/14/2009 | US7560941 Method and system for compensating thermally induced motion of probe cards |
| 07/14/2009 | US7560801 Rewiring substrate strip with several semiconductor component positions |
| 07/14/2009 | US7559139 Method for manufacturing a probe unit |