| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 09/09/2009 | CN201307124Y Connecting structure for reducing phase change of 35kV transformer in action waveform test |
| 09/09/2009 | CN101526577A Connector detection tool |
| 09/09/2009 | CN101526555A Method for manufacturing probe |
| 09/09/2009 | CN101526554A Dielectric window for measuring gas-insulated combined electrical apparatus partial-discharge ultrahigh-frequency signal |
| 09/09/2009 | CN101526553A Probe card |
| 09/09/2009 | CN101526403A Measurement device for temperature and current of high voltage line |
| 09/09/2009 | CN100539304C Anisotropic conductive connector and its production method, and circuit device test instrument |
| 09/09/2009 | CN100539061C Probe apparatus, wafer-inspecting apparatus provided with the probe apparatus, and the wafer-inspecting method |
| 09/09/2009 | CN100538370C Multi-band amplifier for test and measurement instruments |
| 09/09/2009 | CN100538369C Method of making a socket to perform testing on integrated circuits and such a socket |
| 09/09/2009 | CN100538368C Work measurement apparatus |
| 09/09/2009 | CN100538367C Self-powered power bus sensor employing wireless communication |
| 09/08/2009 | US7586317 Inspection apparatus, probe card and inspection method |
| 09/08/2009 | US7586300 Isolation buffers with controlled equal time delays |
| 09/08/2009 | US7585548 compound probe pins arranged in substrate layer; bundle of aligned parallel nanotubes/nanorods and a bonding material |
| 09/08/2009 | CA2521449C Combination hand tool and electrical testing device |
| 09/03/2009 | WO2009107747A1 Wiring board and probe card |
| 09/03/2009 | WO2009107558A1 Probe inspecting method and curable resin composition |
| 09/03/2009 | WO2009107289A1 Iridium alloy excellent in hardness, processability and stain proofness |
| 09/03/2009 | US20090219047 probe for testing electrical properties of a test sample |
| 09/03/2009 | US20090219043 Probe Card |
| 09/03/2009 | US20090219042 Probe card |
| 09/03/2009 | US20090219010 Calibrating signals by time adjustment |
| 09/02/2009 | EP2096775A2 Device for contacting a T/R module with a test device |
| 09/02/2009 | EP2095134A2 Method and apparatus for sample extraction and handling |
| 09/02/2009 | CN201302583Y Vertical probe card provided with reinforcing device |
| 09/02/2009 | CN201302582Y A suspension arm probe card with protection mechanism |
| 09/02/2009 | CN201302581Y Probe device |
| 09/02/2009 | CN201302580Y Feeler lever for detecting the null of an insulator |
| 09/02/2009 | CN201302579Y Battery delivery device and battery electricity testing machine with same |
| 09/02/2009 | CN101523231A Electrical connection device |
| 09/02/2009 | CN101520501A Probe card inclination adjusting method and inclination detecting method |
| 09/02/2009 | CN101520487A Electrical measurement fixture |
| 09/02/2009 | CN101520486A Integrated circuit detecting card with supporting structure for strengthening probe |
| 09/02/2009 | CN101520470A Probe card, manufacturing method of probe card, semiconductor inspection apparatus and manufacturing method of semiconductor device |
| 09/02/2009 | CN101520469A Protective device for motor testing process |
| 09/02/2009 | CN100535668C High frequency probe card |
| 09/02/2009 | CN100535667C Tool used for loading and unloading wafer module group |
| 09/01/2009 | US7583100 Test head for testing electrical components |
| 08/29/2009 | CA2623257A1 Method and apparatus for interrogating an electronic component |
| 08/27/2009 | WO2009105497A2 Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies |
| 08/27/2009 | WO2009105222A2 Test system with high frequency interposer |
| 08/27/2009 | WO2009105181A1 Adjustable electrical probes for circuit breaker tester |
| 08/27/2009 | WO2009104589A1 Method for manufacturing probe supporting plate, computer storage medium and probe supporting plate |
| 08/27/2009 | US20090212807 Probe of cantilever probe card |
| 08/27/2009 | US20090212805 Probe of vertical probe card |
| 08/27/2009 | US20090212801 Method of making high-frequency probe, probe card using the high-frequency probe |
| 08/27/2009 | US20090212800 Electrical connecting apparatus |
| 08/27/2009 | US20090212798 Probe card, manufacturing method of probe card, semiconductor inspection apparatus and manufacturing method of semiconductor device |
| 08/27/2009 | US20090212797 Probe card |
| 08/27/2009 | US20090212795 Probe card with segmented substrate |
| 08/27/2009 | CA2715884A1 Adjustable electrical probes for circuit breaker tester |
| 08/26/2009 | EP2093576A1 Conductive contact holder, conductive contact unit and method for manufacturing conductive contact holder |
| 08/26/2009 | EP2092356A2 Probing apparatus with guarded signal traces |
| 08/26/2009 | EP2092350A2 Measuring device and measuring method for inspecting the surface of a substrate |
| 08/26/2009 | EP1932002B1 Probe with a changing device |
| 08/26/2009 | EP1651948B1 Scanning probe inspection apparatus |
| 08/26/2009 | CN201298064Y Mobile probe tester with pressure-adjusting function |
| 08/26/2009 | CN201298060Y Detachable insulating rope testing jig |
| 08/26/2009 | CN201298048Y A compressor electrical motor test clamp |
| 08/26/2009 | CN201298047Y Multifunctional inspection jig |
| 08/26/2009 | CN201298046Y A temporary encapsulation carrier for a bare chip |
| 08/26/2009 | CN101515030A Probe needle trace transfer member and probe apparatus |
| 08/26/2009 | CN101515017A Detection device of chip diode |
| 08/26/2009 | CN101515000A Method and device for improving measuring precision of current magnitude |
| 08/26/2009 | CN101514998A Probe device having a clip-on wireless system for extending probe tip functionality |
| 08/26/2009 | CN101514997A Probe device having a light source thereon |
| 08/26/2009 | CN100533702C Temperature monitoring system of testing classifying machine |
| 08/26/2009 | CN100533694C Intermetallic spring structure |
| 08/25/2009 | US7579857 Electrical contact device of probe card |
| 08/25/2009 | US7579855 Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby |
| 08/25/2009 | US7579847 Probe card cooling assembly with direct cooling of active electronic components |
| 08/25/2009 | US7579269 Microelectronic spring contact elements |
| 08/25/2009 | US7578057 Method of fabricating segmented contactor |
| 08/25/2009 | CA2509956C Probe for electric test |
| 08/20/2009 | WO2009102030A1 Probe unit |
| 08/20/2009 | WO2009102029A1 Contact probe and probe unit |
| 08/20/2009 | WO2009004647A3 Clamp meter with safe trigger mechanism |
| 08/20/2009 | US20090209053 Connection device and test system |
| 08/20/2009 | US20090206860 Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies |
| 08/20/2009 | US20090206859 Probe device having a light source thereon |
| 08/20/2009 | US20090206823 Multi-meter test lead probe for hands-free voltage measurement of control panel industrial terminal blocks |
| 08/19/2009 | EP2091173A1 Magnetic field sensitive probe for data scheme analysis |
| 08/19/2009 | EP2089730A2 Electrical contact arrangement |
| 08/19/2009 | EP1576378B1 Composite motion probing |
| 08/19/2009 | CN201293799Y Power supply line for test |
| 08/19/2009 | CN201293798Y Probe card for solar battery detection bench |
| 08/19/2009 | CN201293797Y Circuit element adsorption plant with impact unit and machine bench with the plant |
| 08/19/2009 | CN201293796Y Insulated draw rod with various angle |
| 08/19/2009 | CN201293795Y Solar component type test templet house capable of being replaced |
| 08/19/2009 | CN101512349A Sensor module, system, and method for sensors in proximity to circuit breakers |
| 08/19/2009 | CN101509939A AC line short circuit protection arrangement and detecting method |
| 08/19/2009 | CN101509938A Low voltage high-current harmonic generator based on resonance manner |
| 08/19/2009 | CN101509937A Probe unit and detection apparatus |
| 08/19/2009 | CN100530854C Test connector for temperature controller |
| 08/19/2009 | CN100529765C Reset device of test accesses terminal port of JTAG chain circuit used on board |
| 08/19/2009 | CN100529764C Attachable/detachable probing tip system for a measurement probing system |
| 08/19/2009 | CN100529763C Electrical detection facility |
| 08/19/2009 | CN100529762C Space convertor base plate, its forming method and contact pad structure |
| 08/13/2009 | WO2009099183A1 Probe needle and manufacturing method of the same |