Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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10/13/2009 | US7602169 Input cancellation circuit |
10/08/2009 | WO2009121394A1 Antenna arrangement and test method |
10/08/2009 | WO2009084906A3 The proble pin composed in one body and the method of making it |
10/08/2009 | US20090251162 Wireless Test Cassette |
10/07/2009 | EP2107386A2 Battery tester |
10/07/2009 | EP2107380A1 Testing head having vertical probes configured to improve the electric contact with a device to be tested |
10/07/2009 | CN201323357Y Conversion device of connector |
10/07/2009 | CN201323283Y 电连接器 The electrical connector |
10/07/2009 | CN201322762Y Assembly type instruction and record electrical measuring instrument |
10/07/2009 | CN201322761Y Supporting plate for probe cards |
10/07/2009 | CN201322760Y Holding device |
10/07/2009 | CN201322759Y Bare chip testing for discrete device and aging temporary encapsulation carrier |
10/07/2009 | CN201322758Y Antistatic carrier plate |
10/07/2009 | CN101551411A Simulative resistance circuit for device ageing screening lathe |
10/07/2009 | CN101551410A Electrical source for detecting electromagnetic valve quality of automobile |
10/07/2009 | CN101551409A Analogue filter circuit of arbitrary function waveform generating system of device aging screening machine |
10/07/2009 | CN101551408A Arbitrary waveform generation device of device ageing screening lathe |
10/07/2009 | CN101551407A Feedforward arithmetic of arbitrary function waveform generation for device ageing screening lathe |
10/07/2009 | CN101551406A Probe card |
10/07/2009 | CN101551405A Adjustable frame body |
10/07/2009 | CN101551231A Alignment method, tip position detecting device and probe apparatus |
10/07/2009 | CN100547407C Signal generating circuit of electric capacitance measurement |
10/07/2009 | CN100547406C Vertical type high frequency probe card |
10/07/2009 | CN100547405C Connection method for implementing common use of single and double density in PCB test |
10/07/2009 | CN100547404C Probe card clamp mechanism and probe apparatus |
10/06/2009 | US7598757 Double ended contact probe |
10/06/2009 | US7598744 Scan tool for electronic battery tester |
10/06/2009 | US7598743 Battery maintenance device having databus connection |
10/01/2009 | WO2009118850A1 Probe wafer, probe device, and testing system |
10/01/2009 | WO2009118533A1 Current measurement apparatus with shunt resistor and heat sink |
10/01/2009 | US20090243637 Measuring apparatus having nanotube probe |
10/01/2009 | US20090243593 Electrical metering device |
10/01/2009 | DE202009010265U1 Zangenstrommesser für die Messung des Stromverbrauchs von elektrischen Geräten Current probe for measuring the power consumption of electrical equipment |
10/01/2009 | CA2719236A1 Current measurement apparatus with shunt resistor and heat sink |
10/01/2009 | CA2660173A1 System and method for monitoring current in a conductor |
09/30/2009 | CN101546618A Composition of matter for composite plastic contact elements featuring controlled conduction pathways, and related manufacturing processes |
09/30/2009 | CN101545946A Jumper wire board for product reliability test board |
09/30/2009 | CN101545942A Circuit for testing connection gaskets |
09/30/2009 | CN101545927A Method for manufacturing probe card and device of probe card |
09/30/2009 | CN101545926A Probe testing device |
09/30/2009 | CN101545925A Split combined gas meter box |
09/30/2009 | CN101545924A Laptop support with adjustable height for SAR test |
09/30/2009 | CN101545923A Built-in local discharge sensor |
09/30/2009 | CN101545922A Detection cabinet provided with battery cabin |
09/30/2009 | CN100545666C Probe device capable of being used for plural kinds of testers |
09/30/2009 | CN100545660C Method for probing electronic element |
09/30/2009 | CN100545659C Test chip socket |
09/29/2009 | US7595632 Wafer probe station having environment control enclosure |
09/24/2009 | WO2009117264A2 Compensation tool for calibrating an electronic component testing machine to a standardized value |
09/24/2009 | WO2009035456A3 A forked probe for testing semiconductor devices |
09/24/2009 | WO2009033239A3 Electronic seal for energy meter assemblies |
09/24/2009 | US20090237100 Electronic Device Test Apparatus and Method of Mounting of Performance Board in Electronic Device Test Apparatus |
09/24/2009 | US20090237099 Probe card substrate with bonded via |
09/23/2009 | EP2102667A2 Module for a test device for testing circuit boards |
09/23/2009 | EP1399746B1 Image sensor utilizing a low fpn high gain capacitive transimpedance amplifier |
09/23/2009 | CN201314924Y Alternating current precision testing power supply |
09/23/2009 | CN201314923Y Short-circuit and grounding fault indicator |
09/23/2009 | CN201314922Y Mainboard fixing tool |
09/23/2009 | CN201314921Y Socket box used for relay testing |
09/23/2009 | CN201314920Y Electrical measuring instrument |
09/23/2009 | CN201314919Y Power box |
09/23/2009 | CN101540465A Chip carrier socket |
09/23/2009 | CN101540454A Electronic component connecting apparatus, electronic unit and electronic apparatus |
09/23/2009 | CN100543474C Holder for conductive contact |
09/23/2009 | CN100543473C Nonlinear resistor valve sheet for leakage detector and its preparation method |
09/22/2009 | US7593872 Method and system for designing a probe card |
09/22/2009 | US7592823 Electrical component handler having self-cleaning lower contact |
09/22/2009 | US7592796 Plate with an indicator for discerning among pre-identified probe holes in the plate |
09/22/2009 | US7592565 Probe positioning and bonding device and probe bonding method |
09/17/2009 | WO2009113486A1 Probe guard |
09/17/2009 | US20090230983 Socket for inspection |
09/17/2009 | US20090230981 Increasing thermal isolation of a probe card assembly |
09/16/2009 | EP2101181A1 Device including a contact detector |
09/16/2009 | CN201311435Y Directly connected in series high-voltage pulse generator for insulation detection |
09/16/2009 | CN201311434Y Electromagnetic reverberation room |
09/16/2009 | CN201311433Y Insulation bracket |
09/16/2009 | CN201311432Y Micro programmable single phase/three phase electrical measuring instrument |
09/16/2009 | CN101533038A Novel test socket |
09/16/2009 | CN101533037A Relay test connection device |
09/16/2009 | CN101533036A Probe supporting device |
09/16/2009 | CN100541206C Test equipment of semiconductor devices |
09/16/2009 | CN100541205C Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
09/15/2009 | US7589518 Wafer probe station having a skirting component |
09/15/2009 | US7589517 Adaptive slope compensation for switching regulators |
09/15/2009 | US7589515 Method for reducing temperature-dependent error in photocurrent sensor, and photocurrent sensor device |
09/11/2009 | WO2009110392A1 Probe card provided with contact units, and method of exchanging contact units |
09/11/2009 | WO2009062696A3 Apparatus for the contact-connection of circuits |
09/10/2009 | US20090224790 Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes |
09/10/2009 | US20090224788 Apparatus for detecting defect |
09/10/2009 | US20090224783 Membrane probing system with local contact scrub |
09/10/2009 | US20090224780 Wafer level test probe card |
09/10/2009 | DE112007002455T5 Elektrische Verbindungsvorrichtung Electrical connection device |
09/09/2009 | CN201307132Y Wire sealing device for voltage resistant experiment of switch cabinet |
09/09/2009 | CN201307131Y Test connecting-wire used in tests of DC resistance, action waveform and low-voltage impedance |
09/09/2009 | CN201307130Y Heavy current test wire clip |
09/09/2009 | CN201307129Y Single piece pneumatic compression joint test fixture |
09/09/2009 | CN201307128Y ICT pneumatic test fixture |
09/09/2009 | CN201307127Y Crystal measuring clamp |
09/09/2009 | CN201307126Y Test connecting device for circuit breaker of switch cabinet |
09/09/2009 | CN201307125Y Device for collecting short wire and grounding wire for high voltage test of power equipment |