Patents
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
10/2009
10/13/2009US7602169 Input cancellation circuit
10/08/2009WO2009121394A1 Antenna arrangement and test method
10/08/2009WO2009084906A3 The proble pin composed in one body and the method of making it
10/08/2009US20090251162 Wireless Test Cassette
10/07/2009EP2107386A2 Battery tester
10/07/2009EP2107380A1 Testing head having vertical probes configured to improve the electric contact with a device to be tested
10/07/2009CN201323357Y Conversion device of connector
10/07/2009CN201323283Y 电连接器 The electrical connector
10/07/2009CN201322762Y Assembly type instruction and record electrical measuring instrument
10/07/2009CN201322761Y Supporting plate for probe cards
10/07/2009CN201322760Y Holding device
10/07/2009CN201322759Y Bare chip testing for discrete device and aging temporary encapsulation carrier
10/07/2009CN201322758Y Antistatic carrier plate
10/07/2009CN101551411A Simulative resistance circuit for device ageing screening lathe
10/07/2009CN101551410A Electrical source for detecting electromagnetic valve quality of automobile
10/07/2009CN101551409A Analogue filter circuit of arbitrary function waveform generating system of device aging screening machine
10/07/2009CN101551408A Arbitrary waveform generation device of device ageing screening lathe
10/07/2009CN101551407A Feedforward arithmetic of arbitrary function waveform generation for device ageing screening lathe
10/07/2009CN101551406A Probe card
10/07/2009CN101551405A Adjustable frame body
10/07/2009CN101551231A Alignment method, tip position detecting device and probe apparatus
10/07/2009CN100547407C Signal generating circuit of electric capacitance measurement
10/07/2009CN100547406C Vertical type high frequency probe card
10/07/2009CN100547405C Connection method for implementing common use of single and double density in PCB test
10/07/2009CN100547404C Probe card clamp mechanism and probe apparatus
10/06/2009US7598757 Double ended contact probe
10/06/2009US7598744 Scan tool for electronic battery tester
10/06/2009US7598743 Battery maintenance device having databus connection
10/01/2009WO2009118850A1 Probe wafer, probe device, and testing system
10/01/2009WO2009118533A1 Current measurement apparatus with shunt resistor and heat sink
10/01/2009US20090243637 Measuring apparatus having nanotube probe
10/01/2009US20090243593 Electrical metering device
10/01/2009DE202009010265U1 Zangenstrommesser für die Messung des Stromverbrauchs von elektrischen Geräten Current probe for measuring the power consumption of electrical equipment
10/01/2009CA2719236A1 Current measurement apparatus with shunt resistor and heat sink
10/01/2009CA2660173A1 System and method for monitoring current in a conductor
09/2009
09/30/2009CN101546618A Composition of matter for composite plastic contact elements featuring controlled conduction pathways, and related manufacturing processes
09/30/2009CN101545946A Jumper wire board for product reliability test board
09/30/2009CN101545942A Circuit for testing connection gaskets
09/30/2009CN101545927A Method for manufacturing probe card and device of probe card
09/30/2009CN101545926A Probe testing device
09/30/2009CN101545925A Split combined gas meter box
09/30/2009CN101545924A Laptop support with adjustable height for SAR test
09/30/2009CN101545923A Built-in local discharge sensor
09/30/2009CN101545922A Detection cabinet provided with battery cabin
09/30/2009CN100545666C Probe device capable of being used for plural kinds of testers
09/30/2009CN100545660C Method for probing electronic element
09/30/2009CN100545659C Test chip socket
09/29/2009US7595632 Wafer probe station having environment control enclosure
09/24/2009WO2009117264A2 Compensation tool for calibrating an electronic component testing machine to a standardized value
09/24/2009WO2009035456A3 A forked probe for testing semiconductor devices
09/24/2009WO2009033239A3 Electronic seal for energy meter assemblies
09/24/2009US20090237100 Electronic Device Test Apparatus and Method of Mounting of Performance Board in Electronic Device Test Apparatus
09/24/2009US20090237099 Probe card substrate with bonded via
09/23/2009EP2102667A2 Module for a test device for testing circuit boards
09/23/2009EP1399746B1 Image sensor utilizing a low fpn high gain capacitive transimpedance amplifier
09/23/2009CN201314924Y Alternating current precision testing power supply
09/23/2009CN201314923Y Short-circuit and grounding fault indicator
09/23/2009CN201314922Y Mainboard fixing tool
09/23/2009CN201314921Y Socket box used for relay testing
09/23/2009CN201314920Y Electrical measuring instrument
09/23/2009CN201314919Y Power box
09/23/2009CN101540465A Chip carrier socket
09/23/2009CN101540454A Electronic component connecting apparatus, electronic unit and electronic apparatus
09/23/2009CN100543474C Holder for conductive contact
09/23/2009CN100543473C Nonlinear resistor valve sheet for leakage detector and its preparation method
09/22/2009US7593872 Method and system for designing a probe card
09/22/2009US7592823 Electrical component handler having self-cleaning lower contact
09/22/2009US7592796 Plate with an indicator for discerning among pre-identified probe holes in the plate
09/22/2009US7592565 Probe positioning and bonding device and probe bonding method
09/17/2009WO2009113486A1 Probe guard
09/17/2009US20090230983 Socket for inspection
09/17/2009US20090230981 Increasing thermal isolation of a probe card assembly
09/16/2009EP2101181A1 Device including a contact detector
09/16/2009CN201311435Y Directly connected in series high-voltage pulse generator for insulation detection
09/16/2009CN201311434Y Electromagnetic reverberation room
09/16/2009CN201311433Y Insulation bracket
09/16/2009CN201311432Y Micro programmable single phase/three phase electrical measuring instrument
09/16/2009CN101533038A Novel test socket
09/16/2009CN101533037A Relay test connection device
09/16/2009CN101533036A Probe supporting device
09/16/2009CN100541206C Test equipment of semiconductor devices
09/16/2009CN100541205C Probe assembly with multi-directional freedom of motion and mounting assembly therefor
09/15/2009US7589518 Wafer probe station having a skirting component
09/15/2009US7589517 Adaptive slope compensation for switching regulators
09/15/2009US7589515 Method for reducing temperature-dependent error in photocurrent sensor, and photocurrent sensor device
09/11/2009WO2009110392A1 Probe card provided with contact units, and method of exchanging contact units
09/11/2009WO2009062696A3 Apparatus for the contact-connection of circuits
09/10/2009US20090224790 Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes
09/10/2009US20090224788 Apparatus for detecting defect
09/10/2009US20090224783 Membrane probing system with local contact scrub
09/10/2009US20090224780 Wafer level test probe card
09/10/2009DE112007002455T5 Elektrische Verbindungsvorrichtung Electrical connection device
09/09/2009CN201307132Y Wire sealing device for voltage resistant experiment of switch cabinet
09/09/2009CN201307131Y Test connecting-wire used in tests of DC resistance, action waveform and low-voltage impedance
09/09/2009CN201307130Y Heavy current test wire clip
09/09/2009CN201307129Y Single piece pneumatic compression joint test fixture
09/09/2009CN201307128Y ICT pneumatic test fixture
09/09/2009CN201307127Y Crystal measuring clamp
09/09/2009CN201307126Y Test connecting device for circuit breaker of switch cabinet
09/09/2009CN201307125Y Device for collecting short wire and grounding wire for high voltage test of power equipment