Patents
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
11/2009
11/17/2009US7618281 Interconnect assemblies and methods
11/12/2009WO2009136707A2 Perpendicular fine-contact probe having a variable-stiffness structure
11/12/2009WO2009135452A1 Apparatus for contacting a t/r module with a test device
11/12/2009US20090278561 Probe card having redistributed wiring probe needle structure and probe card module using the same
11/12/2009US20090278558 Connecting device for electronic testing system
11/12/2009US20090278527 Precision ac current measurement shunts
11/12/2009DE202009010202U1 Messvorrichtung sowie Verkaufsset nebst Handgerät zur Bestimmung der elektrischen Spannung eines strömenden Fluids Measuring device as well as sales set together with hand-held device for determining the electrical voltage of a flowing fluid
11/11/2009EP2117081A1 Electric contact element for touch contacting electric test items and corresponding contact assembly
11/11/2009EP2115480A1 Test of electronic devices at package level using test boards without sockets
11/11/2009EP2115397A1 Utility monitoring device, system and method
11/11/2009CN201344974Y Automatic connection and test device for electric control or monitoring terminal and measuring instruments
11/11/2009CN201344956Y Variable ratio test instrument with high-low voltage reverse connection protecting function
11/11/2009CN201344940Y 探针 Probe
11/11/2009CN201344939Y Conductive seat used for testing motors
11/11/2009CN101577532A Source impedance stable network
11/11/2009CN101577393A Wafer socket and method for detecting horizontal positioning of wafer
11/11/2009CN101577378A Electric contact element for touch contacting electric test items and corresponding contact assembly
11/11/2009CN101576577A Ceramic capacitive sensor for on-line monitoring
11/11/2009CN101576576A Probe card assembly and medium devices used for same
11/11/2009CN101576575A Circuit board test fixture
11/11/2009CN101576574A Fixing tool
11/11/2009CN101576573A Plug device
11/11/2009CN101576572A Density conversion method and density conversion mechanism for PCB test machine
11/11/2009CN101576571A Density conversion method and density conversion device for PCB test machine
11/11/2009CN100559199C Inspection unit
11/11/2009CN100559196C Universal testing interface device and its universal testing system
11/10/2009US7616020 Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device
11/10/2009US7616017 Probe station thermal chuck with shielding for capacitive current
11/10/2009US7616016 Probe card assembly and kit
11/10/2009US7615987 Device for determining electrical variables
11/10/2009US7615985 Probe for measuring characteristics of an excitation current of a plasma, and associated plasma reactor
11/10/2009US7614298 Opaque aerosol container capacity indicator
11/06/2009CA2664571A1 Precision ac current measurement shunts
11/05/2009WO2009133663A1 Probe card
11/05/2009US20090273359 Electrical testing apparatus having masked sockets and associated systems and methods
11/05/2009US20090273358 Method and apparatus for enhanced probe card architecture
11/04/2009EP2113999A2 Phase current detection apparatus
11/04/2009CN201341011Y Detection wiring device of residual current action protector
11/04/2009CN201340434Y Test jig used in mounting type packaged semiconductor power device
11/04/2009CN201340433Y Test clamp for direct current motor
11/04/2009CN201340432Y Support for production, development and testing of universal electronic product
11/04/2009CN201340431Y Aging board used in mounting type packaged semiconductor power device
11/03/2009US7612628 Ultrafast sampler with coaxial transition
10/2009
10/29/2009WO2009131100A1 Probe card
10/29/2009WO2009130737A1 Substrate for inspection, method for manufacturing substrate for inspection, and inspection method using the substrate for inspection
10/29/2009US20090267792 Customer supported automatic meter reading method
10/29/2009US20090267629 Contact for interconnect system in a test socket
10/29/2009US20090267627 Method of expanding tester drive and measurement capability
10/29/2009US20090267625 Probe for testing a device under test
10/29/2009US20090267590 Method of enabling triggering an oscilloscope
10/29/2009US20090267582 Self-tuning digital current estimator for low-power switching converters
10/28/2009CN101568841A 中继连接器 Relay connector
10/28/2009CN101566667A MOS component testing method
10/28/2009CN101566650A Heat loss self-compensating terminal type water load microwave high power meter
10/28/2009CN100555594C Contactor having contact electrodes formed by laser processing
10/28/2009CN100554981C Electric power transformer insulated on-line monitoring sensor mounting device
10/22/2009WO2009128619A1 Silicon contactor including plate-type conductive particles
10/22/2009WO2009105497A3 Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies
10/22/2009US20090263986 Spring interconnect structures
10/22/2009US20090261851 Spring probe
10/22/2009US20090261850 Probe card
10/22/2009US20090261849 Low Force Interconnects For Probe Cards
10/22/2009US20090261815 Stimulus Responsive Nanoparticles
10/22/2009US20090261812 Current Sensing Assembly
10/21/2009EP2110673A1 Testing head having vertical probes provided with stopping means to avoid their upward and downward escape from respective guide holes
10/21/2009CN201331567Y Detecting device
10/21/2009CN201331545Y Electronic countermeasure equipment PCB plate test maintaining adapter
10/21/2009CN201331544Y Manual single-plate fixture
10/21/2009CN201331543Y General test clamp
10/21/2009CN201331542Y Device of double-manipulator conjunction synchronous operation
10/21/2009CN101563617A Conductive contact unit
10/21/2009CN101562303A Quick-speed plug connector assembly for testing
10/21/2009CN101562301A Electric connector with functions of locking, preventing misplug recognition and testing
10/21/2009CN101562300A Easily-tested misplug-proof locking electric connector
10/21/2009CN101562294A Easily-tested electric connector
10/21/2009CN101561452A Locating method
10/21/2009CN101561451A Spring-type test holder and a sorter with same
10/21/2009CN100552457C Ignition device for loop of high voltage electric appliance experiment
10/21/2009CN100552456C Microcomputer electric detecting probe fasten with multiple layer elasticity
10/21/2009CN100552455C Supporting device for measurement probe
10/21/2009CN100552454C Probe card transfer assist apparatus, and inspection equipment and method using same
10/20/2009US7605582 Modular interface
10/15/2009WO2009126964A1 Clamp with a non-linear biasing member
10/15/2009WO2009004647A4 Clamp meter with safe trigger mechanism
10/15/2009US20090256583 Vertical Microprobes for Contacting Electronic Components and Method for Making Such Probes
10/15/2009US20090255352 Detachable, quick disconnect system for nondestructive testing components
10/14/2009EP2108965A1 Orthogonal radio frequency voltage/current sensor with high dynamic range
10/14/2009CN201327927Y Simple connecting base
10/14/2009CN201327501Y Work fixture for testing optical-electric module
10/14/2009CN201327500Y Testing system capable of reducing transposition time
10/14/2009CN201327499Y Anti-retraction testing rod
10/14/2009CN201327498Y Adsorption device with a plurality of suction nozzles
10/14/2009CN201326659Y Quick dispatch shaft joint
10/14/2009CN101558317A Module for a test device for testing circuit boards
10/14/2009CN101557683A Multilayer circuit board
10/14/2009CN101556293A Intelligent high-pressure range switching device
10/14/2009CN101556292A User line checking meter
10/14/2009CN100550331C Spiral contactor manufacturing method
10/14/2009CN100549708C Device and method for inspection of circuit board
10/13/2009US7603658 Application functionality for a test tool for application programming interfaces