| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 12/09/2009 | CN201359614Y Testing probe needle |
| 12/09/2009 | CN201359613Y Test electrode jig of amorphous silicon solar battery |
| 12/09/2009 | CN201359612Y Wafer test carrier |
| 12/09/2009 | CN101599328A Standard resistor |
| 12/09/2009 | CN101598744A Connecting device of electrical signals |
| 12/09/2009 | CN101598743A Probe card |
| 12/09/2009 | CN101598742A Direct contact type probe card |
| 12/09/2009 | CN100568639C Test connector for mobile phone camera module group |
| 12/09/2009 | CN100567995C Socket for inspection apparatus |
| 12/09/2009 | CN100567994C On-line test attachment |
| 12/08/2009 | US7628645 Connector, printed circuit board, connecting device connecting them, and method of testing electronic part, using them |
| 12/08/2009 | US7628616 Connecting unit including contactor having superior electrical conductivity and resilience, and method for producing the same |
| 12/03/2009 | WO2009145416A1 Socket for testing semiconductor chip |
| 12/03/2009 | WO2009143760A1 Method and device for correcting and obtaining reference voltage |
| 12/03/2009 | WO2009072341A9 Probe apparatus |
| 12/03/2009 | US20090295416 Replaceable probe apparatus for probing semiconductor wafer |
| 12/03/2009 | US20090295389 Magnetic field probe and method for manufacturing the same |
| 12/03/2009 | US20090295372 Nanoscopic electrode molecular probes |
| 12/03/2009 | US20090295369 Current sensing circuit |
| 12/03/2009 | US20090294965 Method of Manufacturing A Semiconductor Device |
| 12/03/2009 | DE202009011899U1 110 GHz Messspitze 110 GHz probe tip |
| 12/03/2009 | DE102009000634A1 Sondeneinheit mit aufsteckbarem Funksystem zum Erweitern der Funktionalität einer Sondenspitze Probe assembly with clip-radio system to extend the functionality of a probe tip |
| 12/03/2009 | DE102009000633A1 Sondeneinheit mit darauf angebrachter Lichtquelle Probe unit with it fixed light source |
| 12/02/2009 | EP2128630A1 Probe card |
| 12/02/2009 | CN201355676Y Electric connector |
| 12/02/2009 | CN201355368Y Variable-frequency resonance power source for partial discharge test of extra-high voltage mutual inductor or transformer |
| 12/02/2009 | CN201355367Y Test probe |
| 12/02/2009 | CN201355366Y Connecting structure for measuring direct-current resistance of transformer |
| 12/02/2009 | CN201355365Y Electricity meter case |
| 12/02/2009 | CN101592682A Probe of cantilevel probe card |
| 12/02/2009 | CN101592681A Probe for testing fixture |
| 12/02/2009 | CN101592680A Connection device |
| 12/02/2009 | CN101592679A Vertical input channel protector of oscilloscope |
| 12/02/2009 | CN100566025C Connection device |
| 12/02/2009 | CN100565219C Strip type test method and function test device |
| 12/02/2009 | CN100565218C Integrated circuit test card |
| 12/02/2009 | CN100565217C Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same |
| 12/02/2009 | CN100565216C Inspection block |
| 12/02/2009 | CN100565215C High power digital varistor and testing method thereof |
| 12/02/2009 | CN100565214C Magnet-shunt meter core support |
| 12/01/2009 | US7626408 Electrical spring probe |
| 12/01/2009 | US7626379 Probe station having multiple enclosures |
| 12/01/2009 | US7626375 System and method for configuring a display for a digital multimeter |
| 12/01/2009 | US7625779 Method of manufacturing a semiconductor device including a semiconductor chip having an inclined surface |
| 11/26/2009 | WO2009141402A1 Method for manufacturing and testing an integrated electronic circuit |
| 11/26/2009 | US20090291573 Probe card assembly and kit, and methods of making same |
| 11/26/2009 | US20090289694 Current-Sensing Apparatus and Method for Current Sensing |
| 11/26/2009 | US20090289656 Dry-type high-voltage load system apparatus and method of preventing chain breaking and arc discharge for use therewith |
| 11/26/2009 | US20090289652 Pogo probe, probe socket, and probe card |
| 11/26/2009 | US20090289650 Probe card and method for selecting the same |
| 11/26/2009 | US20090289648 Coaxial four-point probe for low resistance measurements |
| 11/26/2009 | US20090289647 Interconnect system |
| 11/26/2009 | US20090289646 Test probe |
| 11/25/2009 | CN201352253Y Testing box for electrical protection tests |
| 11/25/2009 | CN201352250Y Discharge device for detecting cable fault based on secondary pulse process |
| 11/25/2009 | CN201352226Y PCB board test needle bed |
| 11/25/2009 | CN201352225Y Connecting needle for wired fixture |
| 11/25/2009 | CN201352224Y PCB soft board test clamp |
| 11/25/2009 | CN201352223Y PCB board test machine clamp |
| 11/25/2009 | CN201352222Y Test fixture for PCB test machine |
| 11/25/2009 | CN201352221Y Array convex block for detection |
| 11/25/2009 | CN101587850A Bearing structure and testing device |
| 11/25/2009 | CN101587172A Secondary battery testing system |
| 11/25/2009 | CN101587165A Wafer acceptance testing method, contact mat and probe card |
| 11/25/2009 | CN101587153A New relay protection checking apparatus |
| 11/25/2009 | CN101587139A Quick tracking arbitrary waveform generator in alternating current electronic load |
| 11/25/2009 | CN101587138A Control system of load box |
| 11/25/2009 | CN101587137A Container type super power load box |
| 11/25/2009 | CN101587136A Super power load box and resistance box unit |
| 11/25/2009 | CN101587135A General probe module |
| 11/25/2009 | CN101587134A Probe of vertical probe card |
| 11/25/2009 | CN101587133A Electric current testing terminal |
| 11/25/2009 | CN100562759C Vehicular combination switch testing jig |
| 11/25/2009 | CN100562751C Thin-film probe card |
| 11/24/2009 | US7622909 Magnetic field sensor and electrical current sensor therewith |
| 11/24/2009 | US7622028 Solution phase electrophoresis device, components, and methods |
| 11/24/2009 | US7621045 Method of producing a probe with a trapezoidal contactor |
| 11/24/2009 | CA2448325C 14/42-volt automotive circuit tester |
| 11/19/2009 | US20090286429 Microelectronic contact structures, and methods of making same |
| 11/19/2009 | US20090284275 Conductive film structure, fabrication method thereof, and conductive film type probe device for ic |
| 11/19/2009 | US20090284272 Probe device and method of regulating contact pressure between object to be inspected and probe |
| 11/19/2009 | US20090284250 Self calibrating current sensor |
| 11/18/2009 | EP2120243A1 Adapter for test plug |
| 11/18/2009 | EP2120054A2 Test holder for microchip |
| 11/18/2009 | EP2118671A1 Battery output housing comprising a shunt or measuring element |
| 11/18/2009 | CN201348656Y Electronic loading device for alternating current or direct current power supplies or generators |
| 11/18/2009 | CN201348646Y Contact type function testing device |
| 11/18/2009 | CN201348641Y Semiconductor test probe |
| 11/18/2009 | CN201348640Y Auxiliary device for cable insulation detection |
| 11/18/2009 | CN201348639Y Test circuit for testing fusing time of fuse |
| 11/18/2009 | CN201348638Y Manual test fixture with adjustable function |
| 11/18/2009 | CN101583880A Electrical connection device |
| 11/18/2009 | CN101583860A Optical device inspecting apparatus |
| 11/18/2009 | CN101581757A Test system and test method |
| 11/18/2009 | CN101581733A Probe apparatus and method for correcting contact position |
| 11/18/2009 | CN101581732A Test holder for microchip |
| 11/18/2009 | CN100561239C Automatic connecting tester |
| 11/18/2009 | CN100561234C Wide band Kelvin double bridge as well as measurement method, autonomous system as well as method and application |
| 11/18/2009 | CN100561233C Fixing mechanism of probe card, fixing method of probe card and probe card |
| 11/17/2009 | US7619429 Integrated probe module for LCD panel light inspection |