| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 01/06/2010 | CN100578578C Detection module of measuring carrier for display panel |
| 01/06/2010 | CN100578240C Method for implementing chip test |
| 01/05/2010 | US7642796 Control system and method of semiconductor inspection system |
| 01/05/2010 | US7642794 Method and system for compensating thermally induced motion of probe cards |
| 01/05/2010 | US7642791 Electronic component/interface interposer |
| 01/05/2010 | US7642769 Insert and tray for electronic device handling apparatus, and electronic device handling apparatus |
| 01/05/2010 | CA2488832C Multi-socket board for open/short tester |
| 01/05/2010 | CA2398082C Voltage sensor |
| 12/31/2009 | US20090322364 Test interposer having active circuit component and method therefor |
| 12/31/2009 | US20090322363 Operation voltage supply method for semiconductor device |
| 12/31/2009 | US20090322361 Probe of detector |
| 12/31/2009 | US20090322333 Cooled NMR Probe Head And NMR Analyzer |
| 12/31/2009 | US20090322323 Intraluminal Magneto Sensor System and Method of Use |
| 12/30/2009 | WO2009158598A2 Evanescent microwave microscopy probe and methodology |
| 12/30/2009 | WO2009117992A3 Test contact arrangement |
| 12/30/2009 | WO2008118677A3 Stiffening connector and probe card assembly incorporating same |
| 12/30/2009 | EP2138852A1 Conductive contact holder and conductive contact unit |
| 12/30/2009 | EP2137667A1 Contactless transmission element and method of characterizing the same |
| 12/30/2009 | CN201374867Y Circuit board with removable test point part |
| 12/30/2009 | CN201374319Y Device for indicating working state of machine station |
| 12/30/2009 | CN201373893Y Solar cell powered multimeter |
| 12/30/2009 | CN201373889Y Low-voltage large-current harmonic source |
| 12/30/2009 | CN201373888Y SOE high-speed and high-resolution test signal generator of electric network equipment |
| 12/30/2009 | CN201373887Y Jig for testing socket |
| 12/30/2009 | CN201373886Y Testing bracket of photovoltaic assembly |
| 12/30/2009 | CN201373885Y Universal wire coil and tool with universal wire coil |
| 12/30/2009 | CN101614756A Probe of tester |
| 12/30/2009 | CN101614755A Integrative formed micro-stretching type spring needle |
| 12/29/2009 | US7639031 Testing assembly for electric test of electric package and testing socket thereof |
| 12/29/2009 | US7639003 Guarded tub enclosure |
| 12/29/2009 | US7638998 Electronic tamper detection circuit for an electricity meter |
| 12/29/2009 | US7638905 Voltage for LCD |
| 12/29/2009 | US7638904 Isolated bidirectional DC-DC converter |
| 12/29/2009 | US7638896 In-vehicle electronic system, in-vehicle electronic apparatus and method of controlling power supply of portable electronic device |
| 12/29/2009 | US7637831 Power transmission mechanism of model vehicle |
| 12/24/2009 | US20090315579 High density integrated circuit apparatus, test probe and methods of use thereof |
| 12/24/2009 | US20090315578 Probe and probe card for integrated circuit devices using the same |
| 12/24/2009 | US20090315577 Probe card assembly |
| 12/24/2009 | US20090315576 Probe card assembly and test probes therein |
| 12/24/2009 | US20090315539 Marine electromagnetic acquisition apparatus with foldable sensor arm assembly |
| 12/24/2009 | DE10122036B4 Substrathaltevorrichtung für Prober zum Testen von Schaltungsanordnungen auf scheibenförmigen Substraten Substrate holder for Prober for testing circuits on disc substrates |
| 12/23/2009 | WO2009154217A1 Contact structure for inspection |
| 12/23/2009 | EP2135096A1 Testing of electronic circuits using an active probe integrated circuit |
| 12/23/2009 | CN201368899Y High-temperature load aging screening device of capacitor |
| 12/23/2009 | CN201368888Y Measuring head mechanism of flying probe testing machine |
| 12/23/2009 | CN201368887Y Test probe for collecting test signal |
| 12/23/2009 | CN201368886Y Test fixture special for elements |
| 12/23/2009 | CN201368885Y Test desk with heat-dissipation element |
| 12/23/2009 | CN101609122A Device for detecting performance of laser sound pickup |
| 12/23/2009 | CN101609105A Probe apparatus |
| 12/23/2009 | CN101609104A Improvement structure of loading box |
| 12/23/2009 | CN101609103A Quick wire clamp device |
| 12/23/2009 | CN101609102A Power frequency withstand voltage and partial discharge test terminal structure of medium-low voltage crosslinked cable |
| 12/23/2009 | CN100573162C Calibration standard |
| 12/23/2009 | CN100573161C Probe measurement device and system |
| 12/23/2009 | CN100573160C Detection installation of circuit board, detection method of circuit board, manufacturing method of circuit board, and circuit board |
| 12/23/2009 | CN100573159C Systems and methods for connecting electrical components |
| 12/23/2009 | CN100573158C Advanced sandwich sub card test general carrier plate and its production method |
| 12/23/2009 | CN100573157C PC board checking device |
| 12/22/2009 | US7634849 Method of assembling and testing an electronics module |
| 12/17/2009 | WO2009151738A2 Receiver for recovering and retiming electromagnetically coupled data |
| 12/17/2009 | WO2009149949A1 Contact base |
| 12/17/2009 | WO2009149725A1 Manipulator for positioning a test head |
| 12/17/2009 | WO2009105222A3 Test system with high frequency interposer |
| 12/17/2009 | US20090312970 Current measuring device and processing unit comprising one such device |
| 12/17/2009 | US20090309620 Tandem handler system and method for reduced index time |
| 12/17/2009 | US20090309597 Superparamagnetic Nanoparticles Based on Iron Oxides with Modified Surface, Method of Their Preparation and Application |
| 12/17/2009 | US20090309591 Displaced electrode amplifier |
| 12/17/2009 | US20090308756 Probe structure coaxial elongated electrical conductor projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
| 12/16/2009 | EP2132580A1 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion |
| 12/16/2009 | EP2132578A1 Device including a contact detector |
| 12/16/2009 | CN201364369Y AC leakage alarm of rail passenger car |
| 12/16/2009 | CN201364368Y Anti-explosion static grounding monitoring alarm |
| 12/16/2009 | CN201364349Y DC voltage generator |
| 12/16/2009 | CN201364348Y High-voltage high-current load device |
| 12/16/2009 | CN201364347Y Probe card |
| 12/16/2009 | CN201364346Y Contact sensor accessory |
| 12/16/2009 | CN201364345Y Device for gas automatic test fixture |
| 12/16/2009 | CN201364344Y Secrete positioning test module |
| 12/16/2009 | CN201364343Y PCB flattener for PCB tester |
| 12/16/2009 | CN101603975A System for controlling sampling analysis of load box |
| 12/16/2009 | CN100571034C Pulse fast edge conversion device |
| 12/16/2009 | CN100570382C Integrate circuit testing structure and using method thereof |
| 12/16/2009 | CN100570372C Test head positioning system |
| 12/15/2009 | US7633306 System and method of measuring probe float |
| 12/15/2009 | US7633287 Current sensor |
| 12/10/2009 | WO2009147929A1 Probe, electronic component testing device, and probe manufacturing method |
| 12/10/2009 | WO2009147804A1 Method for manufacturing probe device |
| 12/10/2009 | WO2009147718A1 Method of manufacturing probe wafer |
| 12/10/2009 | WO2009147717A1 Probe wafer, probe apparatus, and test system |
| 12/10/2009 | WO2009147517A2 Test of electronic devices with boards without sockets based on magnetic locking |
| 12/10/2009 | WO2009146765A1 System for measuring high-frequency signals having standardized power supply and data interface |
| 12/10/2009 | US20090302878 Test Contact System For Testing Integrated Circuits With Packages Having An Array Of Signal and Power Contacts |
| 12/10/2009 | US20090302877 Reduced Ground Spring Probe Array and Method for Controlling Signal Spring Probe Impedance |
| 12/10/2009 | US20090302875 Chip test method |
| 12/10/2009 | US20090302874 Method and apparatus for signal probe contact with circuit board vias |
| 12/10/2009 | US20090302866 Analytical scanning evanescent microwave microscope and control stage |
| 12/10/2009 | DE102008035374A1 System zum Messen von Hochfrequenzsignalen mit normierter Stromversorguns- und Datenschnittstelle A system for measuring high frequency signals with a standardized data interface and Stromversorguns- |
| 12/09/2009 | EP2131204A1 A method and system for testing a semiconductor package |
| 12/09/2009 | CN201360065Y Connector |