| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 02/02/2010 | US7654857 Digital multimeter having sealed input jack detection arrangement |
| 01/29/2010 | CA2669881A1 Port tester with flex bushing, and contact bases |
| 01/28/2010 | WO2009147517A3 Test of electronic devices with boards without sockets based on magnetic locking |
| 01/28/2010 | US20100019786 Method and Apparatus for Nano Probing a Semiconductor Chip |
| 01/28/2010 | US20100019779 Potential measurement apparatus and image forming apparatus |
| 01/28/2010 | US20100019759 Object state detection apparatus and method |
| 01/27/2010 | EP2148209A2 Electrical test device to test equipment under test and electric testing method |
| 01/27/2010 | CN201392991Y Positioning installation instrument of box body |
| 01/27/2010 | CN201392893Y Inflated connector |
| 01/27/2010 | CN201392386Y High-voltage direct current resistance testing pliers with induction electrical alarm |
| 01/27/2010 | CN201392379Y Mechanism for confirming contact state between probe and wafer |
| 01/27/2010 | CN201392351Y Test probe mechanism for full digital electrical property testing machine |
| 01/27/2010 | CN201392350Y Probe card for anti-interference asynchronous trimming wafer test |
| 01/27/2010 | CN201392349Y Chip resistance aging test holding fixture |
| 01/27/2010 | CN101634663A Auxiliary fixture for testing surface mounted element |
| 01/27/2010 | CN100586262C Ic socket |
| 01/27/2010 | CN100585826C Method for manufacturing semiconductor IC device |
| 01/27/2010 | CN100585417C Isolation buffers with controlled equal time delays |
| 01/27/2010 | CN100585411C Method of making microelectronic spring contact array |
| 01/27/2010 | CN100585410C Cable component and manufacturing method therefor |
| 01/26/2010 | US7652492 Integrated compound nano probe card |
| 01/26/2010 | US7652466 Buffer circuit, amplifier circuit, and test apparatus |
| 01/26/2010 | CA2490498C Attachment means for cards and components |
| 01/26/2010 | CA2165212C An electrical metering system having an electrical meter and an external current sensor |
| 01/21/2010 | WO2010008136A2 Defect-detecting multi-probe including nondestructive thin-film sensor |
| 01/21/2010 | WO2010008030A1 Substrate-inspecting device having cleaning mechanism for tips of pins |
| 01/21/2010 | WO2010007816A1 Probe |
| 01/21/2010 | WO2010006683A1 Measurement probe |
| 01/21/2010 | US20100013506 Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device |
| 01/21/2010 | US20100013504 Probe apparatus, a process of forming a probe head, and a process of forming an electronic device |
| 01/21/2010 | US20100013503 Dc test resource sharing for electronic device testing |
| 01/21/2010 | US20100013459 Circuits and methods for high-efficiency on-chip power detection |
| 01/21/2010 | CA2725636A1 Measurement probe |
| 01/20/2010 | EP1807710B1 Kelvin connector including temperature sensor |
| 01/20/2010 | EP1438596B1 Method and apparatus for in-circuit testing of sockets |
| 01/20/2010 | CN201387474Y Testing device for external lithium-ion PACK assembled batteries |
| 01/20/2010 | CN201387470Y Electron and circuit board detecting device |
| 01/20/2010 | CN201387468Y SMD chip testing device |
| 01/20/2010 | CN201387444Y Pointer type digital multimeter |
| 01/20/2010 | CN201387438Y Measuring device with electromagnetic shielding device |
| 01/20/2010 | CN201387437Y PCB plate holding device |
| 01/20/2010 | CN201387436Y Electricity meter box |
| 01/20/2010 | CN201387435Y Micro brush measuring fixture |
| 01/20/2010 | CN101629982A Alignment features in a probing device |
| 01/20/2010 | CN101629971A Probe station, probe socket, probe card and combination thereof |
| 01/20/2010 | CN100582788C Clamp meter with dual display |
| 01/20/2010 | CN100582786C Manipulator for a test head with active compliance |
| 01/20/2010 | CN100582785C Connector for testing a semiconductor package |
| 01/20/2010 | CN100581984C Micro-mechanism testing probe card based on electroplating technique and manufacturing method thereof |
| 01/19/2010 | US7649369 Probe and method of manufacturing probe |
| 01/19/2010 | US7649368 Wafer level interposer |
| 01/19/2010 | US7649367 Low profile probe having improved mechanical scrub and reduced contact inductance |
| 01/19/2010 | US7649348 Auxiliary element for fixing a current sensor to an electrical conductor |
| 01/19/2010 | US7649145 Compliant spring contact structures |
| 01/14/2010 | WO2010005835A2 Sensor cable for electromagnetic surveying |
| 01/14/2010 | WO2009117264A3 Compensation tool for calibrating an electronic component testing machine to a standardized value |
| 01/14/2010 | US20100011334 Method and system for designing a probe card |
| 01/14/2010 | US20100007365 Socket for double ended probe, double ended probe, and probe unit |
| 01/14/2010 | US20100007337 Plasma-facing probe arrangement including vacuum gap for use in a plasma processing chamber |
| 01/14/2010 | US20100007334 Power sourcing equipment device and method of providing a power supply to a powered device |
| 01/13/2010 | EP2144338A1 Coaxial probe |
| 01/13/2010 | EP2143166A2 Spring loaded microwave interconnector |
| 01/13/2010 | CN201382978Y Testing machine of electronic circuit board |
| 01/13/2010 | CN201382964Y Electric arc generating device |
| 01/13/2010 | CN201382963Y ICT needle bed for arc-shaped PCB |
| 01/13/2010 | CN201382962Y Cantilever-type probe card |
| 01/13/2010 | CN201382961Y Slide detachable-type probe of universal meter |
| 01/13/2010 | CN201382960Y Adapter for connecting triode and multimeter |
| 01/13/2010 | CN201382959Y Auxiliary device of multimeter |
| 01/13/2010 | CN201382958Y Flexible contact pressing and double-buffering cam pressure lever mechanism |
| 01/13/2010 | CN201382957Y Instrument display device |
| 01/13/2010 | CN101625375A Wafer level test probe card |
| 01/13/2010 | CN101625374A Needle point structure and needle point forming method |
| 01/13/2010 | CN100580466C Wireless test cassette |
| 01/13/2010 | CN100580465C Panel test circuit structure |
| 01/13/2010 | CN100580460C Accumulator current sensor for automobile |
| 01/13/2010 | CN100580457C Detector and method of manufacturing the same |
| 01/13/2010 | CN100579891C Method for forming microelectronic spring structures on substrate |
| 01/12/2010 | CA2434551C System and method for accurate reading of rotating disk |
| 01/12/2010 | CA2385337C Measuring probe for measuring high frequencies and method of producing said probe |
| 01/07/2010 | WO2010002091A1 Cantilevered micro-contact probe with hinge structure |
| 01/07/2010 | WO2010000265A1 A multi-point probe for testing electrical properties and a method of producing a multi-point probe |
| 01/07/2010 | US20100001753 Position changing apparatus for test handler and power transferring apparatus |
| 01/07/2010 | US20100001752 Parallelism adjusting mechanism of probe card |
| 01/07/2010 | US20100001730 Enhanced fill-factor nmr coils and associated methods |
| 01/07/2010 | US20100001724 IC Microfluidic Platform With Integrated Magnetic Resonance Probe |
| 01/06/2010 | EP2141503A1 A multi-point probe for testing electrical properties and a method of producing a multi-point probe |
| 01/06/2010 | CN201378486Y Digital display resistance box |
| 01/06/2010 | CN201378356Y Building energy-consumption data collector |
| 01/06/2010 | CN201378344Y Electricity prepayment measuring and controlling box |
| 01/06/2010 | CN201378200Y Motor test control cabinet |
| 01/06/2010 | CN201378192Y Comprehensive wiring engineering tool case |
| 01/06/2010 | CN201378187Y Auxiliary device of connector insulating resistance detecting instrument |
| 01/06/2010 | CN201378185Y Current and voltage signal acquisition device of optoelectronic high voltage electric energy meter |
| 01/06/2010 | CN201378176Y High-precision anti-interference excitation power supply for ground screen flaw comprehensively-diagnosing system in transformer substation |
| 01/06/2010 | CN201378175Y Novel waterproof shell for thunder and lightning detection station |
| 01/06/2010 | CN101620238A Transfer mechanism for target object to be inspected |
| 01/06/2010 | CN100578860C Mechanically reconfigurable vertical tester interface for IC probing |
| 01/06/2010 | CN100578630C Probe head and method of fabricating the same |
| 01/06/2010 | CN100578579C Detection module of measuring carrier for display panel |