Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
02/2010
02/25/2010US20100045320 High density integrated circuit apparatus, test probe and methods of use thereof
02/25/2010US20100045319 Wafer and test method thereof
02/25/2010US20100045318 High density integrated circuit apparatus, test probe and methods of use thereof
02/25/2010US20100045317 High density integrated circuit apparatus, test probe and methods of use thereof
02/25/2010US20100045316 Method for inspecting electrostatic chucks with kelvin probe analysis
02/25/2010US20100045315 Diagnostic probe assembly for printhead integrated circuitry
02/25/2010US20100045266 High density integrated circuit apparatus, test probe and methods of use thereof
02/25/2010US20100045265 Method and device for forming a temporary electrical contact to a solar cell
02/25/2010US20100045264 Probe for temporarily electrically contacting a solar cell
02/25/2010US20100044097 Connector, printed circuit board, connecting device connecting them, and method of testing electronic part, using them
02/25/2010US20100043554 Apparatus for ascertaining and/or monitoring a process variable of a medium
02/25/2010US20100043226 Segmented contactor
02/25/2010DE202009010988U1 Messgerät Gauge
02/24/2010CN201413360Y Special test tool for loop resistance of breakers of 110 kV and above
02/24/2010CN201413344Y Optical fiber-aided ignition device
02/24/2010CN201413343Y Casing of three-phase multifunctional electric energy meter
02/24/2010CN201413342Y Heavy-current clamp
02/24/2010CN201413341Y Fixture for measuring electric parameters of concrete
02/24/2010CN201413340Y Switching spring for testing circuit board
02/24/2010CN101657729A Device including a contact detector
02/24/2010CN101655512A Probe card
02/24/2010CN101655511A Probe for temporarily electrically contacting a solar cell
02/24/2010CN101655510A Die carrier
02/23/2010US7667474 Probe device
02/23/2010US7666016 IC socket
02/18/2010US20100039212 Dry-type high-voltage load system apparatus and method of preventing chain breaking and arc discharge for use therewith
02/18/2010US20100039133 Probe head controlling mechanism for probe card assemblies
02/18/2010US20100039132 Probing Apparatus
02/18/2010US20100039131 System and method for modulation mapping
02/18/2010US20100039130 Inspecting method, inspecting apparatus and computer readable storage medium having program stored therein
02/18/2010US20100039129 Probe card
02/18/2010US20100039101 Electrical testing device
02/17/2010EP1321978B1 Contact structure
02/17/2010CN201408853Y Wiring board with test device
02/17/2010CN201408211Y Ammeter
02/17/2010CN201408209Y Multiplex type detecting impedance capable of providing base frequency testing voltage and high frequency partial discharge signal outputting simultaneously
02/17/2010CN201408208Y Reducing pen point of avometer
02/17/2010CN201408207Y Ammeter box
02/17/2010CN201408206Y Insulator detector accessory case
02/17/2010CN201408205Y 自动测试夹具 Automatic Test Fixture
02/17/2010CN201408040Y Metering device
02/17/2010CN201408033Y Metering device
02/17/2010CN101652665A Contactor and method of manufacturing contactor
02/17/2010CN101652664A Mounting method of contactor
02/17/2010CN101650376A Pure water hydrogen conductivity temperature compensation method of power plant
02/17/2010CN101650375A Vertical probe card for narrow test key
02/17/2010CN101650374A Semiconductor component test base provided with temperature-changing device and test machine platform
02/17/2010CN101650373A Explosion protection method and device when testing rechargeable battery
02/17/2010CN100590438C Probe card and method for manufacturing probe card
02/16/2010US7663386 Probe card
02/11/2010WO2010016885A1 Dye application for confocal imaging of cellular microstructure
02/11/2010WO2010016663A2 Flat plate folding type coil spring, pogo pin using the same, and manufacturing method thereof
02/11/2010WO2010016608A1 Electric contact member and contact probe
02/11/2010WO2010015315A1 Contactless loop probe
02/11/2010US20100033201 Mems probe fabrication on a reusable substrate for probe card application
02/11/2010CA2732962A1 Dye application for confocal imaging of cellular microstructure
02/11/2010CA2732189A1 Contactless loop probe
02/10/2010EP2150823A2 Cradle and cable handler for a test head manipulator
02/10/2010CN201402313Y Battery explosion-proof performance testing device
02/10/2010CN201402307Y Improved structure for IC test fixture
02/10/2010CN201402277Y Protecting circuit used in amplifying circuit of transient voltage recorder
02/10/2010CN201402276Y Multi-capacity compensation capacitor for partial discharge tests of dry-type transformer
02/10/2010CN201402275Y Ultra-high voltage corona loading tower
02/10/2010CN201402274Y Clamping-groove type grounding wire
02/10/2010CN201402273Y Rotary cupula
02/10/2010CN201402272Y Light-emitting instrument pointer system of electric bicycle
02/10/2010CN201402154Y Light-emitting instrument pointer structure of electric bicycle
02/10/2010CN101644725A Mems probe fabrication on a reusable substrate for probe card application
02/10/2010CN101644724A Probe testing device
02/10/2010CN101644723A Unit device for measuring performance of electrode material of double electric layer capacitor in water solution system and measuring method therefor
02/10/2010CN101644722A Movable arrester test bed
02/10/2010CN101644721A Testing clamp of Hall device of mobile phone
02/10/2010CN101644720A PCBA calibration clamp and calibration method thereof
02/10/2010CN101644719A Auxiliary device and method for testing circuit board of mobile phone
02/09/2010US7659737 Electrical, high temperature test probe with conductive driven guard
02/09/2010US7659736 Mechanically reconfigurable vertical tester interface for IC probing
02/04/2010US20100026333 Test apparatus and probe card
02/04/2010US20100026329 Test apparatus and electronic device
02/04/2010US20100026327 Electrical Signal Connector
02/04/2010US20100026278 Apparatus for Monitoring Discharge Processes in a Conductor of a Medium-Voltage or High-Voltage System
02/03/2010EP2149794A2 Method for measuring the current strength of an alternating current
02/03/2010EP2149052A2 Clamp meter with safe trigger mechanism
02/03/2010CN201397572Y Wireless apparatus and measuring apparatus having the wireless apparatus
02/03/2010CN201397384Y Resistance detection device for combined cap and annular PTC of lithium battery
02/03/2010CN201397348Y High-voltage test power supply in serial and parallel structure
02/03/2010CN201397347Y Resistor testing needle
02/03/2010CN201397346Y Multi-function pen-shaped universal meter
02/03/2010CN201397345Y 电能表 Meter
02/03/2010CN201397344Y Double-group orbit double-guide direction automatic detector of quartz crystal automatic separation system
02/03/2010CN101639490A Probe relay, test clamp and method for isolating by using test clamp
02/03/2010CN101639489A Material separating device
02/03/2010CN100587509C Efficient switching architecture with reduced stub lengths
02/03/2010CN100587496C Transmission circuit, probe sheet, probe card, semiconductor detector and producing method
02/03/2010CN100587495C Pushing block and handler with the pushing block
02/02/2010US7656649 Mechanical packaging apparatus and methods for an electrical energy meter
02/02/2010US7656638 Earthing and overvoltage protection arrangement
02/02/2010US7656175 Inspection unit
02/02/2010US7656173 Strip socket having a recessed portions in the base to accept bottom surface of packaged semiconductor devices mounted on a leadframe for testing and burn-in
02/02/2010US7656151 Printed circuit board with an opening to access components attached to the printed circuit board
02/02/2010US7656061 Automatic power source configuration
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