Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
03/2010
03/31/2010CN101685136A Mueller christian [de]
03/31/2010CN101685133A Integrated circuit component test equipment and test method thereof
03/31/2010CN101685105A Probe tip
03/31/2010CN101685104A Test probe and manufacturing method thereof
03/31/2010CN101685103A Probe assembly
03/30/2010US7688097 Wafer probe
03/30/2010US7688088 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
03/30/2010US7688087 Test apparatus
03/30/2010US7688067 Probe for electrical measurement methods and use of a flexible probe for production of a rigid probe
03/30/2010US7685705 Method of fabricating a probe card
03/25/2010WO2010031685A1 Method for testing electronic components of a repetitive pattern under defined thermal conditions
03/25/2010WO2010005835A3 Sensor cable for electromagnetic surveying
03/25/2010US20100076707 Current sensor for measuring inhomogeneity of potential distribution of arrester
03/25/2010US20100073021 Electrical contact probe
03/25/2010US20100073018 Adjustable probe head
03/25/2010US20100072980 Method and apparatus for current measurement in an electrical network, in particular a multiphase electrical network
03/25/2010US20100072827 Mobile power source for use with a hand-held machine and method of operating
03/25/2010DE112008001088T5 Verfahren und Vorrichtung zum Erkennen gebrochener Anschlussstifte in einem Testsockel Method and device for detecting a broken connection pins in a test socket
03/24/2010EP2166362A1 Probe assembly
03/24/2010EP2165205A1 Coated motor vehicle battery sensor element and method for producing a motor vehicle battery sensor element
03/24/2010EP2165204A1 Vehicle battery sensor element and method for producing a motor vehicle battery sensor element
03/24/2010EP1425598B1 Magnetic resonance apparatus with excitation antennae system
03/24/2010CN201430251Y Card connector and component thereof
03/24/2010CN201429668Y Panel type short-circuit and earthing fault indicator
03/24/2010CN201429657Y Novel relaying check meter
03/24/2010CN201429633Y Three-phase high-current generator for detecting current transformer on electric power line
03/24/2010CN201429632Y Portable electromagnetic shielded box
03/24/2010CN201429631Y Memory bar protection test socket
03/24/2010CN201429630Y Test station with arranging device
03/24/2010CN201429629Y Insulation resistance safety test box
03/24/2010CN201429628Y Hand-push type through jig
03/24/2010CN101680914A Testing of electronic circuits using an active probe integrated circuit
03/24/2010CN101680913A Method for fabricating probe tip
03/24/2010CN101680912A Universal switching device of special testing machine for testing circuit board and universal fixture
03/24/2010CN101680911A Cradle and cable handler for a test head manipulator
03/24/2010CN101676733A Structure of probe card for integrated circuit test
03/24/2010CN101676732A Wiring plate with high frequency
03/24/2010CN101676731A Circuit board structure of circuit test device
03/24/2010CN100595597C Lightning arrester various waveform aging test device
03/24/2010CN100595592C Instrument panel of electric vehicle
03/23/2010US7683604 Amplifier topology and method for connecting to printed circuit board traces used as shunt resistors
03/23/2010US7683603 Automatic disconnect system, transfer system and method
03/18/2010WO2009011696A8 A device and method for reparing a microelectromechanical system
03/18/2010US20100066397 Alignment features in a probing device
03/18/2010US20100066351 Device for measuring a current flowing in a cable
03/17/2010CN201425596Y High-power contactless electronic regulating resistance
03/17/2010CN201425595Y Programme-controlled clamping device for molded case circuit breaker
03/17/2010CN201425594Y 40.5kV voltage withstand test underframe
03/17/2010CN201425593Y Switching device and vertical conductive adhesive test structure for test of circuit board to be tested
03/17/2010CN201425592Y Miniature programme-controlled clamping device for circuit breaker
03/17/2010CN201425591Y Inner conical bushing partial discharge frock
03/17/2010CN101675350A Test of electronic devices at package level using test boards without sockets
03/17/2010CN101672884A Portable cable fault detection high-voltage capacitor
03/17/2010CN101672881A On-load test device and on-load test method simulating main transformer differential
03/17/2010CN101672864A Multi-functional measurement instrument with safety protection device
03/17/2010CN101672863A Testing component and testing device applying same
03/17/2010CN101672862A Test pencil probe
03/16/2010US7679356 Digital multimeter having improved recording functionality
03/11/2010WO2010027075A1 Wiring board and probe card
03/11/2010WO2010008136A3 Defect-detecting multi-probe including nondestructive thin-film sensor
03/11/2010WO2009136707A3 Perpendicular fine-contact probe having a variable-stiffness structure
03/10/2010EP2161585A2 Flexible test cable
03/10/2010EP2160804A2 A novel clamp meter with rotary mechanism for clamp jaws
03/10/2010CN201421497Y Anti-interference device of field calibrating device of current transformer
03/10/2010CN201421482Y Radio frequency coaxial connector detecting frock
03/10/2010CN201421465Y Waterproof module box for ammeters
03/10/2010CN201421464Y Connecting structure for electric meter hook
03/10/2010CN201421463Y User circuit checking instrument
03/10/2010CN201421462Y Novel test socket
03/10/2010CN201421338Y Tray device for instrument cabinet
03/10/2010CN201419914Y Circuit wafer supply device and circuit wafer testing system applying thereof
03/10/2010CN101669034A Conductive contactor
03/10/2010CN101666816A Electric connecting device and contactor
03/10/2010CN101666815A Test jig
03/10/2010CN101666814A Automatic tray converting device
03/09/2010US7675301 Electronic components with plurality of contoured microelectronic spring contacts
03/04/2010WO2010025002A1 Modified current source (mcs) with seamless range switching
03/04/2010WO2010023004A1 Shunt resistor with evaluation circuit
03/04/2010US20100052719 Device and method for testing display panel
03/04/2010US20100052715 High density integrated circuit apparatus, test probe and methods of use thereof
03/04/2010US20100052714 Probe card cooling assembly with direct cooling of active electronic components
03/04/2010US20100052711 Probe card and manufacturing method of the same
03/04/2010US20100052710 Probe Card
03/04/2010US20100052709 Wing-shaped support members for enhancing semiconductor probes and methods to form the same
03/04/2010US20100052657 Measurement connector
03/03/2010EP2159581A1 Material for probe pin
03/03/2010EP2159580A1 Probe tip
03/03/2010CN201417291Y Test device
03/03/2010CN201417284Y Controllable high-voltage ignition bulb device
03/03/2010CN201417283Y Electronic load array with positioning guide rail
03/03/2010CN201417282Y Three phase electronic type prepaid energy meter case
03/03/2010CN101661050A Main plate fixing tool
03/02/2010US7672805 Synchronization of modules for analog and mixed signal testing in an open architecture test system
03/02/2010US7671612 Integrated compound nano probe card and method of making same
03/02/2010US7671609 Sheet-like probe, method of producing the probe, and application of the probe
02/2010
02/25/2010WO2010019981A1 Apparatus for testing integrated circuitry
02/25/2010WO2009151738A3 Receiver for recovering and retiming electromagnetically coupled data
02/25/2010US20100045324 High density integrated circuit apparatus, test probe and methods of use thereof
02/25/2010US20100045323 Test head positioning system and method
02/25/2010US20100045321 High density integrated circuit apparatus, test probe and methods of use thereof
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