Patents
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
05/2010
05/05/2010CN201449409U Multifunctional measuring instrument with safety device
05/05/2010CN201449402U Protection circuit for leakage current tester
05/05/2010CN201449401U Protection device of vertical input channel of oscillograph
05/05/2010CN201449400U Test fixture for SOT series patch product of semi-conductor triode
05/05/2010CN201449399U Debugging platform for case testing and controlling device
05/05/2010CN201449398U Loading mechanism for capacitor test
05/05/2010CN201449397U Multipurpose connection operating lever based on field high pressure test
05/05/2010CN201449396U Thimble lifting platform adjustment device
05/05/2010CN1926437B Circuit board inspecting device and circuit board inspection method
05/05/2010CN1768271B Test head positioning system and method
05/05/2010CN1467832B Recovery processing method of an electrode
05/05/2010CN101701995A Impulse response analytical test apparatus and method for detecting deformation of transformer winding
05/05/2010CN101701971A High-precision multichannel analog signal source
05/04/2010US7709978 System interface and installation with the system interface
05/04/2010US7709279 Methods for testing semiconductor devices methods for protecting the same from electrostatic discharge events during testing, and methods for fabricating inserts for use in testing semiconductor devices
04/2010
04/29/2010WO2010046457A1 Test probe
04/29/2010WO2010046017A1 Measuring system for determining scatter parameters
04/29/2010WO2010016663A3 Flat plate folding type coil spring, pogo pin using the same, and manufacturing method thereof
04/29/2010US20100104275 Input device
04/29/2010US20100102841 Device, method and probe for inspecting substrate
04/29/2010DE102008043047A1 Schutzschaltung und Messgerät mit einer solchen Schutzschaltung Protection circuit and measuring instrument with a RCD circuit
04/29/2010CA2741161A1 Test probe
04/29/2010CA2738717A1 Measuring system for determining scattering parameters
04/28/2010EP2180326A1 Test probe
04/28/2010EP2179296A1 Instrument transformer test equipment and method
04/28/2010CN201444524U Memory switching test bench
04/28/2010CN201444172U Special voltmeter for wrist battery
04/28/2010CN201444165U Meter head mounting bracket
04/28/2010CN201444164U Multi-dimensional positioning device used for heavy ion irradiation devices
04/28/2010CN201444163U Surface leakage current collecting ring
04/28/2010CN1875281B Conductive contact holder and conductive contact unit
04/28/2010CN101699297A Improved capacitance measurement charging mechanism
04/27/2010US7705618 Composite conductive sheet, method for producing the same, anisotropic conductive connector, adapter, and circuit device electric inspection device
04/27/2010US7705604 Electric circuit for triggering a piezoelectric element, in particular of a fuel injection system of a motor vehicle
04/27/2010US7705554 Circuit arrangement and method for adjusting the power consumption of a load that can be operated by a direct-voltage system
04/27/2010US7705349 Test inserts and interconnects with electrostatic discharge structures
04/27/2010US7703195 Methods of manipulating electrical wall fixtures
04/22/2010WO2010045214A2 Circuit board testing using a probe
04/22/2010WO2010044572A2 Method and apparatus for checking insulation of pouch electric cell and probe for the same
04/22/2010US20100097085 Socket, module board, and inspection system using the module board
04/22/2010DE19781697B4 Elektrisch leitfähige Kontakteinheit Electrically conductive contact unit
04/21/2010EP2022169B1 Mode selection amplifier circuit usable in a signal acquisition probe
04/21/2010CN201440643U Electronic kilowatt-hour meter and serial switch power supply thereof
04/21/2010CN201440152U Carbon-oil resistance tester
04/21/2010CN201440146U 探针卡 Probe Card
04/21/2010CN201440145U Remote control test pen
04/21/2010CN201440144U Lead-sealing structure for electric energy meter
04/21/2010CN201440143U High-current test outlet row clamping mechanism of breaker
04/21/2010CN1877342B Test apparatus capable of accurately connecting a test object to a substrate
04/21/2010CN101697599A Multimedia data card as well as device and method for testing handset multimedia data cards
04/21/2010CN101697002A Low-resistance printed circuit board test device
04/21/2010CN101696982A Printed circuit board performance test table
04/21/2010CN101696981A Program-controlled converter for output polarity of detecting instrument
04/20/2010US7701236 Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer
04/20/2010US7701198 Power measurement apparatus
04/20/2010US7700380 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device
04/20/2010US7699616 High density planar electrical interface
04/15/2010WO2010042926A2 Probe connector
04/15/2010WO2010041188A1 Wafer probe
04/15/2010WO2008063138A3 An improved ball mounting apparatus and method
04/15/2010US20100090682 Multi-Meter Test Lead Probe For Hands-Free Electrical Measurement of Control Panel Industrial Terminal Blocks
04/15/2010US20100090681 Device and method for reading electric currents resulting from an electromagnetic signal detector
04/15/2010US20100090680 Intelligent electronic device having a terminal assembly for coupling to a meter mounting socket
04/15/2010US20100089187 Probe connector
04/15/2010US20100088888 Lithographic contact elements
04/15/2010DE102009000823B3 Photoleitende Messspitze, Messaufbau und Verwendung der photoleitenden Messspitze und/oder des Messaufbaus Photoconductive measuring tip, structure and use of the photoconductive probe tip and / or the measurement setup
04/15/2010DE102007062633B4 Anordnung zum potentialfreien Messen von Strömen Arrangement for floating measuring currents
04/14/2010EP1503216B1 Sheet-form connector and production method and application therefor
04/14/2010CN201438488U Device combining labeling and testing in production process of batteries
04/14/2010CN201438196U Modular probe card device
04/14/2010CN201438195U Air flow guiding device and high-temperature and low-temperature supply system
04/13/2010US7696772 Strip socket for testing and burn-in having recessed portions with material that extends across a bottom surface of the corresponding semiconductor device
04/13/2010US7696742 Method and circuit for reducing noise when measuring intensity of electric current
04/13/2010US7696443 Electronic device with a warped spring connector
04/08/2010WO2010038433A1 Method for manufacturing probe card, probe card, method for manufacturing semiconductor device, and method for forming probe
04/08/2010US20100085036 Overhead Communicating Device
04/08/2010DE19943388B4 Vorrichtung zum Prüfen von Leiterplatten An apparatus for testing printed circuit boards
04/08/2010DE19905118B4 Stromteiler für Meßwandler Power divider for transducer
04/08/2010DE10297010B4 Elektrisch leitende Kontakteinheit Electrically conductive contact unit
04/07/2010EP2171482A1 Mobile high-voltage test set with housing
04/07/2010CN201436785U SPWA drive device capable of outputting various waveforms
04/07/2010CN201436589U Test probe
04/07/2010CN201436588U PCB distribution parameter impedance testing cable and matched impedance testing stripe
04/07/2010CN101692361A Resistance device for sensing current
04/06/2010US7694246 Test method for yielding a known good die
04/06/2010US7692438 Bimetallic probe with tip end
04/01/2010WO2010036790A1 Devices and methods for handling microelectronic assemblies
04/01/2010WO2010034185A1 A general transferring device for testing a special testing apparatus of a circuitry board and a general jig thereof
04/01/2010US20100079161 Probe apparatus
04/01/2010US20100079151 Automatic test equipment self test
04/01/2010US20100079132 Amplifier topology and method for connecting to printed circuit board traces used as shunt resistors
03/2010
03/31/2010EP2169412A1 Electrical current measurement arrangement
03/31/2010EP2169410A1 Electronic electricity meter
03/31/2010CN201435544Y Footing base
03/31/2010CN201434877Y Printed circuit board testing work base
03/31/2010CN201434876Y Conductor resistance detection clamp
03/31/2010CN201434875Y Chip testing jig
03/31/2010CN201434874Y Multifunctional signal exchange board
03/31/2010CN101688886A Contactor, probe card and method of mounting contactor
03/31/2010CN101688885A Probe and probe card