Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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05/05/2010 | CN201449409U Multifunctional measuring instrument with safety device |
05/05/2010 | CN201449402U Protection circuit for leakage current tester |
05/05/2010 | CN201449401U Protection device of vertical input channel of oscillograph |
05/05/2010 | CN201449400U Test fixture for SOT series patch product of semi-conductor triode |
05/05/2010 | CN201449399U Debugging platform for case testing and controlling device |
05/05/2010 | CN201449398U Loading mechanism for capacitor test |
05/05/2010 | CN201449397U Multipurpose connection operating lever based on field high pressure test |
05/05/2010 | CN201449396U Thimble lifting platform adjustment device |
05/05/2010 | CN1926437B Circuit board inspecting device and circuit board inspection method |
05/05/2010 | CN1768271B Test head positioning system and method |
05/05/2010 | CN1467832B Recovery processing method of an electrode |
05/05/2010 | CN101701995A Impulse response analytical test apparatus and method for detecting deformation of transformer winding |
05/05/2010 | CN101701971A High-precision multichannel analog signal source |
05/04/2010 | US7709978 System interface and installation with the system interface |
05/04/2010 | US7709279 Methods for testing semiconductor devices methods for protecting the same from electrostatic discharge events during testing, and methods for fabricating inserts for use in testing semiconductor devices |
04/29/2010 | WO2010046457A1 Test probe |
04/29/2010 | WO2010046017A1 Measuring system for determining scatter parameters |
04/29/2010 | WO2010016663A3 Flat plate folding type coil spring, pogo pin using the same, and manufacturing method thereof |
04/29/2010 | US20100104275 Input device |
04/29/2010 | US20100102841 Device, method and probe for inspecting substrate |
04/29/2010 | DE102008043047A1 Schutzschaltung und Messgerät mit einer solchen Schutzschaltung Protection circuit and measuring instrument with a RCD circuit |
04/29/2010 | CA2741161A1 Test probe |
04/29/2010 | CA2738717A1 Measuring system for determining scattering parameters |
04/28/2010 | EP2180326A1 Test probe |
04/28/2010 | EP2179296A1 Instrument transformer test equipment and method |
04/28/2010 | CN201444524U Memory switching test bench |
04/28/2010 | CN201444172U Special voltmeter for wrist battery |
04/28/2010 | CN201444165U Meter head mounting bracket |
04/28/2010 | CN201444164U Multi-dimensional positioning device used for heavy ion irradiation devices |
04/28/2010 | CN201444163U Surface leakage current collecting ring |
04/28/2010 | CN1875281B Conductive contact holder and conductive contact unit |
04/28/2010 | CN101699297A Improved capacitance measurement charging mechanism |
04/27/2010 | US7705618 Composite conductive sheet, method for producing the same, anisotropic conductive connector, adapter, and circuit device electric inspection device |
04/27/2010 | US7705604 Electric circuit for triggering a piezoelectric element, in particular of a fuel injection system of a motor vehicle |
04/27/2010 | US7705554 Circuit arrangement and method for adjusting the power consumption of a load that can be operated by a direct-voltage system |
04/27/2010 | US7705349 Test inserts and interconnects with electrostatic discharge structures |
04/27/2010 | US7703195 Methods of manipulating electrical wall fixtures |
04/22/2010 | WO2010045214A2 Circuit board testing using a probe |
04/22/2010 | WO2010044572A2 Method and apparatus for checking insulation of pouch electric cell and probe for the same |
04/22/2010 | US20100097085 Socket, module board, and inspection system using the module board |
04/22/2010 | DE19781697B4 Elektrisch leitfähige Kontakteinheit Electrically conductive contact unit |
04/21/2010 | EP2022169B1 Mode selection amplifier circuit usable in a signal acquisition probe |
04/21/2010 | CN201440643U Electronic kilowatt-hour meter and serial switch power supply thereof |
04/21/2010 | CN201440152U Carbon-oil resistance tester |
04/21/2010 | CN201440146U 探针卡 Probe Card |
04/21/2010 | CN201440145U Remote control test pen |
04/21/2010 | CN201440144U Lead-sealing structure for electric energy meter |
04/21/2010 | CN201440143U High-current test outlet row clamping mechanism of breaker |
04/21/2010 | CN1877342B Test apparatus capable of accurately connecting a test object to a substrate |
04/21/2010 | CN101697599A Multimedia data card as well as device and method for testing handset multimedia data cards |
04/21/2010 | CN101697002A Low-resistance printed circuit board test device |
04/21/2010 | CN101696982A Printed circuit board performance test table |
04/21/2010 | CN101696981A Program-controlled converter for output polarity of detecting instrument |
04/20/2010 | US7701236 Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer |
04/20/2010 | US7701198 Power measurement apparatus |
04/20/2010 | US7700380 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
04/20/2010 | US7699616 High density planar electrical interface |
04/15/2010 | WO2010042926A2 Probe connector |
04/15/2010 | WO2010041188A1 Wafer probe |
04/15/2010 | WO2008063138A3 An improved ball mounting apparatus and method |
04/15/2010 | US20100090682 Multi-Meter Test Lead Probe For Hands-Free Electrical Measurement of Control Panel Industrial Terminal Blocks |
04/15/2010 | US20100090681 Device and method for reading electric currents resulting from an electromagnetic signal detector |
04/15/2010 | US20100090680 Intelligent electronic device having a terminal assembly for coupling to a meter mounting socket |
04/15/2010 | US20100089187 Probe connector |
04/15/2010 | US20100088888 Lithographic contact elements |
04/15/2010 | DE102009000823B3 Photoleitende Messspitze, Messaufbau und Verwendung der photoleitenden Messspitze und/oder des Messaufbaus Photoconductive measuring tip, structure and use of the photoconductive probe tip and / or the measurement setup |
04/15/2010 | DE102007062633B4 Anordnung zum potentialfreien Messen von Strömen Arrangement for floating measuring currents |
04/14/2010 | EP1503216B1 Sheet-form connector and production method and application therefor |
04/14/2010 | CN201438488U Device combining labeling and testing in production process of batteries |
04/14/2010 | CN201438196U Modular probe card device |
04/14/2010 | CN201438195U Air flow guiding device and high-temperature and low-temperature supply system |
04/13/2010 | US7696772 Strip socket for testing and burn-in having recessed portions with material that extends across a bottom surface of the corresponding semiconductor device |
04/13/2010 | US7696742 Method and circuit for reducing noise when measuring intensity of electric current |
04/13/2010 | US7696443 Electronic device with a warped spring connector |
04/08/2010 | WO2010038433A1 Method for manufacturing probe card, probe card, method for manufacturing semiconductor device, and method for forming probe |
04/08/2010 | US20100085036 Overhead Communicating Device |
04/08/2010 | DE19943388B4 Vorrichtung zum Prüfen von Leiterplatten An apparatus for testing printed circuit boards |
04/08/2010 | DE19905118B4 Stromteiler für Meßwandler Power divider for transducer |
04/08/2010 | DE10297010B4 Elektrisch leitende Kontakteinheit Electrically conductive contact unit |
04/07/2010 | EP2171482A1 Mobile high-voltage test set with housing |
04/07/2010 | CN201436785U SPWA drive device capable of outputting various waveforms |
04/07/2010 | CN201436589U Test probe |
04/07/2010 | CN201436588U PCB distribution parameter impedance testing cable and matched impedance testing stripe |
04/07/2010 | CN101692361A Resistance device for sensing current |
04/06/2010 | US7694246 Test method for yielding a known good die |
04/06/2010 | US7692438 Bimetallic probe with tip end |
04/01/2010 | WO2010036790A1 Devices and methods for handling microelectronic assemblies |
04/01/2010 | WO2010034185A1 A general transferring device for testing a special testing apparatus of a circuitry board and a general jig thereof |
04/01/2010 | US20100079161 Probe apparatus |
04/01/2010 | US20100079151 Automatic test equipment self test |
04/01/2010 | US20100079132 Amplifier topology and method for connecting to printed circuit board traces used as shunt resistors |
03/31/2010 | EP2169412A1 Electrical current measurement arrangement |
03/31/2010 | EP2169410A1 Electronic electricity meter |
03/31/2010 | CN201435544Y Footing base |
03/31/2010 | CN201434877Y Printed circuit board testing work base |
03/31/2010 | CN201434876Y Conductor resistance detection clamp |
03/31/2010 | CN201434875Y Chip testing jig |
03/31/2010 | CN201434874Y Multifunctional signal exchange board |
03/31/2010 | CN101688886A Contactor, probe card and method of mounting contactor |
03/31/2010 | CN101688885A Probe and probe card |