Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
05/2010
05/25/2010US7722371 Electrical contactor, especially wafer level contactor, using fluid pressure
05/20/2010WO2010055872A1 Spherical shell contact, and method for manufacturing same
05/20/2010WO2010055712A1 Electrical connecting apparatus
05/19/2010EP2187224A1 Environmentally sealed contact
05/19/2010CN201477195U Endurance test device of automobile idling motor
05/19/2010CN201477184U Detection device for display circuit of set top box
05/19/2010CN201477183U Device for testing circuit board and data processing system
05/19/2010CN201477180U Detection carrier of semiconductor crystal grain with double-sided electrode
05/19/2010CN201477173U Automatic detection module for power supply earth line failure
05/19/2010CN201477129U Measuring system capable of realizing interface discharge
05/19/2010CN201477128U Portable current generator
05/19/2010CN201477127U Probe of oscilloscope
05/19/2010CN201477126U Conductor device of tool for detecting circuit board
05/19/2010CN201477125U Electrical testing frame
05/19/2010CN201477124U Voltage quality monitor installation box convenient for observation
05/19/2010CN201477123U Installing box for voltage quality monitor
05/19/2010CN201477122U Test working seat of printing circuit board
05/19/2010CN201477121U Voltage-resistant test wire-supporting frame
05/19/2010CN201477120U Electric wire and cable power frequency voltage test phase changing device
05/19/2010CN201477119U Needle-type electronic measurement clamp
05/19/2010CN201477118U Rotating arm mechanism for test device
05/19/2010CN201477117U Clamping mechanism for test device
05/19/2010CN201477116U Installation structure of failure indicator
05/19/2010CN201477115U Chip stricture carried with transferable probe array
05/19/2010CN201477114U Electric property testing module
05/19/2010CN201477113U Gas blowing device of vibrating plate hopper
05/19/2010CN1979194B Electrical test apparatus for testing an electrical test piece and corresponding method
05/19/2010CN1975439B Probe card transfer assist apparatus and inspection equipment using same
05/19/2010CN101710659A Test jack for reactive controllable chip
05/19/2010CN101710136A Sequence waveform generator
05/19/2010CN101308166B Signal generation circuit for testing hall device electrical behavior
05/19/2010CN101183137B Fixation method of detecting probe type circuit board testing tool
05/19/2010CN101120257B Conductive contactor unit and conductive contactor
05/19/2010CN101021559B Test-blind eliminating instrument and test system for eliminating cable fault test blind zone
05/18/2010US7719297 Probe apparatus and method for measuring electrical characteristics of chips and storage medium therefor
05/18/2010US7719259 Temperature stable current sensor system
05/14/2010WO2010053288A2 Constant-pressure non-destructive contact probe device
05/14/2010WO2010053203A1 Electrical inspecting apparatus
05/13/2010US20100120267 Wafer level interposer
05/13/2010US20100117670 Connecting unit to test semiconductor chips and apparatus to test semiconductor chips having the same
05/12/2010EP2183603A2 Multi-site probe
05/12/2010CN201466411U Quickly plugging connector assembly for measurement
05/12/2010CN201466348U Electric connector with locking and misplugging prevention and test functions
05/12/2010CN201466346U Connector convenient for testing
05/12/2010CN201466129U Multi-purpose hole-positioning battery revolving tray
05/12/2010CN201465685U Resistance box unit in super high-power load box
05/12/2010CN201464629U Lamp service life end detecting circuit
05/12/2010CN201464616U Relay test table
05/12/2010CN201464595U Testing tool for display panel
05/12/2010CN201464594U COG LCD short-circuit testing device
05/12/2010CN201464587U Residual current type monitoring detector for electrical fire protection
05/12/2010CN201464580U Wireless terminal electromagnetic compatibility testing device
05/12/2010CN201464528U Topology structure for multifunctional measurement
05/12/2010CN201464527U Casing of microcomputer frequency analysis device
05/12/2010CN201464526U Portable microcomputer frequency analysis device housing
05/12/2010CN201464525U Oscilloscope automatically performing channel correction along with temperature change
05/12/2010CN201464509U Sampling analysis and control system for load box
05/12/2010CN201464508U Spring needle contact pad and probe card applying same
05/12/2010CN201464507U Probe card and metal probe
05/12/2010CN201464506U Electric energy meter cover
05/12/2010CN201464505U Terminal box
05/12/2010CN201464504U Moveable lightning arrester test bench
05/12/2010CN201464503U Rotatable outer casing structure of electric power collector
05/12/2010CN201464502U Portable laptop bracket for SAR test
05/12/2010CN201464501U Fixture for testing thick film integrated circuit
05/12/2010CN201464500U Improved structure of load box
05/12/2010CN201464499U Electric check ring for insulated section of power line switch terminal
05/12/2010CN201464498U Strengthened test strip for semi-conductor devices
05/12/2010CN201464497U Measuring tool
05/12/2010CN201464496U Testing tool
05/12/2010CN201463958U Micro-power mechanical encoder
05/12/2010CN1695238B Probe method, prober, and electrode reducing/plasma-etching processing mechanism
05/12/2010CN101706557A Automatic detector for communication storage battery
05/12/2010CN101706517A Arc generating device for testing electric switch contact material
05/12/2010CN101706516A Frequency offset method based on beat method
05/12/2010CN101706515A Electric probe
05/12/2010CN101706514A lcr tester
05/12/2010CN101194170B Radio frequency isolation container
05/12/2010CN101126768B Extruded article
05/12/2010CN101086508B Checking apparatus and its connector and checking method
05/12/2010CN101082638B Transmission line used for internal circuit test point
05/11/2010US7714602 Socket for connecting ball-grid-array integrated circuit device to test circuit
05/11/2010US7714598 Contact carriers (tiles) for populating larger substrates with spring contacts
05/11/2010US7714597 Support member assembly for conductive contact members
05/11/2010US7714594 Current detection printed board, voltage detection printed board, and current/voltage detector using same, and current detector and voltage detector
05/11/2010US7714567 Power cable magnetic field sensor
05/06/2010WO2010050613A1 Device, method and probe for inspecting substrate
05/06/2010WO2010048971A1 Test arrangement, pogo-pin and method for testing a device under test
05/06/2010WO2010018463A3 Probe head controlling mechanism for probe card assemblies
05/06/2010US20100109696 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
05/06/2010US20100109695 Chuck for holding a device under test
05/06/2010US20100109691 Low Profile Probe Having Improved Mechanical Scrub and Reduced Contact Inductance
05/06/2010US20100109689 Probe card assembly and test probes therein
05/06/2010US20100109666 NMR-MAS probehead with integral transport conduit for an MAS-rotor
05/06/2010US20100109652 Apparatus for correcting position of a user tray and a test handler
05/06/2010US20100109651 Device for conductivity measurement in a controlled environment and method thereof
05/06/2010US20100109649 Apparatus for determining and/or monitoring a process variable
05/06/2010US20100109648 Current sensing inductor and a circuit thereof
05/06/2010US20100109646 Method and apparatus for amplifying a signal and test device using same
05/05/2010EP2182609A2 Electrical circuit
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