| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 11/08/2001 | US20010038678 Computed tomography method |
| 11/01/2001 | WO2001081864A1 Measuring device using electron beam |
| 11/01/2001 | WO2001081863A1 Electron beam length measuring instrument and length measuring method |
| 11/01/2001 | WO2001081862A1 Electron beam length measuring instrument and length measuring method |
| 11/01/2001 | US20010035495 Scanning electron microscope and method of controlling the same |
| 10/31/2001 | EP1150251A2 Computer tomography method |
| 10/31/2001 | EP1149269A1 Latex coat thickness measuring and control apparatus |
| 10/31/2001 | DE10021219A1 Computertomographie-Verfahren Computed tomography method |
| 10/30/2001 | US6310936 Thin layer nuclear density guage |
| 10/30/2001 | US6310574 Level transmitter |
| 10/25/2001 | US20010033683 Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen |
| 10/24/2001 | EP0805949B1 Measuring layer thickness using backscattering of high energy photons |
| 10/23/2001 | US6306126 Calibrating device |
| 10/04/2001 | EP0885430B1 Apparatus and method for providing high fidelity reconstruction of an observed sample |
| 10/02/2001 | US6297648 Oscillating cavity paint meter |
| 09/27/2001 | DE10013172A1 Verfahren und Vorrichtung zur photothermischen Analyse einer Materialschicht, insbesondere zur Schichtdickenmessung Method and apparatus for photothermal analysis of a layer of material, especially for coating thickness measurement |
| 09/26/2001 | CN1314580A Method for setting measured object position in measuring thin layer thickness by x-ray fluorescent light |
| 09/20/2001 | US20010022829 Method of setting a position of an object of measurement in layer thickness measurement by x-ray fluorescence |
| 09/20/2001 | DE10013048A1 Position adjusting method for layer thickness measurement involves varying space between surface of measurement object and collimator to change brightness of pixels on measurement plane |
| 09/19/2001 | EP1134579A2 Method and apparatus for photothermically analysing a material layer, especially film thickness measurement |
| 09/06/2001 | US20010018891 Calibrated scale in the nanometer range for technical devices used for the high-resolution or ultrahigh-resolution imaging of structures |
| 08/29/2001 | EP1127369A1 Detection of wafer fragments in a wafer processing apparatus |
| 08/21/2001 | US6278767 Methods for measuring curved distances on 3D and MIP images |
| 08/21/2001 | US6278114 Method and apparatus for measuring dimensions of a feature of a specimen |
| 08/21/2001 | CA2121310C Method of measuring inner diameter of pipe |
| 08/14/2001 | US6274876 Inspection apparatus and method using particle beam and the particle-beam-applied apparatus |
| 08/09/2001 | US20010011712 Position detection system for use in lithographic apparatus |
| 08/08/2001 | EP0866944B1 Device for testing flat materials |
| 07/26/2001 | DE10001239A1 Device for measuring structures on substrate has non-optical measurement device on bearer element, whereby normal air pressure conditions exist between measurement device and substrate |
| 07/25/2001 | CN1305225A Device inspection apparatus and inspection method |
| 07/19/2001 | US20010008273 Abbe arm calibration system for use in lithographic apparatus |
| 07/19/2001 | US20010008272 Measuring instrument and method for measuring features on a substrate |
| 07/18/2001 | EP1116932A2 Measuring apparatus and method for measuring structures on a substrat |
| 07/10/2001 | US6259094 Electron beam inspection method and apparatus |
| 07/10/2001 | US6259092 Thickness determination of carbonaceous overlayers on substrates of differing material |
| 07/05/2001 | WO2001047646A1 System for automatic control of the wall bombardment to control wall deposition |
| 06/26/2001 | US6252930 Method and apparatus for measuring thickness of coating layers on substrates using backscattering of x-rays and gamma rays |
| 06/26/2001 | US6252412 Method of detecting defects in patterned substrates |
| 06/26/2001 | US6252237 Low cost thickness measurement method and apparatus for thin coatings |
| 06/21/2001 | WO2001045136A1 Method and system for the examination of specimen using a charged particle beam |
| 06/14/2001 | WO2001042737A1 Tissue sensor |
| 06/14/2001 | CA2394326A1 Tissue sensor |
| 06/07/2001 | WO2001041067A1 Method for extracting objective image |
| 06/07/2001 | WO2001040876A1 Method and apparatus for aligning a crystalline substrate |
| 06/07/2001 | DE10030145A1 Semiconductor wafer testing method involves irradiating charged particle on small region of wafer containing maximum opening defect, based on position data |
| 06/07/2001 | CA2392710A1 Method and apparatus for aligning a crystalline substrate |
| 06/06/2001 | CN1298203A Mask detecting apparatus and method |
| 06/05/2001 | US6242740 Imaging system functioning on submillimeter waves |
| 06/05/2001 | CA2233074C Container fill level and pressurization inspection using multi-dimensional images |
| 05/30/2001 | EP1103783A1 Equipment and method for measuring the basic weight and thickness of the materials in films, ribbons and the like, while simultaneously inspecting their surface |
| 05/29/2001 | US6239601 Thickness measurement device for ice, or ice mixed with water or other liquid |
| 05/29/2001 | US6238522 Method and apparatus for measuring sheet thickness in a paper-making machine |
| 05/23/2001 | EP1102031A2 A pattern dimension measuring method and apparatus |
| 05/23/2001 | CN1296287A Device for checking semiconductor device |
| 05/23/2001 | CN1296178A X-ray guiding device |
| 05/17/2001 | WO2001035051A2 X-ray tomography bga (ball grid array) inspections |
| 05/17/2001 | DE19954520A1 Vorrichtung zur Führung von Röntgenstrahlen Device for guiding X-rays |
| 05/17/2001 | CA2390068A1 Inspection method utilizing vertical slice imaging |
| 05/16/2001 | EP1100092A2 X-ray guiding device |
| 05/15/2001 | US6231668 Method for manufacturing a calibrated scale in the nanometer range for technical devices used for the high resolution or ultrahigh-resolution imaging of structures and such scale |
| 05/10/2001 | DE19950254A1 Verfahren und Vorrichtung zur Bestimmung eines Dickenquerprofils und des Dickenlängsprofils eines laufenden Materialbandes Method and device for determining a transverse thickness profile and the longitudinal thickness profile of a moving material strip |
| 05/09/2001 | EP1097352A1 Thickness measurement of fluorescing coatings |
| 05/02/2001 | CN1293603A Method and apparatus for determining the position of elongated object relative the surface of obstructing body by means of electromagnetic radiation |
| 05/01/2001 | US6226348 X-ray diffractometer method for determining thickness of multiple non-metallic crystalline layers and fourier transform method |
| 05/01/2001 | US6226086 Thickness monitoring |
| 04/25/2001 | EP1094296A2 Method and device for the determination of the thickness profile of a moving material band in the transversal and longitudinal direction |
| 04/25/2001 | EP1093574A1 Automatic defect classification with invariant core classes |
| 04/11/2001 | EP1090269A1 Determining the shape and orientation of a borehole |
| 03/27/2001 | US6208288 Millimeter wave all azimuth field of view surveillance and imaging system |
| 03/21/2001 | EP1085526A1 Measuring oxide thickness underlying a ferromagnetic material on nuclear fuel rods with two eddy current frequencies |
| 03/20/2001 | US6204507 Device for testing flat materials |
| 03/15/2001 | WO2001018487A1 Distortion detector |
| 03/15/2001 | DE10037697A1 Adaptive mask engineering for inspecting defects uses an algorithm to generate a two-dimensional scatter diagram by plotting grey grades of pixels from a test image in contrast to grey grades of pixels from a reference image. |
| 03/13/2001 | US6201850 Enhanced thickness calibration and shading correction for automatic X-ray inspection |
| 03/06/2001 | US6198293 Method and apparatus for thickness measurement using microwaves |
| 02/27/2001 | USRE37065 Triaxial normal and shear force sensor |
| 02/15/2001 | WO2001011656A1 Calibration of a scanning electron microscope |
| 02/15/2001 | WO2001011323A1 Level transmitter |
| 02/15/2001 | WO2001011316A1 X-ray fluorescence sensor for measurement of metal sheet thickness |
| 02/15/2001 | WO2001011315A1 X-ray fluorescence analysis of multilayered samples |
| 02/14/2001 | EP1076222A1 X-ray fluorescence measurement of aluminium sheet thickness |
| 02/13/2001 | US6188079 Measurement of hot container wall thickness |
| 02/08/2001 | WO2001009566A1 X-ray reflectometry measurements on patterned wafers |
| 02/07/2001 | CN2418462Y Front amplifier of beta-ray intelligent thickness instrument |
| 02/06/2001 | US6184694 Portable paint thickness gauge for composite materials using resonant cavities at x-band |
| 02/06/2001 | US6183561 Coat weight measuring and control apparatus |
| 02/01/2001 | WO2000052454A3 Improved thin layer nuclear density gauge |
| 01/31/2001 | EP1072861A1 Method for measuring the wall thickness of a tubular object |
| 01/31/2001 | EP1071535A1 A method and apparatus for determining the position of an elongated object relative the surface of an obstructing body by means of electromagnetic radiation |
| 01/30/2001 | US6178657 Apparatus and method for measuring the relative differential length in a sheet of material |
| 01/18/2001 | WO2001004574A1 Measurement of film thickness by inelastic electron scattering |
| 01/18/2001 | DE10020741A1 Computer tomography imaging method used in computer tomography imaging system, involves determining target object length by totaling distance between each adjoining images using determined boundary of target object |
| 01/17/2001 | EP1069395A1 Pressure-sensitive adhesive sheet for radiography |
| 01/16/2001 | US6175612 In-line fluorescent x-ray film thickness monitor |
| 01/11/2001 | DE19932279A1 Monitoring changes in contour of concave/convex point welding electrodes for motor vehicle manufacture using Doppler radar to measure spectra of moving welding point |
| 01/10/2001 | EP1019708A4 Ct target detection using surface normals |
| 01/09/2001 | US6173084 Noise reduction in an image |
| 01/04/2001 | DE10019789A1 Device and method for measuring the thickness of a sheet of plastic film or paper as it advances during a production process |
| 12/26/2000 | US6167113 X-ray imaging system for determining area density of low density samples |
| 12/20/2000 | EP1061551A2 Scanning charged-particle beam instrument and method of observing specimen image therewith |