| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 04/19/2007 | WO2007002927A3 Imaging geometry |
| 04/11/2007 | EP1771111A1 Penetrating radiation measurements |
| 04/11/2007 | CN1310025C Manufacturing method for test apparatus and parts |
| 04/10/2007 | US7203278 Radiography plate with automatic exposure time recording mechanism |
| 04/10/2007 | US7202951 Laser-based cleaning device for film analysis tool |
| 04/05/2007 | WO2007037626A1 Method of measuring thickness of thin film using microwave |
| 04/05/2007 | US20070076845 Methodologies for non-destructive quantification of thermal barrier coating temperatures on service run parts |
| 04/05/2007 | DE102005046973A1 Superimposed measuring structure used in the production of integrated circuits comprises a first periodic structure formed in a first component layer and a second periodic structure formed in a second component arranged over the first layer |
| 04/04/2007 | CN1940546A Check out test set and apparatus for manufacturing same |
| 04/03/2007 | US7200095 Method and apparatus for measuring a minute pitch |
| 03/29/2007 | WO2007034572A1 Method of measuring film thickness of surface oxide film of zinc-based plated steel sheet |
| 03/28/2007 | EP1766327A1 Determining the size of a radial gap |
| 03/28/2007 | CN1936498A Gas ionization type middle-low-energy X.gamma-ray detector |
| 03/27/2007 | CA2204693C Microwave air-path clearance sensor |
| 03/21/2007 | EP1764612A2 X-ray fluorescence spectrometer |
| 03/21/2007 | CN1932493A X-ray fluorescence analyzer |
| 03/15/2007 | US20070058776 X-ray fluorescence spectrometer |
| 03/13/2007 | US7191091 Advanced cable metrology system |
| 03/08/2007 | US20070051888 System and method for determining a cross sectional feature of a structural element using a reference structural element |
| 03/07/2007 | CN1924553A Method for determining lens errors in a particle-optical device |
| 03/01/2007 | DE102006034838A1 Turbine impeller blade thermal barrier coating layer thickness determining method, by comparing phase of received wave after reflection from impeller blade with phase of transmitted wave |
| 03/01/2007 | DE102005041004A1 Monitoring procedure for formation of deposits in combustion chamber, involves comparing predetermined surface temperature and thickness of combustion chamber walls with wall surface temperature and thickness measured using infrared cameras |
| 02/22/2007 | WO2007020170A1 Method for determining the layer thickness of a tbc coating of at least one blade of a non-positive-displacement machine, a corresponding tbc layer thickness measuring device for carrying out the method and use of the method and the tbc layer thickness measuring device |
| 02/22/2007 | DE10352411B4 Verfahren zur Entzerrung eines Röntgenbildes eines Gepäckstücks Method for equalizing a x-ray image of a bag |
| 02/21/2007 | EP1754861A2 Systems and methods for monitoring turbo machinery applications |
| 02/20/2007 | US7181060 Defect inspection method |
| 02/20/2007 | US7180062 Pattern measuring method |
| 02/15/2007 | DE202005020158U1 Measuring system e.g. for hollow waveguide of level measuring device operating with microwaves, has waveguide having malfunction back reflected with defined portion of electromagnetic wave provided in waveguide receiver |
| 02/15/2007 | DE102005037629A1 Casting part error depth and volume measuring method, involves finding linear function of correlation between material coat and gray scale value in image, and carrying out reflection of function at axis, on which value change is assigned |
| 02/15/2007 | DE102005036285A1 Verfahren zur Bestimmung der relativen Lage einer Röntgenquelle zu einem Röntgenbilddetektor und entsprechendes Röntgensystem A method for determining the relative position of an X-ray source to an X-ray detector and corresponding x-ray system |
| 02/15/2007 | DE102005028786A1 Measuring system for measurement of motor vehicle or part of motor vehicle, has three receiving devices for receiving radio signals and has evaluation device for determination of position of point of measuring head depending on radio signal |
| 02/13/2007 | US7175952 Method of generating mask distortion data, exposure method and method of producing semiconductor device |
| 02/08/2007 | WO2007014611A1 Method and apparatus for checking wall thickness |
| 02/08/2007 | WO2006062952A3 Multiple angle of incidence spectroscopic scatterometer system |
| 02/07/2007 | CN1908580A Method and x-ray system for determination of position of an x-ray source relative to an x-ray image detector |
| 02/06/2007 | US7174224 Smart camera |
| 02/06/2007 | US7174000 Method for measurement of the three-dimensional density distribution in bones |
| 02/06/2007 | US7173268 Method of measuring pattern dimension and method of controlling semiconductor device process |
| 02/01/2007 | DE102006011008A1 Multi-staged method, for preparing of corrected projection data as improved CT-reconstruction, includes initializing in which orientation of specimen is roughly determined and used for extraction of feature points |
| 01/31/2007 | CN1906547A Micro-optic security and image presentation system |
| 01/25/2007 | US20070021940 Use of imaging innovations for design and modification |
| 01/25/2007 | US20070020776 Method and apparatus for wall film monitoring |
| 01/25/2007 | DE102005002950B4 Verfahren zur automatischen Bestimmung der Position und Orientierung des linken Ventrikels und/oder angrenzender Bereiche in 3D-Bilddatensätzen des Herzens A method for automatically determining the position and orientation of the left ventricle and / or adjacent areas in the 3D image data sets of the heart |
| 01/24/2007 | EP1746386A2 Method of measuring three-dimensional surface roughness of a structure |
| 01/23/2007 | US7166840 Method for determining depression/protrusion of sample and charged particle beam apparatus therefor |
| 01/18/2007 | WO2007006626A1 Apparatus for electromagnetically measuring a wall thickness |
| 01/16/2007 | US7164128 Method and apparatus for observing a specimen |
| 01/16/2007 | US7164127 Scanning electron microscope and a method for evaluating accuracy of repeated measurement using the same |
| 01/11/2007 | US20070009087 Equipment and method for locating and identifying incrustations in ducts and in processing plants |
| 01/11/2007 | DE102005032687A1 Verfahren und Anordnung zum Auswerten eines Koordinaten-Datensatzes eines Messobjekts Method and apparatus for evaluating a coordinate record a measurement object |
| 01/11/2007 | DE102005032686A1 Verfahren und Anordnung zum Untersuchen eines Messobjekts mittels invasiver Strahlung Method and apparatus for inspecting a test object by means of invasive radiation |
| 01/04/2007 | US20070005294 Clearance measurement system and method of operation |
| 01/04/2007 | US20070003210 Distance measuring device and method for determining a distance |
| 01/03/2007 | EP1478918A4 Methods and devices for quantitative analysis of x-ray images |
| 12/28/2006 | US20060289756 Standard reference for metrology and calibration method of electron-beam metrology system using the same |
| 12/27/2006 | CN1886637A System and method for counting the number of layers of a multilayer object by means of electromagnetic waves |
| 12/21/2006 | WO2006134662A1 Thin film measuring apparatus, thin film measuring method and thin film manufacturing method |
| 12/20/2006 | CN1880947A Method and device for measuring grammage |
| 12/14/2006 | DE102006024206A1 Röntgenfluoreszenzspektrometer und darin verwendetes Programm X-ray fluorescence spectrometer and is used program |
| 12/14/2006 | CA2550164A1 Method and apparatus for measuring grammage |
| 12/12/2006 | US7148479 Defect inspection apparatus, program, and manufacturing method of semiconductor device |
| 12/07/2006 | US20060272373 Manufacturing method and manufacturing apparatus of pipe, thickness deviation information derivation apparatus, and computer program |
| 12/06/2006 | CN1288418C Measurement of hot container wall thickness |
| 12/05/2006 | US7145986 Solid state X-ray detector with improved spatial resolution |
| 11/30/2006 | US20060269121 Method and apparatus for circuit pattern inspection |
| 11/30/2006 | DE102004051113B4 Verfahren und Messanordnung zur elektrischen Ermittlung der Dicke von Halbleitermembranen durch Energieeintrag Method and apparatus for measuring electrical determination of the thickness of semiconductor membranes by energy input |
| 11/28/2006 | US7143005 Image reconstruction method |
| 11/28/2006 | US7142636 System and method for defective detector cell and DAS channel correction |
| 11/23/2006 | WO2006124536A1 Beta-ray backscatter apparatus for determining thickness and uniformity of anti -tamper coatings |
| 11/23/2006 | US20060261824 Semiconductor device test method and semiconductor device tester |
| 11/16/2006 | US20060255511 X-ray detection of the presence and/or condition of polymer components |
| 11/16/2006 | US20060255510 X-ray detection of polymer components in material processing |
| 11/16/2006 | DE102005048644A1 Surface weight or chemical composition determination procedure uses primary high energy X rays to generate secondary emission of material sample and converter |
| 11/15/2006 | EP1721122A1 Method for the nondestructive determination of the inner dimensions and/or the outer dimensions of a shoe and/or of a last |
| 11/15/2006 | EP1328195A4 Frameless radiosurgery treatment system and method |
| 11/14/2006 | US7135869 Thickness measuring systems and methods using a cavity resonator |
| 11/09/2006 | US20060249885 Apparatus for curing a composite laminate |
| 11/09/2006 | US20060249676 Apparatus and method for wafer pattern inspection |
| 11/09/2006 | DE102005020567A1 Verfahren und Vorrichtung zur Online-Bestimmung des Aschegehalts einer auf einem Födermittel geförderten Substanz und Vorrichtung zur Durchführung einer Online-Analyse Method and apparatus for on-line determination of the ash content of a conveyed on a conveyor means substance and apparatus for performing on-line analysis |
| 11/09/2006 | DE102005020297A1 Device for testing disc material with radiation source has radiation source and radiation detector, which are arranged on opposite sides with respect to disc material |
| 11/02/2006 | WO2006074412A3 Anodizing system with a coating thickness monitor and an anodized product |
| 11/02/2006 | US20060245542 Method for automatic defect recognition in testpieces by means of an X-ray examination unit |
| 11/02/2006 | US20060244629 System and mehod for counting number of layers of multilayer object by means of electromagnetic wave |
| 11/01/2006 | CN1854733A Method for measuring carbon nanometer tube growth speed |
| 10/31/2006 | US7130373 Method and apparatus for film thickness measurement |
| 10/26/2006 | US20060239402 CT method and apparatus for liquid safety-detection with a radiation source |
| 10/26/2006 | US20060237644 Standard member for length measurement, method for producing the same, and electron beam length measuring device using the same |
| 10/26/2006 | DE102005018447A1 Coordinate measuring and object scanning system uses X-ray source and X-ray sensors for primary scan and tactile and/or optical secondary mechanism movable in X, Y and Z directions for secondary scan |
| 10/24/2006 | US7126700 Parametric optimization of optical metrology model |
| 10/19/2006 | US20060231758 Inspection system, inspection method, and process management method |
| 10/18/2006 | CN1849497A A system and method for determining a cross sectional feature of a structural element using a reference structural element |
| 10/12/2006 | WO2006107049A1 Mask inspecting method and mask inspecting apparatus |
| 10/12/2006 | DE102005014793A1 Technik zur CD-Messung auf der Grundlage der Bestimmung von Flächenanteilen Technique for CD measurement on the basis of the determination of surface portions |
| 10/10/2006 | US7120228 Combined X-ray reflectometer and diffractometer |
| 10/10/2006 | US7120225 Methods and devices for analysis of x-ray images |
| 10/05/2006 | US20060219917 Scanning electron microscope with measurement function |
| 10/05/2006 | US20060219909 Detecting apparatus and device manufacturing method |
| 10/03/2006 | US7116816 Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen |
| 09/21/2006 | US20060212261 Method and apparatus for measuring wall thickness, ovality of tubular materials |
| 09/21/2006 | US20060210018 Methods and devices for quantitative analysis of x-ray images |