| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 10/10/2007 | CN101052858A Method and device for measuring width direction end position of stripe body, and method and device for measuring width direction central position of stripe body |
| 10/09/2007 | US7279683 Distance measurement apparatus of gamma ray source using multilayered ray detector |
| 10/09/2007 | US7278186 Ultra low frequency moisture sensor |
| 10/03/2007 | EP1840538A2 Line-width measurement adjusting method and scanning electron microscope |
| 10/03/2007 | EP1840504A1 Pattern measurement apparatus and pattern measuring method |
| 10/03/2007 | EP1839013A2 Anodizing system with a coating thickness monitor and an anodized product |
| 10/03/2007 | EP1040316B1 Distance measuring device and method for determining a distance |
| 10/03/2007 | CN101046373A Continuous precise metal belt measuring X-ray process and equipment |
| 10/03/2007 | CN100340353C Method and apparatus for producing pipe, wall thickness variation-obtaining device, and computer program |
| 10/02/2007 | US7277594 System and method for preparing an image corrected for the presence of a gravity induced distortion |
| 09/27/2007 | US20070225939 Method and apparatus for measuring wall thickness, ovality of tubular materials |
| 09/27/2007 | DE102006013923A1 Microwave position measuring device for e.g. fluid technical linear actuator, has microwave antenna arrangement formed in mode, with which electrical field of microwaves at cross section inner circumference of waveguide is zero |
| 09/27/2007 | CA2644953A1 Method and system using nir spectroscopy for in-line monitoring and controlling content of engineered wood products |
| 09/18/2007 | US7272206 Method and apparatus for void content measurement and method and apparatus for particle content measurement |
| 09/18/2007 | US7271902 Generic interface for an optical metrology system |
| 09/18/2007 | US7269995 Method and apparatus of vibration isolation, in particular for electron beam metrology tools |
| 09/13/2007 | WO2007103304A2 A mobile apparatus capable of surface measurements of a coating thickness |
| 09/13/2007 | WO2007102421A1 Pattern inspecting system and pattern inspecting method |
| 09/12/2007 | CN200947699Y X-ray power control device for thickness meter |
| 09/06/2007 | US20070208533 Image reconstruction method |
| 09/06/2007 | DE102006062009A1 Methode und Vorrichtung zur Inspektion eines Gegenstandes mittels Multienergie-Bestrahlung Method and apparatus for inspecting an object by means of multi-energy radiation |
| 09/06/2007 | DE102006004416A1 Errors detecting method for e.g. cast part, involves comparing values of central moments of pixel in original image by semantics/effective images, and evaluating error in testing part when values of semantics are not maintained for pixel |
| 09/04/2007 | US7266174 Radiographic inspection of airframes and other large objects |
| 08/30/2007 | WO2007097955A2 Methods for monitoring binder mix loading of fiber glass mats |
| 08/30/2007 | CA2640634A1 Methods for monitoring binder mix loading of fiber glass mats |
| 08/29/2007 | EP1166095B1 Improved thin layer nuclear density gauge |
| 08/23/2007 | WO2007094439A1 Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus |
| 08/23/2007 | US20070198209 Magnetic-sensor controller, magnetism measurement apparatus, offset setting method, and computer-readable medium on which offset setting program is recorded |
| 08/23/2007 | US20070195927 Method and apparatus for inspecting circuit boards |
| 08/23/2007 | US20070194236 Semiconductor inspection system |
| 08/22/2007 | CN101023322A Coordinate measuring apparatus and method for measuring an object |
| 08/22/2007 | CN101023321A Method for microwave measurement, measuring device and oscillator |
| 08/16/2007 | US20070192057 Method and apparatus for repairing shape, and method for manufacturing semiconductor device using those |
| 08/16/2007 | US20070189453 X-ray beam calibration for bone mineral density assessment using mammography system |
| 08/15/2007 | CN101019001A Determining the size of a radial gap |
| 08/14/2007 | CA2226263C Apparatus for and method of nuclear quadrupole testing of a sample |
| 08/09/2007 | US20070181825 Measurement method, transfer characteristic measurement method, adjustment method of exposure apparatus, and device manufacturing method |
| 08/09/2007 | DE112005002225T5 Verfahren zur Mikrowellenmessung, Messgerät und Oszillator A method for microwave measurement, meter and oscillator |
| 08/09/2007 | DE102004057743B4 Verfahren und Vorrichtung zum Bestimmen des Flächengewichtes einer geförderten Materialprobe Method and device for determining the surface weight of a supported material sample |
| 08/08/2007 | EP1816468A1 Apparatus and process for measuring the profile of at least one physical quantity of a film material |
| 08/08/2007 | EP1664672A4 Geosteering detectors for boring-type continuous miners |
| 08/08/2007 | CN1331073C A communication method and common control bus interconnecting a controller and a precision measurement assembly |
| 08/07/2007 | US7253901 Laser-based cleaning device for film analysis tool |
| 08/07/2007 | US7253645 Detection of defects in patterned substrates |
| 08/02/2007 | US20070179740 Volume based extended defect sizing system |
| 08/02/2007 | DE102004006258B4 Verfahren zum Angleichen von zwei Messverfahren für die Messung von Strukturbreiten auf einem Substrat A method for matching of two measuring methods for measuring structure widths on a substrate |
| 08/01/2007 | EP1813912A1 Method and device for measuring width direction end position of stripe body, and method and device for measuring width direction central position of stripe body |
| 08/01/2007 | EP1634036A4 Measuring apparatus |
| 08/01/2007 | CN2928283Y Continuous high precision metal strip X-ray thickness measurer |
| 07/26/2007 | WO2007083178A1 Method and device for measuring the thickness of a layer of material |
| 07/26/2007 | CA2637788A1 Method and device for measuring the thickness of a layer of material |
| 07/24/2007 | US7248992 Combined feature dimensional parameter analysis |
| 07/19/2007 | US20070168152 System and method for facilitating automated dental measurements and diagnostics |
| 07/19/2007 | DE102004039763B4 Verfahren zum Bestimmen der Dicke einer Schicht A method for determining the thickness of a layer |
| 07/17/2007 | US7245697 Methods and devices for quantitative analysis of x-ray images |
| 07/12/2007 | WO2007021645A3 Method and system for limiting interference in electroencephalographic signals |
| 07/05/2007 | WO2007075722A1 Measurement of ash composition using scanning high voltage x-ray sensor |
| 07/05/2007 | WO2007074166A1 Measurement of the thickness of (a) film(s) present as a thin layer on a sample support |
| 07/05/2007 | US20070153973 Bone mineral density assessment using mammography system |
| 07/05/2007 | CA2635556A1 Measurement of ash composition using scanning high voltage x-ray sensor |
| 07/04/2007 | EP1803399A1 Method and device for determining the current position of the structure of an object under investigation |
| 07/04/2007 | CN1991345A Battery pole piece surface density measuring system and method |
| 06/28/2007 | WO2007071828A1 Method of manufacturing a pipe and a pipe |
| 06/27/2007 | EP1801571A1 Apparatus for measuring the density of manufactured articles, particularly panels of pressed loose material, and associated method |
| 06/27/2007 | EP1801536A1 Method of manufacturing a pipe and a pipe |
| 06/27/2007 | EP1305815A4 Film thickness measurement using electron-beam induced x-ray microanalysis |
| 06/26/2007 | US7235782 Semiconductor inspection system |
| 06/26/2007 | US7235780 Method and system for detecting a property of a pavement by measuring gamma-radiation |
| 06/20/2007 | EP1438732A4 Methods and apparatus for defect localization |
| 06/20/2007 | CN1982889A Ultrasonic inspection of petroleum pipeline and inspecting robot |
| 06/14/2007 | US20070133746 Method for imaging multiphase flow using electrical capacitance tomography |
| 06/14/2007 | US20070133745 Systems and Methods for Non-Instrusive Inspections of High-Voltage Circuit Breakers |
| 06/14/2007 | US20070133739 Osteoporosis screening using radiographic absorptiometry of the mandible |
| 06/14/2007 | US20070132971 Lithographic apparatus and device manufacturing method |
| 06/14/2007 | US20070131877 Pattern inspection method and system therefor |
| 06/12/2007 | US7231071 Abnormal shadow detecting system |
| 06/12/2007 | US7230241 Method for matching two measurement methods for measuring structure widths on a substrate |
| 06/07/2007 | WO2005079306A3 Method, system, and computer software product for feature-based correlation of lesions from multiple images |
| 06/07/2007 | US20070127806 Pattern inspection apparatus |
| 06/06/2007 | EP1793221A2 Surface inspection method and surface inspection apparatus |
| 05/31/2007 | US20070124108 Structure, system and method for dimensionally unstable layer dimension measurement |
| 05/31/2007 | US20070120078 Method of measuring pattern dimension and method of controlling semiconductor device process |
| 05/30/2007 | CN1971257A CT-method for recording projection data |
| 05/24/2007 | WO2007058212A1 X-ray inspection device |
| 05/24/2007 | US20070114399 Pattern measuring method |
| 05/24/2007 | US20070114398 Method and apparatus for observing a specimen |
| 05/23/2007 | CN1967774A Sample structure of scanning electron microscope made by IC and its manufacturing method |
| 05/17/2007 | US20070112541 Form measuring device, form measuring method, form analysis device, form analysis program, and recording medium storing the program |
| 05/16/2007 | CN1962102A Convexity measuring device using X-ray |
| 05/16/2007 | CN1316229C Thin-membrane thickness and density measurement without sampler |
| 05/10/2007 | US20070104315 Printed circuit board inspection system combining x-ray inspection and visual inspection |
| 05/09/2007 | EP1056395B1 Optical high speed communications for computer tomograph |
| 05/09/2007 | CN1958184A Cooling system of apparatus for measuring thickness / convexity |
| 05/08/2007 | US7214289 Method and apparatus for wall film monitoring |
| 05/03/2007 | DE102006048974A1 Irradiation process using charged particles for sampling and irradiating using a charged particle beam for observing or treating workpieces |
| 05/01/2007 | US7212883 Machine readable medium and method for determining feature-relating tolerance consumed |
| 05/01/2007 | US7212607 X-ray confocal defect detection systems and methods |
| 04/26/2007 | US20070092060 Analysis of Elemental Composition and Thickness in Multilayered Materials |
| 04/25/2007 | EP1777136A1 Moving body system and moving body |
| 04/24/2007 | US7209857 Method of evaluating shape of semiconductor wafer and apparatus for evaluating shape of semiconductor wafer |