Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671)
05/1994
05/03/1994US5309495 Positioning device for an x-ray thickness measuring system
04/1994
04/24/1994CA2109021A1 Process for the identification of randomly shaped materials by determination through application of electromagnetic and/or acoustic waves
04/20/1994EP0592520A1 Apparatus and method for calibrating an x-ray layer thickness measuring apparatus.
03/1994
03/29/1994US5299252 Fluorescent X-ray film thickness measuring apparatus
03/08/1994US5293214 Apparatus and method for performing thin film layer thickness metrology by deforming a thin film layer into a reflective condenser
02/1994
02/22/1994US5289267 Electro-optical system for gauging surface profile deviations
02/17/1994WO1994003776A1 Online tomographic gauging of sheet metal
02/15/1994US5285785 Apparatus and method for locating foreign bodies in humans and animals
02/10/1994DE4226179A1 Correcting long and short-term variations in operating parameters during film analysis using x-ray fluorescence analysis - measuring reference channel and sample intensities at start-up or after re-adjustment, and intensities of excitation beam stimulation intensity as well as measurement specimen intensity
01/1994
01/18/1994US5280176 X-ray photoelectron emission spectrometry system
01/15/1994CA2100147A1 Apparatus for measuring thickness of metals on a rolling mill
01/06/1994WO1994000737A1 Radio frequency linear position sensor
01/05/1994EP0576961A2 Method for automatic foreground and background detection in digital radiographic images
12/1993
12/28/1993CA1325664C Power transmission
12/22/1993EP0574987A1 Arrangement for processing a measurement signal corresponding to the intensity of X-rays reflected by a multilayer structure on a substrate
12/07/1993US5268967 Method for automatic foreground and background detection in digital radiographic images
12/01/1993EP0572144A2 Apparatus and method for performing thin film layer thickness metrology by deforming a thin film layer into a reflective condenser
11/1993
11/25/1993WO1993023722A1 Linear position sensor with equalizing means
11/24/1993CN2147534Y Multi-function modulus of elasticity tester
11/11/1993WO1993022661A1 A method for using secondary radiation scattering to evaluate the thickness of materials
11/02/1993US5258824 In-situ measurement of a thin film deposited on a wafer
10/1993
10/27/1993EP0566963A2 A specimen image producing apparatus
10/19/1993US5255302 Foil-thickness measuring device
10/19/1993CA1323453C Automated laminography system for inspection of electronics
10/07/1993DE4211394A1 Measuring thickness of surface layers in nanometre region - using interaction vol. produced by primary electron beam in raster electron microscope and energy-dispersive X=ray spectroscopy.
09/1993
09/22/1993EP0560894A1 Apparatus and method for determining the linear position of a hydraulic cylinder.
09/15/1993EP0334897B1 Rotor recognition system
09/15/1993CN1076279A Method and device for non-destructive examination of a wall of a tank containing a redioactive liquid
09/02/1993WO1993017298A1 Process and device for the quality control of rolls of foil produced on calender or extrusion machines
08/1993
08/31/1993US5241279 Microwave measuring apparatus for continuously and without contact measuring the thickness of a thin conducting layer of a running insulating support such as a fiber or a tape
08/31/1993US5241278 Radio frequency linear position sensor using two subsequent harmonics
08/26/1993DE4204916A1 Verfahren und vorrichtung zur qualitaetskontrolle von auf kalander- oder extrudermaschinen hergestellten folienrollen Method and apparatus for quality control of on calender or extruder machine film roll produced
08/18/1993CN1075364A Method for measuring thickness of hydrogen-containing thin layer material by neutron technology
08/12/1993DE4203887A1 Positioning system for X=ray secondary radiation back-scattering thin film thickness measurement - positioned using light system with led relative to x ray beam of measuring unit for measuring thickness of thin layers according to back scatter principle
07/1993
07/21/1993EP0551783A1 Method and apparatus for non-destructive testing of the wall of a container filled with a radioactive liquid
07/13/1993US5228071 CT system and method of using the same
07/08/1993WO1993013388A1 Linear position sensor using a coaxial resonant cavity
07/08/1993CA2122603A1 Linear position sensor using a coaxial resonant cavity
07/06/1993CA1320008C Method of simultaneously measuring thickness and composition of film and apparatus therefor
06/1993
06/01/1993US5216372 Microwave steel belt location sensor for tires
05/1993
05/19/1993DE4137673A1 Grazing X=ray reflectometer for rapid diffraction investigations - enabling surface property and thin film thickness determination
05/13/1993WO1993008737A1 Apparatus and method for locating foreign bodies
05/05/1993EP0539612A1 Process for continuously measuring the distance between a coated support material and an apparatus measuring the strength of the material coating
05/05/1993EP0539611A1 Measuring device
05/05/1993EP0539532A1 Dynamic alloy correction gauge
04/1993
04/20/1993US5204889 Apparatus for measuring thickness of metals on a rolling mill
04/15/1993WO1993007444A1 Apparatus and method for determining the linear position of a hydraulic cylinder
04/13/1993US5202909 Method and apparatus for measuring transverse thickness profile of a metal strip
03/1993
03/31/1993EP0526629A4 Radioactive areal density detector with scintillating receiver
03/18/1993WO1993005388A1 Antenna system for soot detecting apparatus
03/18/1993CA2117078A1 Antenna system for soot detecting apparatus
03/16/1993US5195117 Method for using secondary radiation scattering to evaluate the thickness of materials
03/16/1993US5195116 Compton-effect method and system for locating a plane separating two media of different densities
03/16/1993US5195115 X-ray diffractometer device and use of this device
03/11/1993DE4229275A1 Sample position control in focussed ion beam system e.g. for faulty bit analysis of semiconductor memory - allows automatic movement of sample w.r.t. reference point calculated by detection of secondary electrons released by irradiation by ion beam
03/10/1993EP0303595B1 Linear position sensor
03/03/1993EP0529790A1 Microwave sensor to determine thickness
02/1993
02/25/1993DE4141446C1 Measuring thickness of layer of water, snow or ice - evaluating reflected EM radiation directed at inclined angle from above surface e.g. road
02/23/1993US5188426 Method for controlling the thickness of a layer of material in a seam
02/10/1993EP0526629A1 Radioactive areal density detector with scintillating receiver
01/1993
01/30/1993CA2074109A1 Microwave steel belt location sensor for tires
01/26/1993US5182454 Scanning electron microscope
01/21/1993WO1993001470A1 Multiplexed radio frequency linear position sensor system
01/07/1993WO1993000567A1 Apparatus and method for calibrating an x-ray layer thickness measuring apparatus
01/07/1993EP0521839A1 Determination of roll angle
01/03/1993CA2072773A1 Determination of roll angle
12/1992
12/22/1992US5173929 Method for determining the thickness of a metallic coating on a gas turbine blade
11/1992
11/25/1992EP0515187A2 Method and apparatus for sensing proximity of an object using near-field effects
11/23/1992CA2068098A1 Method and apparatus for sensing proximity of an object using near-fieldeffects
11/17/1992US5164971 Non-destructive testing apparatus and process with simultaneous acquisition of radiographic data and tomographic data
11/17/1992CA1310396C Rotor recognition system
11/12/1992DE4215092A1 Photomultiplier tube for measuring hot steel strip thickness
11/10/1992US5162131 Method and equipment for measurement and regulation of quantity of coating
11/03/1992US5161201 Method of and apparatus for measuring pattern profile
10/1992
10/29/1992DE4114398A1 Device for measuring distance between points separated by non-metallic mediun - has transmitter of alternating magnetic field with transmission coil, reception module with receiver coil and distance evaluation and display circuit
10/28/1992EP0511145A2 Method for determining the thickness of an interfacial polysilicon/silicon oxide film
10/28/1992EP0510796A2 Damping mechanism for load cell
10/27/1992US5159643 Method and apparatus for measuring pattern dimension
10/27/1992CA2061843A1 Damping mechanism for load cell
10/15/1992DE4110786A1 Vorrichtung zur ermittlung der schichtdicke eines fluids Device for determining the layer thickness of a fluid
10/14/1992EP0508854A1 Continuous contact-free thickness measuring device for thin conductive films on an insulating substrate, such as a moving fibre or band
10/14/1992EP0507988A1 Method and apparatus for cross section measurement of electrical wires
10/05/1992CA2061278A1 Device for determining the thickness of a fluid film
10/01/1992WO1992016819A1 Dynamic alloy correction gauge
09/1992
09/30/1992CN1018480B Method and apparatus for measuring and/or monitoring properties of yarns or ropes
09/22/1992US5150060 Multiplexed radio frequency linear position sensor system
09/17/1992DE4208187A1 Measuring antenna mirror surface shape - using distance and angle measurement arrangement and computer separation gravitation independent and dependent deformations
09/16/1992EP0503940A2 A method of determining the amount of deformation induced in a material in response to a compressive force
09/15/1992US5148030 Radiation image detecting apparatus using address coded signals
09/14/1992CA2062917A1 Method for determining the amount of deformation induced in a material by a compressive force
09/08/1992US5144814 Thermistor calibration
09/01/1992CA1307056C Thickness/density measuring apparatus
08/1992
08/26/1992WO1992015011A1 Radioactive areal density detector with scintillating receiver
08/26/1992EP0500453A1 Method for non-destructive on-line measuring of a characteristic of a continuously manufactured product, and associated apparatus
08/26/1992CA2083533A1 Radioactive areal density detector with scintillating receiver
08/25/1992US5141064 Liquid damping mechanism employing an adjustable shear plate
08/20/1992CA2060990A1 Non destructive process for measuring a continuously manufactured product, and related device
08/12/1992EP0498687A1 Method and system using the Compton effect to localise a plane separating two media of different densities
08/11/1992US5138644 Method and apparatus for measuring the wall thickness of insulated pipe
08/11/1992US5138256 Method and apparatus for determining the thickness of an interfacial polysilicon/silicon oxide film
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