| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 10/07/1999 | DE19813041A1 Measurement device for rotating object, especially tool, workpiece, or machine part |
| 09/29/1999 | EP0945839A2 Electric resonance element, detection apparatus and moving vehicle control system |
| 09/15/1999 | EP0941409A1 Method and apparatus for sensing piston position |
| 09/14/1999 | US5952133 Methods for evaluating image-forming characteristics of a projection-optical system used in a charged-particle-beam microlithography apparatus |
| 08/24/1999 | US5942688 Apparatus and method for detecting a measurable quantity of an object |
| 08/24/1999 | US5942063 Method of manufacturing multilayer ceramic component including capacitor |
| 08/19/1999 | DE19844756A1 Thickness measuring method for metal strip |
| 08/18/1999 | CN1044745C Testing method for x-ray fluorescent gold content and thickness of gold plated cladded |
| 07/28/1999 | EP0932022A1 Method and apparatus for dimension measurement and inspection of structures |
| 07/28/1999 | CN1224495A 跨式检查系统 Straddle inspection system |
| 07/21/1999 | EP0930638A1 Scanning electron microscope, production method for semiconductor device by using the same, image forming method |
| 07/21/1999 | EP0930515A2 Method for distance measurement and contour sensing using microwaves |
| 07/21/1999 | EP0930046A2 Method of, and apparatus for, imaging |
| 07/13/1999 | US5923720 Angle dispersive x-ray spectrometer |
| 07/13/1999 | US5923034 Pattern transfer mask, mask inspection method and a mask inspection apparatus |
| 06/30/1999 | EP0925482A1 Measurement arrangement |
| 06/23/1999 | EP0923760A1 Noise reduction in an image |
| 06/16/1999 | CN2324538Y Soldering seam melting width real time detector |
| 06/15/1999 | US5912943 Cooling system for a sealed housing positioned in a sterile environment |
| 06/15/1999 | US5912467 Charged particle beam exposure apparatus |
| 06/10/1999 | WO1999028964A1 Method for producing electronic device and foreign matter analyser therefor |
| 06/09/1999 | EP0920672A1 Position-sensing unit and multidimensional pointer comprising one or several such units |
| 06/02/1999 | EP0920241A2 Imaging system |
| 06/02/1999 | EP0919186A2 Apparatus for and method of imaging |
| 05/26/1999 | EP0917642A1 Improved thickness monitoring |
| 05/25/1999 | US5906902 Manufacturing system error detection |
| 05/18/1999 | US5905806 Method of detecting an explosive |
| 05/12/1999 | DE19746956A1 Medical system with X=ray device and therapy device and source of focused acoustic waves |
| 05/04/1999 | US5900937 Optical interferometer using beam energy modulation to measure surface topology |
| 04/22/1999 | WO1999019716A1 Ct target detection using surface normals |
| 04/22/1999 | DE19746069A1 Position measurement device with picometer range resolution |
| 04/20/1999 | US5896429 Gamma ray bombardment |
| 04/08/1999 | WO1999006788A3 Distance measuring device and method for determining a distance |
| 04/07/1999 | EP0837649A4 Diagnostic tomographic laser imaging apparatus |
| 03/25/1999 | WO1999014581A1 Method for measurement of blast furnace liner thickness |
| 03/25/1999 | CA2303342A1 Method for measurement of blast furnace liner thickness |
| 03/24/1999 | EP0903566A2 Imaging system functioning on submillimeter waves |
| 03/11/1999 | DE19739321A1 Measuring uncertainty evaluation method for X-ray fluorescence thickness measurements |
| 02/25/1999 | WO1999009399A1 Apparatus and method for in-situ thickness and stoichiometry measurement of thin films |
| 02/11/1999 | WO1999006788A2 Distance measuring device and method for determining a distance |
| 02/04/1999 | WO1999005487A1 Accurate tissue injury assessment using hybrid neural network analysis |
| 02/02/1999 | US5866904 Scanning electron microscope and method for dimension measuring by using the same |
| 01/26/1999 | US5864600 Container fill level and pressurization inspection using multi-dimensional images |
| 01/19/1999 | US5862199 Method and apparatus for measuring thickness of paint layers on substrates using backscattering of x-rays |
| 12/30/1998 | EP0886759A1 Compton backscatter pipe wall thickness gauge employing focusing collimator and annular detector |
| 12/23/1998 | WO1998058245A1 Angle dispersive x-ray spectrometer |
| 12/23/1998 | EP0885430A1 Apparatus and method for providing high fidelity reconstruction of an observed sample |
| 12/10/1998 | WO1998055916A1 Noise reduction in an image |
| 12/10/1998 | WO1998055851A1 Single beam photoneutron probe and x-ray imaging system for contraband detection and identification |
| 12/08/1998 | US5848118 Method and apparatus for detecting inhomogeneities in seat assemblies |
| 12/08/1998 | US5847488 Apparatus having drive device using electromechanical transducer |
| 12/03/1998 | DE19722482A1 Material testing plant |
| 12/02/1998 | EP0880679A2 Method and apparatus for sensing proximity or position of an object using near-field or magnetic effects |
| 11/24/1998 | US5841094 Method and apparatus for resistance welding coated sheet metal |
| 11/17/1998 | US5838759 Single beam photoneutron probe and X-ray imaging system for contraband detection and identification |
| 11/10/1998 | US5834795 Test pattern for measuring line width of electrode and method for measuring the same |
| 10/28/1998 | EP0873574A1 Method to determine depth profiles in an area of thin coating |
| 10/20/1998 | US5822875 Scanning electron microscopic ruler and method |
| 10/13/1998 | US5821862 Method and apparatus for measuring ice thickness on substrates using backscattering of gamma rays |
| 10/06/1998 | US5818242 Microwave recess distance and air-path clearance sensor |
| 09/30/1998 | EP0866944A2 Device for testing flat materials |
| 09/23/1998 | CN1193898A Dianostic tomographic laser imaging apparatus |
| 09/22/1998 | US5811803 Electron microscope |
| 09/17/1998 | WO1998040696A1 Method for measuring linear dimensions |
| 09/15/1998 | US5809104 Method and device for measuring the content of bone mineral in the skeleton |
| 09/10/1998 | DE19737760A1 Instrumental method of detecting three=dimensional objects |
| 08/27/1998 | DE19707645A1 Layer thickness determination |
| 08/25/1998 | US5798529 Focused ion beam metrology |
| 08/25/1998 | US5798525 X-ray enhanced SEM critical dimension measurement |
| 08/20/1998 | DE19705769A1 Monitoring device for radial and axial clearance between blades and housing of turbo engine |
| 08/19/1998 | EP0858664A1 X-ray thickness gauge |
| 08/18/1998 | US5795531 Method and apparatus for the cross-sectional measurement of electric insulated conductors |
| 07/30/1998 | DE19803021A1 Pattern examination method for IC chips |
| 07/30/1998 | DE19801770A1 Sample analysis device for semiconductor integrated circuit investigation |
| 07/15/1998 | EP0852718A1 Container fill level and pressurization inspection using multi-dimensional images |
| 07/07/1998 | US5778042 On a glass surface |
| 07/07/1998 | US5777327 Pattern shape inspection apparatus for forming specimen image on display apparatus |
| 06/30/1998 | US5774520 Densitometer for determining the density distribution and variation of density of an object |
| 06/30/1998 | US5773984 Method of inspecting abnormality occurring inside pipe and apparatus for practicing the method |
| 06/16/1998 | US5767516 Electron microscope and sample observing method using the same |
| 06/04/1998 | WO1998023867A1 Method and apparatus for sensing piston position |
| 05/20/1998 | EP0842636A1 Measuring instrument and measuring method |
| 05/19/1998 | US5753060 Method of manufacturing multilayer ceramic component |
| 05/12/1998 | US5750990 Method for measuring critical dimension of pattern on sample |
| 05/05/1998 | US5748003 Microwaves used for determining fatigue and surface crack features on metal surfaces |
| 05/05/1998 | US5747802 Automated non-visual method of locating periodically arranged sub-micron objects |
| 04/29/1998 | EP0837649A1 Diagnostic tomographic laser imaging apparatus |
| 04/23/1998 | WO1998016948A1 Method to determine depth profiles in an area of thin coating |
| 04/16/1998 | DE19641981A1 Verfahren zur Bestimmung von Tiefenprofilen im Dünnschichtbereich Method for the determination of depth profiles in thin-film |
| 04/15/1998 | EP0789888A4 X-ray computed tomography (ct) system for detecting thin objects |
| 04/01/1998 | CN1178019A X-ray computerized tomography (CT) system for detecting thin objects |
| 03/12/1998 | WO1998010373A1 Position-sensing unit and multidimensional pointer comprising one or more such units |
| 03/11/1998 | EP0808477A4 Fabrication and use of a sub-micron dimensional standard |
| 03/05/1998 | DE19635431A1 Identification of fibre orientation |
| 02/19/1998 | WO1998007002A1 Improved thickness monitoring |
| 02/10/1998 | US5717205 Method and apparatus for measuring mass distribution of a shaft |
| 01/27/1998 | US5712926 Method of detecting an explosive |
| 01/27/1998 | US5712893 Real time radiographic inspection system |
| 01/20/1998 | US5710514 Hydraulic cylinder piston position sensing with compensation for piston velocity |
| 01/13/1998 | US5708276 Electron-beam exposure device and a method of detecting a mark position for the device |