| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 08/06/1985 | US4534049 Fluorescent X-ray film thickness gauge |
| 07/09/1985 | US4528507 Sheet measuring apparatus with two structurally isolated non-contacting surface follower bodies and wireless signal transmission |
| 06/25/1985 | US4525854 Radiation scatter apparatus and method |
| 06/25/1985 | CA1189638A1 Procedure for determining coating rates |
| 05/28/1985 | US4520308 Process and device for the nondestructive measurement of material accumulations or coating thicknesses on dielectric materials, in particular plastic |
| 05/23/1985 | WO1985002266A1 Process for measuring the state changes induced by weather elements on traffic surfaces and apparatus for implementing such process |
| 05/07/1985 | CA1186814A1 Non-contact radiation thickness gauge |
| 05/07/1985 | CA1186813A1 Apparatus for measuring the thickness profile of strip material |
| 04/23/1985 | US4513384 Thin film thickness measurements and depth profiling utilizing a thermal wave detection system |
| 04/09/1985 | US4510577 Non-contact radiation thickness gauge |
| 03/05/1985 | US4503433 Range measurement by means of frequency modulated continuous wave radar |
| 02/12/1985 | US4499540 Device for the testing of bodies comprising periodic structures |
| 01/22/1985 | US4495635 Method and apparatus for profiling structural sections |
| 01/22/1985 | US4495633 Process and apparatus for the dimensional and non-destructive control of a hollow member |
| 01/17/1985 | WO1985000123A1 System to measure geometric and electromagnetic characteristics of objects |
| 01/17/1985 | WO1985000122A1 Parts sorting systems |
| 01/08/1985 | US4492915 Method and apparatus for the electronic measurement of the thickness of very thin electrically conductive films on a nonconductive substrate |
| 01/01/1985 | US4491731 Tube wall thickness measurement |
| 12/27/1984 | CA1180131A Tube wall thickness measurement |
| 12/05/1984 | EP0127279A1 Strip profile gauge |
| 12/05/1984 | EP0127244A1 Arrangement for measuring the velocity and/or the length of moving objects |
| 10/30/1984 | US4480188 Method and device to determine interplanar distances in electron diffraction images |
| 10/03/1984 | EP0120676A2 Radiation scatter apparatus and method |
| 10/02/1984 | US4475041 Aperture device for measuring thin films |
| 10/02/1984 | US4475037 Method of inspecting a mask using an electron beam vector scan system |
| 09/04/1984 | US4470123 Microwave ice accretion meter |
| 08/21/1984 | US4467198 Radiation shielding arrangement for coating thickness measurement device |
| 07/24/1984 | CA1171557A2 Tube wall thickness measurement |
| 07/24/1984 | CA1171556A2 Tube wall thickness measurement |
| 06/27/1984 | EP0112079A2 Measuring method and apparatus |
| 06/19/1984 | CA1169588A1 Tube wall thickness measurement |
| 06/13/1984 | EP0110468A1 Method of growing an alloy film by a layer-by-layer process on a substrate, and a method of making a semiconductor device |
| 06/13/1984 | EP0110301A2 Method and apparatus for measuring dimension of secondary electron emission object |
| 05/29/1984 | US4451732 Apparatus for measuring thickness of coating on continuously moving material |
| 04/18/1984 | EP0105711A2 Determining the position of a wafer by means of electron beams |
| 04/11/1984 | EP0105185A1 Target body position measuring method for charged particle beam fine pattern exposure system |
| 04/10/1984 | US4442535 Fluorescent X-ray film thickness gauge for very small areas |
| 04/03/1984 | US4441022 Coating thickness measuring device |
| 03/13/1984 | US4437012 Device for bringing about coincidence between the axis of a measuring probe and a normal to the surface of a part to be controlled |
| 03/06/1984 | US4435643 Gammanetric thickness measuring apparatus |
| 02/28/1984 | US4434366 Apparatus for measuring coating thickness |
| 02/28/1984 | CA1163022A1 Apparatus for recording pulse height distribution in a fluorescent x-ray film thickness meter |
| 01/31/1984 | US4428618 Mining machine control signal processing system |
| 01/04/1984 | EP0097473A1 Evaluating the thickness of a layer or determining change in thermal characteristics with depth by thermal wave detection |
| 01/03/1984 | US4424445 Portable coating thickness measuring device |
| 11/23/1983 | EP0094669A1 Gauge for measuring a sheet of material |
| 11/23/1983 | EP0094501A2 Methods of inspecting pattern masks |
| 10/25/1983 | CA1155959A1 Apparatus for determining pen acceleration |
| 10/04/1983 | CA1154883A2 Procedure for measuring coating rates |
| 09/27/1983 | US4406948 Device for measuring thin films by means of beta radiation |
| 09/20/1983 | US4406015 Fluorescent X-ray film thickness gauge |
| 08/30/1983 | US4400958 System for measuring the thickness of a strip emerging from a rolling mill |
| 07/26/1983 | CA1150857A1 Method and apparatus for measuring tube wall thickness |
| 07/21/1983 | WO1983002497A1 Microwave ice accretion meter |
| 07/20/1983 | EP0083962A2 Microwave ice accretion meter |
| 07/12/1983 | US4393305 Method of tube wall thickness measurement |
| 06/14/1983 | CA1148234A1 Apparatus and method for detection of overlapping objects |
| 05/24/1983 | US4385317 Specimen image display apparatus |
| 05/24/1983 | US4384819 Proximity sensing |
| 05/17/1983 | US4384209 Method of and device for determining the contour of a body by means of radiation scattered by the body |
| 05/10/1983 | US4383172 Method and apparatus for measuring coating thicknesses on continuously moving material |
| 05/04/1983 | EP0078096A2 Sheet measuring apparatus |
| 03/30/1983 | EP0075517A1 Device for non-destructive measuring of the thickness of the wall of a hollow workpiece |
| 03/30/1983 | EP0075190A2 Apparatus for measuring thickness |
| 03/08/1983 | US4375761 Monitoring internal combustion engines |
| 03/01/1983 | US4375696 Method of determining the body contour for the reconstruction of the absorption of radiation in a flat zone of a body |
| 02/16/1983 | EP0072367A1 Method of measuring the coating thickness of clad wires or pipes |
| 02/09/1983 | EP0070974A1 Method and device for the non destructive determination of the thickness of the iron-tin intermediate layer of electrolytically tinned sheet metal |
| 01/25/1983 | CA1140274A1 Apparatus for the measurement of density- thickness by use of radiation |
| 11/30/1982 | US4361902 Collimator for x-ray diagnostic apparatus |
| 11/24/1982 | EP0065361A2 Apparatus for measuring the thickness profile of strip material |
| 11/03/1982 | EP0063828A2 Testing method for workpieces |
| 11/02/1982 | US4357540 Semiconductor device array mask inspection method and apparatus |
| 10/06/1982 | EP0061808A2 Apparatus for testing materials with a periodical structure |
| 08/17/1982 | US4345239 Apparatus for determining pen acceleration |
| 08/04/1982 | EP0056925A1 Device for measuring by means of gamma radiation |
| 07/14/1982 | EP0055971A1 Device for controlling the geometry of laminated products |
| 06/23/1982 | EP0054335A1 Method of determining distance using FMCW radar, corresponding apparatus and application to the precise determination of the liquid level in containers |
| 06/22/1982 | CA1126363A1 Radiation method and assembly for assessing web parameters |
| 05/25/1982 | US4331241 Apparatus for thickness sorting of sheet materials |
| 05/18/1982 | US4330835 Method and apparatus for determining the internal dimension of hollow bodies |
| 04/13/1982 | US4324136 Beta gauge mechanism |
| 04/06/1982 | US4322971 Controlling the thickness of moving webs of material |
| 02/10/1982 | EP0045441A2 Device for measuring the thickness of a strip running out of a rolling mill |
| 01/05/1982 | US4309606 Measuring plate thickness |
| 12/30/1981 | EP0042490A2 Signature verification apparatus measuring acceleration capacitively |
| 12/08/1981 | US4304995 Method and apparatus for measuring the wall thickness in a plastic article |
| 12/01/1981 | US4303829 Method of and device for determining body contours for the measurement of the absorption distribution in a slice of the body |
| 09/29/1981 | US4292536 Radiation method and assembly for assessing web parameters |
| 09/08/1981 | US4287769 Apparatus and method whereby wave energy is correlated with geometry of a manufactured part or the like or to positional relationships in a system |
| 08/25/1981 | US4286149 Apparatus and method for detection of overlapping objects |
| 07/07/1981 | US4277681 Low radiation densitometer |
| 05/06/1981 | EP0028056A1 Apparatus and method for detection of overlapping objects |
| 04/28/1981 | US4264822 Electron beam testing method and apparatus of mask |
| 04/22/1981 | EP0027335A1 Method of monitoring the wear of a part of a machine and an internal combustion engine incorporating wear monitoring means |
| 04/14/1981 | CA1099381A1 Apparatus and method whereby wave energy is correlated with geometry of a manufactured part or the like or to positional relationships in a system |
| 03/24/1981 | CA1098221A1 Gamma ray calibration system |
| 03/17/1981 | US4256778 Method of inspecting and retouching a photo mask |
| 01/20/1981 | US4246487 Method and device for determining the focal length of a long focal length electron optical lens |
| 01/13/1981 | CA1093709A1 Non-contacting gage apparatus and method |