| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 02/08/2005 | CA2316903C Determining the shape and orientation of a borehole |
| 02/03/2005 | US20050027194 Frameless radiosurgery treatment system and method |
| 02/02/2005 | EP1501966A2 Spinning preparation machine with microwawe sensors |
| 02/02/2005 | CN2676147Y Sealing device for wall thickness ultrasonic detector for steel pipe |
| 02/02/2005 | CN1575405A Method and apparatus for wall film monitoring |
| 02/02/2005 | CN1573557A Method for removing shading defects of light mask and semiconductor device manufacturing method thereof |
| 02/01/2005 | US6850079 Film thickness measuring apparatus and a method for measuring a thickness of a film |
| 01/27/2005 | WO2005008768A2 A system and method for determining a cross sectional feature of a structural element using a reference structural element |
| 01/27/2005 | US20050017162 Nanoscale standard sample and its manufacturing method |
| 01/27/2005 | CA2826983A1 A seismic measuring system including gps receivers |
| 01/27/2005 | CA2826982A1 A deformation monitoring system |
| 01/26/2005 | EP1499884A1 Method and system for detecting a property of a pavement by measuring gamma-radiation |
| 01/20/2005 | US20050014076 Method of generating mask distortion data, exposure method and method of producing semiconductor device |
| 01/19/2005 | CN1566902A Film thickness measuring method and microwave measuring apparatus |
| 01/19/2005 | CN1185481C Ray testing equipment and ray testing method |
| 01/18/2005 | US6844551 Method of determining lattice constant, method of evaluating material by using the same and electronic microscope suitable for using the same |
| 01/18/2005 | US6844549 Electron beam length-measurement apparatus and measurement method |
| 01/13/2005 | US20050006581 Method and scanning electron microscope for measuring width of material on sample |
| 01/12/2005 | CN1184451C Apparatus and method for measuring film thickness of unsintered ceramic wafer |
| 01/11/2005 | US6840097 Inspection apparatus for tires |
| 01/04/2005 | US6839470 Pattern evaluation method, pattern evaluation system and computer readable recorded medium |
| 12/30/2004 | US20040264764 Apparatus and method for three-dimensional coordinate measurement |
| 12/29/2004 | WO2004114016A2 Imprint lithography with improved monitoring and control and apparatus therefor |
| 12/29/2004 | CN1182369C Measure for wall thickness of hot container |
| 12/28/2004 | US6835511 Defining multiple position-measurement marks on the reticle; using a reticle-inspection device detecting respective positional coordinates of marks on the reticle; mounting reticle in the microlithography apparatus and detecting |
| 12/23/2004 | WO2004111572A1 Measuring apparatus |
| 12/23/2004 | US20040260496 Method for inspecting defect and system therefor |
| 12/22/2004 | CN1181314C 谐波测角仪 Harmonic goniometer |
| 12/21/2004 | US6834253 System and method for outputting measurement data on an object to a graphic file thereof |
| 12/21/2004 | US6833793 Method of a continuous determination of an instantaneous position of an impeller blade tip in a rotor turbine machine |
| 12/16/2004 | US20040252878 Method and its apparatus for classifying defects |
| 12/15/2004 | EP1485515A2 Evaluation of chamber components having textured coatings chamber components |
| 12/09/2004 | US20040247172 Pattern measuring apparatus, pattern measuring method, and manufacturing method of semiconductor device |
| 12/02/2004 | US20040239347 Semiconductor device tester |
| 12/01/2004 | EP1482374A2 Method of generating mask distortion data, exposure method and method of producing semiconductor device |
| 12/01/2004 | CN1178050C Level transmitter |
| 11/30/2004 | US6826510 Method, system and computer product for performing geometric dimension and tolerance stack-up analysis |
| 11/25/2004 | US20040234027 System and method for the measurement of the layer thickness of a multi-layer pipe |
| 11/25/2004 | US20040234025 Processes and a device for determining the actual position of a structure of an object to be examined |
| 11/25/2004 | US20040232920 Method and apparatus for wall film monitoring |
| 11/24/2004 | EP1478918A2 Methods and devices for quantitative analysis of x-ray images |
| 11/18/2004 | WO2004100206A1 Electron beam device, electron beam inspection method, electron beam inspection device, pattern inspection method and exposure condition determination method |
| 11/18/2004 | WO2003085179A8 Spinning preparation machine with microwave sensors |
| 11/18/2004 | US20040228437 In-situ monitoring system for bonding process and method therefor |
| 11/18/2004 | US20040227531 Semiconductor device test method and semiconductor device tester |
| 11/18/2004 | US20040227077 Electron microscopes exhibiting improved imaging of specimen having chargeable bodies |
| 11/16/2004 | US6817246 Distortion detector |
| 11/11/2004 | US20040224238 maintenance of photomasks by coating photoresist layers on masks, then aligning using optical projectors, exposing and developing; microelectronics |
| 11/11/2004 | US20040224237 photomasks/photoresists; scanning electron microscopy; microelectronics |
| 11/11/2004 | US20040222806 Semiconductor device test method and semiconductor device tester |
| 11/11/2004 | US20040222375 Method of determining the concavity and convexity on sample surface, and charged particle beam apparatus |
| 11/11/2004 | DE10160398B4 Verfahren und Vorrichtung zur Prüfung einer Matte aus Biomassepartikeln Method and apparatus for testing a mat of biomass particles |
| 11/10/2004 | EP1474651A2 Distance measuring device and method for determining a distance |
| 11/10/2004 | EP0920672B1 Position-sensing unit and multidimensional pointer comprising one or several such units |
| 11/09/2004 | US6816570 Multi-technique thin film analysis tool |
| 11/09/2004 | US6815677 Scanning electron microscope and method of controlling the same |
| 10/28/2004 | US20040211921 Position measuring device, position measuring system, lithographic apparatus, and device manufacturing method |
| 10/26/2004 | US6810354 Image reconstruction method |
| 10/26/2004 | US6810106 X-ray fluorescence thickness measurement device |
| 10/26/2004 | US6809534 Semiconductor device test method and semiconductor device tester |
| 10/21/2004 | WO2004089056A2 Exempt source for an x-ray fluorescence device |
| 10/21/2004 | US20040207415 Semiconductor device tester |
| 10/20/2004 | EP1468276A2 X-ray diffraction method |
| 10/14/2004 | DE10315545A1 Contour detection of expanding airbag, using x-ray source to produce visual image on image carrier so that contours can be visualized by arrangement of metallic part attached to airbag |
| 10/13/2004 | CN2648402Y Thickness measuring implement for x ray line cable insulating layer |
| 10/12/2004 | US6804548 Irradiation system and its irradiation target movement monitoring method, and irradiation target position recognizing method |
| 10/07/2004 | WO2004085959A1 Sample observing apparatus, edge position calculating device, and program |
| 10/07/2004 | WO2004018959A3 Method and apparatus for thin film thickness mapping |
| 10/07/2004 | US20040195507 Pattern inspection method |
| 10/07/2004 | US20040194257 Spinning preparation machine |
| 09/30/2004 | US20040189325 Method and apparatus for electron density measurement |
| 09/30/2004 | US20040188611 Scanning electron microscope and sample observing method using it |
| 09/29/2004 | EP1462995A2 Method and apparatus for classifying defects |
| 09/28/2004 | US6797965 Charged particle beam apparatus, pattern measuring method, and pattern drawing method |
| 09/23/2004 | WO2004080623A1 Method and apparatus for producing pipe, wall thickness variation-obtaining device, and computer program |
| 09/23/2004 | US20040184575 Method and device for the determination of the thickness of the insulation of a flat ribbon cable in the region of the conductor paths |
| 09/23/2004 | US20040184018 Abbe arm calibration system for use in lithographic apparatus |
| 09/22/2004 | EP1459094A1 Method for localizing a target in an object |
| 09/21/2004 | US6795574 Method of correcting physically-conditioned errors in measurement of microscopic objects |
| 09/16/2004 | US20040178343 Method and apparatus for precision measurement of film thickness |
| 09/16/2004 | US20040177700 Stress measurement method using X-ray diffraction |
| 09/16/2004 | DE10307356A1 Verfahren und Vorrichtung zur Bestimmung der Dicke der Isolation eines Flachkabels in Bereichen der metallischen Leiterbahnen Method and apparatus for determining the thickness of the insulation of a flat cable in areas of the metallic conductor paths |
| 09/14/2004 | US6792359 Method for inspecting defect and system therefor |
| 09/14/2004 | US6792075 Method and apparatus for thin film thickness mapping |
| 09/14/2004 | US6791084 Method and scanning electron microscope for measuring dimension of material on sample |
| 09/14/2004 | CA2142231C Device for measuring the thickness profile of a metal product in the shape of a moving strip or plate |
| 09/08/2004 | CN2639846Y Invisible image optical imaging device |
| 09/07/2004 | US6787773 Film thickness measurement using electron-beam induced x-ray microanalysis |
| 09/02/2004 | WO2004074771A1 Standard member for length measurement, method for producing the same, and electron beam length measuring device using the same |
| 09/02/2004 | US20040170249 Method and apparatus for thin film thickness mapping |
| 09/01/2004 | EP1453077A2 Scanning electron microscope and sample observing method |
| 08/26/2004 | WO2004072664A1 Method and apparatus for measuring characteristics of materials with improved accuracy |
| 08/26/2004 | US20040164245 Scanning electron microscope with measurement function |
| 08/26/2004 | US20040164243 Shape measurement method and apparatus |
| 08/25/2004 | EP1450127A2 Method and device to measure the thickness of the isolation in flat cables |
| 08/25/2004 | EP0852718B1 Container fill level and pressurization inspection using multi-dimensional images |
| 08/25/2004 | CN1523322A Method and device for the determination of the thickness of the insulation of a flat ribbon cable in the region of the conductor paths |
| 08/19/2004 | US20040159283 Method for forming multilayer thin film and apparatus thereof |
| 08/18/2004 | EP1446633A1 Method and apparatus for wall film monitoring |
| 08/17/2004 | US6778850 Frameless radiosurgery treatment system and method |