| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 07/31/1992 | CA2060265A1 Process and system using compton effect for localizing a plane separating two medias having different densities |
| 07/23/1992 | DE4100680A1 Non-destructive detection of deformations of semiconductor crystal in housing - using goniometer to excite crystal by X=ray beam penetrating housing via shutter |
| 07/07/1992 | CA1304834C Device for determining the mass per unit volume of an elementary volume of material |
| 06/30/1992 | US5126566 Dimension measurement system utilizing scanning electron beam |
| 06/02/1992 | US5118940 Paper basis weight detector |
| 05/27/1992 | CN2105668U Online scan thick measurer for plain glass |
| 05/26/1992 | US5117111 Electron beam measuring apparatus |
| 05/20/1992 | EP0485707A2 Body contour determining apparatus for a rotating gamma camera |
| 05/20/1992 | EP0485572A1 An automated system for controlling the quality of geometrically regular-shaped products during their manufacture. |
| 05/13/1992 | EP0485265A1 Apparatus and method for non-destructive control with simultaneous acquisition of radiographic and tomographic data |
| 05/12/1992 | US5113421 Method and apparatus for measuring the thickness of a coating on a substrate |
| 04/15/1992 | EP0480424A2 Scanning electron microscope and method for production of semiconductor device by using the same |
| 04/14/1992 | US5105453 Wood pole decay detector |
| 04/14/1992 | US5105157 Apparatus for determining the average water film thickness of road surfaces |
| 04/08/1992 | EP0478690A1 Method of obtaining accurate compositional information of multilayer compositions |
| 04/07/1992 | US5103471 Apparatus for measuring the thickness of a coating |
| 04/07/1992 | US5103182 Electromagnetic wave measurement of conductive layers of a semiconductor wafer during processing in a fabrication chamber |
| 04/02/1992 | DE4030802A1 Contactless measurer for foils or thin surface layers - uses radiation receiver for heat radiation emitted from object when subjected to microwaves |
| 03/25/1992 | EP0477120A1 Method and apparatus for the transversal profile thickness measurement of a metallic band, especially made of steel |
| 03/24/1992 | US5099504 Thickness/density mesuring apparatus |
| 03/24/1992 | US5099125 Sheet material sensor compensation |
| 02/25/1992 | US5091862 Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography |
| 02/12/1992 | EP0470646A2 In situ measurement of a thin film deposited on a wafer |
| 01/29/1992 | EP0468582A1 Apparatus for X-ray diffractometry and use of this apparatus |
| 01/16/1992 | DE4021388A1 Workpiece coating strength measurer using X=ray fluorescence - projects X=ray beam by X=ray tube, shutter, collimator and mirror mounted in frame |
| 12/31/1991 | US5077765 Method of scanning an x-ray image by means of electrometer probes, and device for performing the method |
| 12/27/1991 | EP0177566B1 Method for precision sem measurements |
| 12/18/1991 | EP0461698A1 Apparatus for analysis of a material and use of that apparatus |
| 12/17/1991 | US5073715 Orientation detector of sources emitting radioactive radiation |
| 12/12/1991 | WO1991019189A1 An apparatus and method for nondestructively determining the dimensional changes of an object as a function of temperature |
| 12/12/1991 | WO1991019164A1 An automated system for controlling the quality of geometrically regular-shaped products during their manufacture |
| 12/10/1991 | US5072172 Method and apparatus for measuring the thickness of a layer of geologic material using a microstrip antenna |
| 12/10/1991 | US5072121 Body contour determining apparatus for a rotating gamma camera |
| 12/04/1991 | EP0459628A2 Radiation image detecting apparatus |
| 12/01/1991 | CA2064572A1 Automated system for controlling the quality of geometrically regular- shaped products during their manufacture |
| 11/05/1991 | USH993 Thin film thickness mapping technique |
| 10/23/1991 | EP0452666A1 Cross scanning method and equipment for measuring the thickness of a film coating |
| 10/22/1991 | US5060250 Method and system for detecting defects in tire sidewalls |
| 10/22/1991 | US5060247 Fluorescent x-ray film thickness gauge |
| 10/16/1991 | EP0451514A2 Measurement of conductive layers of a semiconductor wafer |
| 10/01/1991 | US5054043 Cable insulation eccentricity and diameter monitor |
| 09/24/1991 | US5051585 Apparatus and method of pattern detection based on a scanning transmission electron microscope |
| 08/20/1991 | US5042055 X-ray threaded pipe joint analysis system |
| 08/14/1991 | EP0441375A2 Method of and apparatus for measuring pattern profile |
| 08/14/1991 | EP0441373A2 Method and apparatus for measuring pattern dimension |
| 08/13/1991 | US5040154 Method of monitoring the state of extended shell |
| 08/06/1991 | US5037371 Rotor recognition system |
| 07/16/1991 | CA1286425C Cable insulation eccentricity and diameter monitor |
| 07/10/1991 | EP0197157B1 Method of determining thickness and composition of alloy film |
| 07/02/1991 | US5029337 Method for measuring coating thickness |
| 07/02/1991 | US5029250 Pattern configuration measuring apparatus |
| 06/19/1991 | EP0432360A2 Procedure for determining the mean thickness of a water film on the street surface |
| 06/13/1991 | DE3940253A1 Traffic radiometer for measuring water film thickness on road surfaces - has three pref. identical channels operating in millimetre wavelength region with interchangeable inputs |
| 06/12/1991 | EP0431658A2 Method and arrangement for scanning an X-ray plate using an electrometer probe |
| 06/05/1991 | EP0429773A1 Atomic photo-absorption force microscope |
| 06/04/1991 | US5021666 Pass-line independent web measuring method and apparatus |
| 06/04/1991 | US5021655 Apparatus and method for contactless measurement of coating thickness |
| 05/02/1991 | DE4033051A1 Microfocus X=ray generator with optical spot size sensor - has mirror for reflecting visible and near IR light but not X=rays, adjusting electron beam for max. brightness |
| 04/30/1991 | US5012248 Radar absorption material thickness testing device |
| 04/17/1991 | EP0422017A1 Method and apparatus for measuring the thickness of a coating on a substrate. |
| 04/02/1991 | US5003815 Spectroscopic apparatus |
| 03/27/1991 | EP0419115A1 Pass-line independent web measuring method and apparatus |
| 03/26/1991 | US5003569 Method using x-rays to determine thickness of organic films |
| 03/19/1991 | US5001344 Scanning electron microscope and method of processing the same |
| 03/19/1991 | US5001342 Radioactive tracer cement thickness measurement |
| 03/19/1991 | CA1281792C Linear position sensor |
| 02/28/1991 | DE3927394A1 Thickness measurement arrangement improved for thin material - placing material on metal plate with window opposite modulator reflecting microwaves |
| 02/26/1991 | US4996491 Measurement of the position of an elongated element |
| 02/26/1991 | US4995267 Method of monitoring the state of elongated object and apparatus for performing this method |
| 02/21/1991 | WO1991002216A1 Fluorescent x-ray film thickness gauge |
| 01/30/1991 | EP0410844A1 Orientation detector of sources emitting radioactive radiation |
| 01/29/1991 | US4987823 Location of piston position using radio frequency waves |
| 01/16/1991 | EP0407908A2 Position measuring device |
| 01/11/1991 | CA2020139A1 Power transmission |
| 12/27/1990 | EP0334897A4 Rotor recognition system |
| 12/23/1990 | WO1991000513A1 Method of obtaining accurate compositional information of multilayer compositions |
| 12/23/1990 | CA2062752A1 Method of obtaining accurate compositional information of multilayer compositions |
| 12/18/1990 | US4979199 Microfocus X-ray tube with optical spot size sensing means |
| 11/20/1990 | CA1276703C Method for detecting profile defects on flanged steel wheels using microwave frequency resonator cavities |
| 11/14/1990 | EP0396636A1 Computed tomography inspection of electronic devices |
| 11/07/1990 | EP0396283A2 Thickness/density measuring apparatus |
| 10/24/1990 | CN2064500U Isotope x thickness measuring instruments for the layer of fluorescence plating |
| 10/21/1990 | CA2014893A1 Thickness/density measuring apparatus |
| 10/10/1990 | EP0308493A4 Thickness/density measuring apparatus |
| 10/09/1990 | US4962518 Apparatus for measuring the thickness of a coating |
| 10/03/1990 | EP0390478A1 X-ray apparatus for measuring film thickness |
| 09/25/1990 | US4959848 Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis |
| 09/04/1990 | US4954719 Sheet thickness gauging method and system with auto calibration |
| 08/21/1990 | US4951222 Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography |
| 08/21/1990 | US4950898 Method of position monitoring and apparatus therefor |
| 08/01/1990 | EP0380226A1 Method for measuring coating thickness |
| 07/24/1990 | US4943778 Instrument for measuring high frequency characteristics of sheet-like materials |
| 07/24/1990 | US4943721 Method of obtaining accurate compositional information of multi-layer compositions |
| 06/26/1990 | US4937093 Determining thickness from measured x-ray intensity on calibration curve |
| 06/26/1990 | US4936529 Device for detecting defective wheels on rail cars |
| 05/23/1990 | EP0189414B1 Process for measuring the state changes induced by weather elements on traffic surfaces and apparatus for implementing such process |
| 05/22/1990 | US4928293 Apparatus for stabilization of X-ray fluorescence layer thickness measuring instruments for stabilization SNF process thereof |
| 05/22/1990 | US4928257 Method and apparatus for monitoring the thickness profile of a strip |
| 05/15/1990 | US4926452 Automated laminography system for inspection of electronics |
| 05/08/1990 | US4924100 Strain and temperature measurement |