| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 09/21/2006 | US20060210017 Methods and devices for quantitative analysis of x-ray images |
| 09/21/2006 | DE102005010363A1 Abbildender Mikrowellen-Prober The imaging microwave Prober |
| 09/19/2006 | US7110910 Method and apparatus for determining the straightness of tubes and bars |
| 09/14/2006 | US20060202119 Semiconductor device tester |
| 09/14/2006 | DE102004050370B9 Schichtdickenmessgerät und Verfahren zur Bestimmung der Schichtdicke einer Linerschicht Coating thickness gauge and method for determining the thickness of a liner |
| 09/14/2006 | DE102004038282B4 Verfahren zur Untersuchung auf einem Metallsubstrat aufgebrachter, mit Partikeln durchsetzter Beschichtungen Methods for analysis of a metal substrate applied, interspersed with particles coatings |
| 09/13/2006 | EP1701142A2 Method for measuring the level of a medium inside a container based on the radar principle |
| 09/13/2006 | CN1832846A Imprint lithography with improved monitoring and control and apparatus therefor |
| 09/05/2006 | US7103209 Method for extracting objective image |
| 09/05/2006 | US7103143 X-ray examination apparatus with exposure control |
| 08/31/2006 | WO2006089414A1 Systems, methods and apparatus for non-disruptive and non-destructive inspection of metallurgical furnaces and similar vessels |
| 08/29/2006 | US7099433 Method and apparatus for sorting materials according to relative composition |
| 08/29/2006 | US7099432 X-ray inspection apparatus and X-ray inspection method |
| 08/29/2006 | US7099430 Computed tomography apparatus with a detector diaphragm having a diaphragm element movable longitudinally over the detector |
| 08/24/2006 | DE102006007254A1 Determining three-dimensional movement of object for medical imaging, by using two-dimensional movement of markers in two or more radiographic images |
| 08/23/2006 | EP1540276A4 Method and apparatus for thin film thickness mapping |
| 08/22/2006 | US7095944 Distance measuring device and method for determining a distance |
| 08/22/2006 | US7095884 Method and apparatus for circuit pattern inspection |
| 08/22/2006 | US7093469 Manufacturing method and manufacturing apparatus of pipe, thickness deviation information derivation apparatus, and computer program |
| 08/22/2006 | CA2515477A1 Systems, methods and apparatus for non-disruptive and non-destructive inspection of metallurgical furnaces and similar vessels |
| 08/22/2006 | CA2296785C Measurement of hot container wall thickness |
| 08/16/2006 | EP1690065A1 System and method for counting the number of layers of a multilayer object by means of electromagnetic waves |
| 08/16/2006 | CN2807200Y Concrete springback thickness tester |
| 08/16/2006 | CN1818547A Measuring method and device for built-in length of metal pipeline |
| 08/15/2006 | US7092842 Multiple sensor system |
| 08/15/2006 | US7092486 System and method for the measurement of the layer thickness of a multi-layer pipe |
| 08/10/2006 | US20060176998 X-ray diffraction method |
| 08/10/2006 | DE102006003422A1 Muster-Festlegungsverfahren und Muster-Festlegungsvorrichtung Pattern determination method and pattern-setting device |
| 08/10/2006 | DE102005002950A1 Verfahren zur automatischen Bestimmung der Position und Orientierung des linken Ventrikel in 3D-Bilddatensätzen des Herzens A method for automatically determining the position and orientation of the left ventricle into 3D image data sets of the heart |
| 08/09/2006 | CN1268918C Method of nondestructive and rapid detecting grain size of metal polycrystal |
| 08/08/2006 | US7089047 Fat depth sensor |
| 08/03/2006 | US20060169896 Pattern specification method and pattern specification apparatus |
| 08/02/2006 | CN1267981C Graphic measuring method, manufacturing method of semiconductor device using it and graphic measuring device |
| 08/01/2006 | US7082819 Doppler radar for detecting tire abnormalities |
| 07/27/2006 | US20060164104 Measuring apparatus |
| 07/20/2006 | US20060161381 Laser system for marking tires |
| 07/19/2006 | CN1806158A Measuring apparatus |
| 07/18/2006 | US7079975 Scatterometry and acoustic based active control of thin film deposition process |
| 07/18/2006 | US7078691 Standard reference for metrology and calibration method of electron-beam metrology system using the same |
| 07/18/2006 | US7078688 Shape measuring device and shape measuring method |
| 07/13/2006 | WO2006074412A2 Anodizing system with a coating thickness monitor and an anodized product |
| 07/13/2006 | WO2006073063A1 Method and apparatus for measuring thin film sample, and method and apparatus for manufacturing thin film sample |
| 07/13/2006 | US20060153333 X-ray reflectometry of thin film layers with enhanced accuracy |
| 07/13/2006 | DE10238588B4 Spiegelflächenpräzisions-Meßeinrichtung und Spiegelflächensteuerungssystem einer Reflektorantenne Mirror surface precision measuring device and mirror surface control system of a reflector antenna |
| 07/13/2006 | CA2594335A1 Anodizing system with a coating thickness monitor and an anodized product |
| 07/11/2006 | US7076022 Method and device for X-ray inspection of tire |
| 07/11/2006 | US7076021 Apparatus for measurement of the thickness of thin layers |
| 07/11/2006 | US7075098 Method of selecting pattern to be measured, pattern inspection method, manufacturing method of semiconductor device, program, and pattern inspection apparatus |
| 07/11/2006 | US7075076 Inspection system, inspection method, and process management method |
| 07/11/2006 | US7075072 Detecting apparatus and device manufacturing method |
| 07/05/2006 | CN1797733A Semiconductor device tester |
| 07/05/2006 | CN1797027A Method and system of three-dimensional computed tomography |
| 07/04/2006 | US7071468 Circuit pattern inspection method and its apparatus |
| 06/29/2006 | US20060138709 Methods for monitoring binder mix loading of fiber glass mats |
| 06/27/2006 | US7069066 Bone densitometer providing improved longitudinal studies |
| 06/27/2006 | US7067808 Electron beam system and electron beam measuring and observing method |
| 06/21/2006 | CN1260621C Method for removing shading defects of light mask and semiconductor device manufacturing method thereof |
| 06/20/2006 | US7065176 Method and system to inspect a component |
| 06/20/2006 | US7064829 Generic interface for an optical metrology system |
| 06/08/2006 | DE102005054401A1 Verfahren zum Treffen einer Entscheidung über einen Messwert A method for making a decision on a reading |
| 06/07/2006 | EP1664672A2 Geosteering detectors for boring-type continuous miners |
| 06/06/2006 | US7058159 Methods and devices for quantitative analysis of x-ray images |
| 06/01/2006 | DE102004057769A1 Distance measurement device with electronic analysis and sensor units comprises a conductor structure with a coupling block connecting a high-frequency transceiver via a wave guide to a coupling probe |
| 06/01/2006 | DE102004055797A1 Structure-detection method for determining the inner structure of non-metal objects detects electric/magnetic measurement data via a measuring unit |
| 05/31/2006 | EP1660853A1 Measuring load on an aircraft component by microwave distance links |
| 05/30/2006 | US7054506 Pattern measuring method and measuring system using display microscope image |
| 05/30/2006 | US7053371 Scanning electron microscope with measurement function |
| 05/25/2006 | US20060109486 Method of deciding measurement value |
| 05/25/2006 | US20060109455 Optical inspection system and radiation source for use therein |
| 05/25/2006 | US20060108545 Method and device for measuring quantity of wear |
| 05/24/2006 | DE102004056393A1 Measuring the wall thickness of melting devices filled with a glass melt and having a wall with a layer of refractory material comprises irradiating radar waves into the wall on the outer side and further processing |
| 05/24/2006 | CN1777788A Radiation sources and radiation scanning systems with improved uniformity of radiation intensity |
| 05/23/2006 | US7050534 Methods and devices for quantitative analysis of x-ray images |
| 05/23/2006 | US7049834 Semiconductor device test method and semiconductor device tester |
| 05/23/2006 | US7049589 Pattern inspection method |
| 05/23/2006 | US7049587 Apparatus for inspecting a specimen |
| 05/18/2006 | WO2006033868A3 Method and apparatus for converting a digital radiograph to an absolute thickness map |
| 05/18/2006 | WO2005088245A9 Method and apparatus for measuring wall thickness of a vessel |
| 05/17/2006 | CN1774611A Nondestructive characterization of thin films using measured basis spectra and/or based on acquired spectrum |
| 05/16/2006 | US7046834 Method for measuring bone mineral density by using X-ray image |
| 05/11/2006 | WO2006048979A1 Method and device for measuring width direction end position of stripe body, and method and device for measuring width direction central position of stripe body |
| 05/11/2006 | US20060100804 Method for inspecting defect and system therefor |
| 05/11/2006 | US20060098774 System and method for the measurement of the layer thickness of a multi-layer pipe |
| 05/04/2006 | WO2005052650A3 Micro-optic security and image presentation system |
| 05/04/2006 | DE102004050370B3 Liner layer thickness measuring device for semiconductor wafer, has electron detector detecting electrons in analyzer region and emitting signals for several positions of analyzer, and unit receiving signals to determine layer thickness |
| 05/02/2006 | US7039550 Surface scan measuring instrument, surface scan measuring method, surface scan measuring program and recording medium |
| 05/02/2006 | US7039161 Method for analyzing film structure and apparatus therefor |
| 05/02/2006 | US7039158 Multi-technique thin film analysis tool |
| 05/02/2006 | US7038767 Three-dimensional micropattern profile measuring system and method |
| 04/27/2006 | WO2006042398A1 Improved measurement system |
| 04/27/2006 | DE102004050257A1 Coordinate measuring and object scanning system uses X-ray source and X-ray sensors for primary scan and tactile and/or optical secondary mechanism movable in X, Y and Z directions for secondary scan |
| 04/27/2006 | CA2584506A1 Improved measurement system |
| 04/20/2006 | US20060083347 Method and an apparatus for the inspection of the surface of a tire |
| 04/19/2006 | CN1761541A Method and apparatus for producing pipe, wall thickness variation-obtaining device, and computer program |
| 04/19/2006 | CN1252447C Transient strain waveform storage |
| 04/13/2006 | US20060078091 Delivering X-ray systems to pipe installations |
| 04/13/2006 | DE4316083B4 Radiometrische Meßvorrichtung für Dickenmessungen Radiometric measurement device for thickness measurements |
| 04/13/2006 | DE19946738B4 Vorrichtung und Verfahren zum Prüfen von elektrischen Verbindungen an einer Schaltungsplatine Apparatus and method for inspecting electrical connections to a circuit board |
| 04/13/2006 | DE102004047307A1 Wafer`s structured sample upper surface testing method for Dynamic RAM production, involves finding distance of surface area from flying time of ions from surface to verification device, and receiving result indicating surface portion |
| 04/11/2006 | US7027636 Method of detecting measurement error in measurement system |