| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
|---|
| 05/18/1988 | EP0267683A2 Thin layer monitor |
| 05/10/1988 | US4744040 Distance measurement method making use of electromagnetic wave and system therefor |
| 05/10/1988 | CA1236575A1 Microwave ice accretion measuring instrument |
| 04/26/1988 | US4740693 Electron beam pattern line width measurement system |
| 04/20/1988 | CN87207427U Apparatus for measuring thickness of thin film |
| 04/12/1988 | US4737705 Linear position sensor using a coaxial resonant cavity |
| 03/29/1988 | US4734922 In an extruded sheet thickness monitoring and correction system |
| 03/29/1988 | US4734637 Apparatus for measuring the length of an electrical line |
| 03/22/1988 | US4733074 Sample surface structure measuring method |
| 03/22/1988 | US4732108 Apparatus for monitoring epitaxial growth |
| 02/16/1988 | US4725963 Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects |
| 02/16/1988 | US4725730 System of automatically measuring sectional shape |
| 01/19/1988 | US4720808 Method and apparatus for measuring sheet products |
| 12/09/1987 | EP0248710A1 Detection process for superimposed sheets, device for carrying it out, and application to bank notes |
| 11/24/1987 | US4709383 Method for evaluating residual fatigue life of mechanical parts |
| 11/19/1987 | WO1987007021A1 Method for stabilisation of a square weight detector |
| 11/19/1987 | EP0245660A2 Scanning thermal profiler and method for investigating surface structures |
| 11/11/1987 | EP0244816A2 Mask pattern defect detection apparatus |
| 11/10/1987 | US4705954 Method and apparatus for automatically positioning a particle beam |
| 10/28/1987 | EP0242425A2 Method for evaluating residual fatigue life of mechanical parts |
| 09/29/1987 | US4696568 Method of and apparatus for measuring the velocity and/or the length of moving objects |
| 09/23/1987 | EP0237563A1 Apparatus for inspection and/or positioning objects with wave energy using wave guides |
| 09/22/1987 | US4695729 Tubular part wall thickness measuring device |
| 09/16/1987 | CN86209739U Improved-type double light-beam x-ray thickness-meter |
| 09/09/1987 | CN86207436U Beta-ray apparatus for measuring eggshell thickness |
| 09/08/1987 | US4692936 Method and apparatus for radiographic inspection |
| 08/26/1987 | EP0233389A1 A method of measuring the weight per unit area, density and thickness of a moving sheet |
| 08/18/1987 | US4688185 Microwave ice accretion measuring instrument |
| 07/21/1987 | US4680960 Microwave and luminous probe |
| 07/08/1987 | EP0228147A2 A system for determining the basis weight of cord reinforced tyre fabric |
| 07/07/1987 | US4678915 System and process for measuring and correcting the values of a parameter of a sheet material |
| 07/07/1987 | US4677852 Method of and apparatus for inspecting and/or positioning objects with wave energy using wave guides |
| 07/07/1987 | US4677848 For holding a pneumatic tire under internal inflation pressure |
| 07/01/1987 | EP0227350A2 Monitoring of conductors in cable |
| 06/30/1987 | US4677296 Apparatus and method for measuring lengths in a scanning particle microscope |
| 06/23/1987 | US4675528 Method for measurement of spotsize and edgewidth in electron beam lithography |
| 06/23/1987 | US4675527 Corrosion monitoring probe |
| 06/16/1987 | EP0225863A2 Multi-size tire chuck |
| 06/02/1987 | US4670652 Charged particle beam microprobe apparatus |
| 04/09/1987 | WO1987002136A1 Method of an apparatus for inspection and/or positioning objects with wave energy using wave guides |
| 04/07/1987 | US4656357 Apparatus for measuring coating thickness |
| 03/31/1987 | CA1219970A1 Radiation scatter apparatus and method |
| 03/04/1987 | EP0212078A1 Apparatus for the measurement of the thickness profile of rolled strips |
| 03/03/1987 | US4648107 Device for measuring the thickness of thin films |
| 03/03/1987 | CA1218768A1 Monitoring an electric cable core |
| 02/24/1987 | US4646341 Calibration standard for X-ray fluorescence thickness |
| 01/27/1987 | US4639942 Procedure for measuring the quantity of silicon coating on paper or cardboard |
| 01/06/1987 | US4634291 Coating thickness measurement |
| 12/30/1986 | US4633420 For measuring a thickness of a strip |
| 12/30/1986 | EP0206735A2 Coating weight and thickness gauges |
| 12/30/1986 | EP0206633A2 Method of inspecting masks and apparatus thereof |
| 12/16/1986 | US4630203 Contour radiography: a system for determining 3-dimensional contours of an object from its 2-dimensional images |
| 11/20/1986 | EP0201858A2 Electron beam substrate height sensor |
| 11/20/1986 | EP0201849A2 Method and apparatus for dimensional analysis of continuously produced tubular objects |
| 11/18/1986 | US4623835 Web thickness sensor using loop-gap resonator |
| 11/04/1986 | CA1213661A1 Measuring pipe joints |
| 10/15/1986 | EP0197157A1 Method of determining thickness and composition of alloy film |
| 09/23/1986 | US4613812 Microwave detection system |
| 08/26/1986 | CA1210529A1 Tubular part wall thickness measuring device |
| 08/06/1986 | EP0189470A1 Microwave ice accretion measuring instrument |
| 08/06/1986 | EP0189414A1 Process for measuring the state changes induced by weather elements on traffic surfaces and apparatus for implementing such process. |
| 07/29/1986 | CA1208806A1 Method of growing an alloy film by a layer-by-layer process on a substrate, and a method of making a semiconductor device |
| 07/15/1986 | US4600839 Small-dimension measurement system by scanning electron beam |
| 07/08/1986 | US4599514 Isotopic radiation method and apparatus for measuring the resinous binder applied to a mat of glass fibers |
| 06/24/1986 | US4597093 Apparatus for measuring the thickness of thin layers |
| 06/18/1986 | EP0184859A2 Electron beam line width measurement system |
| 06/10/1986 | CA1205925A1 Gauge for measuring a sheet of material |
| 05/27/1986 | US4590658 Tube wall thickness measurement |
| 04/29/1986 | CA1203905A1 Scanning electron microscope calibration apparatus and method for making precise quantitative measurements on a scanned object |
| 04/22/1986 | US4583298 Auto calibration method suitable for use in electron beam lithography |
| 04/16/1986 | EP0177717A1 Process for the automatic positioning of a curpuscular probe |
| 04/15/1986 | CA1203301A1 Sheet measuring apparatus |
| 04/10/1986 | WO1986002164A1 Method of determining thickness and composition of alloy film |
| 04/09/1986 | EP0176745A1 Device and method to measure lengths in a scanning corpuscular microscope |
| 04/08/1986 | US4581575 Method and apparatus for measuring orientation of constituents of webs or sheets |
| 03/25/1986 | US4578584 Thermal wave microscopy using areal infrared detection |
| 03/25/1986 | CA1202431A1 Method and apparatus to measure the weight per unit area, density and thickness of a moving sheet |
| 03/18/1986 | US4576286 Parts sorting systems |
| 03/11/1986 | US4575462 Determination of atomic ratio of constituents |
| 03/11/1986 | US4574719 Optoelectronic scanner for sewing machine |
| 03/04/1986 | US4574387 Apparatus and method for measuring thickness |
| 02/27/1986 | WO1986001176A1 Microwave ice accretion measuring instrument |
| 02/12/1986 | EP0170778A1 Device for measuring the thickness profile of rolled sheet metal strip |
| 01/28/1986 | US4567364 Method and apparatus for measuring dimension of secondary electron emission object |
| 01/14/1986 | US4564764 Wafer having chips for determining the position of the wafer by means of electron beams |
| 12/31/1985 | CA1198831A1 Nondestructive dimensional detection system |
| 12/10/1985 | US4558225 Target body position measuring method for charged particle beam fine pattern exposure system |
| 12/10/1985 | US4557386 System to measure geometric and electromagnetic characteristics of objects |
| 12/03/1985 | US4556797 Method and apparatus for detecting edge of fine pattern on specimen |
| 11/12/1985 | US4553016 Elongated non-metallic sheet having a metal embedded therein or attached thereon |
| 11/05/1985 | CA1196410A1 Microwave ice accretion meter |
| 10/22/1985 | US4549079 Apparatus for measuring thickness of paint coating |
| 10/15/1985 | CA1195438A1 Fluorescent x-ray film thickness gauge for very small areas |
| 10/08/1985 | US4546384 Test method for workpieces |
| 09/26/1985 | WO1985004250A1 Method and apparatus for precision sem measurements |
| 09/17/1985 | US4542520 X-ray determination of parts alignment |
| 09/17/1985 | US4542297 Apparatus for measuring profile thickness of strip material |
| 08/28/1985 | EP0153202A2 Microwave detection system |
| 08/20/1985 | US4536239 Multi-layer circuit board inspection system |
| 08/07/1985 | EP0150384A2 Thermal wave imaging |