| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
|---|
| 12/13/2000 | CN1276870A CT target detection using surface normals |
| 12/13/2000 | CN1276193A Method and apparatus for setting thickness of paired asymmetric scanned laminae |
| 12/06/2000 | EP1057452A2 Twin asymmetric scan slice thickness setting method and apparatus and radiation tomography method and apparatus |
| 12/06/2000 | EP1056395A1 Optical high speed communications for computer tomograph |
| 12/05/2000 | US6157451 Sample CD measurement system |
| 12/05/2000 | US6157032 Sample shape determination by measurement of surface slope with a scanning electron microscope |
| 11/30/2000 | DE19922125A1 Vorrichtung zum Bestimmen der Dicke oder Blattzahl eines bewegten blattartigen Objekts Apparatus for determining the number of sheets or thickness of a moving sheet-like object |
| 11/29/2000 | EP1055905A2 Method to determine the flatness of a web of material |
| 11/29/2000 | EP1055098A1 X-ray diffractometer without manual intervention for determining thickness of multiple non-metallica crystalline layers, fourier- and average value zero transformations |
| 11/23/2000 | WO2000070305A1 Device for determining the thickness or the number of sheets of a sheet-like object |
| 11/22/2000 | EP1052936A1 X-ray examination device and method for producing undistorted x-ray images |
| 11/22/2000 | EP0886759A4 Compton backscatter pipe wall thickness gauge employing focusing collimator and annular detector |
| 11/21/2000 | US6149592 Integrated fluoroscopic projection image data, volumetric image data, and surgical device position data |
| 11/16/2000 | WO2000068639A1 X-ray imaging system for determining area density of low density samples |
| 11/16/2000 | DE19919990A1 Measuring thickness of zinc layers on iron or steel comprises radiating primary photons onto the layer, measuring the intensity of secondary photons scattered from the layer, and determining the thickness |
| 11/16/2000 | DE19919007A1 Microwave measurement of motor vehicle wheel roller bearing separation distances, uses an array of microwave emitters, to determine forces acting on individual tires to improve driving comfort and safety |
| 11/09/2000 | WO2000066971A1 Position detector with auxiliary means for detecting the direction of the gravity vector |
| 11/07/2000 | US6144875 Apparatus and method for compensating for respiratory and patient motion during treatment |
| 11/02/2000 | WO2000065306A1 Method of measuring film thickness |
| 11/02/2000 | EP1049132A1 Method and apparatus for imaging a surface potential |
| 10/31/2000 | US6140644 Inspection apparatus and method using a particle beam |
| 10/18/2000 | EP1045426A2 Column for charged particle beam device |
| 10/17/2000 | US6133875 Position determining apparatus and position determining method using the same |
| 10/11/2000 | EP1043578A2 Optical testing apparatus for tires |
| 10/05/2000 | WO2000058691A1 Radiographic reference marker |
| 09/27/2000 | EP1039262A2 Sheet thickness and swell measurement method and apparatus therefor |
| 09/21/2000 | WO2000054689A1 Apparatus and method for compensating for respiratory and patient motion during treatment |
| 09/12/2000 | US6119034 Medical system having an X-ray machine and a therapy unit with a source of focused acoustic waves, and a method for coupling the therapy unit to the X-ray machine |
| 09/12/2000 | US6118844 Method and device for the determination of measurement uncertainties in X-ray fluorescence layer thickness |
| 09/08/2000 | WO2000052454A2 Improved thin layer nuclear density gauge |
| 09/05/2000 | US6115450 X-ray fluorescence analyzer capable of determining the center of a sample |
| 09/05/2000 | US6114695 Scanning electron microscope and method for dimension measuring by using the same |
| 08/31/2000 | DE10000362A1 Detecting structured substrates defects involves scanning charged particle beam over substrate with optical column stationary w.r.t. surface, comparing detected images with reference |
| 08/23/2000 | EP0991916A4 Straddle inspection system |
| 08/22/2000 | US6107629 Method to determine depth profiles in an area of thin coating |
| 08/15/2000 | CA2149166C Scanning device |
| 08/15/2000 | CA2049763C Process and cross profile thickness measuring apparatus for metal strips, especially steel |
| 08/10/2000 | DE19951793A1 Thickness calibration and shadow correction for automatic X-ray inspection unit with calibration sheet of known thickness and X-ray absorption placed under object of unknown thickness and absorption |
| 08/10/2000 | DE19903183A1 High frequency distance measuring device, especially a proximity measuring device or proximity switch, comprises a sensor having a hollow conductor antenna with an open end closed by a damping element |
| 08/01/2000 | US6097333 Method for range measurement and contour detection by means of microwaves |
| 07/25/2000 | US6093512 Method and apparatus for dimension measurement and inspection of structures utilizing corpuscular beam |
| 07/20/2000 | WO2000041838A1 A method and apparatus for determining the position of an elongated object relative the surface of an obstructing body by means of electromagnetic radiation |
| 07/19/2000 | EP1020703A2 Measurement of hot container wall thickness |
| 07/19/2000 | EP1019708A1 Ct target detection using surface normals |
| 07/19/2000 | CN1260476A Measure for wall thickness of hot container |
| 07/11/2000 | US6085580 Differential force microscope |
| 07/06/2000 | DE19846885A1 Radiography equipment for examination of insulated pipelines has X-ray or gamma ray source in movable frame to enable scanning of pipe |
| 06/29/2000 | WO2000036979A1 Optical high speed communications for computer tomograph |
| 06/27/2000 | US6081582 Transverse scanning densitometer |
| 06/22/2000 | WO2000036371A1 X-ray diffractometer without manual intervention for determining thickness of multiple non-metallica crystalline layers, fourier-and average value zero transformations |
| 06/22/2000 | WO2000036368A1 Latex coat thickness measuring and control apparatus |
| 06/15/2000 | WO2000033739A1 X-ray examination device and method for producing undistorted x-ray images |
| 06/15/2000 | DE19856537A1 Verfahren zur intraoperativen Kalibration von C-Bogen Röntgenanordnungen Method for intraoperative calibration of C-arm assemblies |
| 06/14/2000 | EP1007917A1 Accurate tissue injury assessment using hybrid neural network analysis |
| 06/07/2000 | EP1005639A1 Apparatus and method for in-situ thickness and stoichiometry measurement of thin films |
| 06/06/2000 | US6072184 Charged-particle-beam projection methods |
| 06/06/2000 | US6072178 Sample analyzing apparatus |
| 05/24/2000 | CN2379778Y Beta rays transmission (reflection) and intelligent type instrument prob for measuring thickness |
| 05/23/2000 | US6067153 Pattern defect inspecting apparatus |
| 05/23/2000 | US6065219 Method and apparatus for determining the shape of an earth borehole and the motion of a tool within the borehole |
| 05/17/2000 | EP1000314A2 Distance measuring device and method for determining a distance |
| 05/17/2000 | EP0808477B1 Fabrication and use of a sub-micron dimensional standard |
| 05/16/2000 | CA2115939C Large aperture device for controlling thickness of conductive coatings on optical fibers |
| 05/11/2000 | DE19951147A1 Determining surface inclination at electron beam incident point with scanning electron microscope involves deriving angle from measured emissions using calibrated relationship |
| 05/09/2000 | US6061425 Coating thickness gauge by X-ray fluorescence |
| 05/04/2000 | DE19951496A1 Radiography appliance for use with biopsy and injection needles monitors needle path between insertion and target points |
| 05/04/2000 | DE19842798C1 Kalibriervorrichtung Calibration |
| 05/03/2000 | EP0852718A4 Container fill level and pressurization inspection using multi-dimensional images |
| 05/02/2000 | US6058352 Accurate tissue injury assessment using hybrid neural network analysis |
| 04/20/2000 | WO2000022655A1 Detection of wafer fragments in a wafer processing apparatus |
| 04/12/2000 | EP0991916A1 Straddle inspection system |
| 04/11/2000 | US6049282 Method and apparatus for measuring ice thickness on substrates using backscattering of gamma rays |
| 04/11/2000 | US6048743 Using a submicron level dimension reference |
| 04/05/2000 | EP0990140A1 Angle dispersive x-ray spectrometer |
| 04/04/2000 | US6047083 Method of and apparatus for pattern inspection |
| 03/28/2000 | US6044326 Measuring borehole size |
| 03/22/2000 | EP0986991A1 Calibration device |
| 03/22/2000 | EP0986745A1 Single beam photoneutron probe and x-ray imaging system for contraband detection and identification |
| 03/14/2000 | US6038280 Method and apparatus for measuring the thicknesses of thin layers by means of x-ray fluorescence |
| 03/14/2000 | US6038018 Substrate inspecting apparatus, substrate inspecting system having the same apparatus and substrate inspecting method |
| 02/29/2000 | US6031888 Fluoro-assist feature for a diagnostic imaging device |
| 02/09/2000 | EP0787284B1 Triaxial normal and shear force sensor |
| 01/27/2000 | WO2000004340A1 Thickness measurement of fluorescing coatings |
| 01/26/2000 | EP0725975B1 Detection system for measuring high aspect ratio |
| 01/25/2000 | CA2141813C Online tomographic gauging of sheet metal |
| 01/20/2000 | WO2000003234A1 Automatic defect classification with invariant core classes |
| 01/20/2000 | DE19830794A1 System and method for measuring layer thickness on substrates utilize the motion of the substrates relative to a measuring head during their transport along a given track |
| 01/06/2000 | WO2000000786A1 Determining the shape and orientation of a borehole |
| 12/22/1999 | EP0966060A1 Millimeter-wave imaging system with 360 degrees field of view |
| 12/21/1999 | US6005397 Microwave thickness measurement and apparatus |
| 12/14/1999 | US6002740 Method and apparatus for X-ray and extreme ultraviolet inspection of lithography masks and other objects |
| 12/07/1999 | US5999591 Measuring instrument and measuring method |
| 11/16/1999 | US5987092 Method of soft x-ray imaging |
| 11/10/1999 | EP0955518A2 Furnace lining measurement |
| 11/04/1999 | WO1999056116A1 Method for controlling the parameters of thin-film coatings and surfaces in real time and device for realising the same |
| 11/02/1999 | US5976449 Method and apparatus for the cross-sectional measurement of electric insulated conductors |
| 10/21/1999 | DE19817260A1 Roughness measuring system for measuring boundary surfaces and-or surfaces which need no mechanically scanning and no imaging processing |
| 10/19/1999 | US5970119 Radiological scaling and alignment device |
| 10/19/1999 | US5969357 Scanning electron microscope and method for dimension measuring by using the same |
| 10/19/1999 | US5969273 Method and apparatus for critical dimension and tool resolution determination using edge width |