| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 10/21/1980 | US4229652 Backscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate material |
| 09/30/1980 | CA1086870A1 X-ray-fluorescence measurement of thin film thicknesses |
| 09/09/1980 | US4221965 Scanning type electron microscope |
| 08/26/1980 | US4219802 Scanning barrier for the discrimination and counting of objects and more specifically of vehicles in transit through a laminar barrage of electromagnetic microwaves |
| 07/01/1980 | US4210902 Device for telemetering loads on power transmission line conductors |
| 06/17/1980 | US4208581 Radioactive ray gauge |
| 06/10/1980 | CA1079414A1 Procedure for measuring unit area weights |
| 05/14/1980 | EP0010797A1 Method and devices for determining the contour of a body for the reconstruction of an absorption distribution in a plane examined area of this body |
| 05/13/1980 | US4203036 X-ray diagnostic apparatus for producing transverse layer images |
| 05/13/1980 | CA1077625A1 Dynamic linearization system for a radiation gauge |
| 04/29/1980 | US4200921 Apparatus and method whereby wave energy is correlated with positional relationships in a system |
| 04/02/1980 | EP0009292A1 Method and apparatus for determining the internal dimension of extended hollow bodies, especially of tubes |
| 04/01/1980 | CA1074868A1 Apparatus for testing tube wall thickness |
| 03/18/1980 | US4194114 Device for non-contact gauging of thickness or weight per unit area of sheet and like materials |
| 03/11/1980 | CA1073561A1 Device for scanning a target with a beam of charged particles |
| 02/26/1980 | US4190770 Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material |
| 02/20/1980 | EP0008168A2 Radiation assembly and method for assessing web parameters |
| 01/23/1980 | EP0006985A1 Method and device for the determination of the focal length of electrooptical lenses of long focal length |
| 07/25/1979 | EP0003038A2 Method for overlay measurement using an electronic beam system as a measuring tool |
| 06/05/1979 | US4157503 Apparatus and method for testing the thickness of the wall of a moving tube leaving an extruder |
| 05/22/1979 | US4155594 Method of and apparatus for steering a mining machine |
| 05/15/1979 | US4155009 Thickness measurement instrument with memory storage of multiple calibrations |
| 05/15/1979 | US4154672 Standardization of penetrating radiation testing system |
| 04/17/1979 | US4150289 Gamma ray calibration system |
| 04/10/1979 | US4149085 Automatic overlay measurements using an electronic beam system as a measurement tool |
| 04/03/1979 | US4147931 Procedure for measuring unit area weights |
| 03/27/1979 | CA1051538A1 Inspection apparatus and method for hot glass containers |
| 02/27/1979 | US4142099 Process and apparatus for controlling metal thickness, and deposition and degradation rates |
| 02/06/1979 | CA1048126A1 Method of pigmentation control for thermoplastic film |
| 01/30/1979 | US4137028 Apparatus for the extrusion of tubular bodies of synthetic-resin material |
| 01/23/1979 | US4136396 Data processing |
| 12/12/1978 | US4129778 Method and apparatus for measuring the thickness of a non-metallic coating on a plated metal plate |
| 10/10/1978 | US4119846 Non-contacting gage apparatus and method |
| 09/19/1978 | US4115690 Backscatter instrument for measuring thickness of a continuously moving coated strip of substrate material |
| 08/29/1978 | US4110623 Device for scanning a target with a beam of charged particles |
| 08/22/1978 | CA1037163A1 Apparatus for collimation of radiation signals for long distance transmission and method of construction therefor |
| 08/01/1978 | US4104527 Scanning apparatus for cross-sectional inspection equipment |
| 07/11/1978 | US4099886 Detecting system |
| 07/11/1978 | US4099874 Detecting system |
| 06/20/1978 | US4095475 Apparatus and method whereby wave energy is correlated with geometry of a manufactured part or the like or to positional relationships in a system |
| 05/09/1978 | US4089054 Device for measuring the thickness of layers with a radionuclide irradiating the layer |
| 05/09/1978 | US4088886 Radiation thickness gauge for sheet material |
| 03/14/1978 | US4079237 Card controlled beta backscatter thickness measuring instrument |
| 02/14/1978 | US4073964 Process for controlling metal thickness, and deposition and degradation rates |
| 01/24/1978 | US4070625 Apparatus for measuring the distance to the floor of the cargo hold of a ship through intervening bulk material |
| 12/20/1977 | US4064396 Dynamic linearization system for a radiation gauge |
| 11/01/1977 | US4056349 Device for measuring slope parameters for a material contained inside a cylinder rotated about the axis thereof |
| 10/11/1977 | US4053899 Electrographic recorder cover assembly with retractable electrodes |
| 09/06/1977 | US4047042 Method of determining the water equivalent depth of snowfall using neutrons of cosmic rays |
| 09/06/1977 | US4047036 Strip profile measurement |
| 08/30/1977 | US4045727 Microwave proximity detector |
| 08/02/1977 | US4039829 Stereoscopic measuring apparatus |
| 07/26/1977 | US4038550 Method and an apparatus for the measuring of the wall thickness of a tube |
| 07/19/1977 | US4037104 Dual beam X-ray thickness gauge |
| 07/05/1977 | US4033885 Apparatus for collimation of radiation signals for long distance transmission and method of construction therefor |
| 05/17/1977 | US4023520 Reaction container for deposition of elemental silicon |
| 02/22/1977 | US4009376 Method and apparatus for measuring material thickness |
| 01/25/1977 | US4004900 Manufacture of flat glass at controlled throughput rate |
| 12/28/1976 | US4000402 Scanning gauge control for sheet processing apparatus |
| 12/21/1976 | US3999067 High speed radiation scanning technique for simultaneously determining the pitch and eccentricity of an encased oil |
| 12/21/1976 | US3999045 Method of pigmentation control for thermoplastic film |
| 12/21/1976 | US3998181 Apparatus for scraping metal coating on hot-coated metal strips |
| 11/16/1976 | US3992096 Detecting system |
| 10/26/1976 | US3988582 Blown film thickness gauge |
| 10/05/1976 | US3984679 Coating thickness monitor for multiple layers |
| 08/03/1976 | US3973259 Device for indicating changes in the position of an object |
| 07/27/1976 | US3971956 Measurement of surface roughness |
| 07/06/1976 | US3968368 Inspection apparatus and method for hot glass containers |
| 05/04/1976 | US3955086 Radiation thickness gauge |
| 04/27/1976 | US3953736 Method of and apparatus for measuring the thickness of objects |
| 01/20/1976 | US3934138 Apparatus for measuring surface stress by X-ray diffraction |