| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 01/08/1998 | WO1998000681A1 Straddle inspection system |
| 12/29/1997 | EP0725975A4 Detection system for measuring high aspect ratio |
| 12/17/1997 | CN1168174A Method and device for measuring content of bone mineral in skeleton |
| 12/11/1997 | WO1997047023A1 Spin-split scanning electron microscope |
| 12/11/1997 | DE19720708A1 High-speed monitor for study of pattern defect on semiconductor wafer |
| 12/02/1997 | US5692511 Diagnostic tomographic laser imaging apparatus |
| 11/27/1997 | DE19721313A1 Test specimen critical dimension measurement system for e.g. semiconductor manufacture |
| 11/26/1997 | EP0808477A1 Fabrication and use of a sub-micron dimensional standard |
| 11/26/1997 | EP0787284A4 Triaxial normal and shear force sensor |
| 11/19/1997 | CN1165323A Automated non-visual method of locating periodically arranged sub-micron objects |
| 11/12/1997 | EP0806680A2 Microwave air-path clearance sensor |
| 11/12/1997 | EP0805949A1 Measuring layer thickness using backscattering of high energy photons |
| 11/12/1997 | EP0705420A4 Online tomographic gauging of sheet metal |
| 10/29/1997 | EP0803059A1 Method and device for measuring the content of bone mineral in the skeleton |
| 10/28/1997 | US5680861 Modular subject positioning system for medical imaging |
| 10/01/1997 | EP0798774A2 An automated non-visual method of locating periodicalliy arranged sub-micron objects |
| 09/30/1997 | US5672007 On a body of water |
| 09/24/1997 | EP0716742A4 Tomographic densitometer |
| 09/23/1997 | US5670886 Method and apparatus for sensing proximity or position of an object using near-field effects |
| 09/12/1997 | WO1997033255A1 Apparatus and method for providing high fidelity reconstruction of an observed sample |
| 09/12/1997 | WO1997033141A1 Compton backscatter pipe wall thickness gauge employing focusing collimator and annular detector |
| 09/12/1997 | CA2248145A1 Compton backscatter pipe wall thickness gauge employing focusing collimator and annular detector |
| 09/10/1997 | EP0422017B1 Method for measuring the thickness of a coating on a substrate |
| 09/09/1997 | US5666394 Thickness measurement gauge |
| 08/27/1997 | CN1157920A Testing method for X-fluorescence gold content and thickness of gold plated, cladded |
| 08/20/1997 | EP0789888A1 X-ray computed tomography (ct) system for detecting thin objects |
| 08/13/1997 | EP0789222A2 Procedure for the fabrication and the calibration of a nanometer length scale for technical equipment for the purpose of giving precise or ultraprecise images of structures |
| 08/07/1997 | CA2196942A1 Process for manufacturing and calibrating a ruler in the nanometre range for technical apparatuses that are used for high-resolution of ultra-high resolution imaging of structures |
| 08/06/1997 | EP0787284A1 Triaxial normal and shear force sensor |
| 08/05/1997 | US5654994 Process for detecting the stroke motion of a valve member which is displaceable in a housing of an injection valve |
| 07/17/1997 | WO1997021075A3 Device for testing flat materials |
| 07/02/1997 | EP0781977A2 Pattern shape inspection apparatus for forming specimen image on display apparatus |
| 07/02/1997 | EP0781976A2 Method for measuring critical dimension of pattern on sample |
| 06/24/1997 | US5641960 Circuit pattern inspecting device and method and circuit pattern arrangement suitable for the method |
| 06/18/1997 | CN1151924A Welding method for coated sheet metal in particular tinplate |
| 06/12/1997 | WO1997021075A2 Device for testing flat materials |
| 06/12/1997 | DE19545340A1 Vorrichtung zur Kontrolle von Flächenmassen Apparatus for control of surface mass |
| 06/10/1997 | US5638420 Straddle inspection system |
| 05/28/1997 | EP0308493B1 Thickness/density measuring apparatus |
| 05/27/1997 | US5633593 Apparatus for sensing proximity of a moving target |
| 05/22/1997 | DE19542583A1 Test system for workpieces with at least one sensor which workpiece passes |
| 05/13/1997 | US5629706 Method for simultaneously measuring the positions of more than one surface in metallurgic processes |
| 05/09/1997 | WO1997016700A1 Measurement arrangement |
| 05/07/1997 | DE19540722A1 Determining condition or composition of surface using Doppler radar sensor |
| 04/15/1997 | US5621219 Device for scanning the geometrical pattern of a mark of an object |
| 04/08/1997 | US5619548 X-ray thickness gauge |
| 04/03/1997 | WO1997012233A1 Container fill level and pressurization inspection using multi-dimensional images |
| 03/18/1997 | US5612625 Method of measuring inner diameter of pipe |
| 03/18/1997 | US5612535 Spin-split scanning electron microscope |
| 03/12/1997 | EP0761368A1 Welding method for coated sheets, especially tin-plated sheets |
| 03/04/1997 | US5608660 Automated system for controlling the quality of geometrically regular-shaped products during their manufacture |
| 02/27/1997 | WO1997007514A1 X-ray thickness gauge |
| 02/18/1997 | US5604314 Triaxial normal and shear force sensor |
| 02/11/1997 | US5602890 Container fill level and pressurization inspection using multi-dimensional images |
| 02/06/1997 | WO1996041134A3 Method and apparatus for sensing proximity or position of an object using near-field or magnetic effects |
| 01/21/1997 | US5596620 X-ray based extensometry device for radiography |
| 01/14/1997 | US5594770 Method and apparatus for imaging obscured areas of a test object |
| 01/14/1997 | US5594245 Scanning electron microscope and method for dimension measuring by using the same |
| 12/19/1996 | WO1996041134A2 Method and apparatus for sensing proximity or position of an object using near-field or magnetic effects |
| 12/19/1996 | WO1996039935A1 Diagnostic tomographic laser imaging apparatus |
| 12/17/1996 | US5585629 Electron beam nano-metrology system |
| 12/17/1996 | US5585211 Fabrication and use of sub-micron dimensional standard |
| 12/17/1996 | CA2129940C Cable-locating apparatus and method |
| 11/28/1996 | DE19620821A1 Electron microscope for flaw analysis and inspecting electronic e.g. semiconductor or superconductor components |
| 11/26/1996 | US5579362 Method of and apparatus for the quantitative measurement of paint coating |
| 11/26/1996 | US5578821 Electron beam inspection system and method |
| 11/19/1996 | US5576541 Beta radiation, improved signal to noise ratio, paper |
| 11/05/1996 | US5572448 Enhanced resolution imaging and measurement systems |
| 10/01/1996 | US5560278 Hydraulic cylinder with an electrical contacting and sealing ring |
| 09/18/1996 | EP0732569A1 Apparatus for measuring surface weight |
| 09/18/1996 | EP0592520B1 Method for calibrating an x-ray layer thickness measuring apparatus |
| 09/10/1996 | US5553500 Triaxial normal and shear force sensor |
| 08/22/1996 | DE19612361A1 Measuring system for position measurement in nanometer and subnanometer range |
| 08/15/1996 | WO1996024885A1 Fabrication and use of a sub-micron dimensional standard |
| 08/14/1996 | EP0725975A1 Detection system for measuring high aspect ratio |
| 07/30/1996 | US5541856 X-ray inspection system |
| 07/23/1996 | US5539322 Calibrated microwave dielectric coating thickness gauge |
| 07/18/1996 | WO1996021856A1 Method and device for measuring the content of bone mineral in the skeleton |
| 07/18/1996 | CA2210250A1 Method and device for measuring the content of bone mineral in the skeleton |
| 07/16/1996 | US5537216 Circuit for including a copy-inhibit signal with a video signal |
| 06/19/1996 | EP0716742A1 Tomographic densitometer |
| 06/19/1996 | EP0619012B1 Linear position sensor using a coaxial resonant cavity |
| 06/11/1996 | CA2037844C Wood pole decay detector |
| 06/05/1996 | EP0601121B1 Radio frequency linear position sensor |
| 06/05/1996 | EP0560894B1 Apparatus and method for detecting a position of a piston |
| 06/04/1996 | US5524132 Process for revealing defects in testpieces using attenuated high-energy x-rays to form images in reusable photographs |
| 06/04/1996 | US5523853 Circuit for including a copy-inhibit signal with a video signal |
| 05/22/1996 | EP0713090A1 Detecting method and a detecting device |
| 05/21/1996 | US5518681 Method and apparatus for the cross-sectional measurement of electric insulated conductors |
| 05/14/1996 | US5517575 Methods of correcting optically generated errors in an electro-optical gauging system |
| 05/14/1996 | CA2064372C Continuous and contact free thickness measurement device of a thin conductive layer on a moving fiber or tape like isolating support |
| 05/09/1996 | WO1996013704A1 Triaxial normal and shear force sensor |
| 05/02/1996 | WO1996013017A1 X-ray computed tomography (ct) system for detecting thin objects |
| 05/02/1996 | DE4438993A1 Determining external contour and-or geometric dimensions of bodies |
| 04/30/1996 | US5512746 Micro-pattern measuring apparatus |
| 04/24/1996 | CN1121220A Scanning device |
| 04/18/1996 | DE19537877A1 Piston position-sensing system for hydraulic cylinder |
| 04/10/1996 | EP0705420A1 Online tomographic gauging of sheet metal |
| 04/02/1996 | US5504794 Device for the measurement of the thickness profile of a metal product in the form of a moving strip or plate |
| 04/02/1996 | US5503570 Female terminal metal fixture for connector |