Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671)
04/1990
04/24/1990US4920265 System for determining the basis weight of cord reinforced tire fabric
04/17/1990US4918712 Device for determining the mass per unit volume of an elementary volume of material
04/10/1990US4916315 Scanning electron microscope for observing and measuring minute pattern of sample
03/1990
03/27/1990US4912328 Apparatus for improving the signal-to-noise ratio of image signals in a scan-type imaging system
03/27/1990US4912313 Method of measuring surface topography by using scanning electron microscope, and apparatus therefor
03/21/1990EP0359434A2 Cable insulation eccentricity and diameter monitor
03/20/1990US4910398 Pattern Measurement method
02/1990
02/28/1990EP0355128A1 Automated laminography system for inspection of electronics
02/07/1990EP0353793A1 Measurement of the position of an elongated element
01/1990
01/16/1990US4894540 Image forming method using secondary electrons from object for noise elimination
01/03/1990EP0348992A2 Apparatus and method of pattern detection based on a scanning transmission electron microscope
01/03/1990EP0348574A2 Method of simultaneously measuring thickness and composition of film and apparatus therefor
12/1989
12/14/1989WO1989012281A1 Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography
12/13/1989EP0345772A2 Pattern configuration measuring apparatus
12/06/1989EP0344322A1 Method of monitoring the state of an extended shell
11/1989
11/16/1989WO1989011205A1 Computed tomography inspection of electronic devices
11/16/1989WO1989011095A1 Method and apparatus for measuring the thickness of a coating on a substrate
11/08/1989EP0341095A2 Identifying the position of objects or zones
10/1989
10/25/1989EP0338079A1 Method and device for controlling the condition of a lengthy construction element
10/19/1989DE3811673A1 Scanning electron microscope method for measuring the profiling, in particular the roughness, of surfaces, and device for carrying out the method
10/18/1989EP0337831A1 Method and device for determining the density of an elementary volume of matter
10/18/1989CN1036451A Thickness measurer of furnace liner
10/04/1989EP0335398A1 Scanning electron microscope for observing and measuring minute pattern of samples
10/04/1989EP0334897A1 Rotor recognition system.
09/1989
09/27/1989EP0148245B1 Method and system to measure geometric and electromagnetic characteristics of objects
09/26/1989CA1260540A1 Apparatus for measuring the length of an electrical line
09/19/1989US4868488 Use of a dielectric microwave resonator and sensor circuit for determining the position of a body
09/13/1989CN1035557A Method of monitoring state of elongated object and apparatus for performing this method
09/12/1989US4866747 Device for measuring the thickness of thin coatings
09/12/1989US4866280 Objective lens of an electron beam apparatus
08/1989
08/22/1989US4860329 X-ray fluorescence thickness measuring device
07/1989
07/25/1989US4852131 Computed tomography inspection of electronic devices
07/11/1989CA1257408A1 System for determining the basis weight of cord reinforced tire fabric
07/04/1989US4845422 For measuring distance
06/1989
06/27/1989US4843346 Radio frequency strain monitor
06/27/1989US4842477 Active clearance control
06/20/1989CA1256219A1 Device for measuring the thickness profile of rolled sheet metal bands
06/14/1989EP0320442A2 Use of a dielectric microwave resonator, and sensor circuits
06/14/1989EP0320122A2 A method of position monitoring and apparatus therefor
06/06/1989CA1255398A1 Apparatus for measuring the thickness profile of rolled strips
05/1989
05/30/1989US4835385 Method of measuring sectional shape and a system therefor
05/24/1989CN1033106A Method and araangement for measuring and/or monitoring properties of yarns or ropes
05/24/1989CN1033101A Method of detecting condition of three-dimensional case
05/18/1989WO1989004477A1 Automated laminography system for inspection of electronics
05/10/1989EP0314813A1 Method and device for controlling the condition of lengthy objects
05/05/1989WO1989003973A1 Method and device for controlling the condition of a lengthy construction element
04/1989
04/19/1989EP0312083A2 Pattern measurement method
04/19/1989EP0312082A2 Image forming method using secondary electrons from object
04/12/1989EP0148908B1 Parts sorting apparatus and method
04/04/1989US4818930 Method and apparatus for thin layer monitoring
04/04/1989US4818871 Process for the detection of superimposed sheets, apparatus for performing the process and application to bank notes
03/1989
03/29/1989EP0308493A1 Thickness/density measuring apparatus.
03/28/1989US4817178 Linear cursor representation method
03/21/1989US4814615 Method and apparatus for detecting defect in circuit pattern of a mask for X-ray exposure
03/21/1989US4814198 Method of controlling and/or measuring layer thickness such as the thickness of surface layers
03/21/1989US4813147 Apparatus for interacting with both sides of a two-sided strip
03/09/1989EP0303595A4 Linear position sensor.
03/05/1989WO1989003972A1 Method for controlling the condition of a prolongated envelope
02/1989
02/28/1989US4809314 Method of aligning a linear array X-ray detector
02/22/1989EP0303595A1 Linear position sensor.
02/14/1989CA1250061A1 Method of measuring layer thickness and composition of alloy plating
02/07/1989USH589 Measurement of film thickness of integrated circuits
02/07/1989US4803715 Thickness measurement with automatic correction for changes in composition
02/07/1989US4803428 Method and apparatus for non-destructive material testing, particularly for determination of thickness of coating layers on a base material by measuring electrical conductivity or magnetic permeability at the finished specimen
01/1989
01/17/1989US4799246 Apparatus for measuring the thickness of thin layers
12/1988
12/13/1988US4791294 Electron beam scanning method and scanning electron microscope
11/1988
11/29/1988US4788431 Specimen distance measuring system
11/23/1988CN88102544A Monitoring method and implementing apparatus for long measured matter state
11/22/1988CA1245376A1 Fuel tube barrier gauge
11/17/1988WO1988008960A1 Method and device for controlling the condition of lengthy objects
11/17/1988EP0291320A2 Method and apparatus for measuring strain and temperature of an object simultaneously
11/15/1988US4785354 Tire load test CT scanner
11/08/1988US4783647 Sheet material manufacturing
11/01/1988CA1244151A1 Method for evaluating residual fatigue life of mechanical parts
10/1988
10/25/1988CA1243757A1 Distance measurement method making use of electromagnetic wave and system therefor
10/20/1988DE3710789A1 Method for passive measurement of liquid films and/or foam layers on water
10/11/1988US4777610 Thickness monitor
10/11/1988US4777364 Defect detection and thickness mapping of the passivation layer(s) of integrated circuits
10/06/1988WO1988007671A1 Thickness/density measuring apparatus
09/1988
09/15/1988DE3707107A1 Device for simultaneously measuring the transverse thickness profile and the strip width during hot rolling of flat sections
09/13/1988US4771173 Contactless apparatus and method for thickness determination of coatings
09/07/1988EP0280980A1 Electrohydraulic Servo system
08/1988
08/31/1988CN87104380A Digital direct reading type thickness gage
08/30/1988US4767926 Electron beam metrology system
08/23/1988US4766311 Method and apparatus for precision SEM measurements
08/17/1988CN87104383A Digital direct-reading type isotope thickness gauge
08/16/1988US4764945 Method of measuring layer thickness and composition of alloy plating
07/1988
07/26/1988CA1239685A1 Microwave detection system
07/19/1988US4759046 Apparatus for measuring the thickness profile of rolled strips
07/19/1988US4757745 Microwave antenna and dielectric property change frequency compensation system in electrohydraulic servo with piston position control
07/05/1988US4755047 Photometric stereoscopic shape measuring method
07/05/1988CA1238989A1 Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects
06/1988
06/16/1988WO1988004201A1 Rotor recognition system
06/14/1988US4751384 Electron beam metrology system
06/08/1988CN87214943U Target changeable type thickness gauge by isotope
06/01/1988EP0269590A2 A method of controlling and/or measuring layer thickness such as the thickness of surface layers
05/1988
05/31/1988US4748647 Fuel tube barrier gauge
05/31/1988US4748327 Method of inspecting masks and apparatus thereof
05/31/1988US4747698 Scanning thermal profiler
05/19/1988WO1988003652A1 Linear position sensor
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