| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 04/24/1990 | US4920265 System for determining the basis weight of cord reinforced tire fabric |
| 04/17/1990 | US4918712 Device for determining the mass per unit volume of an elementary volume of material |
| 04/10/1990 | US4916315 Scanning electron microscope for observing and measuring minute pattern of sample |
| 03/27/1990 | US4912328 Apparatus for improving the signal-to-noise ratio of image signals in a scan-type imaging system |
| 03/27/1990 | US4912313 Method of measuring surface topography by using scanning electron microscope, and apparatus therefor |
| 03/21/1990 | EP0359434A2 Cable insulation eccentricity and diameter monitor |
| 03/20/1990 | US4910398 Pattern Measurement method |
| 02/28/1990 | EP0355128A1 Automated laminography system for inspection of electronics |
| 02/07/1990 | EP0353793A1 Measurement of the position of an elongated element |
| 01/16/1990 | US4894540 Image forming method using secondary electrons from object for noise elimination |
| 01/03/1990 | EP0348992A2 Apparatus and method of pattern detection based on a scanning transmission electron microscope |
| 01/03/1990 | EP0348574A2 Method of simultaneously measuring thickness and composition of film and apparatus therefor |
| 12/14/1989 | WO1989012281A1 Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography |
| 12/13/1989 | EP0345772A2 Pattern configuration measuring apparatus |
| 12/06/1989 | EP0344322A1 Method of monitoring the state of an extended shell |
| 11/16/1989 | WO1989011205A1 Computed tomography inspection of electronic devices |
| 11/16/1989 | WO1989011095A1 Method and apparatus for measuring the thickness of a coating on a substrate |
| 11/08/1989 | EP0341095A2 Identifying the position of objects or zones |
| 10/25/1989 | EP0338079A1 Method and device for controlling the condition of a lengthy construction element |
| 10/19/1989 | DE3811673A1 Scanning electron microscope method for measuring the profiling, in particular the roughness, of surfaces, and device for carrying out the method |
| 10/18/1989 | EP0337831A1 Method and device for determining the density of an elementary volume of matter |
| 10/18/1989 | CN1036451A Thickness measurer of furnace liner |
| 10/04/1989 | EP0335398A1 Scanning electron microscope for observing and measuring minute pattern of samples |
| 10/04/1989 | EP0334897A1 Rotor recognition system. |
| 09/27/1989 | EP0148245B1 Method and system to measure geometric and electromagnetic characteristics of objects |
| 09/26/1989 | CA1260540A1 Apparatus for measuring the length of an electrical line |
| 09/19/1989 | US4868488 Use of a dielectric microwave resonator and sensor circuit for determining the position of a body |
| 09/13/1989 | CN1035557A Method of monitoring state of elongated object and apparatus for performing this method |
| 09/12/1989 | US4866747 Device for measuring the thickness of thin coatings |
| 09/12/1989 | US4866280 Objective lens of an electron beam apparatus |
| 08/22/1989 | US4860329 X-ray fluorescence thickness measuring device |
| 07/25/1989 | US4852131 Computed tomography inspection of electronic devices |
| 07/11/1989 | CA1257408A1 System for determining the basis weight of cord reinforced tire fabric |
| 07/04/1989 | US4845422 For measuring distance |
| 06/27/1989 | US4843346 Radio frequency strain monitor |
| 06/27/1989 | US4842477 Active clearance control |
| 06/20/1989 | CA1256219A1 Device for measuring the thickness profile of rolled sheet metal bands |
| 06/14/1989 | EP0320442A2 Use of a dielectric microwave resonator, and sensor circuits |
| 06/14/1989 | EP0320122A2 A method of position monitoring and apparatus therefor |
| 06/06/1989 | CA1255398A1 Apparatus for measuring the thickness profile of rolled strips |
| 05/30/1989 | US4835385 Method of measuring sectional shape and a system therefor |
| 05/24/1989 | CN1033106A Method and araangement for measuring and/or monitoring properties of yarns or ropes |
| 05/24/1989 | CN1033101A Method of detecting condition of three-dimensional case |
| 05/18/1989 | WO1989004477A1 Automated laminography system for inspection of electronics |
| 05/10/1989 | EP0314813A1 Method and device for controlling the condition of lengthy objects |
| 05/05/1989 | WO1989003973A1 Method and device for controlling the condition of a lengthy construction element |
| 04/19/1989 | EP0312083A2 Pattern measurement method |
| 04/19/1989 | EP0312082A2 Image forming method using secondary electrons from object |
| 04/12/1989 | EP0148908B1 Parts sorting apparatus and method |
| 04/04/1989 | US4818930 Method and apparatus for thin layer monitoring |
| 04/04/1989 | US4818871 Process for the detection of superimposed sheets, apparatus for performing the process and application to bank notes |
| 03/29/1989 | EP0308493A1 Thickness/density measuring apparatus. |
| 03/28/1989 | US4817178 Linear cursor representation method |
| 03/21/1989 | US4814615 Method and apparatus for detecting defect in circuit pattern of a mask for X-ray exposure |
| 03/21/1989 | US4814198 Method of controlling and/or measuring layer thickness such as the thickness of surface layers |
| 03/21/1989 | US4813147 Apparatus for interacting with both sides of a two-sided strip |
| 03/09/1989 | EP0303595A4 Linear position sensor. |
| 03/05/1989 | WO1989003972A1 Method for controlling the condition of a prolongated envelope |
| 02/28/1989 | US4809314 Method of aligning a linear array X-ray detector |
| 02/22/1989 | EP0303595A1 Linear position sensor. |
| 02/14/1989 | CA1250061A1 Method of measuring layer thickness and composition of alloy plating |
| 02/07/1989 | USH589 Measurement of film thickness of integrated circuits |
| 02/07/1989 | US4803715 Thickness measurement with automatic correction for changes in composition |
| 02/07/1989 | US4803428 Method and apparatus for non-destructive material testing, particularly for determination of thickness of coating layers on a base material by measuring electrical conductivity or magnetic permeability at the finished specimen |
| 01/17/1989 | US4799246 Apparatus for measuring the thickness of thin layers |
| 12/13/1988 | US4791294 Electron beam scanning method and scanning electron microscope |
| 11/29/1988 | US4788431 Specimen distance measuring system |
| 11/23/1988 | CN88102544A Monitoring method and implementing apparatus for long measured matter state |
| 11/22/1988 | CA1245376A1 Fuel tube barrier gauge |
| 11/17/1988 | WO1988008960A1 Method and device for controlling the condition of lengthy objects |
| 11/17/1988 | EP0291320A2 Method and apparatus for measuring strain and temperature of an object simultaneously |
| 11/15/1988 | US4785354 Tire load test CT scanner |
| 11/08/1988 | US4783647 Sheet material manufacturing |
| 11/01/1988 | CA1244151A1 Method for evaluating residual fatigue life of mechanical parts |
| 10/25/1988 | CA1243757A1 Distance measurement method making use of electromagnetic wave and system therefor |
| 10/20/1988 | DE3710789A1 Method for passive measurement of liquid films and/or foam layers on water |
| 10/11/1988 | US4777610 Thickness monitor |
| 10/11/1988 | US4777364 Defect detection and thickness mapping of the passivation layer(s) of integrated circuits |
| 10/06/1988 | WO1988007671A1 Thickness/density measuring apparatus |
| 09/15/1988 | DE3707107A1 Device for simultaneously measuring the transverse thickness profile and the strip width during hot rolling of flat sections |
| 09/13/1988 | US4771173 Contactless apparatus and method for thickness determination of coatings |
| 09/07/1988 | EP0280980A1 Electrohydraulic Servo system |
| 08/31/1988 | CN87104380A Digital direct reading type thickness gage |
| 08/30/1988 | US4767926 Electron beam metrology system |
| 08/23/1988 | US4766311 Method and apparatus for precision SEM measurements |
| 08/17/1988 | CN87104383A Digital direct-reading type isotope thickness gauge |
| 08/16/1988 | US4764945 Method of measuring layer thickness and composition of alloy plating |
| 07/26/1988 | CA1239685A1 Microwave detection system |
| 07/19/1988 | US4759046 Apparatus for measuring the thickness profile of rolled strips |
| 07/19/1988 | US4757745 Microwave antenna and dielectric property change frequency compensation system in electrohydraulic servo with piston position control |
| 07/05/1988 | US4755047 Photometric stereoscopic shape measuring method |
| 07/05/1988 | CA1238989A1 Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects |
| 06/16/1988 | WO1988004201A1 Rotor recognition system |
| 06/14/1988 | US4751384 Electron beam metrology system |
| 06/08/1988 | CN87214943U Target changeable type thickness gauge by isotope |
| 06/01/1988 | EP0269590A2 A method of controlling and/or measuring layer thickness such as the thickness of surface layers |
| 05/31/1988 | US4748647 Fuel tube barrier gauge |
| 05/31/1988 | US4748327 Method of inspecting masks and apparatus thereof |
| 05/31/1988 | US4747698 Scanning thermal profiler |
| 05/19/1988 | WO1988003652A1 Linear position sensor |