| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 03/28/1996 | DE19535984A1 Verfahren zum Herstellen einer Mehrschichtkeramikkomponente A method of manufacturing a multilayer ceramic component |
| 03/26/1996 | US5502306 Electron beam inspection system and method |
| 03/26/1996 | US5501344 Process for the identification of randomly shaped and/or plane materials by determination of the structure of the materials through application of electromagnetic and/or acoustic waves |
| 03/13/1996 | EP0701105A1 Method and apparatus for controlling the cross-sectional dimensions of optical fibers during fabrication |
| 03/07/1996 | WO1996007077A1 Measuring layer thickness using backscattering of high energy photons |
| 03/07/1996 | CA2198712A1 Measuring layer thickness using backscattering of high energy photons |
| 03/05/1996 | US5497099 Antenna system for soot detecting |
| 02/22/1996 | DE4429013A1 Arrangement for substrate deposition or sputtering |
| 02/21/1996 | EP0697108A1 A method for simultaneously measuring the positions of more than one surface in metallurgic processes |
| 02/20/1996 | US5493116 Detection system for precision measurements and high resolution inspection of high aspect ratio structures using particle beam devices |
| 01/31/1996 | EP0547220B1 Multiplexed radio frequency linear position sensor system |
| 01/16/1996 | US5485160 Radar-type object shape detector |
| 01/09/1996 | US5483571 Radiographic moire |
| 01/03/1996 | EP0355128B1 Automated laminography system for inspection of electronics |
| 12/13/1995 | EP0686828A1 Scanning apparatus |
| 11/28/1995 | US5471147 Apparatus and method for determining the linear position of a hydraulic cylinder |
| 11/15/1995 | EP0682328A1 Scanning device |
| 11/07/1995 | US5465153 For gauging surface geometry of a test object |
| 10/31/1995 | US5463464 Electro-optical system for gauging surface profile deviations using infrared radiation |
| 10/31/1995 | US5463221 Electron beam measuring apparatus |
| 10/24/1995 | US5460034 Method for measuring and analyzing surface roughness on semiconductor laser etched facets |
| 10/17/1995 | US5459405 Method and apparatus for sensing proximity of an object using near-field effects |
| 10/10/1995 | US5457727 Device for processing a measured signal corresponding to the intensity of X-rays reflected by a multi-layer structure on a substrate |
| 09/06/1995 | EP0485572B1 An automated system for controlling the quality of geometrically regular-shaped products during their manufacture |
| 08/30/1995 | EP0669636A1 Manufacturing system error detection |
| 08/30/1995 | EP0669529A1 Method and apparatus for determining the depth of a gamma emitting element beneath the surface |
| 08/29/1995 | US5445011 Scanning force microscope using an optical trap |
| 08/22/1995 | US5444758 Beam position detecting device |
| 08/22/1995 | US5444245 Method of automatically setting coordinate conversion factor |
| 08/19/1995 | CA2142777A1 Method and apparatus for determining the depth of a gamma emitting element beneath the surface |
| 08/16/1995 | EP0667508A1 Device to measure the thickness profile of a metallic product such as a running band or slab |
| 08/15/1995 | US5442676 Method of determining a given characteristic of a material sample |
| 08/08/1995 | US5440386 Method and device for calibrating an apparatus for measuring the thickness of a sheet of material |
| 08/01/1995 | US5438603 Device for radiography without the use of film |
| 08/01/1995 | US5438417 Electro-optical system for gauging surface profile deviations |
| 08/01/1995 | US5438265 Metallic cable-locating apparatus and method having an image capturing means |
| 07/26/1995 | EP0664437A2 Method and apparatus for obtaining non-destructive measurements for regularly-shaped objects |
| 07/26/1995 | CN2204042Y Multi-function X-rays instrument for axonometry |
| 07/18/1995 | US5434422 Sample position controller in focused ion beam system |
| 07/18/1995 | US5434409 Critical dimension measuring method |
| 06/22/1995 | WO1995016893A1 Contact-free dimensional control device for mechanical parts and other objects |
| 06/15/1995 | WO1995016056A1 Method of monitoring the state of the surface of molten metal and a device for carrying out said method |
| 06/14/1995 | DE4342288A1 Reflectometer for detecting and monitoring condition of threads etc. |
| 06/13/1995 | US5425066 Method of finding the center of a band-shaped region |
| 06/13/1995 | US5423222 Method for determining the relative amount of deformation induced in a sealing component by a sealing |
| 05/30/1995 | US5420803 Enhanced resolution wafer thickness measurement system |
| 05/23/1995 | US5418830 Radiometric thickness measurement gage |
| 05/16/1995 | US5416589 Electro-optical system for gauging surface profile deviations |
| 05/10/1995 | EP0652606A1 Female terminal metal fixture for connector |
| 05/09/1995 | US5414648 Nondestructively determining the dimensional changes of an object as a function of temperature |
| 05/09/1995 | US5414430 Determination of roll angle |
| 05/09/1995 | US5414265 Line-width measurements of metallization coated with insulator on microelectronic circuits using energy dispersive x-ray analysis |
| 05/04/1995 | WO1995012210A1 Detection system for measuring high aspect ratio |
| 05/04/1995 | DE4337060A1 Device for detecting and/or testing products |
| 05/03/1995 | CN1102288A Nanometer metrology |
| 05/02/1995 | US5412210 Scanning electron microscope and method for production of semiconductor device by using the same |
| 05/02/1995 | US5412206 Method and apparatus for determining the depth of a gamma emitting element beneath the surface |
| 03/29/1995 | EP0645646A1 Cable-locating apparatus and method |
| 03/21/1995 | US5400380 Dynamic alloy correction gauge |
| 03/14/1995 | US5398273 X-ray based extensometry device |
| 03/09/1995 | WO1995006874A1 Tomographic densitometer |
| 03/09/1995 | CA2170900A1 Tomographic densitometer |
| 02/15/1995 | CN1027662C Method for measuring thickness of solid thin layer material contained hydrogen with neutron radiation |
| 01/18/1995 | CN2187779Y Processing device for measuring data of roll gap for continuous casting machine |
| 01/17/1995 | US5381694 Ice thickness measurement reflectometer |
| 01/10/1995 | US5381442 Coherent Fourier transform radiometer for determining the thickness distribution of an oil film on a body of water based on the brightness temperature of the oil film and water over a range of radiation frequencies |
| 01/03/1995 | US5379237 Automated system for controlling the quality of regularly-shaped products during their manufacture |
| 12/28/1994 | EP0630467A1 Nanometer metrology |
| 12/28/1994 | EP0630466A1 Enhanced resolution wafer thickness measurement system |
| 12/27/1994 | US5376798 Weight measuring apparatus |
| 12/21/1994 | EP0629837A1 Method of measuring inner diameter of pipe |
| 12/21/1994 | EP0629836A1 Method of inspecting abnormality occurring inside pipe and apparatus for practicing the method |
| 12/20/1994 | US5374934 Antenna mirror-surface measuring system |
| 12/13/1994 | US5373545 Method for the on-line nondestructive measurement of a characteristic of a continuously produced |
| 12/13/1994 | US5372622 Large aperture device for controlling thickness of conductive coatings on optical fibers |
| 11/02/1994 | EP0622610A1 Calibration method and apparatus for flat product transversal profile thickness measuring unit |
| 11/02/1994 | EP0622607A1 Method and apparatus for non-destructive determination of the thickness of deposited mineral coatings and/or the determination of the position of materials underlying such mineral layers |
| 11/02/1994 | EP0622344A2 Large aperture device for controlling thickness of conductive coating on optical fibers |
| 10/13/1994 | WO1994023270A1 Coherent fourier transform radiometer |
| 10/12/1994 | EP0619012A1 Linear position sensor using a coaxial resonant cavity. |
| 10/04/1994 | US5353324 Total reflection X-ray diffraction micrographic method and apparatus |
| 09/28/1994 | EP0617257A1 Electron beam measuring apparatus |
| 09/27/1994 | US5351203 Online tomographic gauging of sheet metal |
| 09/06/1994 | US5345478 Counting photons, nuclear reactors |
| 08/18/1994 | WO1994018549A1 A method for simultaneously measuring the positions of more than one surface in metallurgic processes |
| 08/02/1994 | US5334838 Radiation sensor |
| 07/26/1994 | US5332898 Precision measurement using particle beam devices |
| 07/21/1994 | WO1994016294A1 Nanometer metrology |
| 07/19/1994 | US5331163 Radioactive areal density detector with scintillating receiver |
| 07/05/1994 | US5327081 Method for determining the thickness of a material by means of a radiant energy probe |
| 06/29/1994 | EP0603943A1 A method of determining a given characteristic of a material sample |
| 06/28/1994 | US5325063 Linear position sensor with means to eliminate spurians harmonic detections |
| 06/22/1994 | EP0602192A1 Antenna system for soot detecting apparatus |
| 06/16/1994 | DE4244638A1 Microwave measurement for rapid positional and non=destructive characterisation of dielectric materials - involves analysis of changed resonator length and anisotropic properties induced in material |
| 06/15/1994 | EP0601121A1 Radio frequency linear position sensor. |
| 06/15/1994 | CN1087992A Process for the identification of randomly shaped and/or plane materials by determination of the structhre of the materials through application of electromagnetic and/or acoustic waves |
| 06/09/1994 | DE4241271A1 Spraying system for compressed material mat during wood sheet mfr. - has measurement module holders in each individual spray machine, and evaluation computer processing separately acquired measurement values |
| 06/01/1994 | EP0599052A2 Process for the identification of randomly shaped and/or plane materials by determination of the structure of the materials through application of electromagnetic and/or acoustic waves |
| 05/26/1994 | WO1994011698A1 Enhanced resolution wafer thickness measurement system |
| 05/11/1994 | WO1994010532A1 Electro-optical system for gauging surface profiles |